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| Number | Title | Issue Date |
| 8174280 | Method of testing display panel A method of testing the display panel is provided. a display panel is provided, wherein the display panel has shorting bars and testing pads in a first peripheral area, and IC pads in a second peripheral area. A first stage test is performed to input a common voltag... | 05/08/2012 |
| 8169228 | Chip testing circuit A chip testing circuit is disclosed. The chip testing circuit uses a judging circuit to switch the connection of the data compressing circuit between data compressing base units which compresses 4 XIOs, so as to obtain testing data by one single interface circuit an... | 05/01/2012 |
| 8164346 | Orientation detection circuit and electronic device using the same An orientation detection circuit is provided. The circuit includes a processor, a first resistor, a second resistor, a third resistor, and a vibration switch. The processor comprises a first input pin and a second input pin. The second resistor has a resistance valu... | 04/24/2012 |
| 8164345 | Spectral and information theoretic method of test point, partial-scan, and full-scan flip-flop insertion to improve integrated circuit testability Design for testability (DFT) algorithms, which use both gradient descent and linear programming (LP) algorithms to insert test points (TPs) and/or scanned flip-flops (SFFs) into large circuits to make them testable are described. Scanning of either all flip-flops or... | 04/24/2012 |
| 8154304 | PCB delivery apparatus PCB testing system employing the same A printed circuit board (PCB) testing system includes two gear groups, a pair of transmission belts and a driver. The pair of transmission belts geared onto and driven by the two gear groups is parallel and respectively perpendicular to the PCB transmission guideway... | 04/10/2012 |
| 8148996 | Circuit testing apparatus The invention discloses a circuit testing apparatus for testing a device under testing. The circuit testing apparatus includes a logic tester and a signal-measuring module. The logic tester is coupled to the device under testing for providing a testing signal and a ... | 04/03/2012 |
| 8148997 | Method for monitoring whether the switching threshold of a switching transducer lies within a predefined tolerance range A method monitors whether the switching threshold of a switching sensor lies within a predefined tolerance region. An input signal is applied to the sensor's signal input, and a signal output emits a switch output signal that takes a first value when the input signa... | 04/03/2012 |
| 8148998 | Orientation detection circuit and electronic device using the same An orientation detection circuit is provided. The circuit includes a processor, a first resistor, a second resistor, a third resistor, a vibration switch, a first transistor, and a second transistor. The processor includes a first input pin and a second input pin. T... | 04/03/2012 |
| 8143901 | Test apparatus, test method, and integrated circuit A test apparatus includes an up counter, a down counter, a selector that selects either an up counter output from the up counter or a down counter output from the down counter, an inversion circuit that inverts either the counter output selected by the selector or t... | 03/27/2012 |
| 8138765 | Device and method for actuator monitoring of a safety-related load circuit connected with two channels The invention relates to monitoring actuators arranged in the load circuit of an output circuit for switching the load circuit. Actuators are arranged in series in the load circuit, each of the actuators is connected to a control and evaluation device by a separate ... | 03/20/2012 |
| 8138766 | Flashover analysis tool A method to minimize human intervention during decision making processes while controlling an electrical power system by identifying an initiating element that cause a tripping of the transmission overhead lines and identifying potential future protection system fai... | 03/20/2012 |
| 8134373 | Apparatus and method for detecting performance variations The system contains a circuit apparatus and method for monitoring the status of components within a digital system, the apparatus having a digital device. A power-line is supplied to the digital device. A second signal is rendered from the power-line. At least one m... | 03/13/2012 |
| 8130001 | System and method for detecting a protective device has limited or interrupted current it carries A system and method monitors indicators including other-than-current indicators of protective devices such as cutouts and reclosers, to determine whether the protective devices are restricting, below their rated capacity, or interrupting, current they carry. The sys... | 03/06/2012 |
| 8130006 | Apparatus, system and method for testing electronic elements An electronic element testing apparatus for use with a number of probes. Each probe has a lower pole and an upper pole. The apparatus includes: a first plate having a first side and a second side, the first side having an array of lower pole regions disposed thereab... | 03/06/2012 |
| 8115495 | Wired pipe signal transmission testing apparatus and method A wired pipe signal transmission testing apparatus is provided. The apparatus includes a core having a plurality of threads formed on a surface thereof and a plurality of slots cutting through crests and roots of at least a portion of the threads, thereby creating a... | 02/14/2012 |
| 8106666 | Testing an electrical component Testing an electrical component, the component including a printed circuit board (‘PCB’) with a number of traces, the traces organized in pairs with each trace of a pair carrying current in opposite directions and separated from one another by a substrate layer ... | 01/31/2012 |
| 8098073 | System for terminating high speed input/output buffers in an automatic test equipment environment to enable external loopback testing An apparatus comprising a test termination card having a first set of connections and a second set of connections. The first set of connections may be configured to connect to a specific pinout of a device under test. The second set of connections may be configured ... | 01/17/2012 |
| 8098075 | Testing method for electronic apparatus An electronic apparatus includes a first power contact, a second power contact, and a control unit. The first power contact is electrically connected with an anode of a power supply source, and the second power contact is electrically connected with a cathode of the... | 01/17/2012 |
| 8093921 | Monitoring of interconnect reliability using a programmable device In one embodiment, the reliability of the L2 power and/or ground sub-arrays of contacts of a functional integrated circuit device is verified by applying a reference voltage to a selected contact in sub-array and sequentially measuring the voltage at other contacts ... | 01/10/2012 |
| 8081003 | Circuit arrangement with a test circuit and a reference circuit and corresponding method Implementations are presented herein that include a test circuit and a reference circuit. ... | 12/20/2011 |
| 8076944 | Systems and methods for detecting electrical line faults Methods and systems for detecting changes in currents are disclosed, including: dividing a main current into two or more subcurrents, combining a first magnetic flux of a first subcurrent of the two or more of the subcurrents with another magnetic flux of another cu... | 12/13/2011 |
| 8072226 | Nanostructure sensors Embodiments feature a sensor including a nanostructure and methods for manufacturing the same. In some embodiments, a sensor includes a substrate, a first electrode disposed on the substrate, and a second electrode disposed on the substrate. The second electrode is ... | 12/06/2011 |
| 8067943 | Test apparatus, calibration method, program, and recording medium Provided is a test apparatus, a calibration method, a program causing a computer to perform as a test apparatus, and a recording medium storing the program. The test apparatus includes a response characteristic detecting section that detects a difference between a r... | 11/29/2011 |
| 8058892 | Radiofrequency contactor A radiofrequency contactor includes a testing circuit board having a dielectric substrate, a lower ground conductor on a lower surface of the dielectric substrate, and a radiofrequency signal wiring conductor on an upper surface of the dielectric substrate, a radiof... | 11/15/2011 |
| 8049514 | Integrated circuit inspection system Methods and systems that include a nanotube used as an emitter in the testing and fabrication of integrated circuits. The nanotube emits a signal to a substrate. Based on the signal or the electrical properties, e.g., current induced in the substrate by the signal, ... | 11/01/2011 |
| 8049513 | Method for the adjustment of a device under test A method for adjusting an output signal produced by a device under test from an input variable by: a) positioning the device under test at a first test device with a physical disturbance variable and a known input variable value, b) acquiring at least one measured v... | 11/01/2011 |
| 8030945 | Group of circuits and testing method thereof and testing machine thereof A Group of circuits and a testing method thereof and a testing machine thereof are provided. In the testing method, a first voltage of a first circuit is adjusted to be a second voltage according to a first adjusting signal, wherein the second voltage is closer to a... | 10/04/2011 |
| 8030944 | Method for continuity test of integrated circuit The present invention provides a method for continuity test of integrated circuit. By using both pins of integrated circuit to measure a current of an electrostatic discharge device, the contact resistance of the integrated circuit can be obtained by calculating. Th... | 10/04/2011 |
| 8013615 | Diagnostic circuit and method of testing a circuit A diagnostic circuit is configured for connecting to a unit under test that has a load and a sinusoidal source. The diagnostic circuit includes a voltage sensing device that has an input for sensing a signal, a first terminal for connecting to the load, a second ter... | 09/06/2011 |
| 8008927 | Method and apparatus for ground bounce and power supply bounce detection A method and apparatus for ground bounce and power supply bounce detection in devices have been disclosed. In one case one input to a differential amplifier is coupled to a reference voltage and another input to the differential amplifier is coupled to a measurement... | 08/30/2011 |
| 7999559 | Digital fault detection circuit and method Digital fault detection circuit with an input circuit having input and output, wherein a first signal state at the input causes a predetermined signal state at the output and a second signal state at the input leaves the output floating; a signal line with signal li... | 08/16/2011 |
| 7994798 | Power converter current sensor testing method A method of testing power converter current sensors is disclosed. The method may include receiving a current sensor test request and receiving measured currents from current measurements from the at least one current sensor, based on the test request. The method may... | 08/09/2011 |
| 7969158 | Noise-reduction method for processing a test port A noise-reduction method for processing a port is applied to a test target for testing or being burned in with software. At least one zero-Ohm resistor is provided with a first end thereof electrically connected to a device under test (DUT) of the test target and a ... | 06/28/2011 |
| 7969175 | Separate test electronics and blower modules in an apparatus for testing an integrated circuit The invention relates to an apparatus for testing an integrated circuit of an electronic device. ... | 06/28/2011 |
| 7956617 | Testing circuits for degradation without removal from host equipment A system (S) for testing of electronic circuits (14) includes at least one input signal (18) influenced by the tested circuit (14) for generating a resultant signal (22) conveying characteristics of selected critical performance parameter... | 06/07/2011 |
| 7952361 | Test apparatus Provided is a test apparatus that tests a device under test, including a power supply that generates supply power supplied to the device under test; a transmission path that transmits the supply power generated by the power supply to the device under test; a high-ca... | 05/31/2011 |
| 7948243 | Testable integrated circuit, system in package and test instruction set An integrated circuit die includes first and second test data inputs, a test data output, and a test arrangement for testing the integrated circuit die. The test arrangement includes a multiplexer coupled to the first and second test data inputs, a further multiplex... | 05/24/2011 |
| 7948242 | Integrated circuit and integrated circuit package An integrated circuit includes a monitoring-target circuit portion 1200 and a debugging circuit portion 1100. The debugging circuit portion 1100 acquires a signal on a signal line of the monitoring-target circuit portion 1200 and transmit... | 05/24/2011 |
| 7940057 | Method of detecting disconnection and power discontinuity of I/O unit connected to numerical controller A power discontinuity occurring in any one of a plurality of I/O units connected to a numerical controller is detected. When the power discontinuity occurs in any one of the I/O units, the I/O unit detects the power discontinuity, and transmits the detection of the ... | 05/10/2011 |
| 7940071 | Semiconductor device and a method of testing the same A semiconductor device is provided. The semiconductor devices includes a first and second differential pair to which first and second differential input signals are input. The first and second differential pairs are connected to N (N is an integer greater than 1) cu... | 05/10/2011 |
