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| Number | Title | Issue Date |
| 7795877 | Power line communication and power distribution parameter measurement system and method A power line communication device is provided that in one embodiment includes a parameter sensor device configured to measure a parameter of a power line, a modem configured to transmit parameter data over a power line, and a controller communicatively coupled to th... | 09/14/2010 |
| 7528612 | System and method for monitoring a motor control center A system, in one embodiment, includes a power distribution center having an enclosure with an access door configured to move between a closed position and an open position. The power distribution center includes a non-contact sensor disposed inside the enclosure, wh... | 05/05/2009 |
| 7432717 | Repair device for decorative light shunt A repair device for fixing a malfunctioning shunt across a failed filament in a light bulb in a group of series-connected miniature decorative bulbs includes a high-voltage pulse generator producing one or more pulses of a magnitude greater than the standard AC powe... | 10/07/2008 |
| 7327148 | Method for using internal semiconductor junctions to aid in non-contact testing Capacitive leadframe testing techniques are improved through knowledge of characteristics of semiconductor junctions specific to nodes of device under test (DUT) that are connected to nodes under test of the DUT. ... | 02/05/2008 |
| 7319334 | Apparatus and method of inspecting breakdown of conducting wire A breakdown inspection apparatus for a wire includes a power supply applying a voltage to the wire and an electric field sensor detecting an electric field generated around the wire by the applied voltage so as for a user to determine according to variation of the e... | 01/15/2008 |
| 7315169 | Microprocessor controlled fault indicator having inrush restraint circuit A fault indicator for indicating the occurrence of a fault in an electrical conductor has a housing, a high capacity battery, at least one light emitting diode (LED) visible from the exterior of the fault indicator upon the occurrence of a fault and which may be aut... | 01/01/2008 |
| 7294996 | Characteristic evaluating system and characteristic evaluating method The characteristic evaluating system of the present invention includes: a cable-driving transmitter transmitting a signal to one end of a cable to be measured; a load connected to the other end of the cable; a probe detecting a common mode current of the cable; a re... | 11/13/2007 |
| 7283806 | Wireless sensing system and method An apparatus and method is provided for sensing data relating to a structure (14), including an inspection site sensor system having at least one microprocessor (16) coupled to the structure. At least one sensor (12) for sensing data is connecte... | 10/16/2007 |
| 7276911 | Detection of malfunctioning bulbs in decorative light strings A system for locating a malfunctioning bulb in a decorative light string uses an antenna that produces an output signal corresponding to the strength of the electric field produced by a portion of the light string near the antenna. An amplifier is coupled to the ant... | 10/02/2007 |
| 7242198 | Method for using internal semiconductor junctions to aid in non-contact testing Capacitive leadframe testing techniques are improved through knowledge of characteristics of semiconductor junctions specific to nodes of device under test (DUT) that are connected to nodes under test of the DUT. ... | 07/10/2007 |
| 7239127 | Apparatus and method for inspecting electronic circuits The present invention provides an apparatus and a method for used in a board inspection capable of an inspection of defect in a circuit board with high resolution over a wide range. The method is used for manufacturing a sensor probe comprising layers which include ... | 07/03/2007 |
| 7230411 | Voltage sensing apparatus for medium-voltage electrical power distribution systems A molded voltage sensor is provided that achieves excellent sensing accuracy over a wide temperature range by molding promary and secondary capacitances are of a voltage divider into a solid dielectric material and wherein th e capacitances are preferably fabricated... | 06/12/2007 |
| 7129729 | Socket connection test modules and methods of using the same Test modules, systems, and methods employing capacitors for the testing of the solder joint connections between a printed circuit board (PCB) and a socket of a device are presented in embodiments of the current invention. A test module having capacitors in parallel,... | 10/31/2006 |
| 7081908 | Apparatus and method for testing electrode structure for thin display device using FET function In a method of testing an electrode structure in which a plurality of electrodes are arranged in a matrix, a test unit is positioned at a position of a target one of the plurality of electrodes apart from the target electrode by a preset distance. The test unit has ... | 07/25/2006 |
| 7075307 | Method and apparatus for detecting shorts on inaccessible pins using capacitive measurements The present invention is a method an apparatus for diagnosing short defects on inaccessible or non-contacted nodes of an integrated circuit device using capacitive coupling techniques. In accordance with the invention, an alternating current (AC) signal generator is... | 07/11/2006 |
| 7068039 | Test structure embedded in a shipping and handling cover for integrated circuit sockets and method for testing integrated circuit sockets and circuit assemblies utilizing same A device for enabling testing of electrical paths through a circuit assembly is presented. The device may include a test facilitating shipping and handling cover for a socket of the circuit assembly. The test facilitating shipping and handling cover may have a condu... | 06/27/2006 |
| 7061250 | Capacitive sensor measurement method for discrete time sampled system for in-circuit test Disclosed is a novel method and apparatus for acquiring multiple capacitively sensed measurements from a circuit under test. Multiple digital sources are respectively connected to stimulate multiple respective first ends of multiple respective nets of interest. Resp... | 06/13/2006 |
| 7062427 | Batch editor for netlists described in a hardware description language A system and method are disclosed for editing netlists described in a hardware description language (HDL). In one embodiment, a netlist is provided and a changes module is provided. The changes module contains a set of changes associated with the netlist. A tool, su... | 06/13/2006 |
| 7057395 | Method for diagnosing open defects on non-contacted nodes of an electronic device from measurements of capacitively coupled nodes A method and apparatus for diagnosing open defects on non-contacted nodes of an electrical device is presented. Actual and expected signal measurements are collected for various contacted nodes of the electrical device. Nodes whose actual measurements are out of ran... | 06/06/2006 |
| 7049826 | Inspection device and inspection method The present invention discloses a technique for inspecting a branched circuit wiring having branch portions branched halfway therefrom by using a less number of non-contact sensors. An inspection method for inspecting a branched circuit wiring having three or more e... | 05/23/2006 |
| 7005863 | Monitoring system The invention relates to a device for monitoring a surge arrester connected to a power network, comprising a registering unit (1) and means (63, 66) for attachment of the registering unit to the surge arrester. The registering unit comprises a groundin... | 02/28/2006 |
| 6975312 | Computer system having network connector and method of checking connection state of network cable therefor A computer system having a network connector to which a network cable is connected, including a displaying part displaying a connection state of the network cable; a signal processing part processing a signal inputted through the network connector; and a control par... | 12/13/2005 |
| 6960917 | Methods and apparatus for diagnosing defect locations in electrical paths of connectors of circuit assemblies In a method for testing continuity of electrical paths through a connector, pairs of contacts of the connector are coupled via a first plurality of passive circuit components. The contacts are also coupled to a test sensor port via a second plurality of passive circ... | 11/01/2005 |
| 6958619 | Inspecting apparatus and inspecting method for circuit board The present invention provides an apparatus and method for inspecting a circuit board at a high speed. A PDP driver module 100 as an object to be inspected has an onboard PDP driving LSI 110. A plurality of circuit wirings 111 are connected to t... | 10/25/2005 |
| 6937029 | Method for detection of a shielding fault in a multiwire cable This invention relates to a method for detection of a shielding fault in a multiwire cable forming part of a communication network, during functional operation of the said network, the said cable (10) transferring a multiframe signal S(t), which comprises the... | 08/30/2005 |
| 6933730 | Methods and apparatus for testing continuity of electrical paths through connectors of circuit assemblies A device for testing continuity of electrical paths through a connector of a circuit assembly has a package containing incomplete or no mission circuitry for the circuit assembly. The package is provided with a plurality of contacts for mating to a plurality of cont... | 08/23/2005 |
| 6882157 | Method and device for diagnosing trouble with sensor function A sensor for converting a physical quantity into an electric signal and issuing the output is driven by a drive circuit which is driven by a drive signal issued from a 1-chip microcomputer. The 1-chip microcomputer judges fault of sensor function when the sensor out... | 04/19/2005 |
| 6828770 | Apparatus and method for electrical measurements on conductors A method for measuring at least one characteristic parameter of an alternating current in a conductor, the method including the steps of measuring the magnetic field around the conductor at a point along the conductor; deriving an analogue voltage signal representat... | 12/07/2004 |
| 6777953 | Parallel arc fault diagnostic for aircraft wiring A system for locating parallel arcing faults in a set of wires is described. The system includes three devices that can be used in combination or alone. A first device applies a current to a wire while grounding the remaining wires of the set of wires so as to cause... | 08/17/2004 |
| 6759850 | System and method for non-contact electrical testing employing a CAM derived reference A system and method for electrically testing electrical circuits in which electromagnetic values that are to be sensed by an array of sensors are forecast or simulated, for use as a reference, by calculation using computer files corresponding to a board under test a... | 07/06/2004 |
| 6741081 | Cable fault detector The present invention is a apparatus and method for accurately finding a location of a fault in a fiber cable where a cable locating current is leaking to ground. The system includes a sensor body, voltage probes mounted in the body to face the cable, a reference vo... | 05/25/2004 |
| 6603302 | Circuit testers A circuit tester (1) for testing circuit integrity in a series-wired string of Christmas fairy lights powered by domestic mains electricity. The tester comprises or includes a housing; a probe including a pair of matching current sensors (1,2) protruding ... | 08/05/2003 |
| 6559658 | Noise resistant electronic presence sensor An electromagnetic field presence sensor independently evaluates the presence or absence of an object in a variety of frequency ranges. Conflicting indications of the presence of the object in these different ranges, such as may be caused by electromagnet... | 05/06/2003 |
| 6545484 | Board inspection apparatus and board inspection method An apparatus and method capable of effective board inspection. In the board inspection apparatus wherein a pulse signal is applied to one edge of a pattern line on a board, a non-contact probe receives a signal at another edge of the pattern line, and a c... | 04/08/2003 |
| 6531878 | Direct current voltage detection stick The receiver has a casing member and a tip is removably attached to the casing member. A transmitter is connected to a battery and the transmitter produces a transmitter signal by periodically connecting a resistance to the battery. Preferably, the transm... | 03/11/2003 |
| 6316949 | Apparatus and method for testing electric conductivity of circuit path ways on circuit board A testing apparatus and method for testing conductivity of electric pathways formed on a substrate, each pathway including a first wiring and a second wiring partially overlapping each other. The apparatus includes a first electric signal applier for appl... | 11/13/2001 |
| 6285181 | Method and system for determining the location of an open circuit in a semiconductor device using power modulation A system and method for detecting a location of an open circuit is disclosed. The open circuit is in a circuit of semiconductor device. The semiconductor device has a surface. The method and system include supplying alternating power to the semiconductor ... | 09/04/2001 |
| 6242925 | EMI susceptibility testing apparatus and method Non-destructive EMI susceptibility testing involves near-field injection of very high levels of instantaneous energy and low average power through localized injection of signals of very high field strength and low duty cycle. An electric field injector an... | 06/05/2001 |
| 5995588 | Tone location device for locating faults in a paired line A device and method are provided for locating faults in a paired line. The fault locating device has a transmitting unit connectable to the conductors of a paired line containing the fault. The device also has a portable receiving unit to track the path o... | 11/30/1999 |
| 5578930 | Manufacturing defect analyzer with improved fault coverage A manufacturing defect analyzer for printed circuit boards which can detect open circuit faults between leads of components and the printed circuit board. The manufacturing defect analyzer can operate in an inductive coupling mode or a capacitive coupling... | 11/26/1996 |
