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| Number | Title | Issue Date |
| 7902831 | Methods of performing electrostatic discharge testing on a payment card Methods of performing electrostatic discharge testing on a transaction card are disclosed. A transaction card may be placed on an insulated surface. A grounding probe may be placed at a first location on the transaction card. A discharge probe may be charged to a kn... | 03/08/2011 |
| 7420106 | Scanning probe characterization of surfaces Characterizing dielectric surfaces by detecting electron tunneling. An apparatus includes an atomic force probe. A mechanical actuator is connected to the atomic force probe. A mechanical modulator is connected to the mechanical actuator. The mechanical modulator mo... | 09/02/2008 |
| 7397266 | System and method for testing the electromagnetic susceptibility of an electronic display unit A system and method for testing the electromagnetic (EM) susceptibility of an electronic display unit monitors the light emitted from the electronic display unit as EM noise is applied at a particular testing location of the electronic display unit. An error in the ... | 07/08/2008 |
| 7340360 | Method for determining projected lifetime of semiconductor devices with analytical extension of stress voltage window by scaling of oxide thickness A method for efficiently and accurately measuring a maximum Vcc calculation or failure rate and lifetime projection for microprocessors and other semiconductor products analytically scales low voltages applied to thinner oxides to thicker oxides. The expa... | 03/04/2008 |
| 7271593 | Contactless system and method for detecting defective points on a chargeable surface A method for detecting charge defect spots (CDSs) on a chargeable surface is provided, including charging the chargeable surface to receive and hold a first voltage charge, spacing a surface of a scanner probe a distance from the chargeable surface, the scanner prob... | 09/18/2007 |
| 7253637 | Arc fault circuit interrupter system In order to determine whether arcing is present in an electrical circuit, a sensor signal corresponding to current in said electrical circuit is processed. The sensor signal is filtered to determine the presence of noise in a predetermined frequency range and produc... | 08/07/2007 |
| 7248055 | Electrostatic discharge transient and frequency spectrum measurement of gap discharge An electrostatic discharge testing system includes a measurement chamber to hold a discharge electrode and a target electrode in separation from each other, a first conductive path to supply an ESD pulse to the discharge electrode, and a second conductive path to re... | 07/24/2007 |
| 7239148 | Method and device for measuring surface potential distribution In a surface potential distribution measurement method and device, a sample having a surface with a surface potential distribution is scanned using a charged particle beam in a two-dimensional manner. A detection signal caused by the two-dimensional scanning is obta... | 07/03/2007 |
| 7205783 | Semiconductor integrated circuit, and electrostatic withstand voltage test method and apparatus therefor An electrostatic withstand voltage test method that enables semiconductor integrated circuit testing to be performed with a high degree of precision and at low cost. In this method, with one of ground pins VSS and VSSI of a semiconductor integrated circuit 100 | 04/17/2007 |
| 7161873 | Method of detecting and locating a source of partial discharge in an electrical apparatus A method of detecting and localizing a source of partial discharge in an electrical apparatus placed in an enclosure containing an acoustically-conductive fluid. The method consists in: positioning (31) acoustic detectors an... | 01/09/2007 |
| 7151656 | Arc fault circuit interrupter system A system for determining whether arcing is present in an electrical circuit in response to a sensor signal corresponding to current in the circuit includes a circuit for analyzing the sensor signal to determine the presence of broadband noise in a predetermined rang... | 12/19/2006 |
| 7138804 | Automatic transmission line pulse system A system for measuring electrostatic discharge (ESD) characteristics of a semiconductor device that comprises at least one pulse generator generating ESD-scale pulses, a first point of the semiconductor device receiving a first ESD-scale pulse from the at least one ... | 11/21/2006 |
| 7136265 | Load recognition and series arc detection using bandpass filter signatures A method and system for determining whether arcing is present in an electrical circuit includes sensing a change in an alternating current in the circuit and developing a corresponding input signal, analyzing the input signal to determine the presence of broadband n... | 11/14/2006 |
| 7121721 | Apparatus and method for measuring operating temperatures of an electrical component An apparatus and a method for measuring operating temperatures Tj of a component, particularly transient temperatures Tj in the breakdown region of the component 2 during a breakdown operation, are provided. The component temperature T | 10/17/2006 |
| 7119597 | Methods and apparatus to produce a voltage pulse A test circuit employs use of first and second switches to operably charge a capacitor to over 500 volts and, thereafter, discharge energy stored in the capacitor to test an over-voltage protection circuit associated with a pin of a semiconductor device. When switch... | 10/10/2006 |
| 7098644 | Non-contact high-voltage electrometer architecture with low-voltage feedback A voltmeter measures an unknown voltage on a target surface using multiple sampling stages or a parallel reference capacitor. A movable shutter may alternately be closed during resetting of a voltage measuring circuit and opened so as to expose a detector plate to t... | 08/29/2006 |
| 7068480 | Arc detection using load recognition, harmonic content and broadband noise A method of determining whether arcing is present in an electrical circuit includes sensing a change in current in the circuit and developing a corresponding input signal, analyzing the input signal to determine the presence of broadband noise in a predetermined ran... | 06/27/2006 |
| 7053625 | Method and apparatus for detecting wear in components of high voltage electrical equipment A tracer material is embedded in a component of electrical equipment to detect excessive wear of the component when it is exposed to an electrical arc. As the component wears, the tracer material becomes exposed to the electrical arc and emits electromagnetic radiat... | 05/30/2006 |
| 7038464 | Carrier line oriented spin high voltage leak detection system and method Inspection and leak detection of electrically insulated containers having an electrically conductive solution therein in high speed assembly carrier line systems, includes controlled carrier structure and methods for carrying, conveying, orientating, and spinning th... | 05/02/2006 |
| 7023564 | Sensor device for burr examination In order to provide a burr examination sensor device for the examination of burrs on a workpiece which can be used universally it is suggested that this comprise at least one distance sensor with a detector head, wherein the detector head can be positioned at a dist... | 04/04/2006 |
| 7019545 | Method for monitoring quality of an insulation layer The present invention utilizes wafer acceptance testing equipment to fast monitor the quality of an insulation layer. A plurality of swing time-dependent DC ramping voltages are applied to one of the electrode plates in a capacitor and each corresponding leakage cur... | 03/28/2006 |
| 7005858 | System and method for decreasing ESD damage during component level long term testing A method is disclosed for minimizing damage from electrostatic discharge (ESD) during long-term testing of electronic components and assemblies. The method includes conducting a stress-test, during which a protection circuit is engaged, which shields components and ... | 02/28/2006 |
| 6948152 | Data structures for use with environment based data driven automated test engine for GUI applications This invention provides a data driven automated test engine for GUI applications which is environment based. Data structures are used in connection with a scriptable GUI test tool. The tool generates a GUI map, at least one environment definition (parameter) file, a... | 09/20/2005 |
| 6927394 | Fire detector with electronic frequency analysis A process and system for flame detection includes a microprocessor-controlled detector with a first sensor for sensing temporal energy in a first optical frequency range, and a second sensor for sensing temporal energy in a second optical frequency range. The tempor... | 08/09/2005 |
| 6858448 | Method for evaluating and manufacturing a semiconductor device A semiconductor device evaluation method includes the steps of measuring a total injected electron quantity before an insulating film causes a dielectric breakdown and obtaining the ratio between the total injected electron quantity and a total injected electron qua... | 02/22/2005 |
| 6777948 | Method and apparatus for detecting wear in components of high voltage electrical equipment A tracer material is embedded in a component of electrical equipment to detect excessive wear of the component when it is exposed to an electrical arc. As the component wears, the tracer material becomes exposed to the electrical arc and emits electromagnetic radiat... | 08/17/2004 |
| 6650959 | Method and apparatus for the detection of foreign materials in moving textile materials A method and an apparatus for detecting foreign fibers in a moving textile material, in particular in moving threads, yarns or slivers, include providing a probe for picking up triboelectric signals from the moving textile material and comparing the outpu... | 11/18/2003 |
| 6614234 | Electric discharge machine An electric discharge machine for machining a workpiece by an electric discharge by supplying a machining fluid to a gap between an electrode and the workpiece and supplying pulses to the workpiece while providing the electrode with a jump motion, the jum... | 09/02/2003 |
| 6528985 | Non-destructive testing of passive components A device and a method for the non-destructive testing of passive components by applying an electrical test signal to passive components and an acoustic emission is measured by a microphone and, the measured signal is applied to an evaluation unit.... | 03/04/2003 |
| 6507197 | Electrostatic force detector with cantilever for an electrostatic force microscope An electrostatic force microscope wherein electrostatic force applied to the detector is determined through obtaining the field distribution on several different shaped detectors with the calculation of the voltage distribution near the detector with the ... | 01/14/2003 |
| 6469513 | Automated stationary/portable test system for applying a current signal to a dielectric material being tested An automated test system is provided for evaluating characteristics of photoreceptors used in the electrophotographic process. The test system includes a dielectric material support adapted to receive said dielectric material one or more electrodes adapte... | 10/22/2002 |
| 6466032 | Method and apparatus for identification of the disconnection of a protection device The invention relates to a method and apparatus for identification of the disconnection of a current protection device, in particular of a protection device which is connected in series with a semiconductor component and is arranged on a rotating shaft. A... | 10/15/2002 |
| 6385561 | Automatic fault location in cabling systems A method and apparatus (12-20, 32) for automatically locating faults in a network of signal carriers (cables) utilises an interrogation waveform which is pulse-like in form and receives composite reflected signals from the carriers which are a time distri... | 05/07/2002 |
| 6326792 | Method and apparatus for lifetime prediction of dielectric breakdown A stressing voltage is applied to a dielectric film (step S23). An A-SILC is monitored with stressing time and is plotted on a log-log scale (step S24). A straight line is applied to the plotting, a stressing time at which the line crosses a predetermined... | 12/04/2001 |
| 6150824 | Contactless system for detecting subtle surface potential charge patterns A contactless process for detecting electrical patterns on the outer surface of a member comprising providing a member having a charge pattern on an outer surface, repetitively measuring the charge pattern on the outer surface of the member with an electr... | 11/21/2000 |
| 6119536 | Constant distance contactless device A contactless system including an aerodynamically floatable device, a member having an outer surface adjacent to and spaced from the aerodynamically floatable device, a support mechanism adapted to support the aerodynamically floatable device for free mov... | 09/19/2000 |
| 6034530 | Apparatus and method for measuring a movable electric charge induced in a conductive member A measuring apparatus has a capacitor incorporated in a handy measuring tool electrically connected to a voltage meter, and a sharp leading end of the capacitor is brought into contact with a lead of a large scale integrated circuit device for accumulatin... | 03/07/2000 |
| 6008653 | Contactless system for detecting microdefects on electrostatographic members A contactless process for detecting surface potential charge patterns in an electrophotographic imaging member including at least one photoconductive imaging layer having an imaging surface, providing a scanner including a capacitive probe having an outer... | 12/28/1999 |
| 6002259 | Electrostatic adhesion tester for thin film conductors A electrostatic adhesion tester for thin film conductors. In one embodiment, a device is provided for testing the adhesion strength of a thin film conductor that has been formed upon a substrate. The device includes an adhesion tester that is primarily co... | 12/14/1999 |
| 5959447 | Non-contact measurement of electrical waveforms on the surface of a sample using time domain gating A method and an apparatus for providing non-contact measurement of waveforms proximate to a surface of a sample. In one version, the describe apparatus includes a probe waveform generator that generates probe waveforms with the same repetition rate as a s... | 09/28/1999 |
