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Class 324/455 - Corona induced


Subclass of Class 324 - Electricity: measuring and testing
Definition: Subject matter wherein the electrostatic charge is placed
No. of patents: 73
Last issue date: 12/02/2008


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NumberTitleIssue Date
7459913Methods for the determination of film continuity and growth modes in thin dielectric films
A method for determining film continuity and growth modes in thin dielectric films includes: depositing a material on the substrate using a first value of a growth metric; depositing an amount of charge on a surface of the material; repetitively measuring a surface ...
12/02/2008
7324322Static eliminator
A static eliminator generates ions by applying positive and negative high voltages to a discharge electrode of a discharge head. The static eliminator includes a high voltage power supply unit including a high voltage power supply circuit and a high voltage cable fo...
01/29/2008
7271593Contactless system and method for detecting defective points on a chargeable surface
A method for detecting charge defect spots (CDSs) on a chargeable surface is provided, including charging the chargeable surface to receive and hold a first voltage charge, spacing a surface of a scanner probe a distance from the chargeable surface, the scanner prob...
09/18/2007
7270019Collecting line assembly for monitoring and locating leaks
An assembly for monitoring and locating leaks in an installation includes a collecting line formed of a material that is impermeable to a substance to be monitored. The collecting line has a multiplicity of openings spaced apart in its longitudinal direction. The op...
09/18/2007
7196536Method and apparatus for non-contact electrical probe
Methods and apparatus for non-contact electrical probes are described. In accordance with the invention, non-contact electrical probes use negative or positive corona discharge. Non-contact electrical probes are suited for testing of OLED flat panel displays. ...
03/27/2007
7110238Systems and methods for using non-contact voltage sensors and corona discharge guns
A method and a system for calibrating the work function of a non-contact voltage sensor are provided. The method includes preparing a reference sample to have a stable work function, measuring a voltage of the sample using a non-contact voltage sensor, and determini...
09/19/2006
7109046Surface oxide tabulation and photo process control and cost savings
The present invention relates generally to semiconductor processing, and more particularly to methods and systems for reducing costs of wafer production by analyzing key aspects of wafer status to determine whether to initiate corrective measures to salvage a wafer ...
09/19/2006
7103484Non-contact methods for measuring electrical thickness and determining nitrogen content of insulating films
Non-contact methods for determining a parameter of an insulating film are provided. One method includes measuring at least two surface voltages of the insulating film. The surface voltages are measured after different charge depositions. Measuring the surface voltag...
09/05/2006
7088106Device and method for the measurement of gas permeability through membranes
A device for the measuring membrane permeability in electrical/electrochemical/photo-electrochemical fields is provided. The device is a permeation cell and a tube mounted within the cell. An electrode is mounted at one end of the tube. A membrane is mounted within ...
08/08/2006
7053625Method and apparatus for detecting wear in components of high voltage electrical equipment
A tracer material is embedded in a component of electrical equipment to detect excessive wear of the component when it is exposed to an electrical arc. As the component wears, the tracer material becomes exposed to the electrical arc and emits electromagnetic radiat...
05/30/2006
7049532Electric contacts, electric contact apparatus and method for detecting abrasion of the electric contacts
A pair of electric contacts include a pair of first units which are provided on the surfaces of the end sides of the electric contacts, and generate light having first characteristics at the time of opening and closing of the electric contacts, and a pair of second ...
05/23/2006
7023217Method and apparatus for determining wear of resistive and conductive elements
According to one embodiment, the present invention provides a system for determining wear of an electrical element. The system includes a current source, a voltmeter and a control unit. The control unit is operable to couple the current source and the voltmeter to a...
04/04/2006
7012438Methods and systems for determining a property of an insulating film
A method for determining a property of an insulating film is provided. The method may include obtaining a charge density measurement of the film, a surface voltage potential of the film relative to a bulk voltage potential of the substrate, and a rate of voltage dec...
03/14/2006
6915232Film thickness measuring method, relative dielectric constant measuring method, film thickness measuring apparatus, and relative dielectric constant measuring apparatus
A non-contact method of measuring the thickness of an insulator film on a semiconductor substrate includes: (i) charging the insulator film surface in a non-contact manner; (ii) obtaining a first flat band voltage by conducting, prior to the charging processing step...
07/05/2005
6912123Power supply device
An object of the present invention is to provide a power supply device that permits high efficiency and miniaturization, that makes the constitution of a power supply device advantageous from a cost perspective and an assembly work standpoint, and that also allows t...
06/28/2005
6777948Method and apparatus for detecting wear in components of high voltage electrical equipment
A tracer material is embedded in a component of electrical equipment to detect excessive wear of the component when it is exposed to an electrical arc. As the component wears, the tracer material becomes exposed to the electrical arc and emits electromagnetic radiat...
08/17/2004
6680621Steady state method for measuring the thickness and the capacitance of ultra thin dielectric in the presence of substantial leakage current
A method is described for measuring the capacitance and the equivalent oxide thickness of an ultra thin dielectric layer on a silicon substrate in which the dielectric layer is uniform or patterned. The surface of a dielectric layer is electrically charge...
01/20/2004
6670814Semi-insulating material testing and optimization
A test system and data analysis procedure are provided for use in electrophotographic printing with a whole set of characteristics determined to be important for efficiency and high quality images. The test system and data analysis procedure characterize ...
12/30/2003
6633168Method and apparatus for detecting partial discharge in a voltage transformer
A method and apparatus for detecting a partial discharge in a voltage transformer, the transformer having a first voltage winding and a second voltage winding. A grounded electrostatic shield being operably attached to the transformer, preferably between ...
10/14/2003
6603315Measuring probe, measuring instrument and method for determining the physical stability of emulsions and dispersions
A measuring probe for determining the physical stability of emulsions and dispersions, is constructed from a rod comprising a material which is electrically nonconductive at least on the rod surface. The rod carries at least two conductivity-measurement e...
08/05/2003
6593748Process integration of electrical thickness measurement of gate oxide and tunnel oxides by corona discharge technique
The present invention relates to a system for controlling a thin film formation process using a corona discharge measurement technique. The system includes a thin film formation system operative to form a thin film based on one or more process parameters,...
07/15/2003
6522150Corona discharge apparatus
A corona discharge apparatus includes a control unit and a discharge unit. The control unit has a baseboard with a main power source circuit located thereon. A CPU, a memory as well as other elements such as an attachment for a gas supply source are] inst...
02/18/2003
6469513Automated stationary/portable test system for applying a current signal to a dielectric material being tested
An automated test system is provided for evaluating characteristics of photoreceptors used in the electrophotographic process. The test system includes a dielectric material support adapted to receive said dielectric material one or more electrodes adapte...
10/22/2002
6448804Contactless total charge measurement with corona
A method of measuring total charge of an insulating layer on a semiconductor substrate includes applying corona charges to the insulating layer, and measuring a surface photovoltage of the insulating layer after applying each of the corona charges. The ch...
09/10/2002
6433552Floating plate voltage monitor
A floating plate ion monitoring system and method wherein an ion collector assembly comprises an ion conducting surface and shielding surface in spaced relation, the ion conducting surface being located to receive ion impingement thereon, and wherein a po...
08/13/2002
6255128Non-contact method for determining the presence of a contaminant in a semiconductor device
The present invention provides a non-contact method for determining whether a contaminant is present in a semiconductor wafer having a substrate/dielectric interface formed thereon. in one advantageous embodiment, the method comprises field inducing a jun...
07/03/2001
6181139Method and apparatus for testing the insulating ability of an insulation on an electric conductor
A method and an apparatus for touch-free testing of the insulating ability of an electric insulation on an electric conductor, where the testing item (8), the conductor, continuously is moved between a system of testing electrodes (2, 4), where the electr...
01/30/2001
6133740Chlorine specific gas chromatographic detector
A method and apparatus are set forth which enables a gas chromatographic column output to be connected with a pulse discharge chamber in which chemically bound chlorine in volatile organic or inorganic samples is measured. A spark discharge is formed in t...
10/17/2000
6011404System and method for determining near--surface lifetimes and the tunneling field of a dielectric in a semiconductor
The present invention is directed to a system for, and method of, determining a non-contact, near-surface generation and recombination lifetimes and near surface doping of a semiconductor material. The system includes: (1) a radiation pulse source that bi...
01/04/2000
5963041Device and method for testing surgical instruments
A testing device for detecting defects in insulation of electrosurgical instruments that includes an implement or wand having a distal end, an electrode for generating a spark adapted to detect a defect in the insulation, and mounting means for removably ...
10/05/1999
5923130Repetitive and constant energy impulse current generator
This invention relates to an impulse generator which utilizes the properties of floating electrodes. An exemplary impulse generator comprises a floating electrode with a corona source, a series gap, an output terminal for connecting to a device undergoing...
07/13/1999
5834941Mobile charge measurement using corona charge and ultraviolet light
Corona charge is applied to an oxide layer on a semiconductor wafer. Then ultraviolet light is used to erase a grid pattern of the corona charge. Opposite polarity corona charge is then applied to the layer, resulting in a grid of field-induced PN junctio...
11/10/1998
5804972Partial-discharge measuring device
A partial-discharge measuring device (3) which detects partial discharges in a gas-insulated, metal-enclosed, high-voltage system. The device includes an annular-gap antenna (6) arranged on the inner surface of the metal enclosure (1), a coaxial measuring...
09/08/1998
5644223Uniform density charge deposit source
A method for measuring the thickness of very thin oxide layers on a silicon substrate. A corona discharge source repetitively deposits a calibrated fixed charge density on the surface of the oxide. The resultant change in oxide surface potential for each ...
07/01/1997
5598099System and method for coincidence detection of ungrounded parts with detectors located within and outside a production coating area
A system and method for coincidence detection of ungrounded or inadequately grounded parts during the electrostatic coating process in order to improve production flow, provide an overall cost saving by efficient use of the coating material and prevention...
01/28/1997
5594346Apparatus and methods for identifying and quantifying compounds using a plurality of pulsed rare gas photoionization detectors
A pulsed discharge photoinoization detector is set forth which comprises a plurality of closed chambers for receiving different types of carrier gas flowing there through between inlets and outlets. The carrier gases are exposed to a pair of electrodes fo...
01/14/1997
5541519Photoionization detector incorporating a dopant and carrier gas flow
A pulsed rare gas photoionization detector apparatus is set forth and incorporates a closed chamber for receiving a carrier gas flowing there through between inlets and outlets, and the carrier gas is exposed to a pair of electrodes forming a spark across...
07/30/1996
5532599High voltage spark excitation and ionization system including disc detector
A circular chamber is disclosed. Helium is introduced into the chamber to swirl in a circle to flow past a pair of spaced electrodes forming a spark in the helium. The chamber enables a sample detected by interaction with spark initiated ionization....
07/02/1996
5528150Gas sampling apparatus including a sealed chamber cooperative with a separate detector chamber
An isolated detector for gas is set forth and incorporates a closed source chamber in cooperation with a sample chamber through which sample gas flows. Gas within the source chamber comprises Krypton which is excited to a metastable state by a pulsed, hig...
06/18/1996
5485091Contactless electrical thin oxide measurements
A method for measuring the thickness of very thin oxide layers on a silicon substrate. A corona discharge source repetitively deposits a calibrated fixed charge density on the surface of the oxide. The resultant change in oxide surface potential for each ...
01/16/1996
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