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Class 257/E29.343 - Conductor-insulator-conductor capacitor on semiconductor substrate (EPO)


Subclass of Class 257 - Active solid-state devices (e.g., transistors, solid-state diodes)
Definition: This subclass is indented under subclass E29.342. This subclass
No. of patents: 190
Last issue date: 10/07/2008


1          
NumberTitleIssue Date
7432528TFD LCD panel
Active devices in a thin film diode (TFD) liquid crystal display (LCD) panel used to control liquid crystal are formed by a metal layer, a transparent conductive layer, and an insulating layer sequentially on a substrate, wherein the metal layer is used as transmitt...
10/07/2008
7432548Silicon lanthanide oxynitride films
Electronic apparatus and methods of forming the electronic apparatus include a silicon lanthanide oxynitride film on a substrate for use in a variety of electronic systems. The silicon lanthanide oxynitride film may be arranged as a layered structure having one or m...
10/07/2008
7329939Metal-insulator-metal capacitor and method of fabricating same
A metal-insulator-metal (MIM) capacitor including a metal layer, an insulating layer formed on the metal layer, at least a first opening and at least a second opening formed in the first insultaing layer, a dielectric layer formed in the first opening, a conductive ...
02/12/2008
7279392Thin film structure, capacitor, and methods for forming the same
A thin film structure and a capacitor using the film structure and methods for forming the same. The thin film structure may include a first film formed on a substrate using a first reactant and an oxidant for oxidizing the first reactant. A second film may be forme...
10/09/2007
7276776Semiconductor device
A semiconductor device includes a semiconductor substrate including a main surface; a plurality of first interconnections formed in a capacitance forming region defined on the main surface and extending in a predetermined direction; a plurality of second interconnec...
10/02/2007
7253463Semiconductor memory device and method of manufacturing the same
A semiconductor memory device includes a semi-conductor substrate, a MOS transistor formed on the semiconductor substrate and including a pair of impurity regions as a source and a drain, and a gate electrode, a first conductive plug formed in contact with an upper ...
08/07/2007
7244999Capacitor applicable to a device requiring large capacitance
A capacitor includes a first electrode and a second electrode arranged so that a main surface of the first electrode opposes a main surface of the second electrode, a first pseudo electrode layer disposed on the main surface of the first electrode, and a dielectric ...
07/17/2007
7230292Stud electrode and process for making same
A process of making a stud capacitor structure is disclosed. The process includes embedding the stud in a dielectric stack. In one embodiment, the process includes forming an electrically conductive seed film in a contact corridor of the dielectric stack. A storage ...
06/12/2007
7209340Semiconductor device and MIM capacitor
An MIM capacitor comprises first and second conductor patterns embedded in a first interlayer insulation film so as to extend continuously in a mutually opposing relationship and forming a part of a comb-shaped capacitor pattern, and third and fourth conductor patte...
04/24/2007
7164188Buried conductor patterns formed by surface transformation of empty spaces in solid state materials
A plurality of buried conductors and/or buried plate patterns formed within a monocrystalline substrate is disclosed. A plurality of empty-spaced buried patterns are formed by drilling holes in the monocrystalline substrate and annealing the monocrystalline substrat...
01/16/2007
7145198Compositions for thin-film capacitance device, high-dielectric constant insulating film, thin-film capacitance device, and thin-film multilayer capacitor
A thin-film capacitor(2) in which a lower electrode(6), a dielectric thin-film(8), and an upper electrode(10) are formed in order on a substrate(4). The dielectric thin-film(8) is made of a composition for thin-film capacita...
12/05/2006
7126809Semiconductor device and MIM capacitor
An MIM capacitor comprises first and second conductor patterns embedded in a first interlayer insulation film so as to extend continuously in a mutually opposing relationship and forming a part of a comb-shaped capacitor pattern, and third and fourth conductor patte...
10/24/2006
6590246Structures and methods for improved capacitor cells in integrated circuits
Systems, devices, structures, and methods are described that inhibit atomic migration that creates an open contact between a metallization layer and a conductive layer of a semiconductor structure. A layer of an inhibiting substance may be used to inhibit...
07/08/2003
6544832Method of fabricating a stack capacitor DRAM
A DRAM capacitor contact comprised of a silicon oxide layer with a trench having sidewalls and a form in the silicon oxide layer. A dielectric liner is coated on the sidewalls of the trench. A metal layer is then deposited between the sidewalls and polish...
04/08/2003
6461982Methods for forming a dielectric film
A method of forming a high dielectric oxide film includes forming a high dielectric oxide film on a surface. The high dielectric oxide film has a dielectric constant greater than about 4 and includes a plurality of oxygen vacancies present during the form...
10/08/2002
6410370Capacitor for a semiconductor device
A semiconductor device comprises a substrate such as a semiconductor wafer having a major surface, a first conductive layer formed over the major surface, and a second conductive layer formed over the first conductive layer with the first and second condu...
06/25/2002
6400552Capacitor with conductively doped Si-Ge alloy electrode
Capacitors and methods of forming capacitors are disclosed. In one implementation, a capacitor includes a capacitor dielectric layer including Ta2 O5 formed over a first capacitor electrode. A second capacitor electrode is formed ove...
06/04/2002
6376304Semiconductor memory device and a method for fabricating the same
A semiconductor memory device and a method of fabricating the same are provided, in which an interlayer film which only covers a peripheral circuit region except a memory cell array is formed above the peripheral circuit region to reduce a topological dif...
04/23/2002
6348705Low temperature process for high density thin film integrated capacitors and amorphously frustrated ferroelectric materials therefor
A fully amorphous thin film material that is related to ferroelectric compositions which is grown at low temperature, e.g., below 400° C., to yield a material with voltage independent capacitance, capacitance density of from about 1000 to about 10000 nF/...
02/19/2002
6337216Methods of forming ferroelectric memory cells
A method of fabricating A ferroelectric memory cell composed of an MOS transistor and A ferroelectric capacitor formed over A semiconductor substrate, comprises the steps of forming A contact hole through an insulating layer to form A contact plug to elec...
01/08/2002
6325017Apparatus for forming a high dielectric film
An apparatus for forming a high dielectric oxide film includes a controllable atomic oxygen source and a vaporized precursor source. A deposition chamber for receiving the atomic oxygen from the atomic oxygen source and vaporized precursor from the vapori...
12/04/2001
6326316Method of manufacturing semiconductor devices
Disclosed is a semiconductor device, comprising a semiconductor substrate, a cell transistor formed in the semiconductor substrate, an interlayer dielectric film in which is formed a contact hole communicating with a part of the cell transistor, a contact...
12/04/2001
6323512Nonvolatile ferroelectric capacitor and nonvolatile ferroelectric memory
A nonvolatile ferroelectric capacitor comprising Bi4-x Ax Ti3 O12 thin film which is obtained by substituting at least some atoms of nonvolatile element A such as La for volatile Bi atoms in Bi4 Ti
11/27/2001
6323057Method of producing a thin-film capacitor
A thin-film capacitor having a perovskite-structured polycrystalline oxide thin-film as its dielectric, that exhibits an excellent insulation property is provided. This capacitor comprises a perovskite-structured, polycrystalline oxide thin-film, and top ...
11/27/2001
6287934Capacitor structure of semiconductor memory cell and method for fabricating capacitor structure of semiconductor cell
A capacitor structure in a semiconductor memory cell includes a lower electrode formed on a base body, a capacitor insulation film which is a ferroelectric thin film formed on the lower electrode, and an upper electrode formed on the capacitor insulation ...
09/11/2001
6281023Completely encapsulated top electrode of a ferroelectric capacitor using a lead-enhanced encapsulation layer
A ferroelectric capacitor includes a bottom electrode, a top electrode, and a ferroelectric layer located between the top and bottom electrodes that extends to completely encapsulate the top electrode, except for a contact hole to allow metalization of th...
08/28/2001
6265755Semiconductor integrated circuit comprising MIS capacitors
A semiconductor integrated circuit having an MIS (metal-insulator silicon) capacitor. A first capacitor and a second capacitor are connected in series between a substrate terminal and the MIS capacitor. A power supply is connected between the first and se...
07/24/2001
6262450DRAM stack capacitor with vias and conductive connection extending from above conductive lines to the substrate
A DRAM capacitor contact comprised of a silicon oxide layer with a trench having sidewalls and a form in the silicon oxide layer. A dielectric liner is coated on the sidewalls of the trench. A metal layer is then deposited between the sidewalls and polish...
07/17/2001
6259149Fully isolated thin-film trench capacitor
A process for forming an isolated thin-film trench capacitor includes forming a first trench in a substrate and filling it with an electrically insulating material. A trench capacitor is formed in the first trench by forming first and second pluralities o...
07/10/2001
6246085Semiconductor device having a through-hole of a two-level structure
A semiconductor memory device comprises a bottom electrode of a capacitor connected to a source region of a semiconductor substrate through a contact plug formed in a portion of a through-hole. The remaining portion of the through-hole has a side-wall fil...
06/12/2001
6225658Semiconductor device manufacture method and semiconductor device comprising capacitor and MISFET
A gate insulating film is formed on the surface of active regions of a semiconductor substrate, and a first polysilicon film is deposited on the semiconductor substrate. Impurities are selectively doped into the first silicon film in an area where a capac...
05/01/2001
6222245High capacity capacitor and corresponding manufacturing process
The invention relates to a high-capacitance capacitor which is monolithically integratable on a semiconductor substrate doped with a first type of dopant and accommodating a diffusion well which is doped with a second type of dopant and has a first active...
04/24/2001
6218723Integrated capacitor with high voltage linearity and low series resistance
A capacitor integrated on a silicon substrate includes a first electrode made of highly doped polysilicon, a thin silicon oxide layer, a second electrode made of polysilicon and a silicide layer covering the second electrode. The second electrode has a hi...
04/17/2001
6211005Methods of fabricating integrated circuit ferroelectric memory devices including a material layer on the upper electrodes of the ferroelectric capacitors thereof
Integrated circuit ferroelectric memory devices include an integrated circuit substrate which includes a cell region and a periphery region. A plurality of ferroelectric memory cells are formed in the cell region, including a plurality of ferroelectric ca...
04/03/2001
6211542Completely encapsulated top electrode of a ferroelectric capacitor using a lead-enhanced escapsulation layer
A ferroelectric capacitor includes a bottom electrode, a top electrode, and a ferroelectric layer located between the top and bottom electrodes that extends to completely encapsulate the top electrode, except for a contact hole to allow metalization of th...
04/03/2001
6191443Capacitors, methods of forming capacitors, and DRAM memory cells
Capacitors and methods of forming capacitors are disclosed. In one implementation, a capacitor comprises a capacitor dielectric layer comprising Ta2 O5 formed over a first capacitor electrode. A second capacitor electrode is formed o...
02/20/2001
6184550Ternary nitride-carbide barrier layers
A microelectronic structure including adjacent material layers susceptible of adverse interaction in contact with one another, and a barrier layer interposed between said adjacent material layers, wherein said barrier layer comprises a binary, ternary or ...
02/06/2001
6150184Method of fabricating partially or completely encapsulated top electrode of a ferroelectric capacitor
A ferroelectric capacitor includes a bottom electrode, a top electrode, an a ferroelectric layer located between the top and bottom electrodes that extends to completely encapsulate the top electrode, except for a contact hole to allow metalization of the...
11/21/2000
6150684Thin-film capacitor and method of producing same
A thin-film capacitor having a perovskite-structured polycrystalline oxide thin-film as its dielectric, that exhibits an excellent insulation property is provided. This capacitor comprises a perovskite-structured, polycrystalline oxide thin-film, and top ...
11/21/2000
6141204Capacitor constructions and semiconductor processing method of forming capacitor constructions
A capacitor construction includes, i) a dense mass of electrically insulative oxide; ii) an electrically conductive inner capacitor plate overlying and contacting the electrically insulative oxide mass; iii) a capacitor dielectric layer overlying the inne...
10/31/2000
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