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Patent No. 6351867

Body squeegee

A hand wearable body squeegee comprising a glove portion, a concave squeegee band, and a linear squeegee band.

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Class 257/E21.567 - Using bonding technique (EPO)


Subclass of Class 257 - Active solid-state devices (e.g., transistors, solid-state diodes)
Definition: This subclass is indented under subclass E21.561. This subclass
No. of patents: 304
Last issue date: 10/21/2008


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NumberTitleIssue Date
7439159Fusion bonding process and structure for fabricating silicon-on-insulator (SOI) semiconductor devices
A method of fabricating a semiconductor-on-insulator device including: providing a first semiconductor wafer having an about 200 angstrom thick oxide layer thereover; etching the first semiconductor wafer to raise a pattern therein; doping the raised pattern of the ...
10/21/2008
7432204Wafer and the manufacturing and reclaiming methods thereof
A wafer and the manufacturing and reclaiming methods thereof are disclosed. The wafer includes a semiconductor substrate and a protective layer formed on the surface of the semiconductor substrate. The reclaiming method of the wafer includes providing a wafer having...
10/07/2008
7419884Method of bonding two wafers of semiconductor materials
The invention relates to a method of bonding together two wafers made of materials selected from semiconductor materials by providing two wafers each having a surface that is suitable for molecular bonding; and conducting plasma activation of at least one surface of...
09/02/2008
7405466Method of fabricating microelectromechanical system structures
A method of simultaneously bonding components, comprising the following steps. At least first, second and third components are provided and comprise: at least one glass component; and at least one conductive or semiconductive material component. The order of stackin...
07/29/2008
7390724Method and system for lattice space engineering
A system for manufacturing multilayered substrates. The system has a support member is adapted to process a film of material comprising a first side and a second side from a first state to a second state. The support member is attached to the first side of the film ...
06/24/2008
7381630Method for integrating MEMS device and interposer
A method for producing Microelectromechanical Systems (MEMS) and related devices using Silicon-On-Insulator (SOI) wafer includes providing an SOI wafer, performing a mesa etch to at least partially define the MEMS device, bonding the SOI wafer to an interposer by di...
06/03/2008
7381624Technique for forming a substrate having crystalline semiconductor regions of different characteristics located above a crystalline bulk substrate
By direct bonding of two crystalline semiconductor layers of different crystallographic orientation and/or material composition and/or internal strain, bulk-like hybrid substrates may be formed, thereby providing the potential for forming semiconductor devices in ac...
06/03/2008
7375006Peeling method
A peeling method is provided which does not cause damage to a layer to be peeled, and the method enables not only peeling of the layer to be peeled having a small area but also peeling of the entire layer to be peeled having a large area at a high yield. Further, th...
05/20/2008
7375005Method for reclaiming and reusing wafers
Embodiments of the present invention provide a method for reclaiming and reusing a wafer. In one embodiment, a method for reclaiming a wafer comprises providing a used, nonproductive wafer having a semiconductor substrate and a polysilicon layer formed on the semico...
05/20/2008
7361519Method of manufacturing a semiconductor device
A method of manufacturing a semiconductor device, comprises the steps of: forming a first insulating film on a first substrate; forming a second insulating film on the first insulating film; forming an amorphous silicon film on the second insulating film; holding a ...
04/22/2008
7332411Systems and methods for wafer bonding by localized induction heating
A system and method bond wafers using localized induction heating. One or more induction micro-heaters are formed with a first substrate to be bonded. A second substrate is positioned in intimate contact with the induction micro-heaters. An alternating magnetic fiel...
02/19/2008
7323395Manufacture of solid state electronic components
The present invention concerns methodologies for the mass production of solid state components, in particular capacitors, although other component types including, but not limited to, diodes and resistors may be produced. According to one aspect of the method of man...
01/29/2008
7323396Signal and/or ground planes with double buried insulator layers and fabrication process
The present invention describes a method including the steps of providing a single crystal semiconductor substrate, forming a layer of rare earth silicide on a surface of the semiconductor substrate, forming a first layer of insulating material on the layer of rare ...
01/29/2008
7297612Methods for forming strained-semiconductor-on-insulator device structures by use of cleave planes
The benefits of strained semiconductors are combined with silicon-on-insulator approaches to substrate and device fabrication. ...
11/20/2007
7291538Semiconductor memory device and manufacturing method of the same
In this semiconductor memory device, a potential clamping region having no insulation layer formed therein is provided in an insulation layer. More specifically, the potential clamping region is formed under a body portion at a position near a first impurity region,...
11/06/2007
7273797Methods of forming semiconductor-on-insulator constructions
The invention encompasses a method of forming a semiconductor-on-insulator construction. A substrate is provided. The substrate includes a semiconductor-containing layer over an insulative mass. The insulative mass comprises silicon dioxide. A band of material is fo...
09/25/2007
7271075Method and a device for bonding two plate-shaped objects
A method for bonding two plate-shaped objects (5) with an adhesive which is cured by ultraviolet light irradiation and by heating. The two plate-shaped objects (5) with the adhesive in between are transported into a cure chamber (11) comprising ...
09/18/2007
7256104Substrate manufacturing method and substrate processing apparatus
An SOI substrate which has a thick SOI layer is first prepared. Then, the SOI layer is thinned to a target film thickness using as a unit a predetermined thickness not more than that of one lattice. This thinning is performed by repeating a unit thinning step which ...
08/14/2007
7229892Semiconductor device and method of manufacturing the same
A method of manufacturing a semiconductor device, includes preparing a semiconductor substrate, bonding a first semiconductor layer onto a part of the semiconductor substrate with a first insulating layer interposed therebetween, forming a second insulating layer on...
06/12/2007
7214582Semiconductor substrate and semiconductor circuit formed therein and fabrication methods
A semiconductor substrate and a semiconductor circuit formed therein and associated fabrication methods are provided. A multiplicity of depressions with a respective dielectric layer and a capacitor electrode are formed for realizing buried capacitors in a carrier s...
05/08/2007
7183178Method of manufacturing semiconductor wafer
A method of manufacturing a semiconductor wafer wherein a film is formed on a back surface of a starting semiconductor wafer formed with circuits in a front surface thereof. To prevent the semiconductor wafer from warping even when it is worked as very thin as 100 Î...
02/27/2007
7179719System and method for hydrogen exfoliation
A system and method for hydrogen (H) exfoliation are provided for attaching silicon-on-insulator (SOI) fabricated circuits to carrier substrates. The method comprises: providing a SOI substrate, including a silicon (Si) active layer and buried oxide (BOX) layer over...
02/20/2007
7087980Film thickness measuring monitor wafer
The object of the present invention is to provide a wafer having a structure of enabling an SiC wafer to be put to practical use as a wafer for monitoring a film thickness. For this purpose, an average surface roughness Ra of at least one surface of the SiC wafer is...
08/08/2006
7067393Substrate assembly for stressed systems
A substrate-assembly having a mechanical stress absorption system. The assembly includes two substrates, one of which has a mechanical stress absorbing system, such as a plurality of motifs that absorb thermoelastic stresses, to prevent cracking or destruction of th...
06/27/2006
6703688Relaxed silicon germanium platform for high speed CMOS electronics and high speed analog circuits
Structures and methods for fabricating high speed digital, analog, and combined digital/analog systems using planarized relaxed SiGe as the materials platform. The relaxed SiGe allows for a plethora of strained Si layers that possess enhanced electronic p...
03/09/2004
6696325Method of transferring a thin film device onto a plastic sheet and method of forming a flexible liquid crystal display
A method of transferring a thin film device onto a plastic sheet. A silver-containing buffer layer is formed on a glass substrate. A transferred layer including a thin film device is formed on part of the silver-containing buffer layer. At least one first...
02/24/2004
6693342Thin microelectronic substrates and methods of manufacture
A microelectronic substrate and method for manufacture. In one embodiment, the microelectronic substrate includes a body having a first surface, a second surface facing a direction opposite from the first surface, and a plurality of voids in the body betw...
02/17/2004
6686257Method for transferring epitaxy layer
A method for transferring an epitaxy layer is provided. The method includes steps of (a) providing a first substrate, (b) forming a first epitaxy layer on the first substrate, (c) forming a masking layer having at least a pattern on the first epitaxy laye...
02/03/2004
6680260Method of producing a bonded wafer and the bonded wafer
There is provided a method of producing a bonded SOI wafer wherein a silicon single crystal ingot is grown according to Czochralski method, the single crystal ingot is then sliced to produce a silicon single crystal wafer, the silicon single crystal wafer...
01/20/2004
6676748Method for manufacturing semiconductor substrate
An epitaxial layer is formed on a high-resistance semiconductor substrate containing interstitial oxygen at a high concentration, and then a heat treatment is performed to the semiconductor substrate at a high temperature in an oxidizing atmosphere. Accor...
01/13/2004
6677192Method of fabricating a relaxed silicon germanium platform having planarizing for high speed CMOS electronics and high speed analog circuits
Structures and methods for fabricating high speed digital, analog, and combined digital/analog systems using planarized relaxed SiGe as the materials platform. The relaxed SiGe allows for a plethora of strained Si layers that possess enhanced electronic p...
01/13/2004
6670257Method for forming horizontal buried channels or cavities in wafers of monocrystalline semiconductor material
A method of forming buried cavities in a wafer of monocrystalline semiconductor material with at least one cavity formed in a substrate of monocrystalline semiconductor material by timed TMAH etching silicon; covering the cavity with a material inhibiting...
12/30/2003
6670259Inert atom implantation method for SOI gettering
The present invention relates to a method of manufacturing a silicon-on-insulator substrate, comprising the steps of (1) providing a silicon-on-insulator semiconductor wafer having at least one surface of a silicon film; (2) implanting an inert atom into ...
12/30/2003
6656271Method of manufacturing semiconductor wafer method of using and utilizing the same
A process for manufacturing a semiconductor wafer which has superior suitability for mass production and reproducibility. The process comprises the steps of preparing a first member which has a monocrystalline semiconductor layer on a semiconductor substr...
12/02/2003
6656755Method for manufacturing semiconductor device by polishing
When an SOI substrate composed of a support wafer and an element formation wafer that are bonded together with an insulating film interposed therebetween is polished from a surface of the element formation wafer, a thickness of the element formation wafer...
12/02/2003
6653658Semiconductor wafers with integrated heat spreading layer
The invention is directed to semiconductor wafer structures having increased thermal conductivity over conventional semiconductor wafer designs due to the inclusion of an isotopically-enriched material on at least one surface of the wafer substrate. The i...
11/25/2003
6646322Relaxed silicon germanium platform for high speed CMOS electronics and high speed analog circuits
Structures and methods for fabricating high speed digital, analog, and combined digital/analog systems using planarized relaxed SiGe as the materials platform. The relaxed SiGe allows for a plethora of strained Si layers that possess enhanced electronic p...
11/11/2003
6645830Exfoliating method, transferring method of thin film device, and thin film device, thin film integrated circuit device and liquid crystal display device produced by the same
A method for transferring a thin film device on a substrate onto a transfer member, includes a step for forming a separation layer on the substrate, a step for forming a transferred layer including the thin film device on the separation layer, a step for ...
11/11/2003
6638865Manufacturing method of semiconductor chip with adhesive agent
A semiconductor wafer on which elements have been formed is diced and a rear surface of the semiconductor wafer is ground by a dicing before grinding method to form discrete semiconductor chips. The discrete semiconductor chips are adhered to an adhesive ...
10/28/2003
6639327Semiconductor member, semiconductor device and manufacturing methods thereof
In a bonded semiconductor member, microgaps are formed on a substrate side of a bonding interface to thereby constitute a gettering site, and heavy metal elements contaminated in the substrate are captured by the microgaps. The bonded semiconductor member...
10/28/2003
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