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Class 257/E21.012 - With increased surface area, e.g., by roughening, texturing (EPO)


Subclass of Class 257 - Active solid-state devices (e.g., transistors, solid-state diodes)
Definition: This subclass is indented under subclass E21.011. This subclass
No. of patents: 266
Last issue date: 09/23/2008


1              
NumberTitleIssue Date
7427545Trench memory cells with buried isolation collars, and methods of fabricating same
The present invention relates to semiconductor devices, preferably dynamic random access memory (DRAM) cells, each of which contains at least one trench capacitor with a buried isolation collar. The trench capacitor is located in a trench in a semiconductor substrat...
09/23/2008
7408216Device, system, and method for a trench capacitor having micro-roughened semiconductor surfaces
Some embodiments of the invention include a memory cell having a vertical transistor and a trench capacitor. The trench capacitor includes a capacitor plate with a roughened surface for increased surface area. Other embodiments are described and claims. ...
08/05/2008
7405418Memory device electrode with a surface structure
The invention relates to a memory device electrode, in particular for a resistively switching memory device, wherein the surface of the electrode is provided with a structure, in particular comprises one or a plurality of shoulders or projections, respectively. Furt...
07/29/2008
7354823Methods of forming integrated circuit devices having carbon nanotube electrodes therein
An integrated circuit capacitor includes first and second electrodes and at least one dielectric layer extending between the first and second electrodes. The first electrode includes at least one carbon nanotube. The capacitor further includes an electrically conduc...
04/08/2008
7341906Method of manufacturing sidewall spacers on a memory device, and device comprising same
The present invention is generally directed to a method of manufacturing sidewall spacers on a memory device, and a memory device comprising such sidewall spacers. In one illustrative embodiment, the method includes forming sidewall spacers on a memory device compri...
03/11/2008
7322098Method of simultaneous two-disk processing of single-sided magnetic recording disks
Various methods and apparatus for simultaneously processing two single-sided hard memory disks is provided. Disks are positioned in pairs, with one surface of one disk positioned adjacent one surface of the second disk, with the disk surfaces touching or with a slig...
01/29/2008
7276412MIM capacitor of semiconductor device and manufacturing method thereof
In a capacitor of a semiconductor device, a bottom electrode is formed on a substrate and has an uneven top surface. An interlayer insulation layer is formed on the substrate and has a via hole exposing the top surface of the bottom electrode. A dielectric layer is ...
10/02/2007
7253102Methods for forming and integrated circuit structures containing enhanced-surface-area conductive layers
An enhanced-surface-area conductive layer compatible with high-dielectric constant materials is created by forming a film or layer having at least two phases, at least one of which is electrically conductive. The film may be formed in any convenient manner, such as ...
08/07/2007
7247177Production method for electric double-layer capacitor
A method of manufacturing electric double layer capacitors is disclosed. The method assumes a model in which solute is dissolved in solvent before preparing electrolyte, and estimates a withstanding voltage through a simulation. The electrolyte, of which withstandin...
07/24/2007
7112505Method of selectively etching HSG layer in deep trench capacitor fabrication
The invention provides a method of selectively etching a Hemispherical Silicon Grain (HSG) layer during deep trench capacitor fabrication. A substrate having a pad structure and a deep trench is provided. A buried oxide layer is formed on the upper sidewall of the d...
09/26/2006
6690570Highly efficient capacitor structures with enhanced matching properties
The present specification discloses highly efficient capacitor structures. One embodiment of the present invention is referred to herein as a vertical parallel plate (VPP) structure. In accordance with this embodiment, a capacitor structure having a plura...
02/10/2004
6682984Method of making a concave capacitor
The present invention is directed to fabrication of a capacitor formed with a substantially concave shape and having optional folded or convoluted surfaces. The concave shape optimizes surface area within a small volume and thereby enables the capacitor t...
01/27/2004
6670663DRAM cell capacitor and manufacturing method thereof
A method for manufacturing a cell capacitor includes a step of forming an upper electrode and a trench for the lower electrode simultaneously in a single mask step. Further steps for manufacturing a cell capacitor includes forming a storage node contact b...
12/30/2003
6642565Miniaturized capacitor with solid-state dielectric, in particular for integrated semiconductor memories, E.G. DRAMS, and method for fabricating such a capacitor
A dynamic random access memory capacitor and to a method for producing the same are described. A first (bottom) electrode of the capacitor has a grained surface made of tungsten silicide placed on a tungsten silicide layer which is disposed near a surface...
11/04/2003
6617208High capacitance damascene capacitors
The invention describes a high capacitance damascene capacitor. A etch-stop/capacitor dielectric layer 60 is sandwiched between two conductive plates 40 and 75 to form an integrated circuit capacitor. One metal plate 40 is copper formed using a damascene ...
09/09/2003
6600209Mesh capacitor structure in an integrated circuit
A mesh capacitor structure in an integrated circuit can be made up by arranging at least a unit capacitor module in a coupling way, thereby enhancing its total capacitance by coupling capacitance. The unit capacitor module includes a plurality of first co...
07/29/2003
6586329Semiconductor device and a method of manufacturing thereof
A contact hole having an opening diameter smaller than the minimum dimension that can be formed by photolithographic technique is formed. Using an interlayer insulating film 8 formed on a semiconductor substrate as an etching mask, etching is carried out ...
07/01/2003
6583022Methods of forming roughened layers of platinum and methods of forming capacitors
In one aspect, the invention includes a method of forming a roughened layer of platinum, comprising: a) providing a substrate within a reaction chamber; b) flowing an oxidizing gas into the reaction chamber; c) flowing a platinum precursor into the reacti...
06/24/2003
6576947Cylindrical capacitor and method for fabricating same
A method for fabricating a cylindrical capacitor that exceeds photolithographic resolution. The capacitor is formed by partially etching the storage node opening, thereby reducing the distance between adjacent openings defined by the photolithographic pro...
06/10/2003
6573552Method to form hemispherical grained polysilicon
A capacitor with Enhanced capacitance per cell area is provided. A container supported by a substrate is formed, followed by a first layer of undoped substantially amorphous silicon. Next, a layer of heavily doped amorphous silicon is formed on the first ...
06/03/2003
6570210Multilayer pillar array capacitor structure for deep sub-micron CMOS
A capacitor structure, especially for use in deep sub-micron CMOS, having an array of electrically conductive pillars which form the plates of the capacitor. Each of the pillars is formed by electrically conductive lines segments from at least two differe...
05/27/2003
6555432Integrated capacitor bottom electrode for use with conformal dielectric
Disclosed is a capacitor construction for a more uniformly thick capacitor dielectric layer, and a method for fabricating the same. The method has special utility where the bottom electrode comprises composite layers over which the capacitor dielectric de...
04/29/2003
6542351Capacitor structure
In a capacitive structure of an integrated circuit a comb-like configuration or other thin element configuration provides for capacitive coupling between electrode elements in one plane. By forming electrodes in a plurality of planes and selectively shift...
04/01/2003
6541809Method of making straight wall containers and the resultant containers
A method for providing semiconductor openings having a substantially straight wall or other desired etch profile. An etchable material layer is formed having target dopant levels or other etch rate varying characteristics to compensate for the characteris...
04/01/2003
6509245Electronic device with interleaved portions for use in integrated circuits
A capacitor for use in integrated circuits comprises a layer of conductive material. The layer of conductive material including at least a first portion and a second portion, wherein the first portion and the second portion are arranged in a predetermined...
01/21/2003
6507065Doped silicon structure with impression image on opposing roughened surfaces
A silicon structure is formed that includes a free-standing wall having opposing roughen ed inner and outer surfaces using ion implantation and an unplanted silicon etching process which is selective to implanted silicon. In general, the method provides a...
01/14/2003
6482736Methods for forming and integrated circuit structures containing enhanced-surface-area conductive layers
An enhanced-surface-area conductive layer compatible with high-dielectric constant materials is created by forming a film or layer having at least two phases, at least one of which is electrically conductive. The film may be formed in any convenient manne...
11/19/2002
6479343DRAM cell capacitor and manufacturing method thereof
A method for manufacturing a cell capacitor includes a step of forming an upper electrode and a trench for the lower electrode simultaneously in a single mask step. Further steps for manufacturing a cell capacitor includes forming a storage node contact b...
11/12/2002
6472320Method of producing rough polysilicon by the use of pulsed plasma chemical vapor deposition and products produced by the same
A method for depositing a rough polysilicon film on a substrate is disclosed. The method includes introducing the reactant gases argon and silane into a deposition chamber and enabling and disabling a plasma at various times during the deposition process....
10/29/2002
6465840Integrated structure comprising a patterned feature substantially of single grain polysilicon
The electrical performance of a dielectric film for capacitive coupling in an integrated structure is enhanced by forming the polycrystalline electrically conductive layer coupled with the dielectric film substantially unigranular over the coupling area, ...
10/15/2002
6459116Capacitor structure
The present invention is directed to fabrication of a capacitor formed with a substantially concave shape and having optional folded or convoluted surfaces. The concave shape optimizes surface area within a small volume and thereby enables the capacitor t...
10/01/2002
6451667Self-aligned double-sided vertical MIMcap
A vertical MIM capacitor (140) including a first conductive line (124) and second conductive line (136) sandwiched around a vertical portion of a capacitor dielectric (134). Additional conductive lines (136) may be positioned vertically proximate first co...
09/17/2002
6440825Method of controlling outdiffusion in a doped three-dimensional film
A solid state fabrication technique for controlling the amount of outdiffusion from a three-dimensional film is comprised of the step of providing a first layer of insitu doped film in a manner to define an upper portion and a lower portion. A second laye...
08/27/2002
6429071Method of increasing capacitance of memory cells incorporating hemispherical grained silicon
Disclosed is a method of increasing capacitance of a memory cell capacitor. A bottom electrode, comprising a hemispherical grained (HSG) silicon layer, is subjected to a dry etch process. The etch tends to separate the individual grains of the HSG silicon...
08/06/2002
6413831Method of fabrication for a honeycomb capacitor
A honeycomb/webbed, high surface area capacitor formed by etching a storage poly using an etch mask having a plurality, of micro vias. The etch mask is preferably formed by applying an HSG polysilicon layer on a surface of the storage poly with a mask lay...
07/02/2002
6410955Comb-shaped capacitor for use in integrated circuits
A capacitor for use in integrated circuits comprises a layer of conductive material. The layer of conductive material including at least a first portion and a second portion, wherein the first portion and the second portion are arranged in a predetermined...
06/25/2002
6410397Method for manufacturing a dielectric trench capacitor with a stacked-layer structure
A trench is formed by forming a photoresist film on a second interlevel insulator and performing isoprotonic etching using the photoresist film as a mask. A lower electrode layer made of platinum (Pt), a dielectric film made of a dielectric material and a...
06/25/2002
6404002Dynamic random access memory device with shaped storage nodes
A DRAM device with increased surface area includes a pair of storage nodes arranged in a square configuration, and the square configurations are repeatedly arranged to form matrix cell array region. One of the storage node exhibits an "L" shaped pole and ...
06/11/2002
6403444Method for forming storage capacitor having undulated lower electrode for a semiconductor device
This invention provides a capacitor including a metal lower electrode having an undulated shape and an improved electrode area, and a method of manufacturing the same. A capacitor for data storage is formed on a semiconductor substrate (not shown) via an ...
06/11/2002
6399490Highly conformal titanium nitride deposition process for high aspect ratio structures
Process for forming highly conformal titanium nitride on a silicon substrate. A gaseous reaction mixture of titanium tetrachloride and ammonia is passed over the semiconductor substrate surface maintained at a temperature of about 350° C. to about 800° ...
06/04/2002
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