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| Number | Title | Issue Date |
| 8178860 | Image collection An inspection system for creating images of a substrate. A light source directs an incident light onto the substrate, and a light source timing control controls a pulse timing of the incident light. A stage holds the substrate and moves the substrate under the incid... | 05/15/2012 |
| 7714310 | Apparatus, unit and method for testing image sensor packages The present invention relates to an apparatus, unit and method for testing image sensor packages, which can automatically test whether the image sensor packages are defective before they are assembled into camera modules. An apparatus for testing image sensor packag... | 05/11/2010 |
| 7592616 | Detecting micropipes An automated, non-invasive method for classifying, detecting, and counting micropipes contained within silicon wafers, and generally any assortment of transparent wafers. Classifying, detecting, and counting micropipes takes place through the use of a data processin... | 09/22/2009 |
| 7576347 | Method and apparatus for optically inspecting an object using a light source A method for inspecting an object includes emitting light from a light source, projecting the light emitted from the light source onto a surface of the object, splitting light reflected from the object surface into a first image and a second image, receiving the fir... | 08/18/2009 |
| 7576348 | One-dimensional phase contrast microscopy with a traveling lens generated by a step function change A method for imaging a surface includes generating a traveling lens in an acousto-optic material and incorporating a traveling mask into a portion of the traveling lens so as to produce a composite traveling lens. The method further includes irradiating the composit... | 08/18/2009 |
| 7491959 | Defect inspection apparatus A defect inspection apparatus includes an illumination optical system which sets a transmission illumination region and a reflection illumination region on an inspection target surface of a mask, first and second imaging units having first and second visual fields w... | 02/17/2009 |
| 7488965 | System and method for associating container defect information to a specific path of manufacturing This application relates to an apparatus and method for automated inspection of formed metal containers. More specifically, it pertains to the use of machine vision systems to identify and correlate manufacturing defects occurring in formed food and beverage contain... | 02/10/2009 |
| 7440606 | Defect detector and defect detection method A control part of a defect detector is provided with a magnification operation part, an inspected image display part and a master image display part. The magnification operation part operates a display magnification α1 (display magnification data) for a defe... | 10/21/2008 |
| 7437278 | Simulation method, simulation apparatus, and computer program product for simulation A simulation method according to which a simulation apparatus, including a storage unit, generates a simulant image indicating a cut-out position of a wooden piece in raw wood and a shape of the wooden piece having a predetermined three-dimensional shape at shaping ... | 10/14/2008 |
| 7427768 | Apparatus, unit and method for testing image sensor packages The present invention relates to an apparatus, unit and method for testing image sensor packages, which can automatically test whether the image sensor packages are defective before they are assembled into camera modules. An apparatus for testing image sensor packag... | 09/23/2008 |
| 7427767 | Apparatus for identifying the condition of a conveyor belt An apparatus for identifying the condition of a conveyor belt (6) has a capturing device (12) which can be used to capture two-dimensional images (B) of successive belt sections (15) of the conveyor belt (6) during operation of the convey... | 09/23/2008 |
| 7425719 | Method and apparatus for selectively providing data from a test head to a processor An optical test head comprises one or more detectors for providing output signals indicative of the condition of a workpiece surface. Data from these detectors are stored in one or more memories only when the data from the detectors satisfy one or more conditions (e... | 09/16/2008 |
| 7417724 | Wafer inspection systems and methods for analyzing inspection data Wafer inspection systems and methods are provided. One inspection system includes a module measurement cell coupled to a host inspection system by a wafer handler. The module measurement cell is configured to inspect a wafer using one or more modes prior to inspecti... | 08/26/2008 |
| 7417243 | High-sensitivity optical scanning using memory integration An inspection system includes a CMOS integrated circuit having integrally formed thereon an at least two dimensional array of photosensors and providing an inspection output representing an object to be inspected. A defect analyzer is operative to receive the inspec... | 08/26/2008 |
| 7411207 | Method and its apparatus for inspecting particles or defects of a semiconductor device An apparatus for inspecting particles and/or pattern defects of an object under inspection. Data processing means obtains information on size of the particles and/or the pattern defects from an intensity of the scattered light detected by the light detecting means b... | 08/12/2008 |
| 7382461 | Analysis method and apparatus utilizing attenuated total reflection An image of a light beam, which has been totally reflected from an interface between a dielectric material block and a thin film layer of an analysis chip for supporting a sample, is detected with photodetector and as a two-dimensional image constituted of pixels ar... | 06/03/2008 |
| 7375362 | Method and apparatus for reducing or eliminating stray light in an optical test head An optical test head comprises one or more optical input paths by which a beam of light is communicated from a light source to a workpiece and one or more optical output paths by which light reflected off of the workpiece is communicated to a detector. The input opt... | 05/20/2008 |
| 7372062 | Defect inspection device and substrate manufacturing system using the same A defect inspection device which inspects for surface defects in substrates, and which includes an illumination section that irradiates the substrate with illumination light having a variable incident angle, and a light-receiving section that receives light from the... | 05/13/2008 |
| 7358517 | Method and apparatus for imager quality testing An apparatus and method of detecting a defect in an imager die package. The method comprises the steps of exposing the imager die package to light at a first angle, exposing the imager die package to light at a second angle, outputting electrical signals based on th... | 04/15/2008 |
| 7355193 | Dust and scratch detection for an image scanner Multiple scans of the same object are obtained, where for any given line on the object to be scanned, the angle of the illumination is different for each scan. The different scans are obtained from different rows of photosensors that are separated. Because the angle... | 04/08/2008 |
| 7356787 | Alternative methodology for defect simulation and system A system for defect simulation is provided. A defect layout generator generates a defect layout comprising a given number of spot defects of a given size. A processor first compares the defect layout and a provided circuit layout comprising a plurality of conductive... | 04/08/2008 |
| 7349106 | Apparatus and method for thin-layer metrology An apparatus (1) and a method for thin-layer metrology of semiconductor substrates (16) are disclosed. The semiconductor substrates (16) are delivered or transported to the apparatus (1) by means of at least one cassette element. A measur... | 03/25/2008 |
| 7345753 | Apparatus and methods for analyzing defects on a sample Disclosed are methods and apparatus for facilitating procedures implemented on an analysis tool are provided herein. In one embodiment, an apparatus includes an analyzer module arranged for managing an analyzer tool and causing a high resolution image generated by t... | 03/18/2008 |
| 7339182 | Vacuum evaporator A vacuum evaporator including a vacuum chamber and a source arranged in the vacuum chamber to supply a deposition material to a substrate on which a layer is formed. A crystal sensor measures a deposition speed of the deposition material. The crystal sensor includes... | 03/04/2008 |
| 7333192 | Apparatus and method for inspecting defects A defect inspection apparatus includes an irradiation optical system 20, a detection optical system 30, and an image processor 40. In the irradiation optical system, a mirror 2603 is disposed to reflect downward a beam flux that has been ... | 02/19/2008 |
| 7333202 | Yarn sensor A yarn sensor for optically scanning a yarn (3), traveling longitudinally through a measurement gap (19), includes a light source (20) projecting a beam of light into the measurement gap (19), at least one receiver (23) for directl... | 02/19/2008 |
| 7330248 | Method and apparatus for inspecting defects In a defect inspecting apparatus, having contrast, brightness and appearance of a target for inspection and detection sensitivity of a defect changed depending on optical system conditions, and adapted to perform inspection by selecting an optimal test condition, ev... | 02/12/2008 |
| 7322574 | Separator sheet handling assembly The present invention is embodied in a separator sheet handling assembly 10 that includes a lifting assembly 20 adapted to receive a pallet 12 containing a stack of separator sheets 14. The lifting assembly 20 positions the stack o... | 01/29/2008 |
| 7324201 | Yarn sensor A yarn sensor for textile spinning and bobbin-winding machines for optically scanning a longitudinally traveling yarn (3) within a measurement gap (19), particularly for detecting extraneous fibers, includes a light source (20), a first receiver... | 01/29/2008 |
| 7305119 | Test head for optically inspecting workpieces Apparatus for simultaneously optically inspecting top and bottom surfaces of a workpiece comprise upper and lower test heads, each head comprising at least one laser for providing a laser beam that scans its associated workpiece surface and at least one detector for... | 12/04/2007 |
| 7301165 | Methods and apparatus for inspecting an object A method for inspecting an object using a structured light measurement system that includes a light source for projecting light onto a surface of the object and an imaging sensor for receiving light reflected from the object. The method includes determining a positi... | 11/27/2007 |
| 7302148 | Test head for optically inspecting workpieces An optical test head comprises a block of material with a plurality of optical paths extending therethrough. At least one of the optical paths is an input optical path for receiving laser light and holding a lens for focusing the laser light on a workpiece that is p... | 11/27/2007 |
| 7301149 | Apparatus and method for determining a thickness of a deposited material Method and apparatus for determining a thickness of a deposited material. Energy is passed through the deposited material, wherein some of the energy is transmitted. The transmitted energy is received, and the received energy is used to determine a thickness of the ... | 11/27/2007 |
| 7301133 | Tracking auto focus system A tracking auto-focus system maintains a microscope pointed at a TFT array continuously in focus so as to eliminate the auto-focusing time that would otherwise be required. The tracking auto-focus system includes, in part, a microscope Z actuator, an auto-focus sens... | 11/27/2007 |
| 7300242 | Turbine airfoil with integral cooling system A turbine airfoil usable in a turbine engine and having at least one cooling system. At least a portion of the cooling system may be positioned in an outer wall of the turbine airfoil and be formed from a multi-chambered, metering orifice. The multi-chambered, meter... | 11/27/2007 |
| 7299147 | Systems for managing production information A system for managing production information includes a defect information database, a defect information collection unit, and a manufacturing apparatus information managing unit. The defect information database stores defect information including a coordinate value... | 11/20/2007 |
| 7292329 | Test head for optically inspecting workpieces comprising a lens for elongating a laser spot on the workpieces An optical test head comprises a laser source for providing a laser beam. The laser beam passes through a cylindrical lens for modifying the shape of the beam and a spherical lens for concentrating the beam onto a workpiece (typically a magnetic disk platter). The c... | 11/06/2007 |
| 7292949 | Method and apparatus for estimating surface moisture content of wood chips Method and apparatus for estimating surface moisture content of wood chips employing a surface moisture measurement obtained from a non-contact surface moisture sensor, which measurement is calibrated with values of a set of optical parameters, such as HSL color cam... | 11/06/2007 |
| 7292332 | Method and apparatus for detecting faults in transparent material The method for detecting faults in transparent material includes irradiating a definite partial volume in the material with a first radiation source and coupling light into the material from a second source so that its optical path in the partial volume extends in t... | 11/06/2007 |
| 7289231 | Apparatus and method for determining physical properties of a mask blank An apparatus for determining physical properties of a mask blank. The apparatus includes, for example, an illumination device for radiating a predetermined light laterally into the mask blank, a detection device opposite the illumination device for detecting the lig... | 10/30/2007 |
