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| Number | Title | Issue Date |
| 8148705 | Method and apparatus for inspecting defects of patterns formed on a hard disk medium If an inspection method for inspecting a patterned medium is intended for the nanoimprint process control, it is necessary to measure a correct shape of each pattern element. On the other hand, if the inspection method is intended for the quality control of products... | 04/03/2012 |
| 7838858 | Evaluation system and method of a search operation that detects a detection subject on an object First, an operator inputs various parameters required for a mark recognition operation including a designated position coordinate designated via a mouse and a keyboard (step 201). Then, an edge potential position closest to the designated position is selected... | 11/23/2010 |
| 7723710 | System and method including a prealigner A system and method for prealigning a substrate. One embodiment provides a rotor configured to rotate a carrier around a rotation axis in response to a rotation signal. The carrier includes a main surface substantially perpendicular to the rotation axis. The substra... | 05/25/2010 |
| 7501647 | Apparatus and method for acquiring and evaluating an image from a predetermined extract of a printed product An apparatus for acquiring and evaluating an image of a predetermined extract of a printed product removes the effects of scattered light to improve the accuracy of image evaluation. The apparatus uses a camera that has an electronic image sensor with a two-dimensio... | 03/10/2009 |
| 7378675 | Security markers for indicating condition of an item A method of indicating the condition of an item comprises illuminating the item to excite one or more photoluminescent markers incorporated within the item. Photoluminescent emission from the markers in response to the excitation is compared to one or more pre-defin... | 05/27/2008 |
| 7375360 | Light device of arranging thin film inspection sensor array, and method and apparatus for arranging sensor array using the same There is disclosed a light device for arranging a thin film pattern sensor array where a sensor array used for inspecting a thin film pattern is made to be arranged without a separate correction pattern film in accordance with an inspection subject. In the li... | 05/20/2008 |
| 7372062 | Defect inspection device and substrate manufacturing system using the same A defect inspection device which inspects for surface defects in substrates, and which includes an illumination section that irradiates the substrate with illumination light having a variable incident angle, and a light-receiving section that receives light from the... | 05/13/2008 |
| 7369956 | System for testing tire sidewall irregularities and related methods A device for testing a tire that has a tread and extending sidewalls includes an apparatus for receiving and rotating a tire and at least one measurement device operatively placed to measure at least one of the sidewalls as the tire is rotated wherein the measuremen... | 05/06/2008 |
| 7365295 | Image inspection system for correcting focal position in autofocusing An image inspection system includes a mount stage for a subject; an observation optical system for imaging light reflected by the subject; a focal position moving mechanism for relatively moving a position of the observation optical system in a depth direction of fo... | 04/29/2008 |
| 7365306 | Standard member for length measurement, method for producing the same, and electron beam length measuring device using the same This invention provides an electron beam length measuring technology including a standard component for length measurement that has a finer standard dimension, and its producing method. The standard component for length measurement has a semiconductor member on whic... | 04/29/2008 |
| 7361921 | Device and method for plane-parallel orientation of a the surface of an object to be examined in relation to a focus plane of a lens The orientation of the surface of an object to be examined is changed by adjusting the distance thereof to an optical measuring system in a plane-parallel manner in relation to a focusing plane of the optical measuring system, enabling high speeds of examination to ... | 04/22/2008 |
| 7353954 | Tray flipper and method for parts inspection Manufacturing lines include inspection systems for monitoring the quality of parts produced. Manufacturing lines for making semiconductor devices generally inspect each fabricated part. The information obtained is used to fix manufacturing problems in the semiconduc... | 04/08/2008 |
| 7356176 | Mounting-error inspecting method and substrate inspecting apparatus using the method When a component is replaced or replenished in a predetermined feeder, mounters 3A and 3B refer to mount data in accordance with the feeder number for the feeder and read out the mounting position of the replaced or replenished component. The mounting ... | 04/08/2008 |
| 7337964 | Method and apparatus for ink-based electronic voting The present invention is an ink-based electronic voting apparatus that generates a paper ballot for every voter. The voter marks a ballot with a probe as he/she would with a conventional ink-based system. In one embodiment, the paper ballot is situated underneath th... | 03/04/2008 |
| 7329859 | Photoelectric encoder A photoelectric encoder that has a lens optical system including a lens inserted between a main scale and a light receiving element. In the photoelectric encoder, three planes extended from a surface of the main scale, a principal plane of the lens, and an image pla... | 02/12/2008 |
| 7330042 | Substrate inspection system, substrate inspection method, and substrate inspection apparatus It is an object of the present invention to provide a substrate inspection system, a substrate inspection method, and a substrate inspection apparatus for realizing efficient operation of inspecting both a large region and a small region of a substrate. The present ... | 02/12/2008 |
| 7329830 | High-rate laser marking machine A laser marking machine for objects, namely supports or cards carrying integrated circuits, has a laser chamber having two marking locations for receiving the objects to be marked on at least one face by at least one laser marker having optics for deflecting the las... | 02/12/2008 |
| 7309872 | Paper sheets thread part or paper sheets thread part detection method A paper sheets feature detector 20, through which a banknote 21 is carried and passed is provided with a carrying-in sensor part 22, a transmissive and reflective line light sensor 23, a magnetic sensor 24, a thickness sensor 27... | 12/18/2007 |
| 7297969 | Web marking and inspection system A method and apparatus for use with a web of material having a web length dimension and a web surface, the method for placing mark sequences on the web surface every X distance along the web length dimension identifying location along the web length dimension, the m... | 11/20/2007 |
| 7280200 | Detection of a wafer edge using collimated light A system and method of inspecting a semiconductor wafer that may be employed to detect and to characterize defects occurring on an edge of the wafer. The wafer inspection system includes an optical module for providing a light source to scan the wafer edge, a light ... | 10/09/2007 |
| 7256389 | Glass bottle inspection machine A camera based inspection system for inspecting glass bottles made in a glass-forming machine. A single picture shows the heat distribution of an inspected portion of the bottle over a period of time whereby the operator will see a loss of stability in the glass pro... | 08/14/2007 |
| 7253428 | Apparatus and method for feature edge detection in semiconductor processing A system for identifying a mark or other recess formed in a substrate and at least partially covered by at least one layer of opaque or visibly opaque material. The system includes a radiation source configured and positioned to direct incident electromagnetic radia... | 08/07/2007 |
| 7248353 | Method and apparatus for inspecting samples, and method for manufacturing devices using method and apparatus for inspecting samples A method for alignment of a chip in a substrate surface inspection is provided, in which a surface of a substrate including a chip formed therein is inspected by using a beam. The method is characterized in comprising: a step of placing the substrate so that the chi... | 07/24/2007 |
| 7231080 | Multiple optical input inspection system A system and method of inspecting electrical circuits with multiple optical inputs, including: obtaining first and second image data that are generally spatially coincidental but which each include some image data that is different, modifying one of the images by em... | 06/12/2007 |
| 7218389 | Method and apparatus for inspecting pattern defects A pattern defect inspection apparatus is capable of detecting defects, without being affected by non-uniform thickness of a thin film formed on a sample, even when using monochromatic light, such as a laser. The apparatus comprises a laser to illuminate a sample, co... | 05/15/2007 |
| 7209600 | Synchronization of components for printing The present invention relates to a technique for detecting that all components that make up a completed portion of a form are synchronized. A method is provided for detecting that for a print job, all of the components that make up a completed portion of each form a... | 04/24/2007 |
| 7202492 | Apparatus and method for detecting a feature of a running material web An apparatus for detecting a substantially longitudinally extending feature of a running material web, especially the side edge of the web or an applied marker line, comprises a plurality of individually addressable light sources (22-1, to, 22- | 04/10/2007 |
| 7199387 | Apparatus and method for detecting a predetermined pattern on a moving printed product An apparatus and method for detecting a relatively narrow predetermined pattern, such as a trigger mark, on a moving printed product uses a plurality of sensor elements arranged linearly in an array and a switching apparatus for selecting a properly located subset o... | 04/03/2007 |
| 7191895 | Conveyor induct system with probability estimator A conveyor system, such as an induction subsystem for supplying articles to a sortation subsystem, and method of conveying articles includes providing a conveying surface for conveying a series of articles and at least one sensor for sensing the articles on the conv... | 03/20/2007 |
| 7158663 | Method for measuring confidence of ball grid array model in surface mounted devices A method for obtaining confidence measure of a ball grid array (BGA) model having a plurality of balls in semiconductor surface mounted devices is provided. The method comprises the steps of extracting BGA images from a real surface mounted device, generating a BGA ... | 01/02/2007 |
| 7148961 | Container sidewall inspection Apparatus for inspecting containers having a sidewall with a shoulder and a heel includes a device for positioning a container for inspection, a light source on one side of the container positioning device, and a camera having a light sensor and an entrance pupil on... | 12/12/2006 |
| 7143943 | Method of producing digital images of objects using planar laser illumination beams and electronic image detection arrays Methods of and systems for illuminating objects using planar laser illumination beams (PLIBs) having substantially-planar spatial distribution characteristics that extend throughout the field of view (FOV) of image formation and detection modules employed in such sy... | 12/05/2006 |
| 7142301 | Method and apparatus for adjusting illumination angle A machine-vision system that provides quick changing and/or automatic adjustment of illumination angle, dispersion, intensity, and/or color of illumination. One such system includes a light source emitting polarized light, a machine-vision imager, an image processor... | 11/28/2006 |
| 7134597 | System for handicapped access to voting ballots A voting system that allows voters who may be blind or otherwise disabled to use election ballots without needing to see the ballot. The present invention provides a balloting system which presents and holds an election ballot while allowing a voter to cast and insp... | 11/14/2006 |
| 7126124 | Marking determining method and marking determining apparatus The present invention realizes accurate determination on marking without using an infrared sensor having high responsiveness and high precision. An infrared sensor is disposed such that a region of a predetermined range on the downstream side in the feed direction o... | 10/24/2006 |
| 7127098 | Image detection method and its apparatus and defect detection method and its apparatus The present invention provides an image detection system capable of picking up a high resolution image of the surface condition of a circuit pattern-formed wafer without being affected by steep pattern steps, discontinuous reflectance distributions and optically tra... | 10/24/2006 |
| 7121751 | Placing printing elements and mark sensor at proper positions with respect to the cutter member A tape printer, wherein when a label tape (36) is fed to a tape cutting position after the label (39) of the label tape (36) is printed out, the heating elements (R1 to Rn) of a thermal head (9) are disposed so as to be opposed to ... | 10/17/2006 |
| 7115857 | Apparatus for remotely counting objects in a collection using differential lighting Apparatus for remotely counting the number of individual objects of the same general shape and disposed in a collection having a front end in a common vertical plane. ... | 10/03/2006 |
| 7102148 | Calibration method and device in electronic component mounting apparatus In an electronic component mounting apparatus capable of replacing a component placing device with any of plural other component placing devices different in performance, the distance between the center line of a component pick-up portion of a replaced component pla... | 09/05/2006 |
| 7093540 | Method and device for initial adjustment of the register of the engraved cylinders of a rotary multicolor press To adjust peripheral register of engraved cylinders, the positions of a respective angular register mark arranged on each cylinder is measured with respect to a zero reference, and an angular printing mark characteristic of the position of the engraving is associate... | 08/22/2006 |
