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Pet Toilet-Like Water Disk and Food Storage
One pet-friendly inventor patented "a device for watering pets, e.g., a dog or cat." The device, he helpfully noted, "has the general shape of a toilet."
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| Number | Title | Issue Date |
| 8039827 | Apparatus and methods for measuring at least one physical characteristic of a threaded object In some embodiments, an inspection system includes a collimated light source defining a source optical path and useful to cause a collimated light beam to propagate along the source optical path and a sensing device defining a sensor optical path. A positioning devi... | 10/18/2011 |
| 8035094 | Methods for measuring at least one physical characteristic of a component A method for measuring the physical characteristics of a component includes associating a component with the system such that the component is positioned within the retention mount and operating the system to cause the light source to emit a collimated light beam al... | 10/11/2011 |
| 7745805 | Product inspection system and a method for implementing same that incorporates a correction factor A system and method for measuring the physical characteristics of an object is provided, wherein the method includes disposing the object within the sensor optical path of an inspection system, causing a source collimated light beam to propagate along the source opt... | 06/29/2010 |
| 7369712 | Automated statistical self-calibrating detection and removal of blemishes in digital images based on multiple occurrences of dust in images A method automatically corrects dust artifact within images acquired by a system including a digital acquisition device including a lens assembly. Multiple original digital images are acquired with the digital acquisition device. Probabilities that certain pixels co... | 05/06/2008 |
| 7340109 | Automated statistical self-calibrating detection and removal of blemishes in digital images dependent upon changes in extracted parameter values A method of automatically correcting dust artifact within images acquired by a system including a digital camera includes determining that certain pixels correspond to dust artifact regions within a first digitally-acquired image. The dust artifact regions are assoc... | 03/04/2008 |
| 7336400 | Transforming an input image to produce an output image An input image is transformed to produce an output image. Pixels occurring at edges that represent detail within the input image are detected to produce an intermediate image. Background fill representing textures of the input image is generated. The background fill... | 02/26/2008 |
| 7327502 | Sheet-fed scanning device capable of detecting a document edge A sheet-fed scanning device capable of detecting a document edge includes a scanning module and an automatic document feeder. The scanning module scans a document with a light ray. The automatic document feeder feeds the document across a scanning region on a sheet ... | 02/05/2008 |
| 7315658 | Digital camera A digital camera that automatically corrects dust artifact regions within acquired images by compiling a statistical dust map from multiple images acquired under different image acquisition conditions includes an optical system for acquiring an image including a len... | 01/01/2008 |
| 7310450 | Method of detecting and correcting dust in digital images based on aura and shadow region analysis A method of automatically correcting dust artifact regions within images acquired by a digital image acquisition system including a digital camera with a lens assembly includes determining probabilities that certain pixels within multiple digitally-acquired images c... | 12/18/2007 |
| 7292949 | Method and apparatus for estimating surface moisture content of wood chips Method and apparatus for estimating surface moisture content of wood chips employing a surface moisture measurement obtained from a non-contact surface moisture sensor, which measurement is calibrated with values of a set of optical parameters, such as HSL color cam... | 11/06/2007 |
| 7280200 | Detection of a wafer edge using collimated light A system and method of inspecting a semiconductor wafer that may be employed to detect and to characterize defects occurring on an edge of the wafer. The wafer inspection system includes an optical module for providing a light source to scan the wafer edge, a light ... | 10/09/2007 |
| 7276914 | System and method for guided TDR/TDT computerized tomography A system for detecting a defect or discontinuity in media or at an interface of the media includes a signal generator; a transmission path coupled to the signal generator, wherein the transmission path is arranged along or through the media; a detection circuit for ... | 10/02/2007 |
| 7245784 | Image processing for correcting defects of read image An image reading apparatus having a visible light source for emitting visible light, an invisible light source for emitting invisible light, an imaging optical system for irradiating a document by these light sources to form optical images of the document, and a CCD... | 07/17/2007 |
| 7236274 | Calibration mechanism for an optical module of a sheet-fed scanner A calibration mechanism for an optical module of a sheet-fed scanner is disclosed. The calibration mechanism includes a calibration strip and a driving unit. The calibration strip is moved by the driving unit, and the calibration strip may be moved relative to the o... | 06/26/2007 |
| 7235800 | Electrical probing of SOI circuits Analysis of a semiconductor die having silicon-on-insulator (SOI) structure is enhanced by accessing the circuitry within the die from the back side without necessarily breaching or needing to breach the thin insulator layer of the SOI structure. According to an exa... | 06/26/2007 |
| 7227165 | System and method for classification of timber The present invention provides a system and a method to grade a piece of wood and simultaneously to classify this piece of wood by allowing an examination of four longitudinal faces thereof, so as to determine optimal specifications for a subsequent use thereof such... | 06/05/2007 |
| 7206461 | Digital image acquisition and processing system A digital image acquisition and processing system that automatically corrects dust artifact regions within acquired images by compiling a statistical dust map from multiple images acquired under different image acquisition conditions is provided. The system includes... | 04/17/2007 |
| 7183532 | Detecting a defect in an image scanner Image data in an image scanner is examined to determine whether lines (light or dark) are present in the image data. By examining whether the lines are present in image data for multiple colors, and whether calibration gains for corresponding photosensors are normal... | 02/27/2007 |
| 7167285 | Image scanning apparatus and method, and storage medium A scheme for obtaining an original image free from any dust or scratches on a film by scanning a film original or the like with visible light and infrared light has been proposed. This scheme suffers problems, i.e., a large memory size and long processing time since... | 01/23/2007 |
| 7164511 | Distinguishing positive and negative films system and method A system and method for scanning a photographic film using a scanner automatedly identifies the film as either a positive or negative and controls the scanner settings to perform the scan accordingly. The method includes performing a pre-scan of the film, sampling a... | 01/16/2007 |
| 7164507 | Image input terminal An imaging system, which may be applied both to black and white and color imaging systems and comprising a platen member which defines an imaging portion and a calibration portion is disclosed. The imaging portion and the calibration portion comprise separate portio... | 01/16/2007 |
| 7164510 | Image scanning apparatus and method, and storage medium A scheme for obtaining an original image free from any dust or scratches on a film by scanning a film original or the like with visible light and infrared light has been proposed. This scheme suffers problems, i.e., a large memory size and long processing time since... | 01/16/2007 |
| 7161668 | Wafer edge inspection In one embodiment, a surface analyzer system comprises a radiation targeting assembly to target a radiation beam onto a surface; and a reflected radiation collecting assembly that collects radiation reflected from the surface, wherein the reflected radiation collect... | 01/09/2007 |
| 7161671 | Method and apparatus for inspecting defects Laser lights having a plurality of wavelengths from DUV to VUV range are used to inspect defects of a pattern at high speeds and in a high sensitivity using high light-output lasers, while solving a temporal/spatial coherence problem caused by using lasers as light ... | 01/09/2007 |
| 7161667 | Wafer edge inspection In one embodiment, a system to inspect the edge of a wafer, comprises an surface analyzer assembly, a first drive assembly to impart linear motion between the surface analyzer and a first surface of the wafer, and a second drive assembly to impart rotary motion betw... | 01/09/2007 |
| 7161669 | Wafer edge inspection In one embodiment, a system to inspect an edge region of a wafer, comprises a surface analyzer assembly comprising a radiation targeting assembly that targets a radiation beam onto a surface of the wafer; a reflected radiation collection assembly to collect radiatio... | 01/09/2007 |
| 7155356 | Quality and condition monitoring based on spectrum separating measurement A method of controlling the quality and/or condition of a fibre web in a process for manufacturing and/or finishing the fibre web, which includes, monitoring the fibre web with at least one optical spectrum separating measurement device, determining a quality variab... | 12/26/2006 |
| 7154080 | System and method for detecting the efficacy of machined parts The present invention relates to a system and method for detecting the efficacy of machined parts, and particularly to an automated system and method that detects whether tooling features (e.g., holes) are properly formed and aligned in work pieces during the machin... | 12/26/2006 |
| 7149341 | Wafer inspection apparatus A wafer inspection apparatus has a supporting means (10) for rotatably supporting a wafer (W) formed of a disk, a circumferential edge imaging means (40) for imaging a circumferential edge (S) of the wafer (W) that is supported by the supporting means ... | 12/12/2006 |
| 7131539 | Paper sheets corner fold detection method and paper sheets corner fold detection program When a thickness sensor detects a corner fold in a front end part of the paper sheet being carried, a light sensor checks whether a break exists or not in the front end part. When there is no break, it means the thickness sensor does not detect a corner fold but a f... | 11/07/2006 |
| 7115892 | Method and its apparatus for inspecting particles or defects of a semiconductor device Conventionally, a particle/defect inspection apparatus outputs a total number of detected particles/defects as the result of detection. For taking countermeasures to failures in manufacturing processes, the particles/defects detected by the inspection apparatus are ... | 10/03/2006 |
| 7106458 | Device for detecting edges of sheet-shaped materials A device for detecting edges of sheet-shaped print materials (1), especially of transparencies, that are moved along a transport path through a sheet-processing machine has a beam transmitter (31) and a beam receiver (32), whereby beam transmitt... | 09/12/2006 |
| 7103208 | Detecting and classifying blemishes on the transmissive surface of an image sensor package A method for determining blemishes in or on the transmissive surface of an image sensor package and determining if such blemishes are acceptable for use of the image sensor package including capturing a digital image of a predetermined scene using the image sensor p... | 09/05/2006 |
| 7092096 | Optical scatterometry method of sidewall spacer analysis A method of analyzing structural characteristics of sidewall spacers fabricated on a wafer is disclosed. A grating bar having a plurality of grating targets is provided. A theoretical optical scatterometry spectrum is generated by subjecting the grating targets to o... | 08/15/2006 |
| 7088477 | Image reading apparatus and illumination apparatus This invention has an object of reading a high-quality image by detecting and correcting dust or scratches present on a transparent original in an image reading apparatus for reading, e.g., a transparent original. To achieve this object, an original illumination uni... | 08/08/2006 |
| 7078721 | Object detection apparatus for a vehicle An object detection apparatus for a vehicle includes a light emitter covered with an emission window, a light receptor covered with a reception window, a defect detection light emitter, a defect detection light receptor and a fracture detection circuit. The light em... | 07/18/2006 |
| 7079237 | Apparatus for inspecting a wafer An apparatus for inspecting a wafer includes a handling unit for supporting, rotating and moving the wafer in horizontal and vertical directions, a first image acquisition unit for acquiring a first image corresponding to an upper surface of the wafer supported by t... | 07/18/2006 |
| 7006705 | Image processing for correcting defects of read image An image reading apparatus having a visible light source for emitting visible light, an invisible light source for emitting invisible light, an imaging optical system for irradiating a document by these light sources to form optical images of the document, and a CCD... | 02/28/2006 |
| 6989548 | Inspection device for metal rings of a continuously variable transmission belt An inspection device for metal rings of a Continuously Variable Transmission (CVT) V-belt which does not perform excessive detection of gloss marks as a detrimental manufacturing flaw configured with a first low-pass cutting portion for cutting out a predetermined l... | 01/24/2006 |
| 6979815 | Folding apparatus of a web-fed printing press including a conveyor belt monitoring device A folding apparatus (30) having at least one conveyor belt (10) which is used to convey signatures (64) at least on a section of a path (66, 68) of the signatures (64) through the folding apparatus (30). The folding apparatu... | 12/27/2005 |
