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| Number | Title | Issue Date |
| 8183550 | Imaging an imprinted substrate on a printing press A method of imaging an imprinted substrate on a printing press is provided. The method comprises sensing light reflected by the substrate using a contact image sensor to produce data representative of the imprinted substrate. The substrate has been imprinted with di... | 05/22/2012 |
| 8039826 | Inspecting an imprinted substrate on a printing press A method of inspecting an imprinted substrate on a printing press comprises illuminating a portion of the substrate which has been imprinted with different colors at a plurality of printing units of the printing press. The method further comprises sensing light refl... | 10/18/2011 |
| 7732796 | Inspection system for inspecting an imprinted substrate on a printing press An inspection system for inspecting an imprinted substrate on a printing press has a light source, a contact image sensor, and a processor. The light source is configured to illuminate a portion of the substrate which has been imprinted with different colors at a pl... | 06/08/2010 |
| 7501646 | Security markers for reducing receipt fraud A method of reducing receipt fraud comprises attempting to detect emission from a receipt associated with one or more luminescent markers that are incorporated in a valid receipt. The receipt is validated when the attempt is successful. ... | 03/10/2009 |
| 7440093 | Apparatus and methods for providing selective defect sensitivity Disclosed are techniques and apparatus for accounting for differing levels of defect susceptibility in different pattern areas of a reticle in an inspection of such reticle or in inspection of a semiconductor device fabricated from such reticle. In general terms, tw... | 10/21/2008 |
| 7427767 | Apparatus for identifying the condition of a conveyor belt An apparatus for identifying the condition of a conveyor belt (6) has a capturing device (12) which can be used to capture two-dimensional images (B) of successive belt sections (15) of the conveyor belt (6) during operation of the convey... | 09/23/2008 |
| 7423280 | Web inspection module including contact image sensors A web inspection module is described for scanning an imprinted web in a printing press. The web inspection module includes a light source for illuminating a portion of the web, a contact image sensor having a plurality of sensing elements, and a processor for receiv... | 09/09/2008 |
| 7417749 | Method and apparatus for protecting an optical transmission measurement when sensing transparent materials A method and apparatus for protecting an optical transmission measurement when sensing transparent materials. Sensing apparatus located in a housing directs a light beam at an upward angle to a sheet of transparent material and detects downward surface reflections o... | 08/26/2008 |
| 7408180 | Compensation apparatus for image scan A compensation apparatus for image scan, applied to an optical scanner with a platform, on which an object to be scanned is disposed. The optical scanner has a photosensitive apparatus with a set of scan photosensitive devices and a storage apparatus. When the objec... | 08/05/2008 |
| 7399983 | Quality inspection method and quality inspection device In an inspection for protrusion of the melted thermoplastic material of transversal line seal into inside, it is an object to provide a quality inspection method and a quality inspection device which can easily detect projection on edge of seal, securely capture eve... | 07/15/2008 |
| 7391043 | Self calibrating media edge sensor Various edge detection arrangements are disclosed, including an edge detection method and arrangement that utilizes outputs of commonly illuminated reference and edge sensors as the inputs for a comparator. The reference sensor is configured to have a wide field of ... | 06/24/2008 |
| 7378675 | Security markers for indicating condition of an item A method of indicating the condition of an item comprises illuminating the item to excite one or more photoluminescent markers incorporated within the item. Photoluminescent emission from the markers in response to the excitation is compared to one or more pre-defin... | 05/27/2008 |
| 7361907 | Method for direct dosimetry of radioactive nuclei in different types of samples using solid-state detectors of nuclear traces The invention concerns a novel method adapted to experimental conditions, for determining the function defining the actual detecting sensitivity of a solid-state detector of nuclear traces and which represents the detecting performances for each type of nucleus emit... | 04/22/2008 |
| 7336374 | Methods and apparatus for generating a mask A method for generating a mask for use with a light measurement system that includes a light source for projecting light onto a surface of an object, and an imaging system for receiving light reflected from the surface of the object. The method includes determining ... | 02/26/2008 |
| 7271891 | Apparatus and methods for providing selective defect sensitivity Disclosed are techniques and apparatus for accounting for differing levels of defect susceptibility in different pattern areas of a reticle in an inspection of such reticle or in inspection of a semiconductor device fabricated from such reticle. In general terms, tw... | 09/18/2007 |
| 7199385 | Method and an apparatus for the detection of objects moved on a conveyor means by means of an optoelectronic sensor The invention relates to a method and to an apparatus for the detection of objects moved on a segmented conveyor means by means of an optoelectronic sensor, in which in each case the geometric center of the objects is determined via the optoelectronic sensor, whereu... | 04/03/2007 |
| 7196300 | Dynamic focusing method and apparatus A method and apparatus for dynamically focusing an imaging mechanism on a moving target surface having a variable geometry is herein disclosed. Apparatus for focusing an imaging mechanism may include an objective, a prism, or another optical device that forms part o... | 03/27/2007 |
| 7171283 | Web guiding system and method Systems and methods for guiding one or more web components in connection with a web converting manufacturing process such as that used for manufacturing disposable absorbent garments. Some of the disclosed embodiments include relating inspection data, such as produc... | 01/30/2007 |
| 7161133 | Method and device for evaluating a parameter of a moving object A method for measuring a parameter of a movement of an object, in which a series of successive first time-spaced linear images and a second spaced linear image are taken, (a) a first development of first linear images and (b) a second development consisting of at le... | 01/09/2007 |
| 7145163 | Apparatus for detecting light-transmissive sheet-like body Illuminating light emitted from a light source is led via a condenser lens, an optical fiber, a half-silvered mirror, and a condenser lens to a reflector. The reflector reflects the illuminating light to a CCD device through a telecentric optical system which compri... | 12/05/2006 |
| 7146049 | Making the apparent speed of elements imaged at different speeds approximately the same for image recognition A method for image recognition. In the method, a section of an element is imaged while the element is at a first speed to obtain a first image pattern. The section of the element is also imaged while the element is at a second speed to obtain a second image pattern.... | 12/05/2006 |
| 7119911 | Moiré deflectometer including non-mechanical, transparent, spatial light modulators for demonstrating two-axis rulings A Moiré deflectometer includes at least three non-mechanical, transparent, spatial light modulators for demonstrating two sets of patterns on two parallel planes on two of the modulators thereby creating a Moiré fringe pattern and a method for using the same. More... | 10/10/2006 |
| 7116817 | Method and apparatus for inspecting a semiconductor device A method and apparatus for inspecting a wafer in which a focused charged particle beam is irradiated onto a surface of a wafer on which patterns are formed through a semiconductor device fabrication process, a secondary charged particle image of a desired area of th... | 10/03/2006 |
| 7084965 | Arrangement and method for inspecting unpatterned wafers The invention concerns an arrangement (1) for inspecting preferably unpatterned wafers, and comprises: a first optical inspection device (2) for examining reference wafers (R), which operates using image data processing methods and thereby recognizes d... | 08/01/2006 |
| 7075086 | Measurement of metal polish quality A value of infrared energy reflected from a metallic substrate with a polished surface is determined. The value of the infrared energy reflected, or conversely absorbed, is correlated to a quality of polish. According to an aspect of the invention, one embodiment of... | 07/11/2006 |
| 7068834 | Inspecting method, inspecting system, and method for manufacturing electronic devices The present invention has an analyzing unit including an image detection device for producing a plurality of images of a workpiece, a storage for storing detected images produced by the image detection device, and a display having a screen with a first area for disp... | 06/27/2006 |
| 7039228 | System and method for three-dimensional surface inspection An optical inspection system and method for inspecting a component on a printed circuit board (PCB) which determines three-dimensional information in a single scan. A first visual light source illuminates the PCB surface and component with a green light while a seco... | 05/02/2006 |
| 6998628 | Method of media type differentiation in an imaging apparatus A method of media type differentiation includes the steps of providing a media sensor including a specular detector that provides a specular signal output having a signal level related to an amount of the reflected specular light received; providing a highly reflect... | 02/14/2006 |
| 6974963 | Substrate inspecting device, coating/developing device and substrate inspecting method When a base film of a substrate is formed, for instance, on a scribe line of a wafer, a quadrangular first inspection pattern is formed in advance, and when a resist pattern is formed, a second inspection pattern are formed so as to be on a straight line to the firs... | 12/13/2005 |
| 6965120 | Method and apparatus for quality control in the manufacture of foundry cores or core packets A method and an apparatus for object recognition, in particular defect detection on workpieces, such as shot cores (1) or core packets, wherein the object is illuminated by a light source (4) and recorded and detected by means of a camera (3), a... | 11/15/2005 |
| 6955412 | Print mechanism utilizing an optical imaging sensor A print mechanism and method for printing are disclosed. The print mechanism includes a print head assembly, an actuator for moving the same, and a controller. The print head assembly includes a position detector and a marking device. The position detector includes ... | 10/18/2005 |
| 6952492 | Method and apparatus for inspecting a semiconductor device A method and apparatus for inspecting a semiconductor device in which failure occurence conditions on a whole wafer are estimated by calculating the statistic of potential contrasts in pattern sections from sampled images to implement higher throughput, and defectiv... | 10/04/2005 |
| 6943363 | Apparatus for detecting light-transmissive sheet-like body Illuminating light emitted from a light source is led via a condenser lens, an optical fiber, a half-silvered mirror, and a condenser lens to a reflector. The reflector reflects the illuminating light to a CCD device through a telecentric optical system which compri... | 09/13/2005 |
| 6895108 | Method for inspecting defects in the shape of object A method of inspecting for defects in the shape of an object, using an inspected image obtained from an object to be inspected, comprising the steps of: setting a reference image of a reference model for determining the defect in shape of the object to be inspected;... | 05/17/2005 |
| 6874420 | System and method for register mark recognition A system, method, and process that determine and automatically correct registration errors between printed objects and mechanically produced objects using advanced image processing techniques is disclosed. Means are also presented for maintaining all registered func... | 04/05/2005 |
| 6845178 | Automatic separation of subject pixels using segmentation based on multiple planes of measurement data A method and apparatus for characterizing pixels in an image of an object surface by providing at least two images of the surface wherein each pixel has a unique location common to all of the images; comparing each pixel value at each location to an identification m... | 01/18/2005 |
| 6826298 | Automated wafer defect inspection system and a process of performing such inspection An automated defect inspection system has been invented and is used on patterned wafers, whole wafers, broken wafers, partial wafers, sawn wafers such as on film frames, JEDEC trays, Auer boats, die in gel or waffle packs, MCMs, etc. and is specifically intended and... | 11/30/2004 |
| 6812479 | Sample positioning method for surface optical diagnostics using video imaging Disclosed is a position system and method for correcting the position of a workpiece during a manufacturing process. The system includes a light generating means for projecting a light beam onto the top surface of the workpiece at a predetermined angle and a video c... | 11/02/2004 |
| 6753542 | Defect detection apparatus and storage medium readable by computer According to the present invention, there is disclosed a defect detection apparatus comprising an illuminating unit which irradiates an inspection object with illuminating light, and an image pickup unit which picks up an image of diffracted light from the inspectio... | 06/22/2004 |
| 6684164 | True defect monitoring through repeating defect deletion A method of deleting repeating defects having no effect on product yield of a wafer so that true defects on the wafer are more readily found. A wafer having a plurality of dies thereon is provided. The wafer is scanned to find any repeating defects. If th... | 01/27/2004 |
