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| Number | Title | Issue Date |
| 7626189 | Characterization of fancy yarn According to the method for characterizing fancy yarn, at least one characteristic of the fancy yarn is scanned along the longitudinal direction of the fancy yarn. Values of the scanning are evaluated and the results of the evaluation are outputted. The results of t... | 12/01/2009 |
| 7501645 | Cornea characteristics measuring device An apparatus for measuring characteristics of a substance is provided. The apparatus includes a light source to generate light to form an image. A splitter transmits the light from the light source to a first lens, which collimates the light. A second lens receives ... | 03/10/2009 |
| 7443517 | Measuring instrument and laser beam machine for wafer A measuring instrument for a wafer for measuring the thickness of a wafer held on a chuck table using a laser beam includes a condenser for condensing and irradiating the laser beam on the wafer held on the chuck table, a light reception unit for receiving reflected... | 10/28/2008 |
| 7414739 | Calibration system for sawmill scanning systems The method for calibration of a single point laser system used in a measuring system for wood boards in a sawmill includes the steps of storing two orthogonal dimensions of a calibration bar, the values of the two dimensions being different from each other; placing ... | 08/19/2008 |
| 7411205 | In-stack sheet thickness measuring system A system and method of estimating the thickness of the individual sheets in a stack of sheets in a print media sheet input stacking tray before printing with an electronic sensing system for electronically detecting individual sheet edges in the stack thereof and a ... | 08/12/2008 |
| 7409313 | Method and apparatus for nondestructive evaluation of insulative coating An apparatus is provided for determining thickness and thermal conductivity for an insulative coating disposed on a substrate in an object. The apparatus includes a source for rapidly applying a multiple optical pulses on a surface of the object, where the surface c... | 08/05/2008 |
| 7402826 | System and method for non-destructively determining thickness and uniformity of anti-tamper coatings An improved system and method are disclosed for non-destructively determining the thickness and uniformity of an anti-tamper coating on a sensitive electronic part, such as, for example, an integrated circuit, multi-chip module, or other type of electronic device, c... | 07/22/2008 |
| 7401778 | Multi-sheet feed detection system A multi-sheet feed detection system comprises a photosensor configured to receive light emitted in a non-visible spectrum by a transmitter through at least one sheet, and a detection module configured to detect a multi-sheet feed condition based on an amount of non-... | 07/22/2008 |
| 7375829 | Method for inspecting an insulator with a library of optic images A method for inspecting an insulator with a library of optic images is disclosed. The method for inspecting an insulating layer according to the present invention, comprises the steps of collecting standard data for thickness of the insulating layer; collecting stan... | 05/20/2008 |
| 7369255 | Apparatus and method for capacitive measurement of materials Method for measuring thicknesses of a film, a foil or a material layer with a measuring head which is spaced away from the film and with which a capacitive thickness measurement is performed, in which an optical distance measurement is performed with a distance meas... | 05/06/2008 |
| 7361896 | Scanning electron microscope and a method for adjusting a focal point of an electron beam of said scanning electron microscope In a scanning electron microscope, scanning region is set to be narrow, upon which focused electron beam is scanned, so that the focused electron beam can be irradiated at the almost same position by plural numbers of times, irrespective of movement of the stage or ... | 04/22/2008 |
| 7362435 | Method of determining initial thickness value for sample surface layer, and use of splines for fitting ellipsometric data A method of determining a starting value for thickness of the most influential layer in a mathematical model of a sample for use in a data fitting routine, supplemented by the use of ordinary or B-spline polynomials to represent at least one of the real and imaginar... | 04/22/2008 |
| 7355729 | Apparatus and method for measuring a thickness of a substrate An apparatus and method of measuring the thickness of a substrate. A first light is reflected from a standard sample having a known thickness. The light is concentrated through the light-focusing lens. The first light is converted into a first electrical signal by a... | 04/08/2008 |
| 7354208 | Paper thickness compensation in a printer In a printer, page thickness is compensated for by measuring a displacement between a printhead and a print media support surface. A sensor flag engages a surface of said print media and provides an indication to an optical sensor of the displacement. The print medi... | 04/08/2008 |
| 7353141 | Method and system for monitoring component consumption A method for monitoring consumption of a component, including the steps of emitting a radiation beam onto a first area of the component and detecting a portion of the radiation beam that is refracted by the component. A radiation level signal is generated based at l... | 04/01/2008 |
| 7329549 | Monitoring method of processing state and processing unit The present invention is a monitoring method of monitoring a change of a processing state of an object to be processed when a predetermined process is conducted to the object to be processed by using a processing unit. The method includes: a step of respectively set... | 02/12/2008 |
| 7321129 | Deposition system and film thickness monitoring device thereof A deposition system and film thickness monitoring device thereof. The film thickness monitoring device for monitoring thickness of a thin film coated on an optical substrate includes a laser light source, a retro-reflector, and a light receiver. The laser light sour... | 01/22/2008 |
| 7302830 | Flow detectors having mechanical oscillators, and use thereof in flow characterization systems An improved system, device and method for characterizing a fluid sample that includes injecting a fluid sample into a mobile phase of a flow characterization system, and detecting a property of the fluid sample or of a component thereof with a flow detector comprisi... | 12/04/2007 |
| 7301149 | Apparatus and method for determining a thickness of a deposited material Method and apparatus for determining a thickness of a deposited material. Energy is passed through the deposited material, wherein some of the energy is transmitted. The transmitted energy is received, and the received energy is used to determine a thickness of the ... | 11/27/2007 |
| 7289233 | Optical film measuring device Light emitted from a light source (22) is used through a light projection optical system (23) to perform coaxial down-emission lighting on a measurement target (36). Light reflected by the measurement target (36) is formed on a photo-dete... | 10/30/2007 |
| 7277190 | Measurement system with an optical measurement arrangement The invention concerns an optical measurement arrangement, in particular for the examination of layer systems, and can include an illumination device having at least one illumination source for delivering a measurement light beam and coupling the measurement light b... | 10/02/2007 |
| 7276719 | Device for a goniometric examination of the optical properties of surfaces A device for examining the optical properties of surfaces having at least one first radiation device emitting radiation at least at one first predetermined spatial angle to a surface to be examined, at least one first detector device for capturing the radiation emit... | 10/02/2007 |
| 7252575 | Polishing state monitoring apparatus and polishing apparatus and method A polishing state monitoring apparatus measures characteristic values of a surface, being polished, of a workpiece to determine the timing of a polishing end point. The polishing state monitoring apparatus includes a light-emitting unit for applying light from a lig... | 08/07/2007 |
| 7253901 | Laser-based cleaning device for film analysis tool A system for analyzing a thin film uses an energy beam, such as a laser beam, to remove a portion of a contaminant layer formed on the thin film surface. This cleaning operation removes only enough of the contaminant layer to allow analysis of the underlying thin fi... | 08/07/2007 |
| 7253427 | Automatic object plane detection system and method An object plane detection system comprises a light source adapted to illuminate a media object to generate an image area on a photosensitive sensor. The system also comprises a detection module adapted to determine a location of an object plane corresponding to the ... | 08/07/2007 |
| 7248372 | Technologies for measuring thickness of an optical disc The disclosure includes a system, device, apparatus and programmed medium of measuring thickness of an optical disc by using an interference effect of the optical disc layer. Such a system can include: a spectroscope to separate light, reflected from a surface of an... | 07/24/2007 |
| 7235197 | Method for process control of mechanical embossing texturing Disclosed is both a method and apparatus for controlling and measuring an embossed texture on a decorative article. The embossed textured article includes both peaks and valleys that are measured and quantified to determine a profile of the textured article. Typical... | 06/26/2007 |
| 7233878 | Method and system for monitoring component consumption A method for monitoring consumption of a component, including the steps of emitting a radiation beam onto a first area of the component and detecting a portion of the radiation beam that is refracted by the component. A radiation level signal is generated based at l... | 06/19/2007 |
| 7227637 | Measurement system with separate optimized beam paths The subject invention relates to a broadband optical metrology system that segregates the broadband radiation into multiple sub-bands to improve overall performance. Each sub-band includes only a fraction of the original bandwidth. The optical path—the light path ... | 06/05/2007 |
| 7215855 | Cones and cylinders of laser light A cone-of-light projection system projects a shell of laser light (or other electromagnetic radiation) using a fiber-optic bundle. Incidence optics directs a laser beam to be incident to the fiber-optic bundle at a predetermined angle of incidence, resulting in the ... | 05/08/2007 |
| 7208965 | Planar view TEM sample preparation from circuit layer structures A method of preparing a planar view TEM sample of a planar portion of a circuit layer structure formed on a substrate. The method includes polishing the substrate circuit layer structure until a cross-sectional polishing face has substantially reached a first side f... | 04/24/2007 |
| 7205554 | Method and apparatus for processing a micro sample An object of the invention is to realize a method and an apparatus for processing and observing a minute sample which can observe a section of a wafer in horizontal to vertical directions with high resolution, high accuracy and high throughput without splitting any ... | 04/17/2007 |
| 7205560 | Method and apparatus for processing a micro sample An object of the invention is to realize a method and an apparatus for processing and observing a minute sample which can observe a section of a wafer in horizontal to vertical directions with high resolution, high accuracy and high throughput without splitting any ... | 04/17/2007 |
| 7202951 | Laser-based cleaning device for film analysis tool A system for analyzing a thin film uses an energy beam, such as a laser beam, to remove a portion of a contaminant layer formed on the thin film surface. This cleaning operation removes only enough of the contaminant layer to allow analysis of the underlying thin fi... | 04/10/2007 |
| 7198265 | Imaging apparatus including a movable media sensor An imaging apparatus includes a printing mechanism having a media path. A print media source is provided for supplying a sheet of print media to the printing mechanism. A drive unit is provided, with a drive shaft coupled to the drive unit. A media sensor device is ... | 04/03/2007 |
| 7196800 | Semiconductor die analysis as a function of optical reflections from the die A light reflected from a semiconductor die is used for enhanced control of substrate removal from the die. According to an example embodiment of the present invention, light reflected from a semiconductor die as it is undergoing substrate removal is used to detect t... | 03/27/2007 |
| 7182338 | Apparatus for discriminating sheet material The present invention provides an apparatus for discriminating the kind of a sheet material, comprising: a substrate having a recessed portion; a press member situated so that a sheet material can be deflected using the recessed portion; a support member that is def... | 02/27/2007 |
| 7182976 | Process for forming a thin film and apparatus therefor A process for forming a thin film is described that enables automatic formation of thin films having constant optical properties reliably and in large quantities with excellent reproducibility suitable for mass production. An apparatus for performing the process is ... | 02/27/2007 |
| 7173270 | Detector system for detecting a height of a particle, and lithographic apparatus and device manufacturing method including the same. A lithographic apparatus transfers a pattern from a patterning device onto a substrate and includes a projection system to project a patterned radiation beam onto the substrate; a controllable actuator to adjust a distance between the projection system and the subst... | 02/06/2007 |
| 7173233 | Counter A lite-counting apparatus counts lites in a longitudinal array. During a traversal by the apparatus of a peripheral portion of the array, a beam of radiation is passed from at least one source to at least one detector. Based upon changes in the relative path taken b... | 02/06/2007 |
