Did You Know...
...that to encourage use of his new invention, the shopping cart, market owner Sylvan Goldman hired fake shoppers to push the carts around his store in Oklahoma City? Seems his customers were reluctant to give up their hand-carried baskets.
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| Number | Title | Issue Date |
| 7755072 | System and method for three-dimensional location of inclusions in a gemstone The present invention presents a non-destructive method and means of obtaining either the inner portion or the outer contour of a two-dimensional or three-dimensional model of the outer contours of a gemstone. The method comprising the steps of placing the gemstone ... | 07/13/2010 |
| 7427747 | Optical image pickup apparatus for imaging living body tissue A control portion of an optical image pickup apparatus includes a scan driver, a lock-in amplifier, and an A/D converter. The scan driver outputs a predetermined drive signal to a Y-scanning mirror and an X-scanning mirror and scans the Y-scanning mirror and the X-s... | 09/23/2008 |
| 7414732 | Method and device for determining the 3D profile of an object The invention relates to a method for determining the 3D profile of an object. In order to improve a method of this type, several sections of the object (5) are measured. During at least one measuring operation, at least one reference object (4) is mea... | 08/19/2008 |
| 7379194 | Method and system for determining mail piece dimensions using swept laser beam A method of measuring a mailpiece includes deflecting a laser beam through an arc, determining an angle at which the laser beam is currently directed, and calculating a dimension of the mailpiece based at least in part on the determined angle. ... | 05/27/2008 |
| 7376261 | Surface scan measuring device and method of forming compensation table for scanning probe A measuring system includes a coordinate measuring machine for driving a scanning probe and a host computer. The host computer includes a compensation table (53) and a profile analysis unit (54). The compensation table stores, as compensation data, com... | 05/20/2008 |
| 7372565 | Spectrometer measurement of diffracting structures A normal incidence reflectometer includes a rotatable analyzer/polarizer for measurement of a diffracting structure. Relative rotation of the analyzer/polarizer with respect to the diffracting structure permits analysis of the diffracted radiation at multiple polari... | 05/13/2008 |
| 7373332 | Methods and apparatus for detecting temporal process variation and for managing and predicting performance of automatic classifiers Techniques for detecting temporal process variation and for managing and predicting performance of automatic classifiers applied to such processes using performance estimates based on temporal ordering of the samples are presented. ... | 05/13/2008 |
| 7372051 | Electric charged particle beam microscopy, electric charged particle beam microscope, critical dimension measurement and critical dimension measurement system Magnification errors are reduced in the required range of magnification in electric charged particle beam application apparatuses and critical dimension measurement instruments. To achieve this, a first image, whose magnification for the specimen is actually measure... | 05/13/2008 |
| 7365862 | Methods and apparatus for inspecting an object A method for generating a mask for use with a light measurement system that includes a light source for projecting light onto an object, and an imaging sensor for receiving light reflected from the object. The method includes determining a profile of the object to b... | 04/29/2008 |
| 7359042 | Inspection system for limited access spaces A limited access space inspection system comprising: an imaging device for imaging a region in the limited access space, a mounting for mounting the imaging device to scan about the limited access space and a scanning control unit, associated with the imaging device... | 04/15/2008 |
| 7359545 | Method and system to compensate for lamp intensity differences in a photolithographic inspection tool An after develop inspection tool considers tool-to-tool variability when determining confidence score for wafers under inspection. A golden wafer is used to calculate a RGB signature as well as the slope of the individual RGB curves for different lamp intensities. T... | 04/15/2008 |
| 7352892 | System and method for shape reconstruction from optical images Reconstructing the shape of the surface of an object in greater than two dimensions is performed using a noise-tolerant reconstruction process and/or a multi-resolution reconstruction process. The noise-tolerant reconstruction process can be a Bayesian reconstructio... | 04/01/2008 |
| 7346998 | Foot measuring method There is provided a foot measuring system that includes a support surface for a foot, a plurality of movable measurement structures, an inflatable diaphragm for contacting the first end of each structure and forcing a movement of each structure from an initial posit... | 03/25/2008 |
| 7342218 | Methods and systems for optical inspection of surfaces based on laser screening A method for imaging and an imaging system, the system includes the steps of: (i) scanning a beam of coherent radiation over a surface along a scan axis; (ii) focusing the beam to a spot on the surface, so that the spot has a predetermined dimension along the scan a... | 03/11/2008 |
| 7336374 | Methods and apparatus for generating a mask A method for generating a mask for use with a light measurement system that includes a light source for projecting light onto a surface of an object, and an imaging system for receiving light reflected from the surface of the object. The method includes determining ... | 02/26/2008 |
| 7333213 | Confocal microscopy An improved confocal microscope system is provided which images sections of tissue utilizing heterodyne detection. The system has a synthesized light source for producing a single beam of light of multiple, different wavelengths using multiple laser sources. The bea... | 02/19/2008 |
| 7330279 | Model and parameter selection for optical metrology A profile model for use in optical metrology of structures in a wafer is selected, the profile model having a set of geometric parameters associated with the dimensions of the structure. A set of optimization parameters is selected for the profile model using one or... | 02/12/2008 |
| 7330577 | Three-dimensional modeling of the oral cavity by projecting a two-dimensional array of random patterns A method for creating three-dimensional models of intra-oral scenes and features. The intra-oral scene is illuminated by a two-dimensional array of structured illumination points, with anti-aliasing achieved by using stored two-dimensional patterns of pixels for ant... | 02/12/2008 |
| 7324218 | Method and device for distance measurement The present invention relates to a device (10) for distance measurement, with at least one transmitting branch (14) with a transmission source (22, 24) for a measurement signal for emitting a modulated measuring beam (16, 26, 36) in the d... | 01/29/2008 |
| 7319528 | Surface texture measuring instrument A surface texture measuring instrument provided with a near-field measuring unit (30) including a near-field probe (33) that forms a near-field light at a tip end thereof when a laser beam is irradiated, a laser source (35) that generates the la... | 01/15/2008 |
| 7313948 | Real time detection of loss of cantilever sensing loss An approach to detect when a cantilever loses interaction with a sample, thereby detecting when a portion of an image obtained using a cantilever is spurious is presented. An observer based estimation of cantilever deflection is compared to the cantilever deflection... | 01/01/2008 |
| 7312879 | Distance determination in a scanned beam image capture device Methods, systems, and devices can determine spatial relationships between a probe and a target surface. Specular reflections from the target surface vary dramatically with small changes in angle between the scanning beam and the target surface, and as the geometry o... | 12/25/2007 |
| 7310140 | Method and apparatus for inspecting a wafer surface In a method and an apparatus for inspecting a wafer surface, a wafer is loaded into a chamber. An incident light including a first light for sensing a vertical position of the wafer and a second light for inspecting the wafer surface is irradiated onto the wafer. Th... | 12/18/2007 |
| 7310154 | Shape measurement system An image capturing apparatus for capturing an image of an object. The image capturing apparatus includes a correspondence detector which detects a correspondence of characteristic points of an object based upon captured images of the object. A motion detector detect... | 12/18/2007 |
| 7301133 | Tracking auto focus system A tracking auto-focus system maintains a microscope pointed at a TFT array continuously in focus so as to eliminate the auto-focusing time that would otherwise be required. The tracking auto-focus system includes, in part, a microscope Z actuator, an auto-focus sens... | 11/27/2007 |
| 7294822 | Method and apparatus to communicate with and individually locate multiple remote devices on a two-dimensional surface A method and apparatus is provided by the invention whereby a base station communicates with and determines the position of multiple remote devices on a two-dimensional surface. In one embodiment the base station employs a single channel radio transmitter, an infrar... | 11/13/2007 |
| 7286246 | Method and apparatus for non-contact three-dimensional surface measurement A non-contact three-dimensional surface measurement method is provided in which a grating pattern projected onto an object being measured, while the phase of the pattern is being shifted, is observed in a different direction from a projection direction to analyze th... | 10/23/2007 |
| 7280227 | Device, method and system for measuring the distribution of selected properties in a material A device for measuring a distribution of selected properties of a material. The device includes an emitter configured to emit electromagnetic radiation at at least a first and second frequency in a selected frequency range through the material, at least one sensor c... | 10/09/2007 |
| 7274472 | Resolution enhanced optical metrology A resolution enhanced optical metrology system to examine a structure formed on a semiconductor wafer includes a source configured to direct an incident beam at the structure through a coupling element. The coupling element is disposed between the source and the str... | 09/25/2007 |
| 7274469 | Method and apparatus for calibrating laser 3D digitizing sensor A method for calibrating a laser three-dimensional digitizing sensor. First, a three-dimensional coordinator X-Y-Z is defined and a calibrating surface is provided. Second, a first mapping table of a two-dimensional digital image to the Z axis is established by tran... | 09/25/2007 |
| 7271953 | Confocal microscope A confocal microscope includes a light source that emits illuminating light beam, an illuminating optical system that irradiates the illuminating light beam onto a specimen, a condensing optical system that condenses the light reflected off the specimen and a light ... | 09/18/2007 |
| 7271902 | Generic interface for an optical metrology system An optical metrology system includes a photometric device with a source configured to generate and direct light onto a structure, and a detector configured to detect light diffracted from the structure and to convert the detected light into a measured diffraction si... | 09/18/2007 |
| 7259871 | Apparatus and method for rapid and precise scanning of three-dimensional occlusal profile of dental cast This invention relates to an apparatus and a method for rapid and precise scanning of the three-dimensional (3-D) profile of a dental cast. Disclosed is a measurement apparatus comprising two symmetrically arranged optical projection units and plural image capturing... | 08/21/2007 |
| 7247825 | Method and apparatus for scanning a specimen using an optical imaging system The invention is based on an apparatus and a method for scanning specimens (1) using an optical imaging system (3) and a scanning stage (2), images of the specimen (1) being acquired by means of a camera (4), and/or measurements on... | 07/24/2007 |
| 7248402 | Surgical microscopy system The present invention relates to a surgical microscopy system, comprising a surgical microscope, a stand comprising a base and a plurality of pivotally connected arms, the surgical microscope being mounted to one of the arms, wherein the pivotally connected arms are... | 07/24/2007 |
| 7245387 | Three-dimensional measuring instrument For measuring the three-dimensional shape of an object of measurement using a phase shift method, a three-dimensional shortening the measurement time. A printed state inspection device 1 includes a printed circuit board K printed with cream solder H, an illum... | 07/17/2007 |
| 7236256 | Range finder and method A linearly polarized light projector system projects linearly polarized light onto a subject. While polarizing filters are used for removing light specular-reflected on the subject, a reflected image after removal of the specular-reflected light is captured by image... | 06/26/2007 |
| 7236257 | Jump takeoff position indicator system A jump takeoff position indicator system that discloses the point of takeoff of a long jump or triple jump in athletic competition or practice when an athlete's foot comes in contact with a takeoff board when beginning a jump. A plurality of light beams are emitted ... | 06/26/2007 |
| 7234469 | Surface topography method for determining effect of a botulinum toxin upon a muscle A skin topographical method for quantifying pharmacodynamic parameters of a paralytic effect of a Clostridial toxin, such as a botulinum toxin upon a muscle, such as a frontalis muscle. ... | 06/26/2007 |
| 7231274 | Method of programming a tire monitoring system A process for identifying TPMS electronic wheel sensors on a production line is disclosed. The line of identification data is transmitted in digital bit stream between the electronic wheel sensor and the production line database. Data from the electronic wheel senso... | 06/12/2007 |
