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| Number | Title | Issue Date |
| 7439534 | Reflected light intensity ratio measuring device, device for measuring light energy absorption ratio and heat treatment apparatus A measuring optical system for emitting and receiving light is fixedly installed in a ceiling portion of a measuring device, and a wafer holding part for supporting a semiconductor wafer is provided in a bottom portion of the measuring device. A support table is hor... | 10/21/2008 |
| 7423269 | Automated feature analysis with off-axis tilting One embodiment relates to a method of automated microalignment using off-axis beam tilting. Image data is collected from a region of interest on a substrate at multiple beam tilts. Potential edges of a feature to be identified in the region are determined, and compu... | 09/09/2008 |
| 7385215 | Sensor elements for supercavitating vehicles Sensing elements that quickly and accurately determine if a liquid or gas is present around the sensing elements are disclosed. These sensing elements find particular application in identifying the location of the cavity wall in which a supercavitating vehicle is op... | 06/10/2008 |
| 7385214 | System and method for correcting systematic error of, and calibrating for, tilt angle of surface topology sensor head having plurality of distance sensors The invention relates to a measuring arrangement comprising a sensor head (13) that can be displaced over a surface (11) at a distance therefrom in a scanning direction (R), a plurality of distance sensors which are suitable for distance measurement an... | 06/10/2008 |
| 7341140 | Off-loading conveyor of produce An off-loading conveyor of produce having utility in the discrimination and separation of watermelons includes a support structure defining a conveying path, an endless flexible element mounted on the support structure to extend and to move along the conveying path ... | 03/11/2008 |
| 7321117 | Optical particulate sensor in oil quality detection An oil quality sensor apparatus includes a housing that includes an oil flow path through which oil flows through the housing. One or more photo-detectors can be provided in association and a plurality of light-emitting devices located within the housing and proxima... | 01/22/2008 |
| 7245386 | Object measuring device and associated methods A device for measuring one or more dimensions of an object. One or more light emitters direct light towards the object. At least one light blocking element, arranged between the light emitters and the object, blocks all but a bundle of light to form a light edge on ... | 07/17/2007 |
| 7238543 | Methods for marking a bare semiconductor die including applying a tape having energy-markable properties A method used for marking a semiconductor wafer or device. The method and apparatus have particular application to wafers or devices which have been subjected to a thinning process, including backgrinding in particular. The present method comprises reducing the cros... | 07/03/2007 |
| 7229144 | Method for aligning multiple nozzle members in a solid free form fabrication tool A method for aligning multiple nozzle members in a solid free form build unit is disclosed. A geometric test shape having at least one investigational topographic region projecting outward from a central base is formed and analyzed for at least one physical characte... | 06/12/2007 |
| 7227165 | System and method for classification of timber The present invention provides a system and a method to grade a piece of wood and simultaneously to classify this piece of wood by allowing an examination of four longitudinal faces thereof, so as to determine optimal specifications for a subsequent use thereof such... | 06/05/2007 |
| 7206654 | Digitally active 3-D object creation system A three dimensional object creation system that prints objects layer by layer, the system including a plurality of printheads, the system printing at least part of each of multiple layers simultaneously. ... | 04/17/2007 |
| 7145163 | Apparatus for detecting light-transmissive sheet-like body Illuminating light emitted from a light source is led via a condenser lens, an optical fiber, a half-silvered mirror, and a condenser lens to a reflector. The reflector reflects the illuminating light to a CCD device through a telecentric optical system which compri... | 12/05/2006 |
| 7102786 | Image reading apparatus and processing apparatus In a sky shot, when a closing and opening detection unit detects the opening of a document cover, contour detecting means detects as a probable edge point a pixel thought to be a document edge point, a contour correction unit determines whether the probable edge poi... | 09/05/2006 |
| 7094618 | Methods for marking a packaged semiconductor die including applying tape and subsequently marking the tape The present invention provides a method and apparatus for marking a semiconductor wafer or device. The method and apparatus have particular application to wafers or devices which have been subjected to a thinning process, including backgrinding in particular. The pr... | 08/22/2006 |
| 7083837 | Registered microperforated films for modified/controlled atmosphere packaging A microperforated packaging material for use in modifying or controlling the flow of oxygen and carbon dioxide into and/out of a fresh produce container, where the microperforations are specifically tailored in size, location and number for the specific produce. The... | 08/01/2006 |
| 7046377 | Method for determining corresponding points in three-dimensional measurement The invention relates to connection of corresponding points measured by a computer vision system. The points are indicated by an illuminator (LASER), by means of which several points can be illuminated on the surface of the object at the same time. A camera system (... | 05/16/2006 |
| 7039228 | System and method for three-dimensional surface inspection An optical inspection system and method for inspecting a component on a printed circuit board (PCB) which determines three-dimensional information in a single scan. A first visual light source illuminates the PCB surface and component with a green light while a seco... | 05/02/2006 |
| 7038767 | Three-dimensional micropattern profile measuring system and method A light beam is emitted to a test pattern place formed in the scribe area on the wafer for height measurement, an electron beam is emitted to the test pattern place for width and contrast measurement and their correlations are stored. The three-dimensional profile o... | 05/02/2006 |
| 7034272 | Method and apparatus for evaluating integrated circuit packages having three dimensional features The present invention provides for methods and an apparatus for evaluating objects having three dimensional features. One method involves using both two dimensional data sets to improve the processing of three dimensional data sets. The two dimensional data set can ... | 04/25/2006 |
| 7007950 | Paper feeding apparatus for image forming apparatus and controlling method thereof An apparatus and method feed paper in an image forming apparatus. The paper feeding apparatus in an image forming apparatus includes: a pick-up roller rotated by a pick-up motor, to pick up a paper; a driving roller and a feeding roller rotated respectively by a lin... | 03/07/2006 |
| 6994432 | Early transparency detection routine for inkjet printing A system of classifying incoming media entering an inkjet printing mechanism identifies transparency media without requiring any special manufacturer markings. The media is first optically scanned using a blue-violet light at an initial intensity to obtain both diff... | 02/07/2006 |
| 6995837 | Optical inspection system and method of use In a preferred embodiment, an optical inspection machine for fasteners, including: an inspection station; a main dial rotatable through the inspection station and carrying thereon a plurality of fasteners; a reflective surface surrounding each of the plurality of fa... | 02/07/2006 |
| 6996291 | Systems and methods for correlating images in an image correlation system with reduced computational loads After one or both of a pair of images are obtained, an auto-correlation function for one of those images is generated to determine a smear amount and possibly a smear direction. The smear amount and direction are used to identify potential locations of a peak portio... | 02/07/2006 |
| 6943363 | Apparatus for detecting light-transmissive sheet-like body Illuminating light emitted from a light source is led via a condenser lens, an optical fiber, a half-silvered mirror, and a condenser lens to a reflector. The reflector reflects the illuminating light to a CCD device through a telecentric optical system which compri... | 09/13/2005 |
| 6937349 | Systems and methods for absolute positioning using repeated quasi-random pattern An absolute 2D position-sensing device is usable to measure the position of a first element with respect to a second element. A 2D absolute scale includes an integrated 2D absolute scale pattern extending over the 2D scale area along each measuring axis of the scale... | 08/30/2005 |
| 6904671 | Integrated circuit chip handling apparatus and method The present invention provides for an apparatus and method for handling integrated circuit (IC) chips such as thin small outline package (TSOP) IC chips. Embodiments of the invention are directed toward removal of TSOPs from device under test (DUT) boards. By use of... | 06/14/2005 |
| 6905645 | Apparatus, systems and methods for use in three-dimensional printing Apparatus, systems and methods for use in three-dimensional printing are shown and described. Various embodiments of the invention allow for more precise and controlled delivery of heat to achieve interlayer drying; isolation of the working region from the outside f... | 06/14/2005 |
| 6885466 | Method for measuring thickness of oxide film In a process of manufacturing a semiconductor device, after a gate oxide film is formed, the thickness of the gate oxide film is measured by measuring an exposure period defined from a time at which the oxide film is formed to a time at which the thickness of the ox... | 04/26/2005 |
| 6875993 | Systems and methods for optically detecting and identifying objects in an environment Laser optical sensing systems and methods for detecting object characteristics are disclosed. The system includes a laser source with at least two emission apertures from which laser signals are emitted. The system also includes at least one detector, which is opera... | 04/05/2005 |
| 6768544 | Method and a system for detecting impurities in a transparent material In a method for detecting impurities in a transparent material, the material (2) is scanned line by line and the light transmission through the material is measured and compared with a reference value. If the transmission value at one point of the material is... | 07/27/2004 |
| 6759669 | Multi-point distance measurement device A measurement device includes a laser or other light source for producing a light beam, and optics that split the light beam into a plurality of differentiable beam portions, such as a plurality of polarized beams. The optics also direct the differentiable beam port... | 07/06/2004 |
| 6655005 | Magnetic head positioning apparatus using boundary line detecting method A magnetic head positioning apparatus for adjusting the position of a head member relative to its support member by determining the boundary lines for the edge portion of the head body and the center of the pivot in the support member. Luminance variation... | 12/02/2003 |
| 6640716 | Imaging print media A method and apparatus for imaging material. A section of a medium is photographed with a first camera having a first field of view. The medium is advanced along a feed direction and the section is photographed with a second camera having a second field o... | 11/04/2003 |
| 6492651 | Surface scanning system for selective deposition modeling A closed loop selective deposition modeling apparatus having a surface scanning system for actively monitoring the surface height of a layer of a three-dimensional object as it is being built by selectively dispensing a build material. The surface scannin... | 12/10/2002 |
| 6477265 | System to position defect location on production wafers A system and method for detecting defects in integrated circuit wafers related to photolithographic processing of the wafers. The system has an image processor, or image computer, and an image memory, which has image data for production wafer types stored... | 11/05/2002 |
| 6452150 | Cassette measuring system Apparatus is provided for on-line monitoring of objects such as cassettes and similar devices used for handling semiconductor wafers to determine whether the objects remain within relevant dimensional tolerances during wafer processing. The apparatus incl... | 09/17/2002 |
| 6437355 | Apparatus for judging whether bump height is proper or not An apparatus to check a height of a bump includes a measuring device and a determining device. The measuring device is configured to measure a distance between an image position in an image of a reference object reflected in a surface of the bump and a pr... | 08/20/2002 |
| 6285034 | Inspection system for flanged bolts An inspection system for evaluating rotationally asymmetric workpieces for conformance to configuration criteria having a track for causing the workpieces to translate through a test section, the test section including a plurality of electromagnetic energ... | 09/04/2001 |
| 6049625 | Method of and an apparatus for 3-dimensional structure estimation A method of 3-dimensional structure estimation of the invention, making use of a plurality of stereo-pictures, repeats, for each pixel of a first picture, a step of extracting corresponding small regions (4) corresponding to the concerning pixel according... | 04/11/2000 |
| 6026172 | System and method for zoom lens calibration and method using same Using marks of known dimensions and size, and spacing, a zoom lens may be calibrated in either or both the X and Y spatial directions. A system comprising an image capture device, positioning means, position encoder means, operator interface, and processi... | 02/15/2000 |
