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Apparatus for Simulating a High Five
A self-righting hand-arm configuration which is adapted to pivot when struck by a user, thereby simulating a "high five."
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| Number | Title | Issue Date |
| 8030632 | Controlling angle of incidence of multiple-beam optical metrology tools Provided is a method of controlling multiple beams directed to a structure in a workpiece, the method comprising generating a first illumination beam with a first light source and a second illumination beam with a second light source, projecting the first and second... | 10/04/2011 |
| 8030631 | Apparatus for controlling angle of incidence of multiple illumination beams Provided is an apparatus for projecting multiple beams to a structure on a workpiece comprising a first light source generating a first illumination beam and a second light source generating a second illumination beam, an illumination primary mirror configured to re... | 10/04/2011 |
| 7601978 | Fabric wrinkle evaluation Fabric wrinkles are automatically evaluated using a reliable, accurate, affordable, and efficient system. Two algorithms are used, the facet model algorithm and the plane-cutting algorithm, to extract features for evaluating wrinkles in fabrics. These algorithms eli... | 10/13/2009 |
| 7408570 | Web inspection system A web inspection system provides detection of web flaws along the machine direction and cross direction of a web. The detectable percent contrast between good web material and bad web material in one embodiment approaches noise level. The web inspection system utili... | 08/05/2008 |
| 7375360 | Light device of arranging thin film inspection sensor array, and method and apparatus for arranging sensor array using the same There is disclosed a light device for arranging a thin film pattern sensor array where a sensor array used for inspecting a thin film pattern is made to be arranged without a separate correction pattern film in accordance with an inspection subject. In the li... | 05/20/2008 |
| 7365310 | Increased depth of field for high resolution imaging for a matrix-based ion source The invention provides a method of producing an in-focus image of an area on a sample plate for an ion source, e.g., a matrix-based ion source or any other type of ion source that employs a sample plate onto which samples are deposited. The method generally includes... | 04/29/2008 |
| 7330583 | Integrated visual imaging and electronic sensing inspection systems Integrated inspection and test systems for liquid crystal display (LCD) active plates. The integrated inspection and test systems may combine visual imaging inspection and an electronic sensing such as voltage imaging, electron beam sensing or charge sensing, in whi... | 02/12/2008 |
| 7326901 | High throughput multi beam system and method A system and method for inspecting an article, the system includes a spatial filter that is shaped such as to direct output beams towards predefined locations and an optical beam directing entity, for directing the multiple output beams toward multiple detector arra... | 02/05/2008 |
| 7321108 | Dynamic focusing method and apparatus A method and apparatus for dynamically focusing an imaging mechanism on a moving target surface having a variable geometry is herein disclosed. Apparatus for focusing an imaging mechanism may include an objective, a prism, or another optical device that forms part o... | 01/22/2008 |
| 7283235 | Optical device and inspection module Optical device for representing a central image (10) of an object (1) and at least one lateral image (11, 12, 13, 14) of the same object (1), with the length of the real optical path of said central image (10) being different from ... | 10/16/2007 |
| 7280199 | System for detecting anomalies and/or features of a surface A cylindrical mirror or lens is used to focus an input collimated beam of light onto a line on the surface to be inspected, where the line is substantially in the plane of incidence of the focused beam. An image of the beam is projected onto an array of charge-coupl... | 10/09/2007 |
| 7218771 | Cam reference for inspection of contour images This invention discloses an electrical circuit inspection system including an optical subsystem for optically inspecting an electrical circuit and providing an inspection output identifying more than two different types of regions and an analysis subsystem for analy... | 05/15/2007 |
| 7202898 | Self gating photosurface A semiconductor surface is provided comprising a plurality of light sensitive pixels wherein each pixel of the plurality of pixels comprises an electronic circuit formed on or in the semiconductor surface, the circuit comprising: a photosensor that generates a signa... | 04/10/2007 |
| 7189226 | Coaxial illuminated laser endoscopic probe and active numerical aperture control A coaxial illuminated laser endoscopic probe and active numerical aperture control apparatus and method of use, succinctly known as an illumination and laser source, capable of selectively providing illumination light and laser treatment light through a single optic... | 03/13/2007 |
| 7166856 | Apparatus and method to inspect display panels An apparatus and method to inspect a display panel that can correctly detect a defect of the display panel itself. In the method of inspecting the display panel, a first image is captured from the display panel in a state in which no pattern is applied to the displa... | 01/23/2007 |
| 7154596 | Method and apparatus for backlighting and imaging multiple views of isolated features of an object Manufacturing lines include inspection systems for monitoring the quality of parts produced. Manufacturing lines for making semiconductor devices generally inspect each fabricated part. The information obtained is used to fix manufacturing problems in the semiconduc... | 12/26/2006 |
| 7154527 | Optical device Stereoscopic device including at least two apertures, each including a light valve, a multi wavelength light sensor array and a controllable multi wavelength illumination unit, producing at least two alternating beams of light, each of the beams of light is characte... | 12/26/2006 |
| 7113313 | Dome-shaped apparatus for inspecting a component or a printed circuit board device An apparatus for inspecting a printed circuit board device, the device including at least one component mounted on a circuit board, the apparatus comprising an object carrier for carrying the printed circuit board device, imaging means for imaging along an optical a... | 09/26/2006 |
| 7101461 | Method and apparatus for imaging a paper web A system and process for measuring paper formation characteristics in real time is disclosed. The system comprises apparatus used in a papermaking process, and includes a rotating forming fabric having an upper and lower surface. A paper slurry is deposited upon the... | 09/05/2006 |
| 7092105 | Method and apparatus for measuring the three-dimensional surface shape of an object using color informations of light reflected by the object A method and apparatus for measuring the three-dimensional surface shape of an object using color informations of light reflected by the object. The method and apparatus for measuring the three-dimensional surface shape of the object, in which a real-time measuremen... | 08/15/2006 |
| 7081963 | Substrate holder, and use of the substrate holder in a highly accurate measuring instrument The invention discloses a substrate holder (8) that is configured to receive a substrate (20) and can be utilized to determine the thickness deviation of a substrate from the standard thickness of a specific substrate type. The substrate holder (8 | 07/25/2006 |
| 7075662 | Method for three-dimensional inspection using patterned light projection A three-dimensional inspection system and method is used to obtain information about three-dimensional articles with specular surfaces having a shape and positive or negative height by projecting a pattern of light onto the articles at an oblique angle. The system i... | 07/11/2006 |
| 7068378 | Apparatus and method for measuring amount of projection of abrasive grain on grinding tool A camera unit is arranged opposite a grinding surface. While moving the focal position of the camera unit in a direction perpendicular to the grinding surface relative to the grinding surface of the grinding tool, a control unit causes the camera unit to pickup imag... | 06/27/2006 |
| 7064828 | Pulsed spectroscopy with spatially variable polarization modulation element A metrology device, such as an ellipsometer, includes a light source that produces a pulsed electromagnetic beam, such as a flash bulb or pulsed laser, and a spatially dependent polarizing element that introduces a spatially dependent retardation in the light beam. ... | 06/20/2006 |
| 7064811 | Imaging rotating turbine blades in a gas turbine engine A system (10) for imaging a rotating turbine blade (20) includes an image projector (12) receiving a moving image of the rotating blade and projecting a movement-compensated image. The system also includes an image receptor (14) for recei... | 06/20/2006 |
| 7041997 | Device and method for optical control under diffuse illumination and observation means of crockery items or any glazed ceramic products The invention concerns a method and a device for controlling the surface of ceramic tableware products/ceramic crockery items (and the like, in accordance with the general definition provided in the introduction). The invention is characterised in that it consists, ... | 05/09/2006 |
| 7035001 | High NA system for multiple mode imaging A system for multiple mode imaging is disclosed. The catadioptric system has an NA greater than 0.65, and preferably greater than 0.9, highly corrected for low and high order monochromatic aberrations. The system employs unique illumination entrances and optics to c... | 04/25/2006 |
| 7025544 | Machine tool and lubricant jetting state detector for machine tool A machine tool capable of jetting atomized lubricant (h) forward from the tip of a cutter (17), characterized by comprising a lubricant jetting state detector for detecting the jetting state of the atomized lubricant from the tip of the cutter, the lubricant ... | 04/11/2006 |
| 7027639 | High speed optical image acquisition system with extended dynamic range A high-speed image acquisition system includes a source of light; a sensor for acquiring a plurality of images of the target; a system for determining relative movement between the source and the target; and an image processor for processing the acquired images to g... | 04/11/2006 |
| 7027934 | Apparatus and method for automated web inspection A method of inspecting a moving web. The method includes imaging a sequential portion of the continuously moving web to provide digital information. The digital information is then processed with an initial algorithm to identify any regions on the web containing ano... | 04/11/2006 |
| 7006213 | Method for inspecting the surface of a roll cylinder and device therefor In a process for the inspection of the surface of a cylindrical body and more especially that of a mill roll, at least one zone of the surface is observed by means of an inspection device having an optical axis oriented towards this zone of the surface with a view t... | 02/28/2006 |
| 7004329 | Classifying station with dynamic decision zone A classifying station for classifying a piece of wood in a wood processing plant, the classifying station including an area for an operator, a conveyor for transversely conveying pieces of wood before the area, and a console for entering classification related to a ... | 02/28/2006 |
| 6992315 | In situ combustion turbine engine airfoil inspection A system (10) for imaging a combustion turbine engine airfoil includes a camera (12) and a positioner (24). The positioner may be controlled to dispose the camera within an inner turbine casing of the engine at a first position for acquiring a f... | 01/31/2006 |
| 6970238 | System for inspecting the surfaces of objects An inspection system optically examines the surfaces of objects to detect surface errors. The system scans image strips and, consequently, a given surface rapidly and with sufficient resolution using a linescan camera and an upstream microscope by aligning the captu... | 11/29/2005 |
| 6960777 | Image-forming device sensing mechanism A sensing mechanism for an image-forming device of one embodiment of the invention is disclosed that includes a first light source, a second light source, a detector, and a controller. The first light source is positioned incident to a first side of media, whereas t... | 11/01/2005 |
| 6956963 | Imaging for a machine-vision system Manufacturing lines include inspection systems for monitoring the quality of parts produced. Manufacturing lines for making semiconductor devices generally inspect each fabricated part. The information obtained is used to fix manufacturing problems in the semiconduc... | 10/18/2005 |
| 6948825 | Illumination device and method for illuminating an object An illumination arrangement for illuminating an object to be measured, destined in particular for a coordinate measuring system or a measuring microscope, includes several light sources (18, 20, 22, 24, 26, 28, 30, 32, 34, 36, 60, 62, 64, 66, 68) going out fr... | 09/27/2005 |
| 6943874 | Apparatus for inspecting a surface The invention concerns an apparatus for inspecting a surface, in particular the surface of a mill roll, comprising a housing wherein are arranged means for transmitting and receiving a light beam, and an optical coupling device arranged on the outer surface of a fro... | 09/13/2005 |
| 6937325 | Method and apparatus for measuring eccentricity in a optical fiber A method and an apparatus for obtaining measurements of eccentricity in optical fibers, from which the spin imparted to the optical fiber can be ascertained. The method and apparatus enable eccentricity to be measured in such a way that this measurement can be utili... | 08/30/2005 |
| 6937351 | Non-destructive method of measuring the thickness of a semiconductor wafer The thickness of a semiconductor wafer is non-destructively measured using infrared (IR) microscopy. The wafer is placed on a stage. A distance between the stage and a detector is then varied so that a first image of the wafer is focused on the detector. When focuse... | 08/30/2005 |
