Quotables
"To place a man in a multi-stage rocket and project him into the controlling gravitational field of the moon where the passengers can make scientific observations, perhaps land alive, and then return to earth--all that constitutes a wild dream worthy of Jules Verne. I am bold enough to say that such a man-made voyage will never occur regardless of all future advances."
Lee deForest, American radio pioneer ; 1957
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| Number | Title | Issue Date |
| 8017927 | Apparatus, system, and method for print quality measurements using multiple adjustable sensors An apparatus includes at least one scanner. Each scanner includes a plurality of sensors, and each sensor is capable of measuring one or more characteristics associated with a portion of a substrate. The substrate has printing produced by a printing system. The appa... | 09/13/2011 |
| 7956339 | Single-sided lateral-field and phototransistor-based optoelectronic tweezers Described herein are single-sided lateral-field optoelectronic tweezers (LOET) devices which use photosensitive electrode arrays to create optically-induced dielectrophoretic forces in an electric field that is parallel to the plane of the device. In addition, photo... | 06/07/2011 |
| 7635853 | Analyzing reflection data for recording medium identification A method is proved for analyzing frequency distribution of a reflection from a surface of a body to determine a type of body surface. Initially, a plurality of data points from a sensor that senses the reflection of the body's surface are provided. A first series of... | 12/22/2009 |
| 7612355 | Optoelectronic tweezers for microparticle and cell manipulation An optical image-driven light induced dielectrophoresis (DEP) apparatus and method are described which provide for the manipulation of particles or cells with a diameter on the order of 100 μm or less. The apparatus is referred to as optoelectric tweezers (OET) and... | 11/03/2009 |
| 7465948 | Sheet-surface analyser and method of analysing a sheet-surface The present invention relates to a sheet-surface analyser (10) including illuminating means (32) for casting shadows on the sheet-surface; capturing means (36) for capturing an image of the shadows; analysing means (40) for analysing the ... | 12/16/2008 |
| 7398733 | Inline measurement and closed loop control method in printing machines Spectral, densitometric, or color measured values are detected on sheet printing materials during the printing process in a sheet-fed printing press. The measured values are determined on sheets as they are moving through the printing press and the measured values a... | 07/15/2008 |
| 7365310 | Increased depth of field for high resolution imaging for a matrix-based ion source The invention provides a method of producing an in-focus image of an area on a sample plate for an ion source, e.g., a matrix-based ion source or any other type of ion source that employs a sample plate onto which samples are deposited. The method generally includes... | 04/29/2008 |
| 7347369 | Counting process and device for planar substrates A process includes the steps of loosening a pack of piled substrates, taking a first image of the piled planar substrates, the image being made of a two-dimensional array of single image detectors arranged in lines and columns, counting the number of edges of substr... | 03/25/2008 |
| 7304291 | Information detecting device, sheet material processing apparatus equipped with information detecting device, and signal output device Disclosed is an information detecting device capable of reducing fluctuation in detection accuracy. A recording sheet P transported through a transport path comes into contact with a displacing member, and, in this state, a motor is driven to rotate a cam, and the r... | 12/04/2007 |
| 7301619 | Evaluating a multi-layered structure for voids A method and apparatus measure properties of two layers of a damascene structure (e.g. a silicon wafer during fabrication), and use the two measurements to identify a location as having voids. The two measurements may be used in any manner, e.g. compared to one anot... | 11/27/2007 |
| 7295301 | Dual stage defect region identification and defect detection method and apparatus A method and apparatus for inspecting patterned substrates, such as photomasks, for unwanted particles and features occurring on the transmissive as well as pattern defects. A transmissive substrate is illuminated by a laser through an optical system comprised of a ... | 11/13/2007 |
| 7256895 | Spherical scattering-light device for simultaneous phase and intensity measurements A far-field measurement instrument has multiple imaging lenses cut into a pentagon shape and arranged in geodesic spherical configuration with a common field of view focused on the source of the scattered light to be measured. Aspheric lenses are used to facilitate ... | 08/14/2007 |
| 7239817 | Device for identifying types of sheet materials A device for identifying types of sheet materials has a detecting unit for detecting information regarding moisture of a sheet material; external force applicator for applying an external force to the sheet material; information obtaining unit for obtaining informat... | 07/03/2007 |
| 7220978 | System and method for detecting defects in semiconductor wafers A system and method for detecting defects in semiconductor wafers in a rapid non-destructive manner. Defects in semiconductor wafers can include micropipes and screw dislocations, stress striations, planer defects, polytype inclusions, and others. When a wafer is il... | 05/22/2007 |
| 7217923 | Microstructured pattern inspection method The edges of the reticle are detected with respect to the microstructured patterns exposed by the stepper, and the shapes of the microstructured patterns at the surface and at the bottom of the photoresist are detected. The microstructured patterns are evaluated by ... | 05/15/2007 |
| 7199387 | Apparatus and method for detecting a predetermined pattern on a moving printed product An apparatus and method for detecting a relatively narrow predetermined pattern, such as a trigger mark, on a moving printed product uses a plurality of sensor elements arranged linearly in an array and a switching apparatus for selecting a properly located subset o... | 04/03/2007 |
| 7177025 | Measuring specular reflectance of a sample Apparatus (10) for measuring absolute specular reflectance of a surface of a sample (22) includes a sample holder (12), a light source (18) for transmitting an incident light beam (16) onto a surface of the sample (22) and a... | 02/13/2007 |
| 7173270 | Detector system for detecting a height of a particle, and lithographic apparatus and device manufacturing method including the same. A lithographic apparatus transfers a pattern from a patterning device onto a substrate and includes a projection system to project a patterned radiation beam onto the substrate; a controllable actuator to adjust a distance between the projection system and the subst... | 02/06/2007 |
| 7155356 | Quality and condition monitoring based on spectrum separating measurement A method of controlling the quality and/or condition of a fibre web in a process for manufacturing and/or finishing the fibre web, which includes, monitoring the fibre web with at least one optical spectrum separating measurement device, determining a quality variab... | 12/26/2006 |
| 7145654 | Method and apparatus to reduce spotsize in an optical metrology instrument The measurement spot size of small-spot reflectometers, ellipsometers, and similar instruments can be reduced by placing an optical fiber along the optical path of the instrument, such as between an illumination source and a sample or the sample and a detector. The ... | 12/05/2006 |
| 7092082 | Method and apparatus for inspecting a semiconductor wafer An apparatus for inspecting a semiconductor wafer includes a vertically movable chuck plate for holding said semiconductor wafer, a first light source for illuminating an area on the wafer, a main imaging camera for detecting light scattered from the surface of the ... | 08/15/2006 |
| 7075074 | Electron beam inspection apparatus and method for testing an operation state of an electron beam inspection apparatus In a method for testing an operation state of an electron beam inspection apparatus, an electron beam sequentially scans a plurality of scan lines in a predetermined inspection area on a substrate. A detector detects secondary electrons emitted from the scan lines a... | 07/11/2006 |
| 7070657 | Method and apparatus for depositing antireflective coating This invention provides a stable process for depositing an antireflective layer. Helium gas is used to lower the deposition rate of plasma-enhanced silane oxide, silane oxynitride, and silane nitride processes. Helium is also used to stabilize the process, so that d... | 07/04/2006 |
| 7065240 | Reticle inspection apparatus A reticle inspection apparatus for detecting defects on a reticle 16 includes an image data generator 42 for generating image data of the reticle 16, a definition analyzer 44 for analyzing definition of image from the image data, a defini... | 06/20/2006 |
| 7064822 | Evaluating a multi-layered structure for voids A method and apparatus measure properties of two layers of a damascene structure (e.g. a silicon wafer during fabrication), and use the two measurements to identify a location as having voids. One of the two measurements is of resistance per unit length. The two mea... | 06/20/2006 |
| 7064820 | Surface inspection method and surface inspection system A surface inspection method in a surface inspection system which comprises a photodetection unit and a photodetection polarizing angle changing means, comprising the step of receiving a scattered reflection light from a substrate surface where standard particles are... | 06/20/2006 |
| 7061598 | Darkfield inspection system having photodetector array A darkfield surface inspection tool of the invention includes an illumination source for illuminating a workpiece and generating a light scattering pattern. The light scattering pattern being configured such that the positions of the light beams of the scattering pa... | 06/13/2006 |
| 7053991 | Differential numerical aperture methods Methods for differential numerical aperture analysis of samples, utilizing angle-of-incidence measurements resulting from variable illumination or observation numerical apertures, or both. Metrology applications are provided, and more particularly including scattero... | 05/30/2006 |
| 7045765 | Device for counting stacked products The present invention relates to a device for counting thin products (1) that can be stacked side-by-side in a tray (2), characterized in that it comprises at least one counting station comprised of at least one CIS module (31, 3 | 05/16/2006 |
| 6970194 | Defect correction in electronic imaging systems A method for processing a video data stream including a series of pixel values corresponding to pixel sites in an electronic imaging device includes the step of filtering the video data stream in real time to correct or modify defective pixel values based on a plura... | 11/29/2005 |
| 6965120 | Method and apparatus for quality control in the manufacture of foundry cores or core packets A method and an apparatus for object recognition, in particular defect detection on workpieces, such as shot cores (1) or core packets, wherein the object is illuminated by a light source (4) and recorded and detected by means of a camera (3), a... | 11/15/2005 |
| 6941009 | Method for evaluating pattern defects on a water surface The invention concerns a method for evaluating pattern defects on a wafer surface, comprising the following steps: acquiring the surface data of a plurality of individual image fields (4) of a series-produced wafer (1); storing the data in a reference ... | 09/06/2005 |
| 6936835 | Method and its apparatus for inspecting particles or defects of a semiconductor device An apparatus for optically inspecting particles and/or defects correlates sizes of particles and/or defects to a cause of failure in an inspection result. A data processing circuit points out a cause of failure from the statistics on the inspection result, and displ... | 08/30/2005 |
| 6934028 | Certification and verification management system and method for a web inspection apparatus A certification system and method for inspecting of a roll of web material through a web inspection system which includes the inspection of the roll of web material to determine the number, type and location of one or more detectable flaws along the web material. Th... | 08/23/2005 |
| 6920249 | Method and measuring instrument for determining the position of an edge of a pattern element on a substrate A method and a measuring instrument for determining the position of an edge to be measured on a pattern on a substrate are described. A complete, nonlinear model intensity profile, which identifies the edge to be measured, of a model edge is ascertained and stored, ... | 07/19/2005 |
| 6909105 | Method and device for representing an object A process for obtaining an object image of at least one object (40) is described, wherein at least two partial images of the object (40) are taken under differing object conditions which are formed on the object with spatial patterns, wherein a non-lin... | 06/21/2005 |
| 6904164 | Method of inspecting accuracy in stitching pattern elements A method of quickly and accurately inspecting the stitching accuracy at which regions of a lithographic pattern are stitched at boundaries. The numerous regions of the lithographic pattern are exposed or delineated, one at a time. Inspected regions are scanned with ... | 06/07/2005 |
| 6797975 | Method and its apparatus for inspecting particles or defects of a semiconductor device Conventionally, a particle/defect inspection apparatus outputs a total number of detected particles/defects as the result of detection. For taking countermeasures to failures in manufacturing processes, the particles/defects detected by the inspection apparatus are ... | 09/28/2004 |
| 6747697 | Method and apparatus for digital image defect correction and noise filtering An adaptive median filter (40) provides dynamic detection and correction of digital image defects which are caused by defective or malfunctioning elements of a radiation detector array (20). The adaptive median filter receives (100) lines of pix... | 06/08/2004 |
| 6743337 | Process and apparatus for determining the properties of a traveling material web Process and apparatus for determining properties of a traveling material web. The process includes simultaneously illuminating a plurality of measuring points on the material web with electromagnetic radiation, and imaging, through at least one optical device, the p... | 06/01/2004 |
