Did You Know...
...that Charles Goodyear performed some of his experiments on rubber while in debtor's prison? He was there so often he referred to it as his "hotel". Chronically in debt because of poor business sense and ill health, Goodyear depended on the generosity of friends and family. Even after he unlocked the secret to vulcanizing rubber, he was unable to improve his financial situation. When he died, his estate was $200,000 in debt.
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| Number | Title | Issue Date |
| 8089053 | Dynamically tilting specimen holder for stereo and tomographic imaging in a transmission electron microscope using a combination of micro electro mechanical systems (MEMS) and piezoelectric transducers (PZTs) The present invention relates to double-tilt specimen holders of the side-entry type for transmission electron microscopy (TEM). The invention uses Micro Electro Mechanical Systems (MEMS) and Piezoelectric Transducer (PZT) technology to create a digitally programmab... | 01/03/2012 |
| 8071960 | Method and apparatus for producing samples for transmission electron microscopy In the case of a method for producing samples for transmission electron microscopy, a sample is prepared from a substrate of a sample material. To this end, the sample material is irradiated by means of a laser beam along an irradiation trajectory in order to produc... | 12/06/2011 |
| 8058627 | Addressable transmission electron microscope grid A planar substrate for electrochemical experimentation provides multiple isolated electrical conductors sandwiched between insulating layers of ultrananocrystalline diamond. The isolated electrical conductors may attach to conductive pads at the periphery of the sub... | 11/15/2011 |
| 8030622 | Specimen holder, specimen inspection apparatus, and specimen inspection method A specimen holder is offered which can reduce the amount of chemical sprayed over a specimen consisting of cultured cells. The specimen holder has an open specimen-holding surface. At least a part of the specimen-holding surface is formed by a film and a tapering po... | 10/04/2011 |
| 8008633 | Specimen stage-moving device for charged-particle beam system A charged-particle beam system is offered which is equipped with a Z-motion mechanism to enable tomography. The Z-motion mechanism includes a rotary disk having three tapering surfaces on which balls are nested. The rotary disk is rotated via a worm gear to cause th... | 08/30/2011 |
| 7928407 | Lithographic apparatus and device manufacturing method In an immersion lithographic apparatus, bubble formation in immersion liquid is reduced or prevented by reducing a gap size or area on a substrate table and/or covering the gap. ... | 04/19/2011 |
| 7923701 | Charged particle beam equipment Charged particle beam equipment has a processing unit for calibrating dimension values of an enlarged specimen image, and means for changing the amount by which a charged particle beam is scanned. Also, a specimen stand has a mechanism for holding a specimen having ... | 04/12/2011 |
| 7923702 | System and method for processing an object A system and a method for processing and inspecting an object are provided, wherein the system comprises a particle beam column, an object holder and a gas supply apparatus. Thereby, the object holder is formed comprising a base, a first table displaceable relative ... | 04/12/2011 |
| 7923700 | Sample inspection apparatus, sample inspection method and sample inspection system Sample inspection apparatus, sample inspection method, and sample inspection system are offered which can give a stimulus to a sample held on a film when the sample is inspected by irradiating it with a primary beam (e.g., an electron beam or other charged-particle ... | 04/12/2011 |
| 7820982 | Grid for transmission electron microscopy tomography and method of fabricating the same Disclosed is a moon grid for transmission electron microscopy tomography, including a mesh sheet for protecting an upper objects and a support film formed on the mesh sheet and having nanoparticles dispersed throughout, in which the nanoparticles dispersed throughou... | 10/26/2010 |
| 7807979 | Specimen kit and fabricating method thereof A specimen kit for enclosing a specimen is described, including a first substrate, a second substrate and a sealant. The first substrate has a first observation window at which a thickness thereof is smaller than that of the other parts thereof. The second substrate... | 10/05/2010 |
| 7800077 | Specimen holder for electron microscope The present invention provides a specimen holder for use with an electron microscope. The specimen holder has a retainer mounted at the front end of the body of the specimen holder. The retainer has a plate member provided with a hole around its front end. The hole ... | 09/21/2010 |
| 7763863 | Charged particle beam application apparatus An apparatus capable of improving image quality by making it possible to suck specimens of different sizes electrostatically, and uniformalizing an electric field of a specimen edge portion, while suppressing increase in prime cost is provided. Specimen holding mean... | 07/27/2010 |
| 7759656 | Dual air particle sample cassette and methods for using same An assembly for holding a microscopy sample for storage, observation, manipulation, characterization and/or study of the sample using a microscopy instrument is provided. The assembly includes mating first and second parts having faces between which a microscopy sam... | 07/20/2010 |
| 7723701 | Specimen preservation systems and methods A two-part container for preserving material samples during storage and transport is separable and can be sealed with the presence of an elastomeric O-ring and internal threads on each part of the container. In the configuration at which the threads first engage bet... | 05/25/2010 |
| 7705323 | Microscope stage with flexural axis A microscope stage with a flexural axis may exhibit predictable flexure characteristics and limited cross-coupling translations. Z motion of a Z plate proximate to a Z actuator may be substantially linear, while a distal side of the Z plate may be allowed to rotate ... | 04/27/2010 |
| 7619225 | Multifunction electron microscope specimen holder A multi-purpose multifunction electron microscope specimen box has a box body, a sliding transparent lid fitting over the box body, and an array of piece holes formed on the top surface of the box body. At least one piece hole has a tweezer trough connected to the a... | 11/17/2009 |
| 7586105 | Microfabricated cantilever chip The present invention relates to a device and system from doing mechanical and electrical measurements and manipulation on nano or micro sized objects using a sample holder adapted to fit in situ of a transmission electron microscope. The sample holder comprise at l... | 09/08/2009 |
| 7554099 | Ultra-thin liquid control plate and combination of box-like member and the control plate An ultra-thin liquid control plate and a combination of a box-like member and the control plate include a plate-like member having at least one view hole. The joint surface combined with a sidewall of the view hole and a surface of the plate-like member is provided ... | 06/30/2009 |
| 7550744 | Chamberless substrate handling without substantially touching the surface, having annular rings forming annular orifices, one of the rings forming an air bearing portion and having passages through which a flow of a gas can be established in a first direction, where the flow of the gas is suffici... | 06/23/2009 |
| 7550743 | Chamberless substrate handling A particle beam system having a beam source for generating a particle beam and a vacuum air bearing. The beam source is mounted to a first side of the vacuum air bearing, with an active side of the vacuum air bearing disposed on an opposing second side of the vacuum... | 06/23/2009 |
| 7544953 | Device for preparing microscopy samples A device, method and system for preparing and storing samples for microscopic analysis is disclosed. The device provides a reservoir that can be attached to a displacement pipette thereby filling the reservoir with reagents desired for preparing the samples for micr... | 06/09/2009 |
| 7476871 | Specimen box for electron microscope capable of observing general specimen and live cell A specimen box for an electron microscope capable of observing a general specimen or a live cell is formed of a housing. The housing includes a receiving chamber formed therein and at least one view hole formed on each of a top side thereof and a bottom side thereof... | 01/13/2009 |
| 7435973 | Material processing system and method A material processing system for processing a work piece is provided. The material processing is effected by supplying a reactive gas and energetic radiation for activation of the reactive gas to a surrounding of a location of the work piece to be processed. The rad... | 10/14/2008 |
| 7431813 | Multi-chambered substrate processing equipment having sealing structure between chambers thereof, and method of assembling such equipment Sealing structure provided between a transfer chamber and a chamber, such as a process chamber, connected to the transfer chamber includes an insert member, a docking member, and annular seals. The insert member is fixed to the exterior of the transfer chamber and t... | 10/07/2008 |
| 7432511 | Method of operating liquid in the vacuum or low-pressure environment and observing the operation and device for the operation and observation A method of operating liquid in a vacuum or low-pressure environment and observing the operation and a device for the operation and the observation respectively, including the steps of preparing a housing, putting the housing in the vacuum or low-pressure environmen... | 10/07/2008 |
| 7427755 | Integrated electron beam tip and sample heating device for a scanning tunneling microscope An electron beam heating device with the temperature up to 2200 K is provided for heating a sample and a tip for a scanning tunneling microscope (STM). The electron beam heating device includes a base stage for mating respectively with an electron beam sample heatin... | 09/23/2008 |
| 7425712 | Method of operating liquid in the vacuum or low-pressure environment and observing the operation and device for the operation and observation A method of operating liquid in a vacuum or low-pressure environment and observing the operation and a device for the operation and the observation respectively, including the steps of preparing a housing, putting the housing in the vacuum or low-pressure environmen... | 09/16/2008 |
| 7417236 | Sheet beam-type testing apparatus An electron beam apparatus such as a sheet beam based testing apparatus has an electron-optical system for irradiating an object under testing with a primary electron beam from an electron beam source, and projecting an image of a secondary electron beam emitted by ... | 08/26/2008 |
| 7414355 | Charged particle beam extraction and formation apparatus A charged particle apparatus, with multiple electrically conducting semispheric grid electrodes, the grid electrodes mounted in a dielectric mounting ring, with hidden areas or regions to maintain electrical isolation between the grid electrodes as sputter deposits ... | 08/19/2008 |
| 7394075 | Preparation of integrated circuit device samples for observation and analysis In one embodiment, a sample of an integrated circuit device is prepared for observation in a transmission electron microscope (TEM). The sample may be placed on a surface formed by vertical edges of several TEM grids. The sample may be affixed to a vertical edge of ... | 07/01/2008 |
| 7391038 | Technique for isocentric ion beam scanning A technique for isocentric ion beam scanning is disclosed. In one particular exemplary embodiment, the technique may be realized by an apparatus for isocentric ion beam scanning. The apparatus may comprise an end station having a mechanism for holding and translatin... | 06/24/2008 |
| 7381971 | Method and apparatus for in-situ probe tip replacement inside a charged particle beam microscope We disclose a gripper and associated apparatus and methods for delivering nano-manipulator probe tips inside a vacuum chamber. The gripper includes a tube; a compression cylinder inside of and coaxial with the tube; and at least one elastic ring adjacent to the comp... | 06/03/2008 |
| 7381968 | Charged particle beam apparatus and specimen holder Information of a specimen holder or information of a specimen mounted on the specimen holder is stored in a memory inside the specimen holder mounted to an electron microscope. The memory is accessed to transmit the information of the specimen holder to the electron... | 06/03/2008 |
| 7372549 | Lithographic apparatus and device manufacturing method A lithographic apparatus is disclosed that has a support structure constructed to support a patterning object, the patterning object being capable of imparting a radiation beam with a pattern in its cross-section to form a patterned radiation beam, a substrate table... | 05/13/2008 |
| 7372541 | Lithographic apparatus and device manufacturing method In a lithographic projection apparatus, a structure surrounds a space between the projection system and a substrate table of the lithographic projection apparatus. Gas is used between the structure and the surface of the substrate to contain liquid in the space.... | 05/13/2008 |
| 7348571 | Scanning mechanism for scanning probe microscope and scanning probe microscope A scanning probe microscope scanning mechanism has a Z stage for moving an object to be moved along the Z-axis. The Z stage includes an insulating board, a Z-direction moving actuator fixed to the insulating board, wires for the application of a voltage to the Z-dir... | 03/25/2008 |
| 7348570 | Unsupported, electron transparent films and related methods Unsupported, electron transparent film useful in supporting a sample for imaging and analysis by transmission electron microscopy; methods for making and using the unsupported, electron transparent film; and an integrally formed combination of an unsupported, electr... | 03/25/2008 |
| 7345288 | Sample holder and ion-beam processing system A sample holder and ion-beam processing system are offered which permit a good sample adapted for observation (such as TEM (transmission electron microscopy) observation). The sample holder has a sample placement portion having a sample adhering surface. The holder ... | 03/18/2008 |
| 7345289 | Sample support prepared by semiconductor silicon process technique A sample support of the present invention is prepared such that a silicon substrate is used as a raw material, the thickness structure having a shape and a thickness of 10 μm or less is prepared using a semiconductor silicon process technique. The sample support of... | 03/18/2008 |
