Did You Know...
...that the Band-Aid Bandage was invented by a Johnson & Johnson employee whose wife had cut herself? Earl Dickson's wife was rather accident prone, so he set out to develop a bandage that she could apply without help. He placed a small piece of gauze in the center of a small piece of surgical tape, and what we know today as the Band Aid bandage was born!
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| Number | Title | Issue Date |
| 7619225 | Multifunction electron microscope specimen holder A multi-purpose multifunction electron microscope specimen box has a box body, a sliding transparent lid fitting over the box body, and an array of piece holes formed on the top surface of the box body. At least one piece hole has a tweezer trough connected to the a... | 11/17/2009 |
| 7586105 | Microfabricated cantilever chip The present invention relates to a device and system from doing mechanical and electrical measurements and manipulation on nano or micro sized objects using a sample holder adapted to fit in situ of a transmission electron microscope. The sample holder comprise at l... | 09/08/2009 |
| 7554099 | Ultra-thin liquid control plate and combination of box-like member and the control plate An ultra-thin liquid control plate and a combination of a box-like member and the control plate include a plate-like member having at least one view hole. The joint surface combined with a sidewall of the view hole and a surface of the plate-like member is provided ... | 06/30/2009 |
| 7550744 | Chamberless substrate handling without substantially touching the surface, having annular rings forming annular orifices, one of the rings forming an air bearing portion and having passages through which a flow of a gas can be established in a first direction, where the flow of the gas is suffici... | 06/23/2009 |
| 7550743 | Chamberless substrate handling A particle beam system having a beam source for generating a particle beam and a vacuum air bearing. The beam source is mounted to a first side of the vacuum air bearing, with an active side of the vacuum air bearing disposed on an opposing second side of the vacuum... | 06/23/2009 |
| 7544953 | Device for preparing microscopy samples A device, method and system for preparing and storing samples for microscopic analysis is disclosed. The device provides a reservoir that can be attached to a displacement pipette thereby filling the reservoir with reagents desired for preparing the samples for micr... | 06/09/2009 |
| 7476871 | Specimen box for electron microscope capable of observing general specimen and live cell A specimen box for an electron microscope capable of observing a general specimen or a live cell is formed of a housing. The housing includes a receiving chamber formed therein and at least one view hole formed on each of a top side thereof and a bottom side thereof... | 01/13/2009 |
| 7435973 | Material processing system and method A material processing system for processing a work piece is provided. The material processing is effected by supplying a reactive gas and energetic radiation for activation of the reactive gas to a surrounding of a location of the work piece to be processed. The rad... | 10/14/2008 |
| 7431813 | Multi-chambered substrate processing equipment having sealing structure between chambers thereof, and method of assembling such equipment Sealing structure provided between a transfer chamber and a chamber, such as a process chamber, connected to the transfer chamber includes an insert member, a docking member, and annular seals. The insert member is fixed to the exterior of the transfer chamber and t... | 10/07/2008 |
| 7432511 | Method of operating liquid in the vacuum or low-pressure environment and observing the operation and device for the operation and observation A method of operating liquid in a vacuum or low-pressure environment and observing the operation and a device for the operation and the observation respectively, including the steps of preparing a housing, putting the housing in the vacuum or low-pressure environmen... | 10/07/2008 |
| 7427755 | Integrated electron beam tip and sample heating device for a scanning tunneling microscope An electron beam heating device with the temperature up to 2200 K is provided for heating a sample and a tip for a scanning tunneling microscope (STM). The electron beam heating device includes a base stage for mating respectively with an electron beam sample heatin... | 09/23/2008 |
| 7425712 | Method of operating liquid in the vacuum or low-pressure environment and observing the operation and device for the operation and observation A method of operating liquid in a vacuum or low-pressure environment and observing the operation and a device for the operation and the observation respectively, including the steps of preparing a housing, putting the housing in the vacuum or low-pressure environmen... | 09/16/2008 |
| 7417236 | Sheet beam-type testing apparatus An electron beam apparatus such as a sheet beam based testing apparatus has an electron-optical system for irradiating an object under testing with a primary electron beam from an electron beam source, and projecting an image of a secondary electron beam emitted by ... | 08/26/2008 |
| 7414355 | Charged particle beam extraction and formation apparatus A charged particle apparatus, with multiple electrically conducting semispheric grid electrodes, the grid electrodes mounted in a dielectric mounting ring, with hidden areas or regions to maintain electrical isolation between the grid electrodes as sputter deposits ... | 08/19/2008 |
| 7394075 | Preparation of integrated circuit device samples for observation and analysis In one embodiment, a sample of an integrated circuit device is prepared for observation in a transmission electron microscope (TEM). The sample may be placed on a surface formed by vertical edges of several TEM grids. The sample may be affixed to a vertical edge of ... | 07/01/2008 |
| 7391038 | Technique for isocentric ion beam scanning A technique for isocentric ion beam scanning is disclosed. In one particular exemplary embodiment, the technique may be realized by an apparatus for isocentric ion beam scanning. The apparatus may comprise an end station having a mechanism for holding and translatin... | 06/24/2008 |
| 7381971 | Method and apparatus for in-situ probe tip replacement inside a charged particle beam microscope We disclose a gripper and associated apparatus and methods for delivering nano-manipulator probe tips inside a vacuum chamber. The gripper includes a tube; a compression cylinder inside of and coaxial with the tube; and at least one elastic ring adjacent to the comp... | 06/03/2008 |
| 7381968 | Charged particle beam apparatus and specimen holder Information of a specimen holder or information of a specimen mounted on the specimen holder is stored in a memory inside the specimen holder mounted to an electron microscope. The memory is accessed to transmit the information of the specimen holder to the electron... | 06/03/2008 |
| 7372541 | Lithographic apparatus and device manufacturing method In a lithographic projection apparatus, a structure surrounds a space between the projection system and a substrate table of the lithographic projection apparatus. Gas is used between the structure and the surface of the substrate to contain liquid in the space.... | 05/13/2008 |
| 7372549 | Lithographic apparatus and device manufacturing method A lithographic apparatus is disclosed that has a support structure constructed to support a patterning object, the patterning object being capable of imparting a radiation beam with a pattern in its cross-section to form a patterned radiation beam, a substrate table... | 05/13/2008 |
| 7348570 | Unsupported, electron transparent films and related methods Unsupported, electron transparent film useful in supporting a sample for imaging and analysis by transmission electron microscopy; methods for making and using the unsupported, electron transparent film; and an integrally formed combination of an unsupported, electr... | 03/25/2008 |
| 7348571 | Scanning mechanism for scanning probe microscope and scanning probe microscope A scanning probe microscope scanning mechanism has a Z stage for moving an object to be moved along the Z-axis. The Z stage includes an insulating board, a Z-direction moving actuator fixed to the insulating board, wires for the application of a voltage to the Z-dir... | 03/25/2008 |
| 7345288 | Sample holder and ion-beam processing system A sample holder and ion-beam processing system are offered which permit a good sample adapted for observation (such as TEM (transmission electron microscopy) observation). The sample holder has a sample placement portion having a sample adhering surface. The holder ... | 03/18/2008 |
| 7345289 | Sample support prepared by semiconductor silicon process technique A sample support of the present invention is prepared such that a silicon substrate is used as a raw material, the thickness structure having a shape and a thickness of 10 μm or less is prepared using a semiconductor silicon process technique. The sample support of... | 03/18/2008 |
| 7342237 | Lithographic apparatus and device manufacturing method A lithographic apparatus comprising: an illumination system for providing a projection beam of radiation; a gas pressure controlled article clamp for clamping an article to be placed in a beam path of the projection beam of radiation; and a pressure circuit for cont... | 03/11/2008 |
| 7323695 | Reciprocating drive for scanning a workpiece A reciprocating drive system, method, and apparatus for scanning a workpiece are provided, wherein a motor comprising a rotor and stator operable to individually rotate about a first axis is operable to reciprocally translate the workpiece with respect to a stationa... | 01/29/2008 |
| 7315023 | Method of preparing a sample for examination in a TEM A method of preparing a sample for examination in a TEM, where the sample is attached to a probe tip point, uses a TEM sample holder form embodied in a TEM sample holder coupon. The probe-tip points and the TEM sample holder coupon are oriented with each other so th... | 01/01/2008 |
| 7304313 | Low-pressure chamber for scanning electron microscopy in a wet environment A specimen enclosure assembly (100) for use in an electron microscope and including a rigid specimen enclosure dish (102) having an aperture (122) and defining an enclosed specimen placement volume (125), an electron beam permeable, fluid... | 12/04/2007 |
| 7301157 | Cluster tool for microscopic processing of samples A cluster tool includes multiple tools for microscopic processing of a sample positioned around a rotatable base. A sample holder on the base rotates the sample between the working areas of the tools. A slidable vacuum seal maintains a vacuum in a sample chamber for... | 11/27/2007 |
| 7291847 | Specimen tip and tip holder assembly A specimen tip holder assembly for mounting a specimen tip in a transmission electron microscope (TEM) is described. The specimen tip holder assembly comprises a tip holder for supporting a specimen tip. The tip holder is coupled to an elongate support for movement ... | 11/06/2007 |
| 7282707 | Method and apparatus for handling a sample plate for use in mass analysis A new sample plate handling apparatus for use with mass analysis, and methods for use the same have been developed. The sampling plate handling apparatus comprises a sample plate receiver which receives the sample plate in a first plane, a rotating device for rotati... | 10/16/2007 |
| 7274447 | Material porosity pressure impulse testing system A system and method for determining porosity of a material enables rapid testing of materials by detecting test particle penetration. The material is held by a test chamber wherein a test particle solution covers a surface of the material. The test chamber is pressu... | 09/25/2007 |
| 7270137 | Apparatus and method of securing a workpiece during high-pressure processing An apparatus is disclosed for performing high-pressure processing of a workpiece having a top face and a bottom face. The apparatus comprises a processing chamber and a holder for securing the workpiece within the processing chamber so that a substantial portion of ... | 09/18/2007 |
| 7268646 | Temperature controlled MEMS resonator and method for controlling resonator frequency There are many inventions described and illustrated herein. In one aspect, the present invention is directed to a temperature compensated microelectromechanical resonator as well as fabricating, manufacturing, providing and/or controlling microelectromechanical reso... | 09/11/2007 |
| 7263162 | Sample mounts for microcrystal crystallography Sample mounts (10) for mounting microcrystals of biological macromolecules for X-ray crystallography are prepared by using patterned thin polyimide films (12) that have curvature imparted thereto, for example, by being attached to a curved outer surfac... | 08/28/2007 |
| 7259380 | Scanning mechanism of an ion implanter This invention discloses a scanning mechanism of an ion implanter. The mechanism is a PR-PRR type parallel mechanism with two subchains and two DOFs, driving the wafer holder to scan when the first subchain and the second subchain are translated in the same directio... | 08/21/2007 |
| 7253418 | Device and method for the examination of samples in a non vacuum environment using a scanning electron microscope A chamber suitable for use with a scanning electron microscope. The chamber comprises at least one aperture sealed with a membrane. The membrane is adapted to withstand a vacuum, and is transparent to electrons and the interior of the chamber is isolated from said v... | 08/07/2007 |
| 7253419 | Apertured plate support mechanism and charged-particle beam instrument equipped therewith An apertured plate support mechanism used in an electron beam lithography machine. The apertured plate is held to a plate holder. The plate support mechanism has the plate holder for holding the apertured plate and a holder support for supporting the plate holder. T... | 08/07/2007 |
| 7238953 | Specimen holder for an electron microscope and method for reducing thermal drift in a microscope A specimen holder for an electron microscope, comprising a rod-shaped part, which is provided near one end with a tip, which tip is arranged to receive a specimen, the rod-shaped part, in use, extending with at least the tip into the electron microscope, held by cla... | 07/03/2007 |
| 7235784 | Transmission electron microscope and image observation method using it Drift generated at the time of photographing a TEM image is corrected simultaneously with photographing, so that a TEM image free form influence of drift is photographed. While the TEM image is recorded, drift in the place out of the view field subjected to recordin... | 06/26/2007 |