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| Number | Title | Issue Date |
| 8178839 | Method, device and program for estimating particle emitted from radioisotope source, method for estimating radiation detector, method and device for calibrating radiation detector, and radioisotope source When an energy of a particle emitted from a radioisotope source is obtained by a detector, a histogram obtained from a relationship between a difference ΔE between an energy of a particle emitted outside the radioisotope source and an initial energy which the parti... | 05/15/2012 |
| 8058612 | Microirradiators and methods of making and using same Improved radiation devices and their associated fabrication and applications are described herein. The microirradiators generally include a non-radioactive conducting electrode, an insulating sheath, a radioactive source, and, optionally, a contact electrode. The mi... | 11/15/2011 |
| 8053724 | Real-time S-parameter imager An instrumentation setup is provided to process electronic signals in a positron imager functioning in two different modes of operations for scanning both bulk and thin film materials. According to one part of an implementation, an instrumentation setup comprises an... | 11/08/2011 |
| 7800061 | Suspension system and scanning method A method and apparatus for performing a radiation scan of a structure involve arranging a source of penetrating radiation and a radiation detector at opposed ends of a radiation path through the structure, oriented in such a way that the source emits radiation along... | 09/21/2010 |
| 7750294 | Photonic sensors, xerogel-based sensors and nanosensors A photonic sensor system is provided. The system generally includes a beta emission source, optionally, a scintillation layer, and a luminophore-containing sensory layer. The system can be embodied in a particle. Also provided are photonic sensor strategies which ar... | 07/06/2010 |
| 7718962 | Defect imaging device and method The present invention is directed to a defect imaging device that has an energy beam that is directed at a device under test. The energy beam creates positrons deep within the material of the device under test. When the positrons combine with electrons in the materi... | 05/18/2010 |
| 7633062 | Radiation portal monitor system and method A portal monitoring system has a cosmic ray charged particle tracker with a plurality of drift cells. The drift cells, which can be for example aluminum drift tubes, can be arranged at least above and below a volume to be scanned to thereby track incoming and outgoi... | 12/15/2009 |
| 7557345 | Integrated circuit chips, apparatuses for obtaining backscatter data from samples, methods of backscatter analysis, and methods of forming alpha particle emission and detection systems Some embodiments include methods for fabricating an alpha particle emitter and detector associated with an integrated circuit chip. Some embodiments include an integrated circuit chip comprising an alpha particle emitter and detector supported by a semiconductor sub... | 07/07/2009 |
| 7429733 | Method and sample for radiation microscopy including a particle beam channel formed in the sample source A method and sample for radiation microscopy include a sample source that includes an area of interest, an outer side of a sample formed in the sample source adjacent to the area of interest, an inner side of the sample formed inside the sample source wherein at lea... | 09/30/2008 |
| 7420166 | Real-time S-parameter imager Disclosed is a fully automated system capable of producing high quality real-time S-parameter images. It is a useful and versatile tool in Material Science and Solid State Technology for determining the location of subsurface defect types and concentrations in bulk-... | 09/02/2008 |
| 7394069 | Large-field scanning of charged particles One embodiment relates to a charged-particle beam apparatus. The apparatus includes at least a source for generating the charged-particle beam, a first deflector, and a second deflector. The first deflector is configured to scan the charged-particle beam in a first ... | 07/01/2008 |
| 7369945 | Apparatus and method for storing and transporting data related to vapor emissions and measurements thereof The present invention provides apparatus and a methods for collecting, transmitting and storing fugitive gas emission data. An embodiment of the invention collects fugitive gas with a sampling probe and into a emission monitoring device. The device then sends and st... | 05/06/2008 |
| 7351525 | Positronium-mediated method for identifying a contaminant gas in a gaseous mixture The present invention discloses an in vitro method to identify a contaminant gas in a specimen comprising a mixture of gases as a function of the decay rate of at least one species of positronium. The positronium is obtained by directing the positrons from a positro... | 04/01/2008 |
| 7319223 | Method and apparatus for characterizing a recess located on a surface of a substrate Method and apparatus for characterizing a recess located on a surface of a substrate are provided. One embodiment of the invention provides a method for characterizing a recess located on a surface of a substrate. In a first step, a measurement tip is positioned dir... | 01/15/2008 |
| 7268338 | Imaging array having variable conversion gain A CCD imaging array and a charge measurement amplifier for use in such imaging arrays is disclosed. The array includes a plurality of pixels that accumulate charge when exposed to light, a readout amplifier having input and output ports. The readout amplifier has a ... | 09/11/2007 |
| 7254212 | Particulate matter analyzer, collecting filter and system for analyzing and collecting samples from fluids A system, including a particulate matter analyzer and collecting filter, provides a method of analyzing and collecting samples from fluids, such as collecting particulate matter from air. A mass measuring unit and composition analyzing unit can be provided for eithe... | 08/07/2007 |
| 7231011 | Apparatus for photon activation positron annihilation analysis Non-destructive testing apparatus according to one embodiment of the invention comprises a photon source. The photon source produces photons having predetermined energies and directs the photons toward a specimen being tested. The photons from the photon source resu... | 06/12/2007 |
| 7206376 | Fluid density measurement A wellbore tool for measuring the density of a fluid flowing in a wellbore by a photon attenuation technique includes a tube defining a flow path for the fluid, a photon source at one end of the tube, and a photon detector arranged to receive photons which have pass... | 04/17/2007 |
| 7186976 | Scanning electron microscope There is provided a reconfigurable scanning electron microscope (RSEM) (100) comprising: (a) a gun assembly (110) and an associated electron optical column (120) for generating an electron beam (600), for demagnifying the electron beam ( | 03/06/2007 |
| 7141790 | Defect inspection instrument and positron beam apparatus The purpose of the present invention is to inspect the position, number, and size of fine defects in a variety of solid state materials, including a semiconductor device and metallic materials, with a high spatial resolution of nanometer order. The positron irradiat... | 11/28/2006 |
| 7098409 | Apparatus for weighing materials online An apparatus for weighing materials online is disclosed, which belongs to an art of online weighing of material. The apparatus comprises: a light-emitting unit, emitting light beams irradiating on the surface of materials transported on a belt to form a bright proje... | 08/29/2006 |
| 7075062 | Apparatus and methods for downhole determination of characteristics of formation fluids An oil sample is subjected to nuclear electromagnetic irradiation downhole, and the electron and/or mass density of the oil sample is determined by measuring the attenuation of the irradiation and relating the attenuation to the electron density. If the irradiation ... | 07/11/2006 |
| 7058153 | Method for photon activation positron annihilation analysis A non-destructive testing method comprises providing a specimen having at least one positron emitter therein; determining a threshold energy for activating the positron emitter; and determining whether a half-life of the positron emitter is less than a selected half... | 06/06/2006 |
| 7020239 | Method and device for the determination of the thickness of the insulation of a flat ribbon cable in the region of the conductor paths Method for the determination of the thickness of the insulation of a flat ribbon cable in the region of the metallic conductor paths, wherein one side of the flat ribbon cable is irradiated by means of an x-ray beam, and a detector on the same or on the opposing sid... | 03/28/2006 |
| 7005639 | System and method of composition correction for beta gauges Beta gauge composition correction is performed using signals from a plurality of detectors that are positioned so that the ratio of radiation received by the detectors depends on the composition of material through which the radiation passes before reaching the dete... | 02/28/2006 |
| 6995372 | Nuclear gauge for measuring a characteristic of a sheet material with sheet position and alignment compensation A material sheet attribute detection system, the material sheet having a first side and a second side, the system includes a radiation source located proximate to the first side of the material sheet, the radiation source emitting radiation toward the material sheet... | 02/07/2006 |
| 6995667 | Systems, methods, and computer program products for automatic tracking and/or remote monitoring of nuclear gauges and/or data communication therewith Methods, systems, and computer program products configured to track the geographic location of hazmat substances or devices including same, such as nuclear gauges with a radioactive component, include mounting a tracking device in proximity to the substance, the tra... | 02/07/2006 |
| 6963782 | System and method for effecting control tuning of a manufacturing process The present invention includes a system and method for fine tuning the control of a manufacturing process. A material adjusting device is in communication with a PID controller and PID control loop, and is used to alter a flow of material used in the manufacturing p... | 11/08/2005 |
| 6934025 | Thin film optical measurement system and method with calibrating ellipsometer An optical measurement system for evaluating a reference sample, having at least a partially known composition, includes a reference ellipsometer and at least one non-contact optical measurement device. The ellipsometer includes a light generator, an analyzer, and a... | 08/23/2005 |
| 6922244 | Thin film optical measurement system and method with calibrating ellipsometer An optical measurement system, including a reference ellipsometer and a non-contact optical measurement device, evaluates a sample having at least a partially known composition. The reference ellipsometer includes a light generator to generate a beam of quasi-monoch... | 07/26/2005 |
| 6921896 | Automatic backscatter gauge In an embodiment of the present invention, the same provides an edge sensor capable of locating an edge under a substrate. The edge sensor comprises a radiation source, a scanner, a microprocessor, and an indicator. The radiation source emits photons that are scatte... | 07/26/2005 |
| 6920200 | Density-nonuniform multilayer film analyzing method, and apparatus and system thereof Provided is a novel density-nonuniform multilayer analyzing method that readily and highly accurately enables analyzing the state of distribution and interfacial condition of particulate matter in a density-nonuniform multilayer film. The method includes the step of... | 07/19/2005 |
| 6919563 | Defect evaluation apparatus utilizing positrons Disclosed is a defect evaluation apparatus comprising a source section having a source for generating positrons and a moderator for decelerating the positrons, a sample holding section for holding a sample to be measured, a transfer section for transferring the posi... | 07/19/2005 |
| 6818902 | Positron source A positron source is applicable particularly to solid state physics, including a thin target receiving a continuous or practically continuous 10 MeV electron beam in grazing incidence and generating positrons upon interaction with this beam. ... | 11/16/2004 |
| 6815676 | Material defect evaluation apparatus using positron and its evaluation method A material defect evaluation apparatus using positron for evaluating the degree of deterioration of a specimen by measuring a positron lifetime after irradiating positron to the specimen, includes: a positron source, a positron detector and a γ-ray detector, wherei... | 11/09/2004 |
| 6740877 | Scanning electron microscope and sample observation method using the same According to the present invention, there are newly provided in a scanning electron microscope with an in-lens system a first low-magnification mode that sets the current of the object lens to be zero or in a weak excitation state, and a second low-magnification mod... | 05/25/2004 |
| 6646261 | SEM provided with a secondary electron detector having a central electrode The invention relates to wafer inspection by means of a scanning electron microscope (SEM) column in which the secondary electron detector 22, 24 is positioned centrally above the objective lens of the column. Secondary electrons that leave the central pa... | 11/11/2003 |
| 6642529 | Methods for the automated testing of reticle feature geometries A method for inspecting features on a reticle is provided. The method includes providing a layout design of a test feature and transferring the layout design of the test feature onto the reticle. After the test feature is transferred onto the reticle, an ... | 11/04/2003 |
| 6630666 | Positron trap beam source for positron microbeam production A positron producing apparatus which includes a vacuum chamber with a source of positrons to be supplied into the vacuum chamber forming a positron cloud within a Penning Trap. The positron cloud is to be compressed producing a thin positron beam which is... | 10/07/2003 |
| 6627908 | Radiation source assembly and connector press used in producing such assemblies A radiation source assembly and a connector press used in producing such assemblies. In the radiation source assembly, each of the cap connector and the female connector is provided with internal round threads on its pigtail fitting hole, thus engaging wi... | 09/30/2003 |
