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| Number | Title | Issue Date |
| 8134124 | Method for creating S/tem sample and sample structure An improved method and apparatus for S/TEM sample preparation and analysis. Preferred embodiments of the present invention provide improved methods for TEM sample creation, especially for small geometry ( | 03/13/2012 |
| 7663101 | System and methods for preparing microscopy samples A device, method and system for preparing and storing samples for microscopic analysis is disclosed. The device provides a reservoir that can be attached to a displacement pipette thereby filling the reservoir with reagents desired for preparing the samples for micr... | 02/16/2010 |
| 7659506 | Method and system for generating and reviewing a thin sample A system and method for generating a thin sample, the method includes: milling an intermediate section of a thin sample such as to enable an upper portion of the thin sample to tilt in relation to a lower portion of the thin sample; wherein the lower portion is conn... | 02/09/2010 |
| 7615745 | Method for separating a minute sample from a work piece The invention pertains to a method for separating a minute sample (1) from a work piece (2). Such a method is routinely used in the semiconductor industry to obtain samples from wafers to be inspected in a TEM. It occurred to the inventor that approxim... | 11/10/2009 |
| 7538322 | Method of fabricating sample membranes for transmission electron microscopy analysis A method of fabricating sample lamella for transmission electron microscopy (TEM) analysis is provided. A waiting-examination sample having an analysis target on the top surface of that is offered, and at least a mark around the analysis target is defined. A coverin... | 05/26/2009 |
| 7531794 | Method and apparatus for preparing specimen Preparing a thin-film specimen adapted for TEM (transmission electron microscopy) observation. A high-brightness pixel extraction unit extracts high-brightness pixels which form a specimen image taken by an imaging unit. The intensities becoming greater than a given... | 05/12/2009 |
| 7525087 | Method for creating observational sample According to the present invention, a method for creating a sample for a TEM (Transmission Electron Microscope) observation comprising: forming an observation surface at a specific area of a semiconductor device; forming an amorphous protection film on the observati... | 04/28/2009 |
| 7442924 | Repetitive circumferential milling for sample preparation A method of sample extraction entails making multiple, overlapping cuts using a beam, such as a focused ion beam, to create a trench around a sample, and then undercutting the sample to free it. Because the sidewalls of the cut are not vertical, the overlapping cuts... | 10/28/2008 |
| 7432501 | Ionising particle analyser enabling for example the separation of the fluorescent yield (FY) and the total electron yield (TEY) in EXAPS (extended X-ray absorption fine structure) measurements An ionising particle analyser comprises a source of ionising particles, a charged particle detector, and an ionisable gas located between the source and the detector. The analyser further comprises a charged particle impeding device located between the source and th... | 10/07/2008 |
| 7427753 | Method of cross-section milling with focused ion beam (FIB) device A method of milling a cross section of a wafer and a milling device. The method includes a coarse scanning of at least two milling frames and a fine scanning of at least one milling frame. The milling device is adapted to cross-section milling of a wafer, said milli... | 09/23/2008 |
| 7423261 | Curved conduit ion sampling device and method An ion sampling apparatus for use in a mass spectrometry system. The ion sampling apparatus includes a target support for receiving a sample, an irradiation source for emitting energetic radiation or particles toward the target support, and a conduit having a curved... | 09/09/2008 |
| 7423263 | Planar view sample preparation A method and apparatus is described for orienting samples for charged particle beam operations. A sample is attached to a probe with a major surface of the sample at a non-normal angle to the probe shaft, and the probe shaft is rotated to reorient the sample. The in... | 09/09/2008 |
| 7394075 | Preparation of integrated circuit device samples for observation and analysis In one embodiment, a sample of an integrated circuit device is prepared for observation in a transmission electron microscope (TEM). The sample may be placed on a surface formed by vertical edges of several TEM grids. The sample may be affixed to a vertical edge of ... | 07/01/2008 |
| 7354482 | Film deposition device A film deposition device for depositing a film includes a depositing chamber for depositing the film with plasma. A plasma quantity monitoring device is disposed in the depositing chamber for monitoring a plasma quantity entering the depositing chamber at real time.... | 04/08/2008 |
| 7297944 | Ion beam device and ion beam processing method, and holder member An apparatus has a holder member (21) which holds a sample (3), and a removing beam source (13) which irradiates an inert ion beam onto a cross section (4) of the sample (3) held by a holder member (21) and removes a fractur... | 11/20/2007 |
| 7291837 | Apparatus and method for preparing samples for radiocarbon dating The invention provides a method and apparatus for preparing samples of carbon dioxide with a 14C content for analysis in liquid scintillation counting equipment, the sample being of a known mass and being introduced into and substantially wholly absorbed ... | 11/06/2007 |
| 7257990 | Accelerated ultralow moisture permeation measurement By measuring ultralow moisture permeation through a barrier material sample at a temperature substantially above ambient, definitive values are produced on an accelerated basis that can be used to accurately predict long term daily performance of that barrier materi... | 08/21/2007 |
| 7217121 | Method and apparatus for improved process control in combustion applications This invention relates to a method and apparatus for improved process control in combustion applications, and particularly those relating to the steelmaking industry. An apparatus is provided for process control in a combustion application comprising a laser to tran... | 05/15/2007 |
| 7196338 | Ultra-thin sample preparation for transmission electron microscopy In accordance with the invention, there is a method of fabricating a material for transmission electron microscopy comprising removing a first portion from a material having a thickness of (d1) to form a thinned material having a thickness of (d2 | 03/27/2007 |
| 7189968 | Sample measurement method and measurement sample base material A sample measurement method is a sample measurement method by an electron microscope and includes the film formation step of forming a sample on a projection on the major surface of a substrate, the electron beam irradiation step of irradiating the sample with an el... | 03/13/2007 |
| 7180061 | Method for electron beam-initiated coating for application of transmission electron microscopy A method for preparing a specimen for application of microanalysis thereto includes forming an initial conductive layer over a defined area of interest on a semiconductor substrate, the initial conductive layer formed through an electron beam deposition process. A v... | 02/20/2007 |
| 7178384 | Method and apparatus for measuring ultralow permeation Method and apparatus for testing ultralow moisture permeation through a sample such as a thin barrier film by exposing one surface of a sample to be tested for moisture permeation to a predetermined humidity of HTO. The HTO permeating therethrough is collected in a ... | 02/20/2007 |
| 7151262 | Radioactive gas measurement apparatus and failed fuel detection system To provide a radioactive gas measurement apparatus that is simply constructed and can efficiently measure Xe-133 in a radioactive gas on-line under the condition that the radioactive gas is mixed with interference N-13, an apparatus is provided for measuring a radia... | 12/19/2006 |
| 7112790 | Method to prepare TEM samples A method for preparing a transmission electron microscopy (TEM) sample is provided which includes removing a portion of a substrate using a focused ion beam tool and securing the removed portion to a support structure to form a grafted structure. The method further ... | 09/26/2006 |
| 7078687 | Thin film analyzing method The present invention provides is a thin film analyzing method which can be applied to various fields, and which makes it possible to detect and analyze in a simple manner, with high precision, a distribution of a specific component in a thin film formed on a suppor... | 07/18/2006 |
| 7038218 | Inspection by a transmission electron microscope of a sample A method of manufacturing a transmission electron microscope inspection sample. The sample is mounted into a recess in the mount and the sample is grinded to a preset target thickness. A recess for mounting the sample and a groove for separating the sample from the ... | 05/02/2006 |
| 7034299 | Transmission electron microscope system and method of inspecting a specimen using the same It is possible to reliably and efficiently determine whether a specimen contains viruses, bacteria, etc. and, if it does, identify their types, regardless of the observer. Furthermore, even a newly-discovered bacterium can be quickly identified by utilizing a databa... | 04/25/2006 |
| 7005636 | Method and apparatus for manipulating a microscopic sample In the semiconductor industry, microscopic samples are cut out of substrates for purposes of analysis. In the case of a known method, a sample to be cut loose out of a substrate is attached to a sample carrier connected to a manipulator and the sample is cut loose f... | 02/28/2006 |
| 6999167 | Automated reactor endpointing of platy interference effect pigments An apparatus and a method for objectively ascertaining a color match between a selected standard color and the color exhibited by an interference effect pigment during processing thereof and terminating the process upon achieving a match. The invention provides a sp... | 02/14/2006 |
| 6932939 | System for high throughput sample preparation and analysis using column chromatography A system and method high throughput sample preparation and analysis using column chromatography. Each port in a plurality of ports has a port input that interfaces with a first fluid source and a port output. A fluidic circuit is coupled to each port output and to a... | 08/23/2005 |
| 6930488 | Method and apparatus for accelerated SER testing of circuitry One embodiment of the present invention provides a system that facilitates accelerated Soft-Error Rate (SER) testing of circuitry. The system starts by collecting a radioactive gas from the atmosphere and concentrating the radioactive gas in a testing chamber. Once ... | 08/16/2005 |
| 6924481 | Scanning microscope with brightness control Automatic pattern matching and shape measurement are enabled by adjusting a brightness level of a microscope image based on information of a local region of the image so that a magnified image of the local region takes on an appropriate brightness and is not affecte... | 08/02/2005 |
| 6907796 | Temperature-controlled injector for a chemical analysis unit The invention relates to a temperature-controlled injector for a chemical analysis unit, in particular a gas chromatograph, comprising an injector tube, which can be received by a receiving tube, having a cooling system, which surrounds the receiving tube, through w... | 06/21/2005 |
| 6867413 | High-flow rate, low-noise, gas sampling apparatus and methods for collecting and detecting particulate in a gas A high-flow rate, low-noise, gas sampling apparatus for collecting particulate such as biological, chemical, and radioactive material from a gas on a collector such as an impaction collector includes a housing having an inlet and an outlet and a fan disposed within ... | 03/15/2005 |
| 6847033 | Method and device for quickly and continually detecting changes in the concentration of radon gas that is dissolved in water The invention describes a method and a device for the continual and, in particular, for a fast detection of changes of the concentration of radon gas dissolved in water by means of a transfer into a measuring gas (Rn-222), which can be adopted for a variety of monit... | 01/25/2005 |
| 6826971 | Fabrication method for sample to be analyzed The semiconductor substrate is removed from a wafer or a chip wherein a defect has occurred and, thereby, the surface, which faces the substrate, that contacts the semiconductor substrate in an element formation portion is exposed. A cross section of the element for... | 12/07/2004 |
| 6784427 | Samples for transmission electron microscopy TEM samples are cut from a solid state material with length (l) and width (b) and with a front-side sample surface (7) onto which a curable adhesive of the flowable type is applied for fixing a fiber (2) with a diameter (d) aligned on the sample surfac... | 08/31/2004 |
| 6700121 | Methods of sampling specimens for microanalysis Methods of sampling specimens for microanalysis, particularly microanalysis by atom probe microscopy, include steps of forming a study specimen in a first study object (as by use of focused ion beam milling); removing the study specimen from the study obj... | 03/02/2004 |
| 6674072 | Preparation of thin lead samples for alpha particle emission test A method of preparing a lead sample to determine an amount of alpha particle emission. First, a thin slice is obtained from the lead source, such as by cutting the lead source using a microtome. The thin slice may be rolled to flatten any wrinkles caused ... | 01/06/2004 |
| 6576900 | Methods of sampling specimens for microanalysis Methods of sampling specimens for microanalysis, particularly microanalysis by atom probe microscopy, include steps of forming a study specimen in a first study object (as by use of focused ion beam milling); removing the study specimen from the study obj... | 06/10/2003 |
