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Class 250/298 - Magnetic field path-bending means


Subclass of Class 250 - Radiant energy
Definition: Subject matter wherein the ion selecting means is a magnetic
No. of patents: 124
Last issue date: 01/05/2010


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NumberTitleIssue Date
7642512Mass spectrometry and mass spectroscope
A magnetic field gradient is generated in a space, and a microparticle is flied downward in the space, thereby applying a magnetic force from the magnetic field gradient onto the microparticle. Then, a velocity and an acceleration of the microparticle due to the mag...
01/05/2010
7476855Beam tuning with automatic magnet pole rotation for ion implanters
An ion implantation apparatus, system, and method for controlling an ion beam, wherein a mass analyzer generally positioned between an ion source and an end station is configured to selectively control a path of a desired ion beam. The mass analyzer comprises one or...
01/13/2009
7427751High sensitivity slitless ion source mass spectrometer for trace gas leak detection
A mass spectrometer includes a main magnet having spaced-apart polepieces which define a gap, the main magnet producing a magnetic field in the gap, an ion source to generate ions and to accelerate the ions into the magnetic field in the gap, the ion source located ...
09/23/2008
7385187Multi-reflecting time-of-flight mass spectrometer and method of use
A multiple reflecting time-of-flight mass spectrometer (MR-TOF MS) and method of analysis are disclosed. The flight path of ions is folded along a trajectory by electrostatic mirrors. The longer flight path provides higher resolution while maintaining a moderate ins...
06/10/2008
7381949Method and apparatus for simultaneously depositing and observing materials on a target
A system for joining at least two beams of charged particles that includes directing a first beam along a first axis into a field. A second beam is directed along a second axis into the field. The first and second beams are turned, by interaction between the field a...
06/03/2008
7378651High field asymmetric waveform ion mobility spectrometer FAIMS
Disclosed is an apparatus for separating ions including a plurality of first electrode portions, each first electrode portion of the plurality of first electrode portions having a first length and an outer surface that is at least partially curved in a direction tra...
05/27/2008
7368710Sample preparation method
The present invention provides a method of sample preparation for use in obtaining elemental isotope ratios of a material by accelerator mass spectrometry. The method comprises forming the material into a sample without any substantial chemical alteration of the mat...
05/06/2008
7326941Apparatus and methods for ion beam implantation using ribbon and spot beams
This invention discloses an ion implantation apparatus with multiple operating modes. It has an ion source and an ion extraction means for extracting a ribbon-shaped ion beam therefrom. The ion implantation apparatus includes a magnetic analyzer for selecting ions w...
02/05/2008
7317192High energy polyenergetic ion selection systems, ion beam therapy systems, and ion beam treatment centers
Devices and methods are provided for generating laser-accelerated high energy polyenergetic positive ion beams that are spatially separated and modulated based on energy level. The spatially separated and modulated high energy polyenergetic positive ion beams are us...
01/08/2008
7315034Irradiation system with ion beam/charged particle beam
In an irradiation system with an ion beam/charged particle beam having an energy filter, the energy filter is formed by deflection electrodes and a deflection magnet which can be switchingly used. The deflection magnet has a general window-frame shape and is formed ...
01/01/2008
7223972Stabilization of a magnetic section of a mass spectrometer
An analytical instrument, such as a mass spectrometer, the instrument having a magnetic section with a controllable electromagnetic field. Controlling the electromagnetic field is accomplished by controlling a temperature of a base plate within the magnetic section,...
05/29/2007
7223335Ion separation
A device for separating ions from a fluid stream is disclosed. The device includes multiple chambers in fluid communication with one another. A first chamber has an inlet, and a last chamber has an outlet. The inlets and outlets of intermediate chambers are connecte...
05/29/2007
7164139Wien filter with reduced chromatic aberration
One embodiment disclosed relates to a Wien filter for a charged-particle beam apparatus. The charged-particle beam is transmitted through the Wien filter in a first direction. A magnetic field generation mechanism is configured to generate a magnetic field in a seco...
01/16/2007
7115861Spectrograph time of flight system for low energy neutral particles
A mass spectrometer is provided for identifying mass and velocity distributions in a continuous ion beam is configured with a circular dispersive system creating a rotating electromagnetic field, which is capable of deflecting the ion beam from an initial direction,...
10/03/2006
7112789High aspect ratio, high mass resolution analyzer magnet and system for ribbon ion beams
The present invention provides a windowframe magnet having an aligned array of paired bedstead coils in mirror symmetry can bend a high aspect ratio ribbon ion beam through angle of not less than about 45 degrees and not more than about 110 degrees, and can focus it...
09/26/2006
7105839Method and fine-control collimator for accurate collimation and precise parallel alignment of scanned ion beams
In system for implanting workpieces with an accurately parallel scanned ion beam, a fine-control collimator construct is used to reduce the deviation of the scanned ion beam from a specified axis of parallelism and thereby improve its collimation. The shape of the f...
09/12/2006
7078852Method and apparatus for simultaneously depositing and observing materials on a target
A system for joining at least two beams of charged particles that includes directing a first beam along a first axis into a field. A second beam is directed along a second axis into the field. The first and second beams are turned, by interaction between the field a...
07/18/2006
7078713Electromagnetic regulator assembly for adjusting and controlling the current uniformity of continuous ion beams
An electromagnetic regulator assembly for the production of contiguous magnetic fields which are applied to a continuous ion beam is described. The assembly is structured for controlling the uniformity of traveling continuous ribbon-shaped beams; and allows for dire...
07/18/2006
7029855Radioactive multiplexing analytical methods for biomarkers discovery
A novel analytical method involves labeling samples with different radioactive labeling agents, mixing and subjecting the mixture to any separation technique, and then differentially detecting and quantifying subcomponents from each sample for comparison. The novel ...
04/18/2006
7019314Systems and methods for ion beam focusing
Systems and methods are provided for focusing a scanned ion beam in an ion implanter. A beam focusing system is provided, comprising first and second magnets providing corresponding magnetic fields that cooperatively provide a magnetic focusing field having a time-v...
03/28/2006
7012248Time of flight system on a chip
A CMOS time-of-flight “TOF” system-on-a-chip “SoC” for precise time interval measurement with low power consumption and high counting rate has been developed. The analog and digital TOF chip may include two Constant Fraction Discriminators “CFDs” and a T...
03/14/2006
6984821Mass spectrometer and methods of increasing dispersion between ion beams
A mass spectrometer includes a magnetic sector configured to separate a plurality of ion beams, and an electrostatic sector configured to receive the plurality of ion beams from the magnetic sector and increase separation between the ion beams, the electrostatic sec...
01/10/2006
6979818Mass spectrometer for both positive and negative particle detection
A mass spectrometer suitable to measure both positive and negative particles, such as ions for example in a vacuum chamber. This spectrometer is provided with a turnable permanent magnet segment, which provides the gap of a yoke with adequate magnetic flux having th...
12/27/2005
6937017Magnetic pole magnet device using the magnetic pole, and magnetic resonance imaging apparatus
The present invention is intended to provide a magnetic pole, a magnet apparatus, and a magnetic resonance imaging apparatus that the magnetic structure of the magnet apparatus for generating a uniform magnetic field is formed in a lower burst mode, and the profitab...
08/30/2005
6930316Ion implantation system and ion implantation method
In an ion implantation system including (a) an ion source (b) a mass analyzing portion, (c) an ion acceleration portion, (d) an ion beam focusing/deflecting portion, and (e) an end station chamber for implanting ions onto a semiconductor substrate. The ion source co...
08/16/2005
6906321Time-of-flight mass spectrometer
In a TOF-MS according to the present invention, ions fly a round orbit or a reciprocal path once or more than once to be separated by their mass to charge ratios before they are detected by a detector, The detector is movable at least in two positions, where the eff...
06/14/2005
6906333Magnetic separator for linear dispersion and method for producing the same
A magnetic sector for charged particle beam transport that includes a magnetic field profile that achieves a linear dispersion from a collimated beam of charged particles proportional to their mass-energy-to-charge ratio. In one embodiment, the field profile necessa...
06/14/2005
6906453Method and apparatus for simultaneously depositing and observing materials on a target
A system for joining at least two beams of charged particles that includes directing a first beam along a first axis into a field. A second beam is directed along a second axis into the field. The first and second beams are turned, by interaction between the field a...
06/14/2005
6903351Charged particle beam irradiation equipment having scanning electromagnet power supplies
A power supply for applying a voltage to a scanning electromagnet for deflecting a charged particle beam has a first power supply unit having no filter and a second power supply unit having a filter. When an irradiation position of the charged particle beam in an ir...
06/07/2005
6900434Method and device for separating ion mass, and ion doping device
A hollow exciting current pathway in the form of a conductor is arranged outside of an ion deflection casing with a curved contour and having an inlet and an outlet. The conductor is composed of a widthwise spiral formation of conductors running through the inlet an...
05/31/2005
6881966Hybrid magnetic/electrostatic deflector for ion implantation systems
A magnetic deflector for an ion beam is disclosed and comprises first and second coils. The coils are positioned above and below the beam, respectively, and extend along a width of the beam. Current passes through the coils to generate a magnetic field therebetween ...
04/19/2005
6855939Particle beam system having a mirror corrector
The invention relates to a particle beam system comprising a particle source (1), a mirror corrector (9, 21 to 25), and an objective lens (16). The mirror corrector comprises an electrostatic mirror (9) and a magnetic beam deflecto...
02/15/2005
6843375Magnetic separator for linear dispersion and method for producing the same
A magnetic sector for charged particle beam transport that includes a magnetic field profile that achieves a linear dispersion from a collimated beam of charged particles proportional to their mass-energy-to-charge ratio. In one embodiment, the field profile necessa...
01/18/2005
6838676Particle beam processing system
A method for slowing and controlling a beam of charged particles includes the steps of superimposing at least one magnetic field on a mass and passing the beam through the mass and at least one magnetic field such that the beam and the mass slows but does not stop t...
01/04/2005
6835930High mass resolution magnet for ribbon beam ion implanters
A mass analyzer for a ribbon shaped ion beam is disclosed. The mass analyzer comprises a pair of coils that define an entrance end and an exit end of the analyzer. Field clamps are employed at or proximate to one or more of the entrance and exit ends of the mass ana...
12/28/2004
6833545Method and device for performing analyses in parallel
The present invention relates to analysis devices having means (3, 5, 7) for producing a plurality of ion beams of samples substantially simultaneously; mass separating means for individually mass separating each ion beam in parallel and detecting means (1...
12/21/2004
6831276Microscale mass spectrometric chemical-gas sensor
A mass sensor, in an exemplary embodiment, includes a housing that includes a first plate, a second plate, and a center portion positioned between the first and second plates. The mass analyzer also includes an ionizer a double focusing mass spectrometer, and an ion...
12/14/2004
6815880Method and apparatus for simultaneously depositing and observing materials on a target
A system for joining at least two beams of charged particles that includes directing a first beam along a first axis into a field. A second beam is directed along a second axis into the field. The first and second beams are turned, by interaction between the field a...
11/09/2004
6815666Single stage accelerator mass spectrometer
A negative ion source placed inside a negatively-charged high voltage electrode emits a beam which is accelerated to moderate energy, approximately 35,000 electron volts, and filtered by a momentum analyzer i.e. an analyzing bending magnet, to remove unwanted ions. ...
11/09/2004
6781117Efficient direct current collision and reaction cell
An improved collison or reaction cell for collecting and focusing gas-phase ions in a mixture from an ion source or a mass analyzer into a gas-filled collision cell, inducing fragmentation or reaction of the ions by interaction with neutral or ionic gas-phase specie...
08/24/2004
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