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Class 250/297 - For causing complex ion path


Subclass of Class 250 - Radiant energy
Definition: Subject matter wherein diverse field means act simultaneously
No. of patents: 33
Last issue date: 07/13/2010


NumberTitleIssue Date
7755040Mass spectrometer and electric field source for mass spectrometer
An electric field source for a mass spectrometer and a mass spectrometer are described. ...
07/13/2010
7728290Orbital ion trap including an MS/MS method and apparatus
A method of obtaining a mass spectrum of elements in a sample is disclosed. Sample precursor ions having a mass to charge ratio M/Z are generated, and fragmented at a dissociation site, so as to produce fragment ions of mass to charge ratio m/z. The fragment ions ar...
06/01/2010
7429730SIFT-MS instruments
A SIFT or SIFDT apparatus in which the upstream quadrupole and the downstream quadrupole are housed within a single evacuated chamber with the upstream quadrupole being connected to the downstream quadrupole by a curved flow tube. In a preferred form the interior of...
09/30/2008
7378649Simplex optimization methods for instrumentation tuning
In some embodiments, a method of optimizing operating parameters of an analytical instrument (e.g. lens voltages of a mass spectrometer) includes steps taken to minimize the method duration in the presence of substantial instrument noise and/or drift. Some methods i...
05/27/2008
7378651High field asymmetric waveform ion mobility spectrometer FAIMS
Disclosed is an apparatus for separating ions including a plurality of first electrode portions, each first electrode portion of the plurality of first electrode portions having a first length and an outer surface that is at least partially curved in a direction tra...
05/27/2008
7351961Measuring cell for ion cyclotron resonance spectrometer
This invention relates to a measuring cell for an Ion Cyclotron Resonance (ICR) spectrometer. The present invention provides a measurement cell for an FTMS spectrometer, comprising an excitation electrode arrangement positioned about a longitudinal axis which extend...
04/01/2008
7351958Ion optics systems
In various embodiments, provided are ion optics systems comprising an even number of ion mirrors arranged in pairs such that a trajectory of an ion exiting the ion optics system can be provided that intersects a surface substantially parallel to an image focal surfa...
04/01/2008
7282708Method of selecting ions in an ion storage device
The method of the present invention is to select ions having a predetermined mass to charge ratio by applying an ion selecting electric field in an ion storage space of an ion storage device. The method is characterized in that the ion selecting electric field is ge...
10/16/2007
7247495Mass spectrometer method and apparatus for analyzing a sample in a solution
The invention provides a mass spectrometric method for analyzing a sample in a solution, including the steps of directing a flow of a solution containing sample compounds to be analyzed towards a supersonic nozzle having an input end and an output end; vaporizing th...
07/24/2007
7129483Laser desorption and ionization mass spectrometer with quantitative reproducibility
Laser desorption/ionization time-of-flight mass spectrometer (“LDI-TOF-MS”) devices, and methods, that accurately measure the mass of analytes contained in a sample and which also measure the quantities of analytes present in a sample in a consistent manner from...
10/31/2006
7034293Linear ion trap apparatus and method utilizing an asymmetrical trapping field
A linear ion trap includes four electrodes and operates with an asymmetrical trapping field in which the center of the trapping field is displaced from a geometrical center of the trap structure. The asymmetrical trapping field can include a main AC potential provid...
04/25/2006
7019314Systems and methods for ion beam focusing
Systems and methods are provided for focusing a scanned ion beam in an ion implanter. A beam focusing system is provided, comprising first and second magnets providing corresponding magnetic fields that cooperatively provide a magnetic focusing field having a time-v...
03/28/2006
6958476Methods to improve resolution of cross sectioned features created using an ion beam
Methods for creating a cross section of at least one feature located on a substrate are disclosed. The methods include coating the feature with a layer of contrast enhancing material, recoating the feature with a second material that is different from the contrast e...
10/25/2005
6903331Mass spectrometer
An ion tunnel ion trap comprises a plurality of electrodes having apertures. The ion tunnel ion trap is preferably coupled to a time of flight mass analyser. ...
06/07/2005
6878933Method for coupling laser desorption to ion trap mass spectrometers
The subject invention provides improved methods for injecting ions into a quadrupole ion trap mass spectrometer (QIT-MS). The methods of the subject invention are applicable to procedures involving atmospheric pressure laser desorption (AP-LD) of a sample to be inve...
04/12/2005
6833545Method and device for performing analyses in parallel
The present invention relates to analysis devices having means (3, 5, 7) for producing a plurality of ion beams of samples substantially simultaneously; mass separating means for individually mass separating each ion beam in parallel and detecting means (1...
12/21/2004
6822224Tandem high field asymmetric waveform ion mobility spectrometry (FAIMS)tandem mass spectrometry
A tandem mass spectrometer is disclosed. A first mass analyzer within a low-pressure region is provided for passing ions therethrough. A collision cell is at an ion outlet of the mass analyzer to provide a location for ions to collide therein with a collision gas to...
11/23/2004
6815674Mass spectrometer and related ionizer and methods
In one embodiment, a miniaturized structure and associated method function as a mass spectrometer or analyzer and may, with modification, function as an ion generator. The miniaturized structure has a pair of generally planar parallel spaced electrodes which have pr...
11/09/2004
6670606Preparation of ion pulse for time-of-flight and for tandem time-of-flight mass analysis
The use of a segmented-ion trap with collisional damping is disclosed to improve performance (resolution and mass accuracy of single stage and tandem time-of-flight mass spectrometers. In the case of single stage spectrometers ions are directly injected f...
12/30/2003
6649911Method of selecting ions in an ion storage device
The present invention describes a method of selecting ions in an ion storage device with high resolution in a short time period while suppressing amplitude of ion oscillation immediately after the selection. In a method of selecting ions within a specific...
11/18/2003
6646252Multi-anode detector with increased dynamic range for time-of-flight mass spectrometers with counting data acquisition
A new detection scheme for time-of-flight mass spectrometers is disclosed. This detection scheme allows extending the dynamic range of spectrometers operating with a counting, technique (TDC). The extended dynamic range is achieved by constructing a multi...
11/11/2003
6633034Method and apparatus for imaging a specimen using low profile electron detector for charged particle beam imaging apparatus including electrostatic mirrors
A charged particle beam method and apparatus use a primary electron beam to irradiate a specimen so as to induce the specimen to emit secondary and backscattered electrons carrying information about topographic and material structure of the specimen, resp...
10/14/2003
6580072Method for performing failure analysis on copper metallization
Described are methods of adapting FIB techniques to copper metallization, and to structures that result from the application of such techniques. A method in accordance with the invention can be used to sever copper traces without damaging adjacent materia...
06/17/2003
6573110Combinatorial chemistry system and method of use
A combinatorial chemistry system allows for the dual processing of different molecules coated on a library of beads. The system includes beads coated with different molecules on each bead, a bead holder, screening equipment and characterization equipment....
06/03/2003
6525314Compact high-performance mass spectrometer
A compact high-performance mass spectrometer includes an ion source, an ion filter, a collision cell, a fragment filter, and an ion detector, along with one or more ion deflectors and one or more gas removal rings. An ion deflector allows a straight ion f...
02/25/2003
6329654Multipole rod construction for ion guides and mass spectrometers
A miniature multipole rod assembly, an apparatus and a technique for constructing such an assembly used for ion guide and mass spectrometers....
12/11/2001
6294781Electromagnetic mass distiller
A device for segregating high-mass particles in a multi-species plasma from lower-mass particles has a chamber surrounded by a hollow annular shaped enclosure which defines a central axis. In a radial direction outwardly from the axis, the chamber include...
09/25/2001
5689112Apparatus for detection of surface contaminations on silicon wafers
Surface contamination of silicon wafers is detected by a combined beam-deflecting magnet and magnetic spectrometer system. Heavy ions are directed onto the surface of a silicon wafer through the beam-deflecting magnet, and ions back-scattered from contami...
11/18/1997
5166518Mass spectrometer with electrostatic energy filter
A mass spectrometer comprising ion source means (1) for producing ions characteristic of a sample to be analysed; ion detector means (14) for receiving at least some of said ions; magnetic sector analyzing means (18) and electrostatic analyzing means (8) ...
11/24/1992
4952803Mass Spectrometry/mass spectrometry instrument having a double focusing mass analyzer
A double focusing mass spectrometer is used as the second mass analyzer of a Mass Spectrometry/Mass Spectrometry Instrument comprising a uniform electric field and a magnetic sector. Fragment ions produced from precursor ions of a certain ionic species ar...
08/28/1990
4829179Surface analyzer
A surface analyzer for analyzing physical properties of the surface of a sample by means of PELS (Proton energy loss spectroscopy) in which accelerated ion beams such as proton beams impinge on the sample in the vertical direction to the surface of the sa...
05/09/1989
4723076Double focusing mass spectrometers
There is provided a mass spectrometer having at least three analyser sectors of the electrostatic or magnetic types, at least one sector being of the electrostatic type and at least one further sector being of the magnetic type. The spectrometer includes ...
02/02/1988
4644161Mass spectrograph
A mass spectrograph combining one or more magnetic deflections with the action of electrostatic fields, characterized by the fact that the system is circularly symmetrical; by the fact that the ions are injected radially from a source constituted by a hea...
02/17/1987
 
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