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| Number | Title | Issue Date |
| 8026480 | Mass spectrometer A basic ion optical system (2) in which the temporal focusing of ions is ensured includes a plurality of sector-shaped electrodes (11, 12, 13, and 14), an ion injection slit (15), and an ion ejection slit (16), which are placed on ... | 09/27/2011 |
| 8013297 | Ion gate for dual ion mobility spectrometer and method thereof Disclosed is an ion gate for a dual IMS and method. The ion gate includes an ion source, a first gate electrode placed on one side of the ion source, a second gate electrode placed on the other side of the ion source, a third gate electrode placed on the side of the... | 09/06/2011 |
| 7679054 | Double stage charged particle beam energy width reduction system for charged particle beam system The present invention relates to e.g. a charged particle beam energy width reduction system for a charged particle beam with a z-axis along the optical axis and a first and a second plane, comprising, a first element acting in a focusing and dispersive manner, a sec... | 03/16/2010 |
| 7498572 | Deflecting electromagnet and ion beam irradiating apparatus A deflecting electromagnet has first and second magnetic poles that are opposed to each other via an inter-pole space through which an ion beam passes. The deflecting electromagnet further has: a pair of potential adjusting electrodes which are placed to sandwich a ... | 03/03/2009 |
| 7402799 | MEMS mass spectrometer A MEMS mass spectrometer having metal walls connected between a lid and base, with the walls defining a plurality of interior chambers including sample gas input chambers, an ionizer chamber, a plurality of ion optics chambers and a ion separation chamber. A detecto... | 07/22/2008 |
| 7378651 | High field asymmetric waveform ion mobility spectrometer FAIMS Disclosed is an apparatus for separating ions including a plurality of first electrode portions, each first electrode portion of the plurality of first electrode portions having a first length and an outer surface that is at least partially curved in a direction tra... | 05/27/2008 |
| 7365312 | Method and apparatus for enhanced sequencing of complex molecules using surface-induced dissociation in conjunction with mass spectrometric analysis The invention relates to a method and apparatus for enhanced sequencing of complex molecules using surface-induced dissociation (SID) in conjunction with mass spectrometric analysis. Results demonstrate formation of a wide distribution of structure-specific fragment... | 04/29/2008 |
| 7351316 | Water electrolysis method and device for determination of hydrogen and oxygen stable isotopic composition Water electrolysis device determining stable isotopic composition of water and a water electrolysis method for stable isotopic composition of water capable of analyzing many samples easily, safely and at low cost in very short time, and rapidly analyzing 17 | 04/01/2008 |
| 7351955 | Reduction of chemical noise in a MALDI mass spectrometer by in-trap photodissociation of matrix cluster ions A MALDI mass spectrometer includes a radiation source, such as a gas or solid state laser, that emits a beam of radiation (typically in the UV or IR wavelengths) directed along the central axis of a linear ion trap in which analyte ions and matrix cluster ions are c... | 04/01/2008 |
| 7331216 | Leak rate measuring device A leak rate measuring device contains a strip spectrometer in which the ion path of the respective gas is influenced by at least one variable influencing quantity. When a gas having a predetermined mass is detected, and leakages of a gas having other predetermined m... | 02/19/2008 |
| 7312042 | Embossed cell analyte sensor and methods of manufacture An analyte measurement system is provided having sensors with embossed test chamber channels. In one embodiment, the sensors are elongate test strips for in vitro testing, each test strip having a substrate, at least one electrode, an embossed channel in the electro... | 12/25/2007 |
| 7241993 | Inspection system by charged particle beam and method of manufacturing devices using the system An inspection apparatus by an electron beam comprises: an electron-optical device 70 having an electron-optical system for irradiating the object with a primary electron beam from an electron beam source, and a detector for detecting the secondary electron im... | 07/10/2007 |
| 7217919 | Method and apparatus for multiplexing plural ion beams to a mass spectrometer A method/apparatus for multiplexing plural ion beams to a mass spectrometer. At least two ion sources are provided with means of transporting the ions from the ion sources to separate two-dimensional ion traps. Each ion trap is used for storage and transmission of t... | 05/15/2007 |
| 7214934 | Radio frequency power generator A RF power generator for exciting inductively coupled plasma for spectrometry includes an induction coil for exciting the plasma as part of its load circuit. The load circuit also comprises a capacitor connected in parallel with the induction coil. The RF power gene... | 05/08/2007 |
| 7211788 | Mass spectrometer and mass filters therefor A mass filter apparatus for filtering a beam of ions is described. The apparatus comprises an ion beam source and first and second mass filter stages in series to receive the ion beam. A vacuum system maintains the first and second filter stages at substantially the... | 05/01/2007 |
| 7176452 | Microfabricated beam modulation device A beam modulation device gate is constructed from a silicon material, such as a silicon layer on an silicon on insulator wafer. The device further comprises a set of electrical contacts on the layer. The layer defines a set of electrically conducting silicon materia... | 02/13/2007 |
| 7161158 | System and method for fast focal length alterations An apparatus and method for fast changing a focal length of a charged particle beam the method comprising the step of changing a control signal in response to a relationship between the control signal voltage value and the focal length of the charged particle beam. | 01/09/2007 |
| 7126114 | Method and system for mass analysis of samples A system and method of analyzing a sample is described. The system includes an ion source and a deflector for producing a plurality of ion beams each of which is detected in distinct detection regions. A detection system uses the information obtained from the detect... | 10/24/2006 |
| 7115861 | Spectrograph time of flight system for low energy neutral particles A mass spectrometer is provided for identifying mass and velocity distributions in a continuous ion beam is configured with a circular dispersive system creating a rotating electromagnetic field, which is capable of deflecting the ion beam from an initial direction,... | 10/03/2006 |
| 7034315 | Particle source with selectable beam current and energy spread The invention describes a particle source in which energy selection occurs. The energy selection occurs by sending a beam of electrically charged particles 13 eccentrically through a lens 6. As a result of this, energy dispersion will occur in an image... | 04/25/2006 |
| 7012248 | Time of flight system on a chip A CMOS time-of-flight “TOF” system-on-a-chip “SoC” for precise time interval measurement with low power consumption and high counting rate has been developed. The analog and digital TOF chip may include two Constant Fraction Discriminators “CFDs” and a T... | 03/14/2006 |
| 6995365 | Mass analyzer having improved ion selection unit An improved mass spectrometer is set forth. The mass spectrometer comprises an ion injector that is configured to provide a plurality of ions for analysis and an ion selection unit that is adapted to receive the plurality of ions from the ion injector and provide on... | 02/07/2006 |
| 6984821 | Mass spectrometer and methods of increasing dispersion between ion beams A mass spectrometer includes a magnetic sector configured to separate a plurality of ion beams, and an electrostatic sector configured to receive the plurality of ion beams from the magnetic sector and increase separation between the ion beams, the electrostatic sec... | 01/10/2006 |
| 6956206 | Negative ion atmospheric pressure ionization and selected ion mass spectrometry using a 63NI electron source Negative ion atmospheric pressure ionization mass spectrometers and selected ion mass spectrometers with a 63Ni ion source and a drift tube for reaction of a sample with electrons from the 63Ni ion source prior to analysis of a sample by mass s... | 10/18/2005 |
| 6924478 | Tandem mass spectrometry method Multiply charged ions are trapped and accumulated in a spatially limited region before being injected into an ion trap mass spectrometer such as a Fourier transform ion cyclotron resonance mass spectrometer (FTICR MS). In the ion trap electron capture dissociation (... | 08/02/2005 |
| 6906321 | Time-of-flight mass spectrometer In a TOF-MS according to the present invention, ions fly a round orbit or a reciprocal path once or more than once to be separated by their mass to charge ratios before they are detected by a detector, The detector is movable at least in two positions, where the eff... | 06/14/2005 |
| 6831276 | Microscale mass spectrometric chemical-gas sensor A mass sensor, in an exemplary embodiment, includes a housing that includes a first plate, a second plate, and a center portion positioned between the first and second plates. The mass analyzer also includes an ionizer a double focusing mass spectrometer, and an ion... | 12/14/2004 |
| 6815674 | Mass spectrometer and related ionizer and methods In one embodiment, a miniaturized structure and associated method function as a mass spectrometer or analyzer and may, with modification, function as an ion generator. The miniaturized structure has a pair of generally planar parallel spaced electrodes which have pr... | 11/09/2004 |
| 6815666 | Single stage accelerator mass spectrometer A negative ion source placed inside a negatively-charged high voltage electrode emits a beam which is accelerated to moderate energy, approximately 35,000 electron volts, and filtered by a momentum analyzer i.e. an analyzing bending magnet, to remove unwanted ions. ... | 11/09/2004 |
| 6762407 | Mass spectrometer including a quadrupole mass analyzer arrangement A mass spectrometer having an ion optics system in a first vacuum region, which diverts ions travelling in a first direction from a source, characterized by an initial pressure, through an angle such that neutral particles and photons from the source continue in the... | 07/13/2004 |
| 6717140 | Selective ion source for high intensity focused and collimated ion beams—coupling with high resolution cycloidal path sector A mass spectrometer is described in which the ions are submitted to the action of a uniform adjustable electrical field {right arrow over (E)}1, within a set of plane parallel electrodes a1, . . . , ai, . . . an fitted wit... | 04/06/2004 |
| 6650527 | Article comprising a casimir force modulator and methods therefor Method and apparatus for modulating the direction and magnitude of the Casimir force between two bodies. In accordance with the illustrative embodiment, a repulsive Casimir force is generated by placing two bodies in near-proximity to one another. For one... | 11/18/2003 |
| 6646252 | Multi-anode detector with increased dynamic range for time-of-flight mass spectrometers with counting data acquisition A new detection scheme for time-of-flight mass spectrometers is disclosed. This detection scheme allows extending the dynamic range of spectrometers operating with a counting, technique (TDC). The extended dynamic range is achieved by constructing a multi... | 11/11/2003 |
| 6639227 | Apparatus and method for charged particle filtering and ion implantation A charged particle filter provides a curved through path and has both magnetic poles for applying a magnetic field normal to the plane of curvature of the path and electrodes for applying a radial electric field. The filter is used as an energy filter dow... | 10/28/2003 |
| 6633034 | Method and apparatus for imaging a specimen using low profile electron detector for charged particle beam imaging apparatus including electrostatic mirrors A charged particle beam method and apparatus use a primary electron beam to irradiate a specimen so as to induce the specimen to emit secondary and backscattered electrons carrying information about topographic and material structure of the specimen, resp... | 10/14/2003 |
| 6596991 | Isotopomer mass spectrometer The analysis of isotopomers is conveniently performed using a double focusing high mass resolution magnetic mass spectrometer comprising an electric field and a magnetic field by a constant accelerating voltage slightly less than the accelerating voltage ... | 07/22/2003 |
| 6593566 | Method and apparatus for particle acceleration A method and apparatus for accelerating and a decelerating particles based on particle surface interactions. In particular, in some embodiments, particles traveling away from a surface are made to travel at either a higher or lower speed than that with wh... | 07/15/2003 |
| 6590207 | Microscale mass spectrometric chemical-gas sensor A mass sensor includes a magnet assembly and a mass analyzer. The mass analyzer includes a ceramic housing formed from two end plates and a center portion. The mass analyzer further includes a thermionic electron emitter ionizer, a double focusing mass sp... | 07/08/2003 |
| 6573517 | Ion implantation apparatus An ion injecting apparatus has an ion source, a mass-analyzing magnet, an accelerating/decelerating element, and deflecting elements. The mass analyzing magnet mass-analyzes an ion beam extracted from the ion source. The accelerating/de-celerating element... | 06/03/2003 |
| 6573110 | Combinatorial chemistry system and method of use A combinatorial chemistry system allows for the dual processing of different molecules coated on a library of beads. The system includes beads coated with different molecules on each bead, a bead holder, screening equipment and characterization equipment.... | 06/03/2003 |
