Did You Know...
...that the Eveready Battery began as an invention called the "electric flowerpot," which was a tube with a battery and light bulb inside? The idea was to fasten this gizmo to the side of a flowerpot so it would illuminate the flowers from the bottom. The idea died on the vine and the businessman who licensed the flower pot, Conrad Huber, was left with a pile of useless tubes -- until he found a way to market them as batteries to light the world!
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| Number | Title | Issue Date |
| 7364043 | Fastener inspection system A high-speed fastener inspection system is provided to perform 100 percent inspection of various geometry features and to sort a large number of fasteners at high speed. The inspection system includes a rotary table having an outer periphery, an inner periphery, and... | 04/29/2008 |
| 7355395 | Method and apparatus for eddy current-based quality inspection of dry electrode structure A system for non-destructive non-contact quality inspection of dry electrode units of energy storage includes an eddy current-based inspection system having a conveyor belt, and a hollow dielectric shell. An outer surface of the shell has a plurality of spaced apart... | 04/08/2008 |
| 7329831 | Laser trimming of resistors Improved systems and methods for laser trimming resistors printed on a substrate layer are provided. An exemplary embodiment measures a resistance value for each annular resistor and sorts the annular resistors into one or more bins based on the measured resistance ... | 02/12/2008 |
| 7274202 | Carousel device, system and method for electronic circuit tester A rotatable or translatable carousel configured to facilitate electrical or electronic testing of Devices Under Test (DUTs) in combination with an insertion handler and a test head is disclosed. The carousel is configured to be placed on a test head of a tester in a... | 09/25/2007 |
| 7248043 | Method and apparatus for eddy current-based quality inspection of dry electrode structure A system for non-destructive non-contact quality inspection of dry electrode units of energy storage includes an eddy current-based inspection system having a conveyor belt, and a hollow dielectric shell. An outer surface of the shell has a plurality of spaced apart... | 07/24/2007 |
| 7218128 | Method and apparatus for locating and testing a chip A probe apparatus includes a nest element operable to precisely locate a chip having a plurality of exposed interconnects on a face of the chip to permit conductive connection to the chip through the interconnects. The nest element includes a pocket dimensioned to l... | 05/15/2007 |
| 7199590 | Screening method for laminated ceramic capacitors A laminated ceramic capacitor C has a plurality of internal electrodes embedded in a dielectric base substance in a stratified manner, the internal electrodes are caused to conduct to a pair of terminal electrodes provided on an outer surface of the dielectric base ... | 04/03/2007 |
| 7189938 | Process and system to package residual quantities of wafer level packages Various preferred processes and equipment are described herein that more efficiently handle residual semiconductor parts during packaging. The processes include picking and removing all of the bad parts from a wafer before picking the good parts and picking all of t... | 03/13/2007 |
| 7165002 | Test device for dynamic memory modules A test device for dynamic memory modules is described and has an electronic test unit for generating test signals. Accordingly, the electronic test unit has at least one electronic component for generating the test signals, and is configured for use on a personal co... | 01/16/2007 |
| 7161346 | Method of holding an electronic component in a controlled orientation during parametric testing A component handler includes an improved test seat having a shape that ensures that an electronic component seated in the test seat is in an appropriate orientation for parametric testing. The test seat has a base surface and first and second opposed seat side surfa... | 01/09/2007 |
| 7151388 | Method for testing semiconductor devices and an apparatus therefor A method for testing integrated circuit devices and loading such devices into a test board for further testing and an apparatus therefor is disclosed. The method allows for selection between two modes of operation. In a first mode, the integrated circuit devices are... | 12/19/2006 |
| 7105377 | Method and system for universal packaging in conjunction with a back-end integrated circuit manufacturing process A method and system for universal packaging in conjunction with an automated in-line back-end IC manufacturing process. In one method embodiment, the present invention processes a die-strip through a number of integrated in-line processes that function independently... | 09/12/2006 |
| 7030634 | Characteristic measuring apparatus for electronic components An apparatus for measuring the electrical characteristic of a chip-shaped electronic component having first and second external terminal electrodes at first and second opposing ends thereof includes a holder that holds an electronic component with the first and seco... | 04/18/2006 |
| 6961638 | Reject bottle detection and ejection mechanisms A reject bottle detection and ejection apparatus has a plurality of sensors positioned along the length of a belt conveyor that senses whether a bottle conveyed by the conveyor is positioned in an upright orientation, in an inverted orientation, in a sideways orient... | 11/01/2005 |
| 6932750 | Exercise stand An exercise stand which is constructed of a main frame on which are mounted a leg at each corner. The leg is to support the main frame in a spaced position above a supporting surface. A pair of sub-frames are mounted on the main frame with each sub-frame being linea... | 08/23/2005 |
| 6919532 | Method of forming dimensionally precise slots in resilient mask of miniature component carrier A laser beam (102) cuts through a component carrier mask (96) made of thin elastomeric material such as silicone rubber to form slots (98) having slot openings of a desired shape. In a preferred embodiment, a light absorptivity enhancement mater... | 07/19/2005 |
| 6914424 | Automatic integrated circuit testing system and device using an integrative computer and method for the same An automatic integrated circuit testing system, device and method using an integrative computer. The system includes a machine frame having at least one testing computer for holding and testing the integrated circuit. The machine frame also has at least one automati... | 07/05/2005 |
| 6750416 | Instrument for measuring and sorting resistors and method therefor The invention describes a method for measuring and classifying resistors (2), in which in a measuring station (3) the resistance value of the resistor (2) supplied by a feed and transport device (12) of the measuring station (3) is... | 06/15/2004 |
| 6696655 | Device and method for sorting out metal fractions from a stream of bulk material The invention relates to a device and a method for blowing out metal fractions from a stream of bulk material that is conveyed by bulk material means. The device comprises blow-out nozzles which are located on a drop section, and which are arranged along ... | 02/24/2004 |
| 6563331 | Test and burn-in apparatus, in-line system using the test and burn-in apparatus, and test method using the in-line system An apparatus for testing semiconductor devices allows various testing processes, including a burn-in process, to be performed at the same testing stage. Test trays which contain the semiconductor devices are used throughout an in-line system so that an en... | 05/13/2003 |
| 6479777 | Electronic parts conveying apparatus and method An electronic parts conveying apparatus reduces damage to electronic parts (e.g., chip-type electronic parts) and stabilizes the positions of the electronic parts during a conveying operation. The conveying apparatus has a conveying table having, on its e... | 11/12/2002 |
| 6448525 | Capacitor characteristics measurement and packing apparatus Capacitor characteristics measurement apparatus and packing apparatus includes a turntable (1) intermittently driven at a constant pitch to supply capacitors (C) from a parts feeder (8) to a holder section (2) of the turntable (1) in a one-by-one manner. ... | 09/10/2002 |
| 6444935 | High speed track shutter system for semi-conductor inspection The present invention provides a shutter system for use with an automated semiconductor chip handling device. The semiconductor chip handling device includes a track down which semiconductor chips travel. Reliefs are positioned on the track to prevent the... | 09/03/2002 |
| 6362443 | Method of storing products and storage system A product storage method is carried out by a product storage system comprising an intermediate storage yard, a product moving means capable of holding a product, of moving vertically, laterally and longitudinally and of placing the product at any place in... | 03/26/2002 |
| 6313652 | Test and burn-in apparatus, in-line system using the test and burn-in apparatus, and test method using the in-line system A test and burn-in apparatus for semiconductor chip package devices, an in-line system which includes the test and burn-in apparatus, and a test method which employs the in-line system are provided. A test and burn-in apparatus for testing semiconductor d... | 11/06/2001 |
| 6294747 | Inspection machine for surface mount passive component This invention is a visual inspection machine for a surface mount passive component (chip) made up of a rotating circular loader wheel inclined to the horizontal and including an upper exposed wheel surface against which an inventory of chips is placed fo... | 09/25/2001 |
| 6285193 | Method of measuring insulation resistance of capacitor and apparatus for screening characteristics The insulation resistance of a capacitor is accurately measured within a short period of time by applying AC signals at two different frequencies f1 and f2 to the capacitor to measure the impedance Z1 and Z2 of ... | 09/04/2001 |
| 6204464 | Electronic component handler A high-speed handler for receiving a heap of randomly oriented parallel piped-shaped ceramic components, each component of the type having at least one set of metal terminations located on opposite edges thereof, presenting them in individual seats in con... | 03/20/2001 |
| 6198291 | Double-speed tester and method of use thereof for testing microelectronic devices A double-speed tester for a microelectronic device, in which a plurality of recesses is formed on the circumference of a test plate at an interval of step, the recesses each accommodating a microelectronic device which is measured with the test plate rota... | 03/06/2001 |
| 6194679 | Four electrical contact testing machine for miniature inductors and process of using In a machine for testing and sorting miniature electrical inductors of the type having spaced-apart, opposed first and second metal-terminated ends, wherein the machine includes a feed station having an inlet, an outlet and adapted to receive bulk quantit... | 02/27/2001 |
| 6163000 | Inspecting sorting machine for finished products of plastic film capacitor An inspecting sorting machine for finished products of plastic film capacitor, includes a pneumatic pump, an automatic feeding table, a main inspecting machine, a central processing unit, a number of measuring gauges, a charging and discharging power supp... | 12/19/2000 |
| 6066822 | Semiconductor device testing apparatus and semiconductor device testing system having a plurality of semiconductor device testing apparatus A semiconductor device testing system is provided efficiently utilizes a plurality of semiconductor device testing apparatus. More particularly, a host computer controls a plurality of semiconductor device testing apparatuses and a dedicated classifying m... | 05/23/2000 |
| 6025567 | Binning wheel for testing and sorting capacitor chips A machine for continuously testing and sorting large quantities of miniature capacitor chips, where the chips having electrically conductive surfaces on opposite ends thereof, including a thin, endless belt arranged to pass over a plurality of rotatable p... | 02/15/2000 |
| 5865319 | Automatic test handler system for IC tester An automatic test handler system for automatically supplying IC devices to be tested to an IC tester and sorting the tested IC devices based on the test results. The system includes a testing machine for testing the IC devices by contacting the IC devices... | 02/02/1999 |
| 5673799 | Machine for testing and sorting capacitor chips and method of operating same A method of continuously testing and sorting large quantities of capacitor chips, including the steps of loading the chips into identical rows of aligned positions in a rotatable member, simultaneously and sequentially rotating the member to advance the c... | 10/07/1997 |
| 5510719 | Method for screening early failure of ceramic capacitor A method of screening ceramic capacitors. The method includes the steps of: charging the ceramic capacitors by applying a constant d.c. voltage which is larger than the rated voltage and smaller than the breakdown voltage; and leaving the charged ceramic ... | 04/23/1996 |
| 5450014 | Test apparatus for detecting reverse insertion of a capacitor on a test board An in-circuit test apparatus includes a constant voltage source that supplies constant voltages and a current amplification circuit that outputs a constant current based on the constant voltages. A switch transfers the constant current from the current am... | 09/12/1995 |
| 4790438 | Electrical component sequential testing apparatus Sorting apparatus for electrical components includes: (a) an electrical test station, (b) a transport forming pockets for receiving electrical components and for sequentially lifting the received components to the test station, (c) test circuitry including relative... | 12/13/1988 |
| 4779040 | Method and apparatus for recognizing the polarity of polarized capacitors For recognizing the polarity of polarized capacitors, their capacitance is measured with an alternating voltage which is superposed with a positive dc voltage and than a negative dc voltage of equal amount. Since a polarized capacitor comprises a lower ca... | 10/18/1988 |
| 4748401 | Method and apparatus for recognizing the polarity of polarized capacitors For recognizing the polarity of polarized capacitors, the capacitors are charged to a prescribable positive voltage or to a prescribable negative voltage of equal magnitude once with a constant positive direct current and once with a constant negative dir... | 05/31/1988 |
