Class 209/572 - Detecting flaw in dielectric

Subclass of Class 209 - Classifying, separating, and assorting solids
Definition: Methods and apparatus wherein items are tested for a flaw
No. of patents: 3
Last issue date: 07/19/2011

Number	Title	Issue Date
7982155	System of testing semiconductor devices, a method for testing semiconductor devices, and a method for manufacturing semiconductor devices A system of testing semiconductor devices includes a classification module configured to classify a plurality of lots into a plurality of groups; an apparatus assignment module configured to assign a plurality of testing apparatuses to each of the groups; and a test...	07/19/2011
4721917	Coating continuity detector A method and apparatus are disclosed for detecting the continuity of nonconductive coatings on conductive web materials, such as rolls of metallic foils. The coated side of the sheet material web contacts a conductive surface and electrical resistance of ...	01/26/1988
4284947	Detecting the size and shape of bodies The size and shape of a body is determined by rolling it between the plates of capacitors, the dielectric constant of which is thereby changed. A capacitor scans sections of the body along its longitudinal axis to detect its diameter and surface faults, a...	08/18/1981

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