Dining Table Having Integral Dishwasher
A space-saving dishwasher, which may be installed within a counter top or table, having a dish-carrying rack that is vertically shiftable through the open top of the dishwasher for facilitating loading and unloading of the dishes.
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| Number | Title | Issue Date |
| 8091505 | Secondary battery, method and device for testing the negative electrode, and method and device for producing negative electrode thereof In a method for testing a negative electrode of a secondary battery, light is irradiate to an active material layer formed on a current collector having a plurality of projections at least on one side thereof, the active material layer including first columnar bodie... | 01/10/2012 |
| 8020512 | Pattern formation device A pattern formation device includes a conveyance table, a pair of guide rails, a carriage, a plurality of droplet discharge heads, an inspection camera, a camera base, a linear motor, a motor housing case, a moving cable, and a cable housing case. The motor housing ... | 09/20/2011 |
| 8011319 | Method for oxidizing a layer, and associated holding devices for a substrate A holding device is presented in which a layer which is to be oxidized is processed, in a single-substrate process. The process temperature during the processing is recorded directly at the substrate or at a holding device for the substrate. The process includes int... | 09/06/2011 |
| 7537661 | Liquid applying apparatus and ink-jet printing apparatus When it is determined that an end process flag is not stored in memory, there is a possibility that the recovery operation was not executed normally and the viscosity increased or fixed coating liquid exist in a liquid holding member and liquid flow paths. Therefore... | 05/26/2009 |
| 7524378 | Maintenance system, substrate processing device, remote operation device, and communication method A maintenance system of a substrate processing apparatus, including a remote operation unit for operating the substrate processing apparatus from a remote place by transmitting a remote operation information to a side of the substrate processing apparatus through a ... | 04/28/2009 |
| 7393416 | Vapor deposition process and apparatus therefor An apparatus for depositing a ceramic coating on a component. The apparatus includes an evaporation source containing multiple different oxide compounds, at least one of the oxide compounds having a vapor pressure that is higher than the remaining oxide compounds, t... | 07/01/2008 |
| 7349092 | System for reducing stress induced effects during determination of fluid optical constants A system for determination of optical constants of liquids, including provision for reducing stress induced effects while obtaining data. ... | 03/25/2008 |
| 7327456 | Spectrophotometer, ellipsometer, polarimeter and the like systems Disclosed are improvements in ellipsometer and the like systems capable of operating in the Vacuum-Ultra-Violet (VUV) to Near Infrared (NIR) wavelength range, and methodology of use. ... | 02/05/2008 |
| 7312156 | Method and apparatus for supporting a semiconductor wafer during processing A semiconductor wafer is processed while being supported without mechanical contact. Instead, the wafer is supported by gas streams emanating from a large number of passages in side sections positioned very close to the upper and lower surface of the wafer. The gas ... | 12/25/2007 |
| 7300684 | Method and system for coating internal surfaces of prefabricated process piping in the field The coating of internal surfaces of a workpiece is achieved by connecting a bias voltage such that the workpiece functions as a cathode and by connecting an anode at each opening of the workpiece. A source gas is introduced at an entrance opening, while a vacuum sou... | 11/27/2007 |
| 7277171 | Flying mobile on-board ellipsometer, polarimeter, reflectometer and the like systems A substantially self-contained “on-board” material system investigation system functionally mounted on a three dimensional locational system to enable positioning at desired locations on, and distances from, the surface of a large sample, including the capabilit... | 10/02/2007 |
| 7274450 | Sample entry purge system in spectrophotometer, ellipsometer, polarimeter and the like systems A sample sequestering system which allows access to a subspace in a chamber encompassed generally enclosed space, for use in entering and removing a sample when the subspace is opened to atmosphere. Sufficient purge gas is flowed from within the generally enclosed s... | 09/25/2007 |
| 7268876 | General virtual interface algorithm for in-situ spectroscopic ellipsometric data analysis A method of characterizing the outermost material on an article manufactured by deposition or removal of material from its surface, which requires no prior knowledge of the composition of the article. ... | 09/11/2007 |
| 7265838 | Method of calibrating effects of multi-AOI-system for easy changing angles-of-incidence in ellipsometers and the like Disclosed is a system for enabling easy sequential setting of different Angles-of-Incidence of a beam of electromagnetic radiation to a surface of a sample system involving regression based methodology for evaluating and compensating the effects of the presence elec... | 09/04/2007 |
| 7243665 | Spray-type automotive wheel washer An automotive wheel washer comprising a circular conduit having a diameter of approximately 12 to 20 inches and further provided with a plurality of circumferentially spaced nozzles which direct cleaning fluid and chemicals laterally of the wheel washer and toward t... | 07/17/2007 |
| 7227637 | Measurement system with separate optimized beam paths The subject invention relates to a broadband optical metrology system that segregates the broadband radiation into multiple sub-bands to improve overall performance. Each sub-band includes only a fraction of the original bandwidth. The optical path—the light path ... | 06/05/2007 |
| 7217336 | Directed gas injection apparatus for semiconductor processing A method and system (1) for utilizing shaped orifices (e.g., sonic and simple orifices, and divergent nozzles) in the gas inject system (20) as part of a plasma process system. By utilizing the shaped orifices, directionality of gas flow (25) ca... | 05/15/2007 |
| 7215424 | Broadband ellipsometer or polarimeter system including at least one multiple element lens Quasi-achromatic multi-element lens(es) which are precisely mounted with respect to one another in a tubular mounting fixture, and the application thereof in focusing, (and optionally re-colliminating), a spectroscopic electromagnetic beam into a very small, chromat... | 05/08/2007 |
| 7211295 | Silicon dioxide film forming method Disclosed herein is a silicon dioxide film forming method including: a reaction chamber heating step of heating a reaction chamber to a predetermined temperature, the reaction chamber containing an object to be processed; a gas pretreating step of energizing a proce... | 05/01/2007 |
| 7203565 | Temperature abnormality detection method and semiconductor manufacturing apparatus A semiconductor manufacturing apparatus includes: a hot plate that heats an article to be processed; a temperature control section that controls temperature of the hot plate; a main body control section that controls the entirety of the apparatus based on a process ... | 04/10/2007 |
| 7179352 | Vacuum treatment system and process for manufacturing workpieces A process is disclosed for manufacturing coated substantially plane workpieces, in which the workpieces are guided to a vacuum treatment area guided by a control. The treatment atmosphere is modulated in the treatment area as a function of workpiece position with th... | 02/20/2007 |
| 7169254 | Plasma processing system and apparatus and a sample processing method A plasma processing apparatus having a sample stage disposed inside a vacuum chamber and a plate member disposed opposing to a sample which is placed on the sample stage and supplied with electric power. The sample is processed using a plasma generated between the s... | 01/30/2007 |
| 7150791 | Floating head liquid dispenser with dispensing head sensor A floating head liquid dispenser includes a robotic control mechanism for moving a support member toward and away from a substrate. A liquid dispensing head is operatively connected to the support member for movement relative thereto upon contact with the substrate.... | 12/19/2006 |
| 7132372 | Method for preparing a semiconductor substrate surface for semiconductor device fabrication A method for preparing a semiconductor substrate surface (28) for semiconductor device fabrication, includes providing a semiconductor substrate (20) having a pure Ge surface layer (28) or a Ge-containing surface layer (12), such as SiGe.... | 11/07/2006 |
| 7122096 | Method and apparatus for processing semiconductor In a semiconductor processing apparatus including a process chamber, a sample stand for holding a sample in the process chamber, and a process gas supply unit for supplying a process gas to the process chamber, a plurality of samples of a lot are successively suppli... | 10/17/2006 |
| 7109131 | System and method for hydrogen-rich selective oxidation The present invention relates generally to semiconductor fabrication. More particularly, the present invention relates to system and method of selectively oxidizing one material with respect to another material formed on a semiconductor substrate. A hydrogen-rich ox... | 09/19/2006 |
| 7101458 | Plasma processing method and apparatus In a plasma processing method and apparatus for monitoring an operating status of a plasma processing apparatus and/or a processing status of an object being processed, emission spectra emitted from a plasma is obtained as optical data when the plasma process is per... | 09/05/2006 |
| 7094614 | In-situ monitoring of chemical vapor deposition process by mass spectrometry A method and apparatus are provided for controlling a CVD process used to deposit films on semiconductor substrates wherein the by-products of the reaction are measured and monitored during the reaction preferably using mass spectrometry and the results used to calc... | 08/22/2006 |
| 7077159 | Processing apparatus having integrated pumping system An apparatus 115 for processing a substrate 20, comprises an integrated pumping system 155 having a high operating efficiency, small size, and low vibrational and noise levels. The apparatus 115 comprises a chamber, such as a load-lock ch... | 07/18/2006 |
| 7078250 | Method and apparatus for manufacturing organic electroluminescent device, electronic apparatus and method of removing ionic impurities A method of manufacturing an organic electroluminescent device having a functional layer formed by at least a light emitting layer positioned between a pair of electrodes, the method includes the steps of storing a liquid material in a container, the liquid material... | 07/18/2006 |
| 7061614 | Measurement system with separate optimized beam paths The subject invention relates to a broadband optical metrology system that segregates the broadband radiation into multiple sub-bands to improve overall performance. Each sub-band includes only a fraction of the original bandwidth. The optical path—the light path ... | 06/13/2006 |
| 7018479 | Rotating semiconductor processing apparatus A reactor for processing semiconductor wafers and the like is provided. The reactor employs one or more rotating components to more evenly distribute temperature or gases within the chamber. In one embodiment, the reactor is provided with rotating reflectors, which ... | 03/28/2006 |
| 7018475 | Device, method and arrangement for pressing two axis-parallel rollers approachable to one another in a device for producing and/or treating a web of material Two axially parallel rolls are pressed against each other in a device for producing and/or treating a moving material web. Sensor elements are arranged in the force transmission path running from the force-producing elements via the rolls, outside roll bodies of the... | 03/28/2006 |
| 6966967 | Variable speed pump control A method and apparatus for monitoring operating characteristics and/or control signals of a system comprising a variable speed vacuum pump. Operating characteristics and/or control signals of the system may be monitored, and the pumping speed of the variable speed v... | 11/22/2005 |
| 6951821 | Processing system and method for chemically treating a substrate A processing system and method for chemically treating a substrate, wherein the processing system comprises a temperature controlled chemical treatment chamber, and an independently temperature controlled substrate holder for supporting a substrate for chemical trea... | 10/04/2005 |
| 6937341 | System and method enabling simultaneous investigation of sample with two beams of electromagnetic radiation Disclosed are system and method for characterizing a system consisting of a fluid sample on a two sided stage, utilizing data obtained by applying, from both sides thereof, beams of electromagnetic radiation to a fluid coated surface in a containing cell volume. The... | 08/30/2005 |
| 6936108 | Heat treatment device A film-forming unit of the invention includes: a processing furnace, gas-supplying means that supplies a process gas into the processing furnace, heating means that heats an inside of the processing furnace to a predetermined process-temperature, and a normal-pressu... | 08/30/2005 |
| 6934025 | Thin film optical measurement system and method with calibrating ellipsometer An optical measurement system for evaluating a reference sample, having at least a partially known composition, includes a reference ellipsometer and at least one non-contact optical measurement device. The ellipsometer includes a light generator, an analyzer, and a... | 08/23/2005 |
| 6922975 | Cosmetic material sheet and method for manufacture of the sheet and apparatus for use in the manufacture A cosmetic material sheet which comprises a sheet substrate 1 having, on an upper surface thereof, a large number of concave portions 5 arranged in a checkered pattern, a foundation layer 6 provided at a given position on the upper surface of th... | 08/02/2005 |
| 6922244 | Thin film optical measurement system and method with calibrating ellipsometer An optical measurement system, including a reference ellipsometer and a non-contact optical measurement device, evaluates a sample having at least a partially known composition. The reference ellipsometer includes a light generator to generate a beam of quasi-monoch... | 07/26/2005 |