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Class 73/105 - Roughness


Subclass of Class 73 - Measuring and testing
Definition: Subject matter for testing of surfaces for roughness.
No. of patents: 1430
Last issue date: 04/24/2012


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NumberTitleIssue Date
7263874Methods and apparatus for determining properties of a fluid
A method and system for determining properties of a fluid involves interacting the fluid with a standing wave in a first state to establish the standing wave in a second state, analyzing an electric signal associated with the standing wave to determine a characteris...
09/04/2007
RE39803Non vibrating capacitance probe for wear monitoring
A non-vibrating capacitance probe for use as a non-contact sensor for tribological wear on a component. The device detects surface charge through temporal variation in the work function of a material. A reference electrode senses changing contact potential differenc...
09/04/2007
7263876Apparatus and method of detecting surface convexity of members, and method of producing the members
A method of detecting a convexity present on a surface of a belt-shaped member (belt) or a roll-shaped member (roller), includes frictionizing (abrading) a surface of the member with a plate, and detecting at least one of (1) a vibration generated on the plate or (2...
09/04/2007
7262515Energy conversion systems using nanometer scale assemblies and methods for using same
Energy conversion systems utilizing nanometer scale assemblies are provided that convert the kinetic energy (equivalently, the thermal energy) of working substance molecules into another form of energy that can be used to perform useful work at a macroscopic level. ...
08/28/2007
7260980Liquid cell and passivated probe for atomic force microscopy and chemical sensing
The invention provides a liquid cell for an atomic force microscope. The liquid cell includes a liquid cell housing with an internal cavity to contain a fluid, a plurality of conductive feedthroughs traversing the liquid cell housing between the internal cavity and ...
08/28/2007
7261941Sharp end, multi-layer carbon nano-tube radial aggregate and method of manufacturing the aggregate
A method of manufacturing a acute tip, multi-wall carbon nanotube radial aggregate, comprising the steps of leading a graphite rod into plasma flame generated in a hydrogen-added inert gas atmosphere to evaporate carbon from the graphite rod and stacking, on the sur...
08/28/2007
7262408Process and apparatus for modifying a surface in a work region
An apparatus and process for manufacturing changes of a substrate in a work region which is 100×100×100 microns or smaller is described. The apparatus uses a plasma source adjacent to the work region to produce radiation or matter which changes the surface. An ato...
08/28/2007
7262522Microelectromechanical isolating power converter
A microelectromechanical system (MEMS) device is used to transfer power from a source generator to a power generator that delivers electrical power to a load, while maintaining electrical isolation between the source generator and power generator for size critical a...
08/28/2007
7257992Surface finish tester apparatus and methods
Automated apparatus and methods for testing surface finishes. In at least one preferred embodiment, automated apparatus capable of reliably, automatically testing surface finishes in industrial environments. In at least one further preferred embodiment, an automated...
08/21/2007
7258012Integrated monolithic tri-axial micromachined accelerometer
A monolithic integrated 3-axis accelerometer chip includes a single crystal substrate, the substrate including at least one single crystal membrane layer portion. A single sensor microstructure made from the single crystal membrane senses acceleration in each of the...
08/21/2007
7258901Directed growth of nanotubes on a catalyst
A nanostructure is fabricated using charged particle deposition to deposit a catalyst on a substrate. A charged particle beam is directed to location on the substrate where the catalyst is to be deposited, with a beam-activated precursor gas also being directed to t...
08/21/2007
7260051Molecular memory medium and molecular memory integrated circuit
A molecular memory media having a media surface and a platform with read/write heads. The platform and media are moved to allow one of addition, removal, and repositioning of atoms, electrons, and charges on a surface of the media. The media is a material capable of...
08/21/2007
7255636Hybrid burnishing head design for improved burnishing of disk media
A hybrid burnishing head for processing of surfaces of hard disk media comprises a solid body including a first major surface and a second, opposed major surface comprising a burnishing surface including first and second surface portions, wherein the first surface p...
08/14/2007
7253407Active cantilever for nanomachining and metrology
A probe assembly suited for use in a scanning probe microscope (SPM) system includes a cantilever having an attachment to a main body portion. A suitable tip disposed at the free end of the cantilever provides various functions. According to various embodiments of t...
08/07/2007
7253408Environmental cell for a scanning probe microscope
An environmental cell for use with a scanning probe microscope includes a cell chamber, a probe mounted to the cell chamber, a puck selectively connected to the cell chamber, a sample holder selectively inserted in the puck, and a translation mechanism coupled to th...
08/07/2007
7251987Scanning probe microscope and measuring method by means of the same
A scanning probe microscope is capable of radiating light on a sample without moving the sample from the scanning probe microscope and is capable of measuring the sample while controlling the conditions under which the sample is placed without changing the location ...
08/07/2007
7251988Topography analyzing system
A topography analyzing system (10) for analyzing a topographic microstructure is provided. The topography analyzing system includes a three-dimensionally adjustable platform (12), a loading platform (13), a microscopic viewing device (14)...
08/07/2007
7250602Probe device
A probe device comprises a cantilever comprising a probe allocated to be opposed to a surface of a sample, means for feeding back a vibration amplitude value of the cantilever, thereby self-exciting and vibrating the cantilever at a predetermined frequency, means fo...
07/31/2007
7249504Level meter
The invention relates to a level meter for metering the level of a filling substance in a container by means of electromagnetic signals that are guided into and out of the container along a waveguide. The inventive level meter guarantees a high tightness even at lar...
07/31/2007
7249494Beam tracking system for scanning-probe type atomic force microscope
Disclosed is a novel scanning-probe type atomic force microscope wherein false deflection of the probe is reduced. The probe of the scanning-probe type atomic force microscope moves in both the horizontal direction and the vertical direction during the scanning, whi...
07/31/2007
7246517Atomic force microscope with probe with improved tip movement
An atomic force microscope probe provides an indentation testing function in a direction along an axis. The probe has a tip and an arm structure holding the tip. The arm structure has one end mounted on a fixed stage, the other end coupled to the AFM tip, and a holl...
07/24/2007
7247895Electrostatic nanolithography probe actuation device and method
Method and apparatus for selectively actuating a cantilevered probe for applying a compound to a substrate in nanolithography. A probe having a probe electrode and a substrate having a counter electrode are provided. Voltage applied to the probe electrode and/or cou...
07/24/2007
7248039Disk pack swap process for evaluating magnetic recording performance
A method for testing electromagnetic characteristics of magnetic media while maintaining consistent performance of a read/write head and recording channel is disclosed. The disclosed method is performed such that reduced statistical sampling is achieved. The method ...
07/24/2007
7249002Direct relative motion measurement for vibration induced noise and drift cancellation
A surface analysis apparatus and a method for compensating for mechanical vibrations and drifts in a surface analysis instrument are disclosed. A probe that is sensitive to the distance between the probe and a sample surface provides a probe signal. The probe signal...
07/24/2007
7245789Systems and methods for minimally-invasive optical-acoustic imaging
This document discusses, among other things, an imaging guidewire that includes one or more optical fibers communicating light along the guidewire. At or near its distal end, one or more blazed or other fiber Bragg gratings (FBGs) directs light to a photoacoustic tr...
07/17/2007
7243571Ultra-precision positioning system
Provided is an ultra-precision positioning system. The system comprises a base, a motion stage movably provided to the top of the base, and first to sixth feeding mechanisms for moving the motion stage to have six degrees of freedom. The first to sixth feed mechanis...
07/17/2007
7241992Method of amplitude modulated electrostatic polymer nanolithography
A method of amplitude modulated electrostatic polymer nanolithography providing rapid creation of features in a polymer film is disclosed. The nanolithography method of the present invention generates features by mass transport of polymer within an initially uniform...
07/10/2007
7241994Scanning probe microscope and specimen surface structure measuring method
A digital probing type atomic force microscope (AFM) for measuring high aspect structures with high precision. A probe 21 is vibrated while moved to the vicinity of an atomic force region on a specimen surface. The position of the probe is measured when a spe...
07/10/2007
7241420Capillary-channel probes for liquid pickup, transportation and dispense using stressy metal
Fluidic conduits, which can be used in microarraying systems, dip pen nanolithography systems, fluidic circuits, and microfluidic systems, are disclosed that use channel spring probes that include at least one capillary channel. Formed from spring beams (e.g., stres...
07/10/2007
7241995Electron microscope equipped with magnetic microprobe
There is disclosed an electron microscope equipped with a magnetic microprobe. The microscope can apply a strong electric field to a local area on a specimen made of a magnetic material. The magnetic flux density per unit area of the microprobe is high. The microsco...
07/10/2007
7241990Laser device
A laser device includes a target position, an optical component separated a distance J from the target position, and a laser energy source separated a distance H from the optical component, distance H being greater than distance J. A laser source manipulation mechan...
07/10/2007
7242477Apparatus and methods for detecting overlay errors using scatterometry
Disclosed is a method for determining an overlay error between at least two layers in a multiple layer sample. A sample having a plurality of periodic targets that each have a first structure in a first layer and a second structure in a second layer is provided. The...
07/10/2007
7240428Method for making probes for atomic force microscopy
A method for producing probes for atomic force microscopy comprises producing, on a surface of one side of a semiconductor substrate, one or more moulds for the production of one or more probe tips. One or more probe configurations and at least one set of a probe ti...
07/10/2007
7240434Stage apparatus
A stage apparatus may include a first stage, a second stage movable with respect to the first stage, at least one flexure hinge to connect the first stage with the second stage, a plurality of actuators provided between the first stage and the second stage to push t...
07/10/2007
7240540Rough road detection system
A rough road detection system includes a collection module, a statistical module, and a comparison module. The collection module collects samples from a vibration sensitive signal. The statistical module removes a periodic anomaly from the samples and removes a rand...
07/10/2007
7240541Optical microcantilever, manufacturing method thereof, and optical microcantilever holder
An optical microcantilever capable of reducing loss when propagating light. An optical microcantilever 10 comprises a support 1, an optical waveguide 2, a light-blocking film 3, a reflecting film 4, a pointed tip 5, a micros...
07/10/2007
7239544Electrical memory component and a method of construction thereof
An electrical memory component is provided, comprising read/write probes and a chalcogenide storage media. Each read/write probe is adapted for selective electrical connection to a memory portion of the chalcogenide storage media and for performing read and write op...
07/03/2007
7234342Fully digital controller for cantilever-based instruments
A controller for cantilever-based instruments, including atomic force microscopes, molecular force probe instruments, high-resolution profilometers and chemical or biological sensing probes. The controller samples the output of the photo-detector commonly used to de...
06/26/2007
7235197Method for process control of mechanical embossing texturing
Disclosed is both a method and apparatus for controlling and measuring an embossed texture on a decorative article. The embossed textured article includes both peaks and valleys that are measured and quantified to determine a profile of the textured article. Typical...
06/26/2007
7236283Scanning mirror unit and beam scanning probe
A scanning mirror unit for scanning a beam comprises: at least one cantilever which is formed by bonding an elastic material and a piezoelectric material together and supported by a base at its one end; and a movable mirror which is supported at least by a free end ...
06/26/2007
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