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| Number | Title | Issue Date |
| 7194896 | Surface hardness distribution measuring method and apparatus It is possible to blast air on a surface portion of a measured object from a hole of pressing means, project illumination light in a concentric pattern with an optical element and shoot the measured object with a CCD so as to visually grasp hardness distribution on ... | 03/27/2007 |
| 7196450 | Electromechanical assemblies using molecular-scale electrically conductive and mechanically flexible beams and methods for application of same Electromechanical systems utilizing suspended conducting nanometer-scale beams are provided and may be used in applications, such as, motors, generators, pumps, fans, compressors, propulsion systems, transmitters, receivers, heat engines, heat pumps, magnetic field ... | 03/27/2007 |
| 7196599 | Electrostatic device An electrostatic device (10) includes a first flexible electrode (1) on which a plurality of second electrodes (2) are mounted so as to move with the first electrode (1). Upon the application of an electrical charge, the or each second el... | 03/27/2007 |
| 7194725 | System and method for design rule creation and selection A method of producing design rules including generating a plurality of parametrically varying geometric layouts and simulating how each geometric layout will pattern on a wafer. Edges of structures within the simulated geometric layouts can be classified based on ma... | 03/20/2007 |
| 7193715 | Measurement of overlay using diffraction gratings when overlay exceeds the grating period A method for measuring overlay in semiconductor wafers includes obtaining diffraction based and imaging based measurements of the same target. The two separate measurements are then combined in a way that is consistent to both measurements to obtain an overlay measu... | 03/20/2007 |
| 7191639 | On-chip magnetic force actuation of microcantilevers by coplanar coils An on-chip coil is provided in a micromachined device for magnetic actuation of a nanoelectromechanical microcantilever. The novel geometry involves a three dimensional solenoid or planar coil carrying high current that generates a large enough magnetic field in its... | 03/20/2007 |
| 7192789 | Method for monitoring an ion implanter A method for monitoring an ion implanter is disclosed. In one embodiment, the method comprises providing a wafer, forming a barrier layer on the surface of the wafer wherein the barrier layer has a substantial blocking effect on ion implantation, performing an ion i... | 03/20/2007 |
| 7190175 | Orthogonal microwave imaging probe A microwave imaging microscope and associated probe, or a read head. The probe or the read head includes a sensor unit with three fixed electrodes, preferably a stimulating electrode surrounding a sensing electrode and isolated by a grounded electrode. Circuitry cou... | 03/13/2007 |
| 7185440 | Sensing contact probe A sensing contact probe includes a beam support and a probe. The probe has a bent beam body that extends from the beam support to a probe tip face that has a position and faces in an angular direction. The bent beam body has first and second beam layers bonded toget... | 03/06/2007 |
| 7184824 | Method and system for examining tissue according to the dielectric properties thereof A probe, method and system for examining tissue in order to differentiate it from other tissue according to the dielectric properties of the examined tissue are provided. The probe includes an inner conductor, having a plurality of sharp, thin, conductive spikes, at... | 02/27/2007 |
| 7181958 | High aspect ratio tip atomic force microscopy cantilevers and method of manufacture The present invention provides a method for the selective growth of single carbon nanotubes (CNT) on the tip apex of a conventional cantilever. Selective CNT growth is established by coating the backside of a cantilever, having a through-hole at a tip apex, with a c... | 02/27/2007 |
| 7181977 | Sensor assembly with lead attachment A beam-type sensor capable of measuring displacement or acceleration includes a thin, flexible sheet of piezoresponsive material defining broad sides and a proximal end. In order to optimize boundary conditions, the proximal end of the sheet is supported by a clamp ... | 02/27/2007 |
| 7183131 | Process for producing a nanoelement arrangement, and nanoelement arrangement A process for producing a nanoelement arrangement and to a nanoelement arrangement. A first nanoelement is at least partially covered with catalyst material for catalyzing the growth of nanoelements. Furthermore, at least one second nanoelement is grown on the catal... | 02/27/2007 |
| 7183548 | Apparatus for modifying and measuring diamond and other workpiece surfaces with nanoscale precision Apparatus and techniques are provided for modifying and measuring surfaces of diamond workpieces and other workpieces with nanoscale precision. The apparatus and techniques exploit scanning probe microscopy (SPM) and atomic force microscopy (AFM) at a wide range of ... | 02/27/2007 |
| 7183762 | Apparatus and method for evaluating magnetic heads, and disk for use in evaluating magnetic heads A DC current is supplied to the write coil of a GMR head 1 equipped with a completed HGA (Head Gimbal Assembly). The element part of the GMR head 1 is thereby thermally deformed. Thus deformed, the element part protrudes, abutting on a rotating laser-b... | 02/27/2007 |
| 7181057 | Overlay marks, methods of overlay mark design and methods of overlay measurements An overlay mark for determining the relative position between two or more successive layers of a substrate or between two or more separately generated patterns on a single layer of a substrate is disclosed. The overlay mark includes a plurality of working zones, whi... | 02/20/2007 |
| 7180662 | Stage assembly and method for optical microscope including Z-axis stage and piezoelectric actuator for rectilinear translation of Z stage A stage assembly mountable on an optical microscope for orienting a sample into a desired focal position includes an X-axis plate operable for rectilinear shifting in the X-axis direction and a Y-axis plate mounted on the X-axis plate operable for rectilinear transl... | 02/20/2007 |
| 7180221 | Piezo-electric assembly A piezo-electric type of assembly for effecting and interfacing relative motion between two surfaces. The assembly consisting of a first and a second transducer to be driven by electrical signals. Both transducers are coupled at one end to a low inertia member that ... | 02/20/2007 |
| 7180586 | System for detection of wafer defects Fast on-line electro-optical detection of wafer defects by illuminating with a short light pulse from a repetitively pulsed laser, a section of the wafer while it is moved across the field of view of an imaging system, and imaging the moving wafer onto a focal plane... | 02/20/2007 |
| 7178260 | Measuring head A unit damper apparatus 18 is used as a damper apparatus 18 which absorbs an impact and a vibration conveyed from a contact 14 to a seesaw member 12, and a structure of this unit damper apparatus 18 is the structure which absorbs c... | 02/20/2007 |
| 7178387 | Method and apparatus for scanning in scanning probe microscopy and presenting results Information is collected from a region of interest using a scanning probe microscope having a tip by moving the tip along at least one predefined path extending from a center location to a peripheral location in the region of interest and collecting information usin... | 02/20/2007 |
| 7177457 | Overlay marks, methods of overlay mark design and methods of overlay measurements An overlay mark for determining the relative shift between two or more successive layers of a substrate via scanning is disclosed. The overlay mark includes at least one test pattern for determining the relative shift between a first and a second layer of the substr... | 02/13/2007 |
| 7171845 | Apparatus for measurement of friction force at the interface of a slider and rotating disk A slider-disk interface tester for measuring the friction force at the interface uses a “negative-pitch” slider in contact with a rotating disk. The tester includes a base that supports a motor for rotating the disk and an actuator for supporting the slider and ... | 02/06/2007 |
| 7170842 | Methods for conducting current between a scanned-probe and storage medium Certain embodiments of the present invention are directed at data storage devices capable of storing, reading and writing data to storage areas of nanometer dimensions. Certain embodiments are directed at devices wherein a fluid medium and particles are provided bet... | 01/30/2007 |
| 7170055 | Nanotube arrangements and methods therefor Nanotubes and nanotube-based devices are implemented in a variety of applications. According to an example embodiment of the present invention, nanotube tips are coated with metal. In some applications, the metal coating facilitates the resolution of nano-scale magn... | 01/30/2007 |
| 7168709 | Suspension control apparatus of vehicle The invention provides a suspension control apparatus for a vehicle which can execute a suspension control suitable even for a rough road by executing the suspension control based on an actual road surface profile, while taking various vehicle states (weight, speed,... | 01/30/2007 |
| 7170054 | Scanning probe microscopy cantilever holder and scanning probe microscope using the cantilever holder A scanning probe microscope having a cantilever holder is provided which gives a cantilever great amplitude by a small-sized vibrator configurable in a limited space and is stably operated even in environments of high viscous drag such as a liquid. A cantilever base... | 01/30/2007 |
| 7170048 | Compound scanning probe microscope An optical observation image obtained through an objective lens is displayed on a display unit, and a marker indicating a position of a tip portion of a cantilever is displayed on the optical observation image displayed on the display unit. ... | 01/30/2007 |
| 7168301 | Method and apparatus of driving torsional resonance mode of a probe-based instrument A method of operating a scanning probe microscope includes using a probe having a cantilever, and oscillating the probe at a torsional resonance frequency thereof. In addition, the method includes substantially increasing torsional drive efficiency with dual actuato... | 01/30/2007 |
| 7168606 | Method of mitigating inner diameter reduction of welded joints Aspects of the present invention provide methods and apparatus for connecting two tubulars using a welding process with reduced inner diameter flash. The method includes connecting an end of a first expandable tubular to an end of a second expandable tubular using a... | 01/30/2007 |
| 7165445 | Digital control of quality factor in resonant systems including cantilever based instruments A digital system for controlling the quality factor in a resonant device. The resonant device can be any mechanically driven resonant device, but more particularly can be a device that includes a cantilever within its system, such as an atomic force microscope. The ... | 01/23/2007 |
| 7165462 | Individual slider testing Systems and methods of testing individual sliders are disclosed. One embodiment is a test system that includes a mechanical stress system, a quasi-static measurement system, a transport system, and a slider holder. The individual sliders to be tested are aligned in ... | 01/23/2007 |
| 7167344 | Magnetic head actuator having finely movable tracking device A magnetic head actuator provided with a finely movable tracking device having a piezoelectric element is provided for easy wiring to the piezoelectric element and reducing problems such as wire breakage and continuity defects. In the magnetic head actuator, a porti... | 01/23/2007 |
| 7166839 | Apparatus for measuring a three-dimensional shape Conventionally, there is no method for quantitatively evaluating the three-dimensional shape of an etched pattern in a non-destructive manner and it takes much time and costs to determine etching conditions. With the conventional length measuring method only, it has... | 01/23/2007 |
| 7161227 | Structure and method for fabricating semiconductor structures and devices for detecting an object High quality epitaxial layers of monocrystalline materials can be grown overlying monocrystalline substrates such as large silicon wafers by forming a compliant substrate for growing the monocrystalline layers. An accommodating buffer layer comprises a layer of mono... | 01/09/2007 |
| 7159477 | Apparatus for inspecting deformation of pipes An apparatus is provided for measuring deformation of a surface of a pipe. The apparatus has a central portion to which a detector section is mounted. At each side, guides are connected to the housing via arms. The housing has a platform below which an inverted U-sh... | 01/09/2007 |
| 7162069 | Objectification of surface test methods through image processing The invention relates to the objectification of surface test methods through image processing. Information z(x, y) is measured and recorded for each image point (x, y) of the measuring field of an examined specimen surface, and resultant magnitudes are calculated th... | 01/09/2007 |
| 7162383 | Calibration method for surface texture measuring instrument, calibration program for surface texture measuring instrument, recording medium storing the calibration program and surface texture measuring instrument In a calibration method for a surface texture measuring instrument which measures a surface of a workpiece and includes an arm that is supported to be swingable around a base point thereof and is provided with a contact point at an end for scanning the workpiece sur... | 01/09/2007 |
| 7159452 | Method for measuring a configuration of an object A touch sensor 10 having a stylus 12 with a tip 12A making contact with a test piece W has an operational control structure including an oscillator 3 which oscillates the stylus 12 in the axial direction; a detecting circuit 4 | 01/09/2007 |
| 7158224 | Optically active substrates A device for optical examination of biological materials using radiation of a selected wavelength includes a substrate having a first surface and a second surface opposite to the first surface. The first surface includes a dense array of micro-optical elements arran... | 01/02/2007 |
