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| Number | Title | Issue Date |
| 8113038 | Systems and methods for detecting a coating on an item such as a magnetic head Systems and methods for detecting presence of a coating on an item such as a magnetic head. Points on a surface of the item are contacted with an electrically conductive object. A determination may be made as to whether an electrical connection is made between the e... | 02/14/2012 |
| 8109135 | Cantilever assembly A cantilever assembly (1) comprises a cantilever (10) having a cantilever tip (11). The cantilever is mounted to a rigid support (12,120,121) and is provided on its back side with an area (110) of a high reflectance material having... | 02/07/2012 |
| 8104332 | Probe and cantilever To provide a probe 1 for use in a cantilever 2 of an scanning probe microscope (SPM) manufacturable in a simple manufacturing process and usable while allowing full use of the properties of single-crystalline material and a cantilever 2 using th... | 01/31/2012 |
| 8087289 | High resolution surface potential microscope A scanning probe system and method for using the same are disclosed. The system includes a probe that interacts with a specimen. The probe is caused to vibrate at a first frequency of the probe. A probe deflection signal indicative of an oscillation amplitude of the... | 01/03/2012 |
| 8087288 | Scanning stylus atomic force microscope with cantilever tracking and optical access A scanned-stylus atomic force microscope (AFM) employing the optical lever technique, and method of operating the same. The AFM of the invention includes a light source and a scanned optical assembly which guides light emitted from the light source onto a point on a... | 01/03/2012 |
| 8091143 | Atomic force microscopy probe A probe for atomic force microscopy (SM) comprising a micromechanical resonator (RMM) and a tip for atomic force microscopy (P1) projecting from said resonator, the probe being characterized in that: it also includes means (EL1) for selectively excitin... | 01/03/2012 |
| 8065908 | Scan type probe microscope Provided is an atomic force microscope capable of increasing the phase detection speed of a cantilever vibration. The cantilever (5) is excited and the cantilever (5) and a sample are relatively scanned. Displacement of the cantilever (5) is det... | 11/29/2011 |
| 8056402 | Nanoprobe tip for advanced scanning probe microscopy comprising a layered probe material patterned by lithography and/or FIB techniques By forming an appropriate material layer, such as a metal-containing material, on a appropriate substrate and patterning the material layer to obtain a cantilever portion and a tip portion, a specifically designed nano-probe may be provided. In some illustrative asp... | 11/15/2011 |
| 8060943 | Carbon nanotube oscillator surface profiling device and method of use The proposed device is based on a carbon nanotube oscillator consisting of a finite length outer stationary nanotube and a finite length inner oscillating nanotube. Its main function is to measure changes in the characteristics of the motion of the carbon nanotube o... | 11/15/2011 |
| 8042383 | Digital Q control for enhanced measurement capability in cantilever-based instruments A digital system for controlling the quality factor in a resonant device. The resonant device can be any mechanically driven resonant device, but more particularly can be a device that includes a cantilever within its system, such as an atomic force microscope. The ... | 10/25/2011 |
| 8028567 | AFM tweezers, method for producing AFM tweezers, and scanning probe microscope AFM tweezers that include a first probe, including a triangular prism member having a tip of a ridge which is usable as a probe tip in a scanning probe microscope, and a second probe, including a triangular prism member provided so as to open/close with respect to t... | 10/04/2011 |
| 8024963 | Material property measurements using multiple frequency atomic force microscopy Apparatus and techniques for extracting information carried in higher eigenmodes or harmonics of an oscillating cantilever or other oscillating sensors in atomic force microscopy and related MEMs work are described. Similar apparatus and techniques for extracting in... | 09/27/2011 |
| 8011230 | Scanning probe microscope A scanning probe microscope, capable of performing shape measurement not affected by electrostatic charge distribution of a sample, which: monitors an electrostatic charge state by detecting a change in a flexure or vibrating state of a cantilever due to electrostat... | 09/06/2011 |
| 8001830 | High frequency deflection measurement of IR absorption An AFM based technique has been demonstrated for performing highly localized IR spectroscopy on a sample surface. Such a technique implemented in a commercially viable analytical instrument would be extremely useful. Various aspects of the experimental set-up have t... | 08/23/2011 |
| 8001831 | Positioning apparatus and scanning probe microscope employing the same There is provided a scanning probe microscope employing a positioning apparatus M1 including a unit to be driven in XY direction having a substantially square form in plane geometry at the center of the plane in the XY directions and having a first elastic su... | 08/23/2011 |
| 7997124 | Scanning probe microscope A scanning probe microscope has a cantilever mounted to undergo oscillation movement over a surface of a sample. The cantilever has a probe on a distal end thereof. A Z-axis controlling amount calculating mechanism calculates a controlling amount for keeping constan... | 08/16/2011 |
| 7997123 | Nanotipped device and method A dispensing device has a cantilever comprising a plurality of thin films arranged relative to one another to define a microchannel in the cantilever and to define at least portions of a dispensing microtip proximate an end of the cantilever and communicated to the ... | 08/16/2011 |
| 7997126 | Texture measuring apparatus and method A texture measuring apparatus that measures surface information of an object includes: a probe coming into contact with the object while moving on a surface of the object; a first sensor unit, provided at the probe, for detecting a force acting on the probe in a dir... | 08/16/2011 |
| 7997125 | Miniaturized spring element and method for producing the spring element A miniaturized spring element is intended to be particularly suitable for use as a beam probe or cantilever for detecting atomic or molecular forces, in particular in an atomic force microscope, and, to this end, is intended to make it possible to detect its deflect... | 08/16/2011 |
| 7992431 | Piezoelectric microcantilevers and uses in atomic force microscopy The invention is direct to a piezoelectric microcantilever for static contact and dynamic noncontact atomic force microscopy which may be carried out in solution. The piezoelectric microcantilever, which includes a piezoelectric layer and a non-piezoelectric layer i... | 08/09/2011 |
| 7987703 | Tweezer-equipped scanning probe microscope and transfer method A tweezer-equipped scanning probe microscope comprises a first arm with a probing portion, a second arm that moves along an opening direction or a closing direction relative to the first arm, an electrostatic actuator that drives the second arm along the opening dir... | 08/02/2011 |
| 7975316 | Atomic force microscope and interaction force measurement method using atomic force microscope A frequency shift Δf obtained by an FM-AFM can be expressed by a simple linear coupling of a ΔfLR derived from a long-range interaction force and a ΔfSR derived from a short-range interaction force. Given this factor,... | 07/05/2011 |
| 7971266 | Method for providing a probe for a probe-microscopic analysis of a test sample in a probe microscope and arrangement with a probe microscope The present invention relates to a method for providing a measuring probe (1, 1a, 2) for a probe microscopic examination of a sample in a probe microscope, in particular a scanning probe microscope, in which the measuring probe (1), which... | 06/28/2011 |
| 7966867 | Scanning probe microscope The invention provides a scanning probe microscope capable of performing highly accurate three-dimensional profile measurement in a state in which no sliding of the probe or deformation of the sample substantially occurs. The present invention realizes a highly accu... | 06/28/2011 |
| 7963153 | Non-destructive ambient dynamic mode AFM amplitude versus distance curve acquisition A method, a system and a computer readable medium for dynamic mode AFM amplitude versus distance curve acquisition. In an embodiment, a constant force feedback mechanism is enabled prior to the first time an AFM probe tip contacts a sample. The feedback mechanism se... | 06/21/2011 |
| 7958776 | Atomic force gradient microscope and method of using this microscope A scanning probe microscope in which the probe is oscillated at a frequency lower than its resonant frequency, a force sensor that is sensitive to the bending of the cantilever and minimally sensitive to the oscillation is used to measure tip-sample interaction forc... | 06/14/2011 |
| 7958775 | Triboacoustic probe The invention relates to a sensor for the quantitative measurement of the feel of a surface, comprising a prehensile envelope, a hollow contact body for bringing into contact with the surface on a sensing zone, first acoustic detection elements to detect noises emit... | 06/14/2011 |
| 7945964 | Apparatus structure and scanning probe microscope including apparatus structure Provided are a structure of an apparatus for analysis, inspection, and measurement in which a support structure supporting a detection unit is resistant to disturbance, suppresses a reduction in resolution during large-sample measurement, and has high rigidity, and ... | 05/17/2011 |
| 7945965 | Sensor for observations in liquid environments and observation apparatus for use in liquid environments The sensor has the self-detecting probe including a body portion, an elongated belt-like flexible substrate, connecting members, a resinous portion, and external contacts formed at the ends of the flexible substrate brought out of liquid. The probe further includes ... | 05/17/2011 |
| 7937991 | Fully digitally controller for cantilever-based instruments A controller for cantilever-based instruments, including atomic force microscopes, molecular force probe instruments, high-resolution profilometers and chemical or biological sensing probes. The controller samples the output of the photo-detector commonly used to de... | 05/10/2011 |
| 7934417 | Scanning probe microscope Implementations of the present invention relate to a scanning probe microscope, which includes a base frame to which a probe holder with a probe as well as a probe support are, or can be fixed. The probe and the sample mount can be moved relative to one another in o... | 05/03/2011 |
| 7926328 | Sample manipulating apparatus There is provided a sample manipulating apparatus which is an apparatus for manipulating a sample mounted on a substrate surface, in which at least position data and shape data are acquired by observing the sample. Thereafter, tweezers are positioned by moving means... | 04/19/2011 |
| 7913544 | Scanning probe devices and methods for fabricating same The present invention is directed to scanning probes in which a cantilever contacts a stylus via an integrated stylus base pad, and methods for fabricating such probes. The probe offer many advantages over other types of scanning probes with respect to eliminating t... | 03/29/2011 |
| 7908908 | Materials and methods for identifying biointeractive nanostructures and/or nanoparticles Disclosed herein are surface force microscope probes comprising living cells adhered thereto, as well as methods of making same. Also disclosed is a system for high throughput screening of nanostructures having biological relevance through use of surface force micro... | 03/22/2011 |
| 7908909 | Apparatus and method of transporting and loading probe devices of a metrology instrument The preferred embodiments are directed to a probe cassette for a scanning probe microscope that includes a base having at least one probe storage receptacle, a lid mountable on the base with the probe storage receptacle at least substantially covering the at least o... | 03/22/2011 |
| 7900506 | Multi-dimensional standing wave probe for microscale and nanoscale measurement, manipulation, and surface modification The present invention provides a multi-dimensional standing wave probe for microscale and nanoscale measurement, manipulation, and surface modification, including: a filament having a first free end and a second end that is attached to at least one actuator to apply... | 03/08/2011 |
| 7895885 | Method and system for nanoknife and MEMS platform Methods and systems for constructing microfabricated devices including a microknife and methods and devices for a three-dimensional microstructure constructed from a plurality of separable planar components using one or more microfabrication techniques and optionall... | 03/01/2011 |
| 7886583 | Apparatus and method of amplifying low voltage signals A low voltage signal amplifying apparatus includes a probe device, an actuator providing relative motion between the probe device and the sample, and a transducer that generates a voltage signal indicative of a property of at least one of the probe device, the sampl... | 02/15/2011 |
| 7874202 | Probe apparatus for measuring an electron state on a sample surface In a probe apparatus that intermittently irradiates a sample with excitation light to observe the sample while subjecting a cantilever including a probe arranged to face a surface of the sample to self-excited vibration at a predetermined frequency, the sample is ir... | 01/25/2011 |
| 7866205 | Sample operation apparatus There is provided a sample operation apparatus in which, by a static electricity force acting between a probe and a sample, an accurate position is gripped without the sample being moved, and the sample can be operated by the probe for an observation, a grip, a rele... | 01/11/2011 |
