Class 73/1.42 - Timing apparatus (e.g., fuse, camera, or shutter)

Subclass of Class 73 - Measuring and testing
Definition: Subject matter wherein the device being proven or calibrated
No. of patents: 32
Last issue date: 08/25/2009

Number	Title	Issue Date
7578163	System and method for calibrating an adjustable delay time for a delay module A timing calibration system for an adjustable delay time of a delay module for an electronic circuit is provided. The system includes a control delay module including at least one calibration delay module, the control delay module having a second delay time. The sys...	08/25/2009
7352189	Time aligned bussed triggering using synchronized time-stamps and programmable delays Techniques for triggering that provide time-aligned triggering of a set of components using a bussed topology. Triggering according to the present teachings includes a set of components that each include circuitry for measuring a propagation delay on a trigger bus o...	04/01/2008
7283917	System and method for calibrating an adjustable delay time for a delay module A timing calibration system for an adjustable delay time of a delay module for an electronic circuit is provided. The system includes a control delay module including at least one calibration delay module, the control delay module having a second delay time. The sys...	10/16/2007
7281181	Systems, methods and computer programs for calibrating an automated circuit test system In one embodiment, an automated circuit test system is calibrated by electrically coupling a first calibration unit between a plurality of drivers and comparators of the test system, and then executing an AC timing calibration procedure to determine a timing delay f...	10/09/2007
7239971	Method and apparatus for calibrating communications channels A periodic signal is driven onto a transmission line, and the frequency of the periodic signal is varied from an initial frequency that corresponds to a quarter wave or half wave of an estimated length of the transmission line. A null or a peak in the envelope of th...	07/03/2007
7228248	Test apparatus, timing generator and program therefor There is provided a test apparatus including a PLL circuit for generating a strobe signal of which the timing is shifted according to a given delay control voltage, a variable delay circuit being provided divergently from a path connecting the PLL circuit and the ti...	06/05/2007
7121132	Method for calibrating semiconductor test instruments A method for calibrating a semiconductor test instrument leading cost reduction, simplified work, and short working time. Drivers are related to comparators in one-to-one correspondence. A clock signal and a strobe signal have a one-to-one correspondence. The phase ...	10/17/2006
7111490	Method for calibrating semiconductor test instruments A method for calibrating a semiconductor test instrument leading cost reduction, simplified work, and short working time. Drivers are related to comparators in one-to-one correspondence. A clock signal and a strobe signal have a one-to-one correspondence. The phase ...	09/26/2006
7107816	Method for calibrating semiconductor test instruments A method for calibrating a semiconductor test instrument leading cost reduction, simplified work, and short working time. Drivers are related to comparators in one-to-one correspondence. A clock signal and a strobe signal have a one-to-one correspondence. The phase ...	09/19/2006
7107817	Method for calibrating semiconductor test instruments A method for calibrating a semiconductor test instrument leading cost reduction, simplified work, and short working time. Drivers are related to comparators in one-to-one correspondence. A clock signal and a strobe signal have a one-to-one correspondence. The phase ...	09/19/2006
7107815	Method for calibrating semiconductor test instruments A method for calibrating a semiconductor test instrument leading cost reduction, simplified work, and short working time. Drivers are related to comparators in one-to-one correspondence. A clock signal and a strobe signal have a one-to-one correspondence. The phase ...	09/19/2006
7107166	Device for testing LSI to be measured, jitter analyzer, and phase difference detector LSI test equipment can acquire output data of an LSI as a device under test by a clock signal output from the LSI to be measured and acquire measurement data synchronously with the output data having jitter. The LSI test equipment includes a clock side time interpol...	09/12/2006
7095487	Systems and methods for determining depth using shuttered light pulses Systems and methods are presented that use light sensors and computing devices to compute the depth of an object using shuttered light pulses. In one embodiment, depth is determined as follows: A light emitter emits a pulse of light that is directed toward an object...	08/22/2006
7096144	Digital signal sampler A sampling circuit for testing an integrated circuit receives several signals from points of interest in the integrated circuit, digitizes them, and determines whether the digitized signal is above or below a threshold. By sampling the signal at different phases of ...	08/22/2006
7043959	Method for calibrating semiconductor test instrument A method for calibrating a semiconductor test instrument leading cost reduction, simplified work, and short working time. Drivers are related to comparators in one-to-one correspondence. A clock signal and a strobe signal have a one-to-one correspondence. The phase ...	05/16/2006
7035074	Method and arrangement for monitoring the drive of an actuator An arrangement for monitoring the drive of an actuator includes an output-stage component which includes a counter. With the aid of the counter, the switch-on time of the actuator is determined. The determined switch-on time is made available to the microcomputer fo...	04/25/2006
6934896	Time shift circuit for functional and AC parametric test A time shift circuit for changing a delay timing of a portion of a test pattern for testing a semiconductor device. The time shift circuit includes a multiplexer for selectively producing delay value data indicating a value of time shift in response to a shift comma...	08/23/2005
6499334	Variable delay element test circuit A loop circuit including a variable delay element whose delay time amount can be set arbitrarily is formed, a loop control circuit controls so that the positive/negative logic of input pulse signal to the variable delay element is always constant, the num...	12/31/2002
6463392	System and method for adjusting a sampling time in a logic analyzer A system and method are provided for detecting a stable region in a data signal to facilitate the alignment between a data signal and a corresponding clock signal. The system includes a processor coupled to a local interface and a memory coupled to the lo...	10/08/2002
6163759	Method for calibrating variable delay circuit and a variable delay circuit using the same In a variable delay circuit calibrating method in which the state of connection of M delay stages connected in cascade through multiplexers and weighted differently is controlled by a control signal value to generate a calibrated amount of delay correspon...	12/19/2000
5898110	Precise rain gauge and methods of calibration A rain gauge and methods of tilt time calibration and flow rate calibration. The rain gauge comprises a pair of buckets separated by a darn rotatably attached to a base. A threaded balance weight is used to calibrate the rain gauge to equalize the tilt ti...	04/27/1999
5894081	Method and apparatus for adjusting output signals from a semiconductor device to fulfill a timing specification Integrated circuits must fulfill published timing specifications that have been given to customers. To fulfill published timing specifications, such as minimum valid time and maximum valid time, a circuit for adjusting the output signals from an integrate...	04/13/1999
5811655	Delay time calibration circuit and method A delay time calibration circuit reduces timing skews among a plurality of test channels of a semiconductor test system for testing a semiconductor device. The delay time calibration circuit includes: a plurality of calibration loops each of which include...	09/22/1998
5493892	Method for calibrating the time response of a mass air flow sensor by laser trimming selected resistors and without an air flow A method for calibrating the response time of a mass air flow sensor in which the sensors bridge offset voltage is measured and the constant CI is calculated from the initial value of the bridge offset voltage. CI is a constant of th...	02/27/1996
5415053	Apparatus for automatically testing machine safety system An apparatus for testing an industrial machine safety system that allows the machine to begin operation only when a plurality of safety push buttons have all been depressed, and that stops the machine's operation when any safety push button is released. T...	05/16/1995
5070843	Ignition timing control apparatus of internal-combustion engine An ignition timing control apparatus for an internal-combustion engine comprises a resonance-type acceleration sensor for detecting vibration acceleration, a discriminating means for eliminating noise signal components from the output of the acceleration ...	12/10/1991
4894787	Automatic load monitoring system with remote sensing A novel system for determining the magnitudes of loads on rotating helicopter components from signals remotely measured on the helicopter fuselage is characterized by a processor which decomposes the measured signals into corresponding Fourier components ...	01/16/1990
4627268	Method for calibrating instruments for time interval measurements A method and apparatus is presented for calibrating instruments for time interval measurements, pulse width measurements, and rise and fall time measurements. The preferred method comprises generating two coherent pulses using a linear passive device. The...	12/09/1986
4598575	Timer calibration method and apparatus An apparatus for calibrating a timer of the type having a first and a second input channel in which an initial signal arriving over one input channel initiates a timing cycle, while a subsequent signal arriving over the other input channel terminates the ...	07/08/1986
4295359	Calibration apparatus for CML circuit test unit An apparatus for calibrating a test unit adapted to characterize CML integrated circuits. The apparatus is adapted to deskew the time delays of each pin of the fixture which receives the CML circuit under test with respect to a certain predetermined pin a...	10/20/1981
4280355	Fuze data quantizing system The present invention discloses an in-flight testing of projectile and mor fuzes. A microminiature electronic circuitry in a cartridge form is designed to attach to any of the large caliber shell or mortar fuzes. The test-cartridge is a recoverable, reus...	07/28/1981
4178590	Electronic weft thread monitor for shuttleless weaving machines The invention is concerned with an electronic device enabling an operator to easily and correctly adjust the time interval in which the weft insertion in shuttleless looms fitted with an electronic weft or filling thread monitor is to be monitored. A safe...	12/11/1979

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Class 73/1.42 - Timing apparatus (e.g., fuse, camera, or shutter)