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| Number | Title | Issue Date |
| 4644486 | Vector network analyzer with integral processor A precision vector network analyzer which is suitable for a wide range of applications including both laboratory and automated production measurements and testing is disclosed. New measurement capabilities, greater ease of use, and nearly complete automat... | 02/17/1987 |
| 4620282 | System and method for documenting and checking cable interconnections A system and method for documenting and checking the common connections provided by each wire of a cable between connector terminals located at opposite ends of the cable. The system includes a cable analyzer which is used to generate control information ... | 10/28/1986 |
| 4554636 | Apparatus for testing circuits within a system A capability for internal self-testing is provided for a test instrument in which data, in digital and in analog form, is sampled from various test points. A programmable delay generator is used to process some of the data and to provide strobes which con... | 11/19/1985 |
| 4517661 | Programmable chip tester having plural pin unit buffers which each store sufficient test data for independent operations by each pin unit A test system for testing circuits in integrated circuit chips includes a host computer for controlling the test system, and a plurality of blocks operable in parallel and each including a controller, storage for test programs and test data, and plurality... | 05/14/1985 |
| 4510572 | Signature analysis system for testing digital circuits A signature analyzer for testing digital circuits. The analyzer includes a memory which is initially programmed with a set of signatures characterizing the digital signals on the nodes of a correctly operating circuit. The nodes of a test circuit are then... | 04/09/1985 |
| 4503386 | Chip partitioning aid (CPA)-A structure for test pattern generation for large logic networks Disclosed is a design discipline, or approach, in the form of circuitry and a test method, or methodology which obviates the problems of the prior art and allows testing of each individual chip and interchip connections of a plurality of interconnected ch... | 03/05/1985 |
| 4493045 | Test vector indexing method and apparatus A data channel for a digital tester includes a random access local memory containing a main vector sequence, a subroutine vector sequence, and a test vector list. An index register is loaded with the address of the first vector in the list of vectors that... | 01/08/1985 |
| 4488354 | Method for simulating and testing an integrated circuit chip A method and apparatus for simulating custom chips to be used in a data processing system. Each chip is simulated by a chip simulator that includes a mother board and a plurality of baby boards mounted and interconnected on the mother board. Each baby boa... | 12/18/1984 |
| 4333142 | Self-configurable computer and memory system Computer and memory system on a wafer which contains redundant elements and which is capable of self-testing and self-configuration to form a complete system consisting of a central processing unit (CPU), a read only memory unit (ROM), and a plurality of ... | 06/01/1982 |
| 4218745 | Microcomputer assisted electrical harness fabrication and testing system A microcomputer based system which provides a fast, error-free method of electrical harness fabrication and testing. Each connector into which the harness will be wired is mounted on a receptacle containing a multiplex transponder, a plurality of which ar... | 08/19/1980 |
| 4212075 | Electrical component testing system for component insertion machine A testing system is provided within a component insertion machine for testing a component immediately prior to its insertion into a printed circuit board. The insertion of the component is conditioned upon the successful passage of one or more tests that ... | 07/08/1980 |
| 4081858 | System for computing wiener kernels Equipment is provided for determining the characteristics of a linear or non-linear system from its output y, for a quasi-random input x. The non-linear system may be a biological system. The computer described calculates first and second order kernels fr... | 03/28/1978 |
| 4070565 | Programmable tester method and apparatus A method and apparatus for automatic, programmed, in-circuit testing of individual logic elements. A plurality of program-operated device connection switches are provided for making connections to the circuit under test. A plurality of program-operated dr... | 01/24/1978 |
| 4041386 | Multifunctional circuit analyzer A multifunctional circuit analyzer is disclosed which is capable of determining the complete signature of an unknown electrical signal. The circuit analyzer utilizes a high and low peak detection circuit and an analog to digital converter to determine the... | 08/09/1977 |
