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| Number | Title | Issue Date |
| 5406132 | Waveform shaper for semiconductor testing devices A plurality of clock signals, which determine the edge timing of a driver output waveform, are generated by a timing generator. Pattern data and control data synchronized therewith from selecting a waveform mode in real time are generated by a patter gene... | 04/11/1995 |
| 5377202 | Method and apparatus for limiting pin driver offset voltages A test equipment pin driver having a main output channel including a pulse forming circuit, a buffer and an output amplifier connected in series. The pulse forming circuit provides pulses that are timed to a data input signal, and the buffer passes the pu... | 12/27/1994 |
| 5371748 | Technique and apparatus for testing an electrically programmable ROM embedded among other digital circuitry on an IC chip A method and apparatus for testing an electrically programmable read-only-memory which is embedded within logic or other digital circuitry on an integrated circuit is described. An integrated circuit tester is used to test the electrically programmable re... | 12/06/1994 |
| 5127011 | Per-pin integrated circuit test system having n-bit interface Apparatus and method for controlling an operation of a test pin of a per-pin semiconductor device test system [10]. The apparatus includes pattern storage memory [42] for storing and for outputting information related to a state of the test pin for indivi... | 06/30/1992 |
| 5111459 | Electronic circuit tester An electronic circuit tester according to the invention comprises: a connection board for connection with each of the terminals of the circuit to be tested; n boards (16), called electronic pins, comprising signal shaping means each of which is connected ... | 05/05/1992 |
| 5107205 | Semiconductor device tester with a test waveform monitoring circuit A tester for semiconductor devices such as IC memory chips is provided with an improved test waveform simulating function. The test waveform simulating circuit comprises relays for selecting one of the outputs of a plurality of drivers. The driver output ... | 04/21/1992 |
| 5063383 | System and method for testing analog to digital converter embedded in microcontroller A tester system tests the transfer characteristics and operability of an analog to digital converter (ADC) embedded in a microprocessor. The tester generates a sequence of analog signal test values, and prompts the microprocessor to read and convert each ... | 11/05/1991 |
| 4903267 | Method of generating test data The invention prepares test data on a logic LSI which includes a plurality of signal pins, a control pin for inputting an external control signal, and control circuitry responsive to the external control signal for setting the signal pins in a desired sta... | 02/20/1990 |
| 4799008 | AC level calibration apparatus In an analog test system for testing integrated circuit chips, AC level calibration is achieved by adding a minimal number of new elements and more fully utilizing elements existing in the system. A reference voltage from an existing precision DC power so... | 01/17/1989 |
| 4791356 | In-circuit testing system An in-circuit test system having means to stimulate the device-under-test at any desired electrical node of the device, means to record the device's response waveform at any node, means to edit the response waveform, and means to use the edited waveform t... | 12/13/1988 |
| 4694242 | Integrated circuit tester and remote pin electronics therefor The present invention relates, in general, to an electronic and measuirng circuits are located remotely from the test head. A low device count circuit at each pin performs the necessary high speed switching. The force and measure lines are relatively long... | 09/15/1987 |
| 4675673 | Programmable pin driver system Programmable pin drivers allow PROM pins to be individually programmed and regulated to specified voltages and currents. Each pin is assigned a voltage multiplexer to select a regulated voltage and a power amplifier to supply current. The source voltage t... | 06/23/1987 |
| 4656632 | System for automatic testing of circuits and systems A Universal Pin Electronics ("UPE") System is disclosed which incorporates a plurality of testing channels, each of which is coupled to a single input pin of a unit under test and is capable of selectively generating a plurality of different types of stim... | 04/07/1987 |
| 4625332 | Programmable time varying attenuator A programmable time varying attenuator has a reprogrammable digital circuit or impressing an analog attenuation signal on a continuous wave noise signal. This signal is fed to the input of a receiver and since the digital circuitry can be reprogrammed with... | 11/25/1986 |
| 4598398 | Test apparatus for PCM/FDM transmultiplexer A device is described which utilizes an addressing circuit to output, from a memory device, stored digital samples of an analog sinusoid, in logarithmic form, to a level control circuit, which modifies the digital level by means of adding a logarithmic sc... | 07/01/1986 |
| 4538266 | Diagnostic apparatus for digital-to-analog converters An apparatus for diagnosing a plurality of digital-to-analog converters simultaneously is provided. Digital signal generation means applies digital signals to the plurality of digital-to-analog converters, and the digital signals are changed in sequence s... | 08/27/1985 |
| 4538268 | Test-signal generating device for testing electronic equipment A generating device comprising means for storing test signals in the form of digital samples coupled to a digital-to-analog converter for converting the samples to analog signals at the output of the device. A read/write memory is interposed between the d... | 08/27/1985 |
| 4510439 | Digital circuit multi-test system with automatic setting of test pulse levels A pair of complementary VMOS transistors connected in push-pull is utilized to convert pulses supplied to the gates of these transistors into two-level output signals of which each of the voltage levels is independently adjustable. A digital-to-analog con... | 04/09/1985 |
| 4439858 | Digital in-circuit tester A circuit adapted for use in a high speed computer controlled digital in-circuit tester for obtaining high pulse fidelity at each electrical node of a circuit under test is provided. High pulse fidelity is obtained by minimizing the current in the power s... | 03/27/1984 |
| 4316259 | Programmable function generator A programmable function generator which provides three independent signal sources for use as test stimuli in automatic test equipment is disclosed. Each of the three signal outputs are separately programmable as either a function generator, or as a pulse gener... | 02/16/1982 |
| 4302843 | Method and apparatus for measuring transmission characteristics of a test object during communication gaps A method for measuring the transmission characteristics of a transmission line during gaps in communications on said transmission line consists of monitoring the transmission line for a gap in communication thereon, and applying an identifier signal follo... | 11/24/1981 |
| 4074189 | Carrier with code An extensible coded carrier provided with a binary code, consisting of a number of binary code elements mounted, for example, on a printed-circuit board. The code is capable of being extended to include an element which is analogue in principle, for examp... | 02/14/1978 |
