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"I watched his countenance closely, to see if he was not deranged ... and I was assured by other senators after he left the room that they had no confidence in it."
U.S. Senator Smith of Indiana ; After seeing Samuel Morse demonstrate the telegraph.
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| Number | Title | Issue Date |
| 4441182 | Repetitious logic state signal generation apparatus Apparatus as disclosed which comprises a register normally operable in the parallel data in/parallel data out mode but which has control mechanisms for allowing it to be converted to a serial data in/serial data out register. This register comprises part ... | 04/03/1984 |
| 4434488 | Logic analyzer for a multiplexed digital bus A logic analyzer for measuring individually a plurality of logic signals transmitted via a multiplexed digital bus in a time-sharing manner is disclosed. First and second memory circuits store respectively first and second logic signals of the multiplexed... | 02/28/1984 |
| 4425643 | Multi-speed logic analyzer A logic analyzer which can simultaneously measure one block of input data in detail and the same or another block of input data in rough form is disclosed. The logic analyzer comprises first and second sections each including a memory circuit to store the... | 01/10/1984 |
| 4419656 | Method and apparatus for digital converter testing A method and apparatus is described for dynamically testing the overall performance characteristics of digital-to-analog converts and analog-to digital converters which involve excitation of the converters by an orthogonal function signal. Specifically th... | 12/06/1983 |
| 4402055 | Automatic test system utilizing interchangeable test devices An automatic test system controlled by a general purpose digital central processor is disclosed. The central processor accepts test programs in a high level compiler language such as Atlas. The Atlas program is compacted into a simplified language which i... | 08/30/1983 |
| 4395767 | Interconnect fault detector for LSI logic chips A large-scale integrated circuit (LSI) chip has an individual voltage level sensing circuit connected with each input and output connecting pin so that isolation between the pins is maintained and so that the individual level sensor output can provide an ... | 07/26/1983 |
| 4381563 | Apparatus and method for visually presenting analytical representations of digital signals Signals at selected points on a test device place indicia on a record indicating, for each selected point, a selected logical active level and an initial polarity level. At preselected time intervals, levels, level changes and the number of transitions pe... | 04/26/1983 |
| 4375635 | Signal measurement apparatus A word recognizer probe to be removably incorporated with the mainframe of a logic analyzer is disclosed. The use of serial input-parallel output type memory means in the probe minimizes the number of interconnection signal paths between the probe and the... | 03/01/1983 |
| 4365334 | Electrical testing apparatus and methods A system is disclosed for generating test data for testing logic circuits. It has a store storing a respective Logic List for each of the basic logic circuit types in the form of a list of logic states identifying terminals of the logic circuit to which s... | 12/21/1982 |
| 4354268 | Intelligent test head for automatic test system An intelligent test head which can be plugged into an existing computer-controlled automatic test system that is adapted to carry out certain tests on integrated circuits and discrete devices, the test head making it possible for the system to execute spe... | 10/12/1982 |
| 4348759 | Automatic testing of complex semiconductor components with test equipment having less channels than those required by the component under test A method and apparatus for testing large or very large scale integrated circuit packages is described. The testing equipment required for testing such packages is assumed to lack the number of channels necessary to connect one channel to each input/output... | 09/07/1982 |
| 4291404 | Automatic circuit tester with improved voltage regulator A battery operated microcomputer controlled programmable circuit testing device. Standard I/O/memory devices (25a, 25b) are connected to a microcomputer (20) in such a manner as to treat the I/O ports (46, 47) of the I/O memory devices as programmable int... | 09/22/1981 |
| 4241307 | Module interconnection testing scheme This specification describes the testing of interconnections between modules mounted on a card and between the modules and the input and output terminals of the card. Each of the modules has an Exclusive-OR circuit which receives an input from each of the... | 12/23/1980 |
| 4211917 | Circuit board testing apparatus and method A system by which a plurality of different circuit boards can be reliably tested by a single testing apparatus having a plurality of test programs adapted for testing particular circuit boards. Each circuit board has a pair of non-circular keying pins, wi... | 07/08/1980 |
| 4168527 | Analog and digital circuit tester An automatic tester for singularly testing a plurality of different types of standard electronic modules. A test program is written for each type of standard electronic module and this test data is stored on cassette tape. As the tester is adaptable for t... | 09/18/1979 |
| 4161276 | Complex logical fault detection apparatus and method The present invention relates to apparatus and method for testing logic circuit boards for complex logical faults contained therein. A known good identical logic circuit is stimulated by a preselected sequence of binary test patterns and the number of tra... | 07/17/1979 |
| 4146835 | Testing the differential response times of a plurality of circuits In integrated circuits having multiple gate functions, the difference between the propagation delay times of each of the gate functions is often important in that it affects the reliability of the circuits. To determine these delay differences, input sign... | 03/27/1979 |
| 4139818 | Circuit means for collecting operational errors in IC chips and for identifying and storing the locations thereof The present disclosure describes electronic circuits for use with test and diagnostic (T&D) means to collect errors orignating within integrated circuit (IC) chips during their operation in a system environment. Moreover, the circuits employ counters and ... | 02/13/1979 |
| 4108358 | Portable circuit tester A portable circuit tester is disclosed which features efficient and simplified testing and fault identification of electronic units, such as circuit cards or the like. The tester incorporates an executive test program stored in a programmable read-only Me... | 08/22/1978 |
| 4099668 | Monitoring circuit A monitoring circuit for digital circuits is disclosed. The monitor is primarily applicable to digital circuits which operate in a cyclic mode with the digital patterns generated during each cycle being repeated in a predictable manner. A predetermined nu... | 07/11/1978 |
| 4097797 | Apparatus for testing electrical circuit units such as printed circuit cards A system is described for testing electrical circuit units, particularly printed circuit cards having a plurality of plug-in connector terminals. The testing system is first operated in the Generation Mode wherein it generates a reference test pattern produced... | 06/27/1978 |
| 4076970 | Switching system having a central controller for accessing individual telephone circuits for testing A switching system for connecting any one of a plurality of electrical circuits to any one of a plurality of test positions, wherein a central controller including a microprocessor directs, in a pre-programmed manner, all necessary switching functions. In... | 02/28/1978 |
| 4074189 | Carrier with code An extensible coded carrier provided with a binary code, consisting of a number of binary code elements mounted, for example, on a printed-circuit board. The code is capable of being extended to include an element which is analogue in principle, for examp... | 02/14/1978 |
| 4066882 | Digital stimulus generating and response measuring means A high-speed, real-time automatic test system element that is compatible with most contemporary computers and will interface with units under test via a front-mounted coaxial patch panel and rear exiting cables to mate with common automatic test system in... | 01/03/1978 |
| 4058767 | Apparatus and process for testing AC performance of LSI components Apparatus for determining the AC or switching delay behavior of an LSI circuit. The apparatus measures the signal propagation along different circuit paths to determine the AC characteristic. Each LSI circuit line under test is connected to a display thro... | 11/15/1977 |
| 4044244 | Automatic tester for complex semiconductor components including combinations of logic, memory and analog devices and processes of testing thereof Logic and analog functions in a complex semiconductor component are stuck fault and parametrically tested through an analog/digital measurement adapter coupled to logic and analog testers. Both logic and analog testers are under computer control whose pur... | 08/23/1977 |
| 4009437 | Net analyzer for electronic circuits The present disclosure describes a device for checking the dc characteristics of electronic nets disposed for example in assemblies utilized in data processing equipment. The operation of the analyzer assumes the presence of one or more controlled impedan... | 02/22/1977 |
| 4002974 | Method and apparatus for testing circuits Functional and parametric checks of a circuit to be tested are in effect conducted concurrently. Equivalent loads are connected to the circuit and the loads are programmable under control of a test system. In that way, various different fan-in and fan-out... | 01/11/1977 |
| 3976940 | Testing circuit An improved testing circuit is provided which includes a pair of comparator circuits each of which is disposed for comparing two minimum threshold amplitudes of responses from a device under test, and a multiplexer circuit coupled to the outputs of the pa... | 08/24/1976 |
| 3939333 | Previous events memory The method of storing, without interruption, digital signals having asynchronous transitions and reproducing these digital signals upon an expanded time scale after the occurrence of a fault. The apparatus comprises an input counter, an output counter, an adde... | 02/17/1976 |
| 3931506 | Programmable tester A method and apparatus for automatic, programmed, in-circuit component testing and functional testing. A multi-mode measurement unit having an exciter circuit, computing circuit, and a converter circuit is provided for measuring electrical signals. The me... | 01/06/1976 |
