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| Number | Title | Issue Date |
| 6816747 | Computer-implemented system and process for improving manufacturing productivity One aspect of the present invention relates, to a computer-implemented system for improving manufacturing productivity. The system is comprised of at least one computer configured to: (1) receive a plurality of productivity data elements regarding a manufacturing pr... | 11/09/2004 |
| 6816798 | Network-based method and system for analyzing and displaying reliability data A network-based method and system for analyzing and displaying reliability data from a user is provided. The method includes recording reliability data, obtaining unreliability plots, obtaining Weibull distribution parameters, creating control charts for those param... | 11/09/2004 |
| 6810296 | Correlating an inline parameter to a device operation parameter A method and an apparatus for dynamic targeting for a process control system. Inline parameter data relating to a processed workpiece is received. A determination is made whether the inline parameter would result in a value of a device operation parameter within a p... | 10/26/2004 |
| 6810359 | Maintenance and management method of equipment for production operations and support system therefor A maintenance and management method of equipment for production operations, comprising: obtaining machinery component defect data by inspecting the equipment; performing countermeasures and inspections based on these data; obtaining defect frequency data and inspect... | 10/26/2004 |
| 6807453 | Method and system for evaluating a defective ratio of products A defective ratio evaluation method includes the steps of classifying defective information describing a design structure of a product and manufacturing features which become product defective occurrence factors and making the defective information accessible; compa... | 10/19/2004 |
| 6804570 | Predicting manufacturing process failures A method for generating a predictor of failure of a manufacturing process. The predictor is generated by generating a candidate solution for the predictor and then determining a fitness of the candidate solution using fitness cases pertaining to the manufacturing pr... | 10/12/2004 |
| 6804619 | Process control based on tool health data A method is provided for a process control based on tool health data. The method comprises processing a workpiece using a processing tool, receiving trace data associated with the processing of the workpiece from the processing tool and determining at least one valu... | 10/12/2004 |
| 6792359 | Method for inspecting defect and system therefor Based on a plurality of defects' position-coordinates and attribute detected by an inspecting apparatus, defects that are easily detectable by an observing apparatus are selected. With these selected defects employed as the indicator, the observing apparatus detects... | 09/14/2004 |
| 6785623 | Business to business electronic test monitoring information system A system/method of establishing a two-way communication system between a testing/manufacturing site and a component vendor is disclosed. The system allows the test results related to a component failure to be immediately available to a vendor by allowing the vendor ... | 08/31/2004 |
| 6785638 | Method and system of dynamic learning through a regression-based library generation process The present invention relates to a method and system for efficiently determining grating profiles using dynamic learning in a library generation process. The present invention also relates to a method and system for searching and matching trial grating profiles to d... | 08/31/2004 |
| 6782331 | Graphical user interface for testing integrated circuits A system that includes a graphical user interface (GUI) connected to an input/output device of a computer system and one or more test instruments producing a set of electrical signals. The system also includes a probe card that has a multiple probe needles used for ... | 08/24/2004 |
| 6778156 | Method for examining quality of flat panel display device A method for examining quality of a flat panel display device is disclosed, in which good/fail of the flat panel display device is automatically examined to improve efficiency of the operation and obtain exact examined result. The method for examining good/fail of a... | 08/17/2004 |
| 6778873 | Identifying a cause of a fault based on a process controller output A method and apparatus is provided for identifying a cause of a fault based on controller output. The method comprises processing at least one workpiece under a direction of the controller and detecting a fault associated with the processing of the at least one work... | 08/17/2004 |
| 6775630 | Web-based interface with defect database to view and update failure events The present invention is directed to a system and method for providing access to semiconductor manufacturing information. The present invention system and method allows users to interface with semiconductor characteristic data and to data associated with manufacturi... | 08/10/2004 |
| 6775817 | Inspection system and semiconductor device manufacturing method A method and system are provided for analyzing defects having the potential to become electrical failures, during the inspection of particles and/or pattern defects of a wafer used in the manufacture of electronic devices such as semiconductor integrated circuits. D... | 08/10/2004 |
| 6774647 | Noninvasive optical method and system for inspecting or testing CMOS circuits A method and system for testing an integrated circuit. The method comprises the steps of obtaining periodic optical emissions over a defined period of time and from a defined area of an integrated circuit operating with time-varying internal currents, and time resol... | 08/10/2004 |
| 6766214 | Adjusting a sampling rate based on state estimation results A method and an apparatus are provided for adjusting a sampling rate based on a state estimation result. The method comprises receiving metrology data associated with processing of workpieces, estimating a next process state based on at least a portion of the metrol... | 07/20/2004 |
| 6763313 | System and method for measuring an object A system and method for measuring an object using different measurement apparatuses located at various measurement stations, and for gathering measurement data on the object automatically. The system comprises a plurality of measurement computers (100) locate... | 07/13/2004 |
| 6748342 | Method and monitoring device for monitoring the quality of data transmission over analog lines The method and respective device monitors the quality of data transmission over wavelength-division-multiplexed channels on an optical waveguide using an analog check signal. The analog check signal is formed by decoupling and combining a fraction p of the signals o... | 06/08/2004 |
| 6748337 | Method and apparatus for providing quality control in an instrument for medical analysis A method and apparatus for providing quality control in a medical analysis instrument is provided. The method includes the steps of: 1) sending one or more quality control specimens to an operator of the analytical instrument; 2) directly or indirectly communicating... | 06/08/2004 |
| 6745142 | Recipe comparison system A recipe comparison system having recipe management ability in both offline accessing and online operating modes. The recipe comparison system includes an equipment server, an analysis module, and a recipe management module. The equipment server receives an upload s... | 06/01/2004 |
| 6745140 | Electronic test system with test results view filter An electronic test system with a test results view filter that enables the user to filter the test results of a test program according to their particular datapoint value status. The test results view filter is preferably comprised of graphical elements representing... | 06/01/2004 |
| 6742168 | Method and structure for calibrating scatterometry-based metrology tool used to measure dimensions of features on a semiconductor device The present invention is generally directed to a method and a structure for calibrating a scatterometry-based metrology tool used to measure dimensions of features on a semiconductor device. In one illustrative embodiment, the method comprises measuring a critical d... | 05/25/2004 |
| 6741940 | Computer-implemented method of defect analysis In the step (S11), chip classification data in which a plurality of chips are classified into four sorts on the basis of presence/absence of (new) defects and pass/fail (of integrated circuits) is obtained. Next, in the step (S12) set is a situation wh... | 05/25/2004 |
| 6735541 | Process unit monitoring program The present invention is a method to monitor and analyze the performance of a hydrocarbon-processing unit such as pipestill or hydrocracker unit. The invention includes the steps of collecting historical data relating to the hydrocarbon processing unit, from a proce... | 05/11/2004 |
| 6728594 | Central control system and method for fine tuning individual cigarette manufacturing control systems The present invention includes a central control system and method for fine tuning a cigarette manufacturing process. A measurement device captures measurements of particular cigarette properties. The measurement data is sent to and stored in a central database. Onc... | 04/27/2004 |
| 6725115 | Dynamic testing of electronic assemblies Method and apparatus for providing dynamic testing of electronic assemblies during their manufacture. A production line includes a communication network to interconnect assembly and inspection equipment. Events impacting the manufacture of the assemblies are communi... | 04/20/2004 |
| 6721691 | Metrology hardware specification using a hardware simulator A method and system in metrology for integrated circuits, for incorporating the effects of small metrology hardware-based and material-based parameter variations into a library of simulated diffraction spectra. In a first embodiment, a method is disclosed for determ... | 04/13/2004 |
| 6714885 | Method for measuring number of yield loss chips and number of poor chips by type due to defect of semiconductor chips A method for measuring the number of yield loss chips and the number of poor chips by type due to defects of semiconductor chips by which it is possible to remarkably improve the yield of semiconductor chips by measuring the number of yield loss chips due to defects... | 03/30/2004 |
| 6711514 | Method, apparatus and product for evaluating test data Method, apparatus and product for analyzing a quality control regimen comprising one or more quality control tests, to determine if the tests are in statistical control, and therefore could be removed from the regimen or sampled at a different rate. On sample data r... | 03/23/2004 |
| 6704692 | Method and system for tracking multiple objects An improved method and system for solving a combinatorial optimization problem, such as a tracking problem, to define a plurality of associations of measurements taken of a plurality of objects is provided. In one aspect, a method, a system and a computer... | 03/09/2004 |
| 6697747 | Quantifying the effectiveness of an operation such as an inspection procedure A method of performing an operation comprises operation steps and evaluation steps. The evaluation steps comprise: identifying a set of performance shaping factors which influence the outcome of the operation; allocating a probability value to each per... | 02/24/2004 |
| 6694275 | Profiler business model A quality control system implemented by a service provider for a user via the utilization of sophisticated software algorithms in creating a library of profiles based on product specification. These libraries of profiles are compared with profiles of manu... | 02/17/2004 |
| 6675129 | Internet based supplier process reliability system The present invention provides a system by which the host can receive an ongoing reliability audit of a component supplier's production test results over the Internet. This invention analyses and graphs the test results to determine component reliability ... | 01/06/2004 |
| 6665623 | Method and apparatus for optimizing downstream uniformity A method includes measuring a characteristic of a workpiece at a plurality of locations. A uniformity profile is generated based on the characteristic measurements. At least one acceptable region of the workpiece is identified based on the uniformity prof... | 12/16/2003 |
| 6662128 | Normalized-constraint algorithm for minimizing inter-parameter crosstalk in imaging of scattering media A method and system for minimizing inter-coefficient crosstalk in imaging the internal properties of a scattering medium. The method and system minimizing inter-coefficient. crosstalk in image reconstruction by solving a system of linear perturbation equa... | 12/09/2003 |
| 6653139 | On-site drug testing method The invention described herein includes a method of testing a specimen such as urine to determine whether the specimen contains specific substances such as drugs of abuse. An on-site screening test provides a preliminary test result either by visual or ma... | 11/25/2003 |
| 6651017 | Methods and systems for generating a quality enhancement project report Methods and systems for generating a quality enhancement project report. In one embodiment, the methods and systems generate a report of a Six Sigma quality enhancement project directed to a selected process. The project report in this embodiment includes... | 11/18/2003 |
| 6643596 | System and method for controlling critical dimension in a semiconductor manufacturing process A system and method for controlling critical dimension in a semiconductor manufacturing process. The system 10 controls critical dimension by altering focus and exposure settings, based on a single measured attribute (i.e., critical dimension) and on a pr... | 11/04/2003 |
| 6643592 | System and method for fault diagnosis A method and system for accessing a remote site by a field engineer faced with a machine fault. The remote site includes various expert systems and fault prediction tools to assist the field engineer. In the event the field engineer is unable to diagnose ... | 11/04/2003 |
