Did You Know...
...that power steering was invented by independent inventor Francis W. Davis? As chief engineer in the 1920s of the truck division of the Pierce Arrow Motor Car Company, he saw how hard it was to steer heavy vehicles. So that he would be able to keep the profits from his future invention, Davis left his job, rented a small engineering shop in Waltham, Mass., and developed a hydraulic power steering system that led to power steering.
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| Number | Title | Issue Date |
| 8108169 | Method and apparatus for matching translucent coatings of absorbent substrates In one embodiment, the present invention is a method and apparatus for matching translucent coatings of absorbent substrates. In one embodiment, a method for matching a color of a sample includes generating a plurality of recipes, each of the recipes representing a ... | 01/31/2012 |
| 8082119 | Method and system for mask fabrication process control A method for controlling mask fabrication is provided, wherein the method uses statistical process control analysis. A manufacturing model is defined. A process run of a mask is performed as defined by the manufacturing model. A fault detection analysis is performed... | 12/20/2011 |
| 8041526 | Method, apparatus and system for reducing waste in production systems A production system includes at least one production component having a production cycle which is interruptible by a detected production failure, at least one detector configured to monitor an output of the at least one production component, the detector configured ... | 10/18/2011 |
| 7925461 | Quality control system, analyzer, and quality control method A quality control method using a plurality of analyzers and a control device connected to the analyzers via a network, the method comprising: (a) measuring quality control samples by the analyzers; (b) collecting a plurality of quality control data obtained by measu... | 04/12/2011 |
| 7711503 | System and method for integrating the internal and external quality control programs of a laboratory A system and method that enables a laboratory to integrate its internal and external quality control programs to thereby control the quality of its laboratory testing services. The system has a storage device and a processor operable to maintain in the storage devic... | 05/04/2010 |
| 7702476 | Method of controlling the quality of industrial processes and system therefor A system for controlling the quality of industrial processes including the steps of: having one or more reference signals relating to the industrial process, acquiring one or more real signals which are indicative of the quality of said industrial process, obtaining... | 04/20/2010 |
| 7620513 | Optical time domain reflectometer, and optical fiber measuring method and optical fiber measuring system using the same In order to easily and efficiently carry out various characteristic evaluations of optical fibers which have been laid down, a table file which is for carrying out association of optical fibers serving as measuring objects with measured data when the optical fibers ... | 11/17/2009 |
| 7539586 | Correction method and measuring instrument A measuring instrument comprising a stylus displaced following a work, the instrument further comprises a corrector for correcting a displacement in the translation axis direction value according to a height detection axis direction value of the stylus position in a... | 05/26/2009 |
| 7532990 | System and method for press signature tracking and data association In an exemplary embodiment of the present invention, a method for operation of a printing press includes the steps of generating unique individual signature identification information, tracking printing press operation information and associating the printing press ... | 05/12/2009 |
| 7519492 | Apparatus and method for fully automated closed system quality control of a substance The present invention provides an apparatus and method for automated quality control of a substance comprising a compartment wherein a substance is located, a monitoring device coupled to the compartment and configured to monitor at least one quality control paramet... | 04/14/2009 |
| 7469192 | Parallel profile determination for an optical metrology system A system to process requests for wafer structure profile determination from optical metrology measurements off a plurality of structures formed on one or more wafer includes a diffraction signal processor, a diffraction signal distributor, and a plurality of profile... | 12/23/2008 |
| 7467054 | System and method for integrating the internal and external quality control programs of a laboratory A system and method that enables a laboratory to integrate its internal and external quality control programs to thereby control the quality of its laboratory testing services. The system comprises a storage device and a processor operable to maintain in the storage... | 12/16/2008 |
| 7421358 | Method and system for measurement data evaluation in semiconductor processing by correlation-based data filtering By performing a contingency-based correlation test of measurement data, such as defect data, with respect to electrical test data after progressively filtering the measurement data, an enhanced analysis of process flow characteristics may be accomplished. Consequent... | 09/02/2008 |
| 7409306 | System and method for estimating reliability of components for testing and quality optimization A system and method for determining the early life reliability of an electronic component, including classifying the electronic component based on an initial determination of a number of fatal defects, and estimating a probability of latent defects present in the el... | 08/05/2008 |
| 7401004 | System for reviewing defects, a computer implemented method for reviewing defects, and a method for fabricating electronic devices A system for reviewing defects includes an analysis module configured to analyze defect information of a plurality of intermediate products, the defect information including information of an amount of defects classified by sizes of the defects existing in each of t... | 07/15/2008 |
| 7386420 | Data analysis method for integrated circuit process and semiconductor process A data analysis method for an integrated circuit process is described, for analyzing the results of at least an in-line quality test, a product test and a yield test done to the products of the IC process. The products are divided into a normal group and an abnormal... | 06/10/2008 |
| 7379847 | High bandwidth image transfer The above and other needs are met by an inspection system having a sensor array that is connected to a high speed network connection, and is adapted to provide image data in regard to images of a substrate. A process node is also connected to the high speed network ... | 05/27/2008 |
| 7366580 | Production line control using shift registers for contact lens manufacture A method for controlling a production line for the manufacture and/or packaging of contact lenses which production line simultaneous by processes at least two lots, the method comprising dividing at least a portion of the production line into a series of cells throu... | 04/29/2008 |
| 7366620 | Evaluation method of fine pattern feature, its equipment, and method of semiconductor device fabrication Equipment extracts components of spatial frequency that need to be evaluated in manufacturing a device or in analyzing a material or process out of edge roughness on fine line patterns and displays them as indexes. The equipment acquires data of edge roughness over ... | 04/29/2008 |
| 7363098 | Method to identify machines causing excursion in semiconductor manufacturing The present invention discloses a method that recognizes and uses the grouping patterns of process material by different machines at different process steps to identify potential problem machines causing the excursion in semiconductor manufacturing. The excursion co... | 04/22/2008 |
| 7358748 | Methods and systems for determining a property of an insulating film A method for determining a property of an insulating film is provided. The method may include obtaining a charge density measurement of the film, a surface voltage potential of the film relative to a bulk voltage potential of the substrate, and a rate of voltage dec... | 04/15/2008 |
| 7359830 | Method for automatic on-line calibration of a process model A method is disclosed for collecting and processing raw process data. The method includes processing the raw data through a process model to obtain a prediction of the process quality; processing this prediction through two dynamic transfer functions thus creating t... | 04/15/2008 |
| 7359813 | Outlier screening technique Multiple parameters of manufactured units are continually measured until some of the units fail, where failure can be accelerated by adjusting operating conditions. Pre-failure data is then examined to find outliers or aberrant parameter values that may have contrib... | 04/15/2008 |
| 7353609 | Hole location method and apparatus The invention discloses differing embodiments of methods for checking the location or potential location of one or holes in structure relative to edges, fillets, and thickness changes. The area in the vicinity of the hole may be checked in order to determine whether... | 04/08/2008 |
| 7356377 | System, method, and medium for monitoring performance of an advanced process control system A method for monitoring performance of an advanced process control system for at least one process output includes calculating a variance of a prediction error for a processing performance and/or a probability for violating specification limits of the processing per... | 04/08/2008 |
| 7348559 | Defect inspection and charged particle beam apparatus In a defect inspection apparatus which combines a plurality of probes for measuring electric properties of a specimen including a fine circuit line pattern with a charged particle beam apparatus, the charged particle beam apparatus reduces a degradation in resolutio... | 03/25/2008 |
| 7349116 | Design-to-ship enabled shipping device in a commercial printing environment and managing workflow for use with same A design-to-ship enabled shipping device in a commercial printing environment and method for managing workflow for use with the same. The present invention provides a method, program product and system for managing workflow in a commercial printing environment inclu... | 03/25/2008 |
| 7346411 | Automatic control and monitoring system for splice overlapping tolerance in textile ply The present system enables the monitoring and automatic control of the tolerance in splice overlap of textile play , though the identification of the overlap area, identification and counting of textile cords in the overlap area, and the generation of a control sign... | 03/18/2008 |
| 7343215 | Methothology for estimating statistical distribution characteristics of product parameters Disclosed is method for estimating statistical distribution characteristics of product parameters. The method comprises determining n number of product parameters, which characterize a product, and m number of characteristic parameters dependent on the product param... | 03/11/2008 |
| 7343352 | Method and system for assessing the quality and cost of inspection A method, system, and software for assessing the cost tradeoffs associated with performing inspection includes determining measurement variations and product characteristic variations to define an inspection plane. The inspection plane is divided into a plurality of... | 03/11/2008 |
| 7340359 | Augmenting semiconductor's devices quality and reliability A method for augmenting quality or reliability of semiconductor units, including providing few populations of semiconductor units that are subject to quality or reliability testing. The populations include few quality or reliability fail candidate populations and ot... | 03/04/2008 |
| 7337124 | Method and system for a quality software management process A quality management framework system and method for operating a quality plan in a product development organization having quality objectives. The system includes a plurality of computer implemented tools accessible by users for operating a plurality of quality proc... | 02/26/2008 |
| 7332940 | Voltage hold circuit and clock synchronization circuit A voltage hold circuit which holds an input signal voltage includes a voltage comparator unit configured to output a result of comparison between a voltage of an externally inputted control signal and a voltage of an outputted analog hold signal, a digital value hol... | 02/19/2008 |
| 7332718 | Method for finding disconnection of conductive wires formed on plate glass and apparatus therefor The invention relates to a method for finding disconnection of a conductive wire formed on a plate glass. This method includes the steps of (a) applying a voltage to the conductive wire; and (b) imaging thermal radiation from a surface of the conductive wire by an i... | 02/19/2008 |
| 7333907 | System and methods for characterization of chemical arrays for quality control Systems, methods and computer readable media for characterizing a chemical array. At least one metric indicative of accuracy of location of features on the chemical array by a feature extraction process used to extract signals from features of the chemical array may... | 02/19/2008 |
| 7332361 | Xerographic micro-assembler Xerographic micro-assembler systems and methods are disclosed. The systems and methods involve manipulating charge-encoded micro-objects. The charge encoding identifies each micro-object and specifies its orientation for sorting. The micro-objects are sorted in a so... | 02/19/2008 |
| 7332359 | Semiconductor device inspection method Techniques for inspecting semiconductor devices. An inspection condition using chip matrix data and chip size data is set. The intricate circuit patterns of at least one semiconductor device is inspected with the inspection condition. In an embodiment of the present... | 02/19/2008 |
| 7328078 | Services portal An apparatus for monitoring performance of an industrial process includes a service portal for collecting, transmitting and analyzing parameter data from process field devices that includes a network connection that connects to a process control system of the indust... | 02/05/2008 |
| 7324924 | Curve fitting for signal estimation, prediction, and parametrization A method and system of automatically curve fit data series to generate data signal characterization and prediction is disclosed. The method includes receiving input data including a plurality of data series and set of input parameters. The method also includes prepr... | 01/29/2008 |
| 7324862 | Quality control apparatus and control method of the same, and recording medium recorded with quality control program Various items of data collected at different process steps are associated on production sites where traceability is hard to conduct. A quality control apparatus controls a manufacturing process in order to manufacture products of predetermined quality, including a d... | 01/29/2008 |
