Celebrity Inventors
Mark Twain (Samuel L. Clemens) received Patent No. 121,992 for "An Improvement in Adjustable and Detachable Straps for Garments." He later received two more patents: one for a self-pasting scrapbook and one for a game to help players remember important historical dates.
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| Number | Title | Issue Date |
| 8180587 | System for brokering fault detection data A method of brokering information in a manufacturing system which includes a broker coupled between a supplier of information and a consumer of information. The manufacturing system receives information from the supplier in a first format and sends information from ... | 05/15/2012 |
| 8165837 | Multi-scale classification of defects A computerized method for categorizing defects on a substrate. A list of defects on the substrate is received as input to a processor, where each defect is represented by a defect location and an associated micro-defect code. The input is analyzed with the processor... | 04/24/2012 |
| 8126669 | Optimization and matching of optical systems by use of orientation Zernike polynomials The present disclosure relates to specification, optimization and matching of optical systems by use of orientation Zernike polynomials. In some embodiments, a method for assessing the suitability of an optical system of a microlithographic projection exposure appar... | 02/28/2012 |
| 8078420 | Raman spectrometry authentication A method and apparatus for authenticating items having a security mark containing a DNA fragment to prevent fraud uses a Raman spectrometer to generate a response spectrum from monochrome incident beam on the security mark on an item. Gross fluorescence is removed f... | 12/13/2011 |
| 7979225 | Method and system of testing device sensitivity Method and system that test device sensitivity according to whether the device passes or fails when subjected to a test signal. The device may be repeatedly subjected to test signal at varying operating parameters in order to assess pass-fail threshold at which the ... | 07/12/2011 |
| 7962302 | Predicting wafer failure using learned probability Techniques for estimating a quality of one or more wafers are presented. One or more first wafers comprising one or more first dies are tested. A probability of wafer failure is determined in accordance with one or more first test measurements of the one or more fir... | 06/14/2011 |
| 7895008 | Method of performing measurement sampling of lots in a manufacturing process A method of performing measurement sampling in a production process includes passing a lot through a manufacturing process, employing a set of combinational logistics to determine if sampling is indicated and, if sampling is indicated, establishing a sampling decisi... | 02/22/2011 |
| 7869966 | Inspection method and its apparatus, inspection system The present invention relates to a tool for analyzing by priority a defect having a high possibility of causing an electrical failure when inspecting a particle and a pattern defect in a piece of work which constitutes an electronic device such as a semiconductor in... | 01/11/2011 |
| 7822566 | Method, device and program for setting a reference value for substrate inspection Where substrates with components are produced through a series of production processes and inspected after each of these production processes, a method is provided for setting an optimum reference value for making judgments in these inspections such that the frequen... | 10/26/2010 |
| 7792651 | Methods and systems for computing gear modifications A method of computing gear modifications from a gear inspection chart is provided. The method includes extracting a gear profile from the gear inspection chart. The method also includes quantifying the gear profile. The method also includes determining a gear modifi... | 09/07/2010 |
| 7761250 | Optical metrology system optimized with design goals Provided is a method of designing an optical metrology system for measuring structures on a workpiece where the optical metrology system is configured to meet two or more design goals. The design of the optical metrology system is optimized by using collected design... | 07/20/2010 |
| 7751998 | Semiconductor device, method for measuring characteristics of element to be measured, and characteristic management system of semiconductor device A plurality of series circuits each consisting of a current-carrying element and an element to be measured are provided between a power supply potential VDD and a ground potential VSS. The current-carrying elements are supplied with a test signal commonly, and corre... | 07/06/2010 |
| 7742889 | Designing an optical metrology system optimized with signal criteria Provided is a method of designing an optical metrology system for measuring structures on a workpiece wherein the optical metrology system is configured to meet one or more signal criteria. The design of the optical metrology system is optimized by using collected s... | 06/22/2010 |
| 7734437 | Apparatus for designing an optical metrology system optimized with signal criteria Provided is an apparatus for designing an optical metrology system for measuring structures on a workpiece wherein the optical metrology system is configured to meet one or more signal criteria. The design of the optical metrology system is optimized by using collec... | 06/08/2010 |
| 7729873 | Determining profile parameters of a structure using approximation and fine diffraction models in optical metrology Provided is a method for determining one or more profile parameters of a structure using an optical metrology model, the optical metrology model comprising a profile model, an approximation diffraction model, and a fine diffraction model. A simulated approximation d... | 06/01/2010 |
| 7664614 | Method of inspecting photomask defect A method of inspecting defect of a mask is provided. In this method, a database for storing a plurality of virtual simulation models is created. The virtual simulation models are determined by a plurality of factors including an optical effect and a chemical effect ... | 02/16/2010 |
| 7664613 | System and method of data harvesting Data harvesting can be carried out relative to performance or reliability information associated with one or more groups of electrical units. Ambient condition detectors associated with a variety of industrial or commercial installations and subject to a variety of ... | 02/16/2010 |
| 7660686 | Ion implant metrology system with fault detection and identification Samples subject to ion implantation are measured using a modulated optical reflectance system and the results of the measurements are compared to specification ranges for acceptable samples and a plurality of parametric ranges. Each parametric range is associated wi... | 02/09/2010 |
| 7653502 | Data logger with pass/fail analysis A data logger analyzes temperature data associated with a product passing through a conveyor oven and provides a visual indication indicating whether the product's temperature profile is within acceptable limits. Thus, an operator need not download captured temperat... | 01/26/2010 |
| 7647193 | Authentication of pharmaceuticals using molecular computational identification A method, apparatus and computer program product for authenticating a pharmaceutical product is provided. The method includes receiving an identifier and a quantity for the pharmaceutical product and receiving a photonic signal from the pharmaceutical product, where... | 01/12/2010 |
| 7627444 | Methods, systems, and computer-readable media for facility integrity testing Methods, systems, and computer-readable media provide for facility integrity testing. According to embodiments, a method for populating a watch list with circuits of a communications network to be monitored for repeat failures is provided. According to the method, a... | 12/01/2009 |
| 7552019 | Systems and methods of converting RFID labels Various method embodiments comprise testing a plurality of RFID tags forming at least a portion of a first web to identify defective RFID tags and verified RFID tags, cutting the first web between a rotary die and an anvil to remove at least the verified RFID tags f... | 06/23/2009 |
| 7436169 | Mechanical stress characterization in semiconductor device Methods of characterizing a mechanical stress level in a stressed layer of a transistor and a mechanical stress characterizing test structure are disclosed. In one embodiment, the test structure includes a first test transistor including a first stress level; and at... | 10/14/2008 |
| 7421885 | Method for characterizing porous low dielectric constant films A method and apparatus for determining pore size distribution and/or the presence of at least one killer pore in at least a portion of a porous film deposited upon a substrate are disclosed herein. In one embodiment, there is provided a method for determining pore s... | 09/09/2008 |
| 7421355 | Measuring apparatus, measuring method, testing apparatus, testing method, and electronic device There is provided a measuring apparatus for measuring a signal-under-test, having a comparator for sequentially comparing voltage values of the signal-under-test with a threshold voltage value fed thereto at timing of strobe signals sequentially fed thereto, a strob... | 09/02/2008 |
| 7421358 | Method and system for measurement data evaluation in semiconductor processing by correlation-based data filtering By performing a contingency-based correlation test of measurement data, such as defect data, with respect to electrical test data after progressively filtering the measurement data, an enhanced analysis of process flow characteristics may be accomplished. Consequent... | 09/02/2008 |
| 7409306 | System and method for estimating reliability of components for testing and quality optimization A system and method for determining the early life reliability of an electronic component, including classifying the electronic component based on an initial determination of a number of fatal defects, and estimating a probability of latent defects present in the el... | 08/05/2008 |
| 7409309 | Method of deciding the quality of the measurement value by the edge width A method of deciding the quality of a measurement value of the line width, the line interval or the like of a pattern on an object to-be-measured, including acquiring the signal intensity distribution of the pattern on the object to-be-measured, detecting the edge p... | 08/05/2008 |
| 7401004 | System for reviewing defects, a computer implemented method for reviewing defects, and a method for fabricating electronic devices A system for reviewing defects includes an analysis module configured to analyze defect information of a plurality of intermediate products, the defect information including information of an amount of defects classified by sizes of the defects existing in each of t... | 07/15/2008 |
| 7398171 | Automated quality control method and system for genetic analysis Aspects of the present invention describe a method and apparatus for automating quality control for gene expression data. A computer based device receives gene expression data associated with a spectral species and genetic sample in each well of a plate. Gene expres... | 07/08/2008 |
| 7398169 | Measuring apparatus, measuring method, testing apparatus, testing method, and electronics device There is provided a measuring apparatus for measuring a signal-under-test, having a comparator for sequentially comparing voltage values of the signal-under-test with a reference voltage value fed thereto at timing of strobe signals sequentially fed thereto, a strob... | 07/08/2008 |
| 7358847 | IC tag An integrated circuit tag includes an item information storage unit that stores item information related to the item, an item information controller that provides control to change the item information, and an item information display unit that displays the item inf... | 04/15/2008 |
| 7346411 | Automatic control and monitoring system for splice overlapping tolerance in textile ply The present system enables the monitoring and automatic control of the tolerance in splice overlap of textile play , though the identification of the overlap area, identification and counting of textile cords in the overlap area, and the generation of a control sign... | 03/18/2008 |
| 7346465 | Method of testing the objects in a set to obtain an increased level of quality A method performs quality control testing on the objects in a set of objects to obtain a level of quality. The method identifies a number of objects that satisfy the static testing limits, determines statistical measures from the number of objects, determines a dyna... | 03/18/2008 |
| 7340359 | Augmenting semiconductor's devices quality and reliability A method for augmenting quality or reliability of semiconductor units, including providing few populations of semiconductor units that are subject to quality or reliability testing. The populations include few quality or reliability fail candidate populations and ot... | 03/04/2008 |
| 7337091 | Method and apparatus for coordinating fault detection settings and process control changes A system includes a process tool for processing a workpiece, a process controller, and a fault monitor. The process controller is configured to determine a control action for updating an operating recipe of the process tool. The fault monitor is configured to determ... | 02/26/2008 |
| 7337033 | Data mining to detect performance quality of tools used repetitively in manufacturing A tool with one or more chambers in a manufacturing system is identified as performing at or below an acceptable level by the following steps. Store process data from tools for each one of a plurality of individual processes for a processed object in a process datab... | 02/26/2008 |
| 7337375 | Diagnostics of cable and link performance for a high-speed communication system A method and system for performing diagnostic tests on a real-time system controlled by a state machine. A sequence of states recorded as the state machine operates is used to determine error conditions. The sequence of states is compared to expected sequences of st... | 02/26/2008 |
| 7334212 | Method for interlayer and yield based optical proximity correction An optical proximity correction method is provided using a modified merit function based upon yield. Known failure mechanisms related to layout geometries are used to derive yield functions based upon distance values between layout features, such as, edge features. ... | 02/19/2008 |
| 7333876 | Systems and methods for providing electronic quality control in a process for applying a polyurethane to a substrate The present invention comprises systems and methods for providing electronic quality control in a process for applying a polyurethane to a substrate. One aspect of the present invention includes a computer-implemented method for providing electronic quality control ... | 02/19/2008 |
