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| Number | Title | Issue Date |
| 6944556 | Circuits and methods for current measurements referred to a precision impedance Circuitry and methods for obtaining accurate measurements of current supplied by an integrated circuit are provided. Current calculations are performed using information from a precision termination resistor and from the ratio relationship of two on-chip resistors. ... | 09/13/2005 |
| 6941365 | Computer resource allocation layout description The invention discloses a method for maximizing overall system performance among a set of computer systems which periodically run a set of jobs. It is known that some allocations of jobs to computer systems are worse than others where “worse” may mean slower or ... | 09/06/2005 |
| 6937965 | Statistical guardband methodology A method for creating a guardband that incorporates statistical models for test environment, system environment, tester-to-system offset and reliability into a model and then processes a final guardband by factoring manufacturing process variation and quality agains... | 08/30/2005 |
| 6934028 | Certification and verification management system and method for a web inspection apparatus A certification system and method for inspecting of a roll of web material through a web inspection system which includes the inspection of the roll of web material to determine the number, type and location of one or more detectable flaws along the web material. Th... | 08/23/2005 |
| 6931356 | System for dynamically adjusting performance measurements according to provided service level Methods, systems and programs in an information processing system comprising one or a plurality of devices managed by a manager device, for decreasing the cost of monitoring measurements, while using conventional techniques for managing problems. The cost saving is ... | 08/16/2005 |
| 6931337 | Lithography tool image quality evaluating and correcting Electron beam lithography tool image quality evaluating and correcting including a test pattern with a repeated test pattern cell, an evaluation method and correction program product are disclosed. The test pattern cell includes a set of at least three elongated spa... | 08/16/2005 |
| 6931350 | Regression-clustering for complex real-world data A method and system for determining regression functions from a computer data input using K-Harmonic Means (KHM) regression clustering (RC) and comprising the steps of: (1) selecting K regression functions ƒ1, . . . , ƒK; (2) associating an i... | 08/16/2005 |
| 6928395 | Method and system for dynamic learning through a regression-based library generation process The present invention relates to a method and system for efficiently determining grating profiles using dynamic learning in a library generation process. The present invention also relates to a method and system for searching and matching trial grating profiles to d... | 08/09/2005 |
| 6928394 | Method for dynamically adjusting performance measurements according to provided service level Methods, systems and programs in an information processing system comprising one or a plurality of devices managed by a manager device, for decreasing the cost of monitoring measurements, while using conventional techniques for managing problems. The cost saving is ... | 08/09/2005 |
| 6928375 | Inspection condition setting program, inspection device and inspection system A program is provided for setting efficiently, and with precision, the inspection conditions of an inspection device that detects particles and deformed patterns in or on products such as semiconductor integrated circuits that are manufactured by simultaneously form... | 08/09/2005 |
| 6922600 | System and method for optimizing manufacturing processes using real time partitioned process capability analysis A system and method for optimizing a manufacturing process. The system comprises: a database of operational data gathered from previously performed manufacturing processes; a filtering system for filtering the database into a plurality of data subsets; a calculation... | 07/26/2005 |
| 6919956 | Method of automatically repairing cracks and apparatus for use in such method A method and apparatus automatically repairs cracks produced in a member to be repaired. A wide field image is obtained by photographing the whole surface of a blade 31 or the like in a wide field view by a remote camera 11 and the position of cracks o... | 07/19/2005 |
| 6918101 | Apparatus and methods for determining critical area of semiconductor design data Disclosed are mechanisms for efficiently and accurately calculating critical area. In general terms, a method for determining a critical area for a semiconductor design layout is disclosed. The critical area is utilizable to predict yield of a semiconductor device f... | 07/12/2005 |
| 6917433 | Methods and systems for determining a property of a specimen prior to, during, or subsequent to an etch process Methods and systems for monitoring semiconductor fabrication processes are provided. A system may include a stage configured to support a specimen and coupled to a measurement device. The measurement device may include an illumination system and a detection system. ... | 07/12/2005 |
| 6914239 | System for analyzing mass spectrometric data A system for analyzing mass spectrometric data is provided, which has an data input means for entering mass spectrometric data of a parent ion and dissociated ions resulting from multiple dissociation of the parent ion, and an analytical means for providing characte... | 07/05/2005 |
| 6915177 | Comprehensive integrated lithographic process control system based on product design and yield feedback system The present invention provides systems and methods that facilitate performing fabrication process. Critical parameters are valued collectively as a quality matrix, which weights respective parameters according to their importance to one or more design goals. The cri... | 07/05/2005 |
| 6912436 | Prioritizing an application of correction in a multi-input control system A method and an apparatus for selectively applying correction to a process control. Manufacturing data relating to the processing of a workpiece is acquired. The manufacturing data includes metrology data relating to the processed workpiece. An adjustment for at lea... | 06/28/2005 |
| 6912435 | Methods and systems for controlling reticle-induced errors Systems and methods for controlling at least one reticle-induced error in a process system, the systems and methods including adjusting measurement data associated with the process system, where the adjustment can be based on at least one reticle identifier (ID) ass... | 06/28/2005 |
| 6909931 | Method and system for estimating microelectronic fabrication product yield Within a method for estimating a microelectronic fabrication product yield and a system for estimating the microelectronic fabrication product yield there is employed a specific mathematic algorithm for estimating yield of a new microelectronic fabrication product w... | 06/21/2005 |
| 6907352 | Mass spectrometric data analyzing method, mass spectrometric data analyzing apparatus, mass spectrometric data analyzing program, and solution offering system A main object is to cope with an unknown structure substance thereby to identify the structure of a parent ion highly precisely and to derive a supposed structure. A method for analyzing mass spectrometric data is disclosed, which: acquires mass spectrometric data o... | 06/14/2005 |
| 6907369 | Method and apparatus for modifying design constraints based on observed performance A method for modifying design constraints based on observed performance includes measuring a characteristic of a plurality of devices manufactured in a process flow. A design constraint associated with the characteristic is defined. A performance metric relating the... | 06/14/2005 |
| 6901347 | Availability, reliability or maintainability index including outage characterization Improved reliability, availability and/or maintainability metrics have been developed that account for customer perceived factors such as frequency of outage, duration of outages, business impact of outages, etc. In various realizations and exploitations, such impro... | 05/31/2005 |
| 6898539 | Method for analyzing final test parameters A method for analyzing final test parameters includes the following steps: To retrieve the final test parameters of each product lots by searching a database. To compare the final test parameters to select a representative final test parameter and a representative f... | 05/24/2005 |
| 6895350 | Fraction defective estimating method, system for carrying out the same recording medium A method and a system for estimating an assembling-related fraction defective coefficient of an article in the stage preceding to manufacturing, e.g. at a stage of design. Assembling operation, properties/conditions of parts to be assembled and conditions of an asse... | 05/17/2005 |
| 6892154 | Method and apparatus for developing multiple test cases from a base test case A system and method for generating a test case for testing a device to be connected to a computer is disclosed. A base test object is provided. The base test object defines test properties for a device. The base test object includes a transaction generator that gene... | 05/10/2005 |
| 6889149 | System and method for fingerprinting of semiconductor processing tools A system and method is used for measuring the performance of semiconductor processing tools. A software component may be used to define a set of performance variables and associate performance limits. From the set of performance variables, a set of variables may be ... | 05/03/2005 |
| 6885955 | Semiconductor process yield analysis based on evaluation of parametric relationship Semiconductor process yield analysis in which the relationship between a wafer-level parameter and a die-level parameter is evaluated can be performed more quickly and with greater accuracy than has been the case with previous such yield analysis. The yield analysis... | 04/26/2005 |
| 6876934 | Method for determining fault coverage from RTL description A method for evaluating the upper bound fault coverage of an integrated circuit (IC) or a portion thereof from register transfer level (RTL) description is provided. The method requires the analysis of a circuit described in RTL consisting of primary input and outpu... | 04/05/2005 |
| 6870388 | System and method for generating a SHMOO plot by varying the resolution thereof A scheme for testing an electrical device to determine a range of combinations of values of N parametric variables, i.e., a SHMOO plot, for which the device functions properly. In one embodiment, the method comprises defining an N-dimensional plot region comprising ... | 03/22/2005 |
| 6868352 | Organic semiconductor product state monitor An organic semiconductor product state monitor attached to a product receives a product usefulness input, which, along with the product predetermined usefulness limit, is used to determine an indicator command to indicate a state of usefulness of the product. An org... | 03/15/2005 |
| 6859748 | Test structure for measuring effect of trench isolation on oxide in a memory device An apparatus for measuring effects of isolation processes (280) on an oxide layer (286) in a memory device (255) is described. In one embodiment, the apparatus comprises a structure (110) comprised of an array (110c) of memo... | 02/22/2005 |
| 6859745 | Interactive information package A product package embodying the principles of the present invention includes an integrated circuit device which is configured for radio frequency interfacing with associated equipment. The package is configured such that the integrated circuit device is disposed wit... | 02/22/2005 |
| 6859746 | Methods of using adaptive sampling techniques based upon categorization of process variations, and system for performing same Methods of using adaptive sampling techniques based upon categorization of process variations, and a system for performing same are disclosed. In one illustrative embodiment, the method comprises acquiring metrology data regarding at least one process operation perf... | 02/22/2005 |
| 6859756 | Diagnostic method for manufacturing processes A method for use in a system for diagnosing the causes of manufacturing defects involves process characterization. A set of forms is identified for a workpiece and for a piece of manufacturing equipment that acts upon the workpiece. The forms for the workpiece are p... | 02/22/2005 |
| 6856928 | Method for automated exception-based quality control compliance for point-of-care devices A computer-implemented method to process POC information for potential QC compliance issues. A system and method for implementation of traditional laboratory analyzer based QC compliance in point-of-care (POC) environments is disclosed. A specific system and method ... | 02/15/2005 |
| 6850854 | Semiconductor production system A semiconductor production system has a semiconductor manufacturing apparatus having an exposure unit, a control unit for controlling the exposure unit and a storage device; a semiconductor inspection apparatus having an observation unit, a control unit for controll... | 02/01/2005 |
| 6847906 | Inspection system for and method of confirming soundness of transported object There are disclosed an inspection system for and a method of confirming the soundness of a transported object while the object is being transported and handled. Waveform sampling sensors are mounted on the transported object and a transportation container, and a GPS... | 01/25/2005 |
| 6845345 | System for monitoring and analyzing diagnostic data of spin tracks A system for analyzing diagnostic information associated with a spin track is provided. The system includes one or more analysis systems that collect diagnostic information from one or more spin tracks. The system further includes one or more maintenance systems tha... | 01/18/2005 |
| 6841403 | Method for manufacturing semiconductor devices and method and its apparatus for processing detected defect data Disclosed herein is a method for manufacturing semiconductor device and a method and apparatus for processing detected defect data, making it possible to quickly infer or determine a process and related manufacturing equipment that causes defects in a fabrication li... | 01/11/2005 |
| 6834259 | Guard tour system The guard tour system of the present invention is comprised of a central computer which runs a computer program that enables a variety of electronic hardware components to function as the guard tour system. As a guard progresses through a guard tour, he or she uses ... | 12/21/2004 |
