Celebrity Inventors
Mark Twain (Samuel L. Clemens) received Patent No. 121,992 for "An Improvement in Adjustable and Detachable Straps for Garments." He later received two more patents: one for a self-pasting scrapbook and one for a game to help players remember important historical dates.
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| Number | Title | Issue Date |
| RE43405 | Method of displaying measurement result in inspection process and system thereof, and computer program A method of displaying a measurement result in an inspection process using network, the method includes a first step that a host, which intensively controls and manages a device for inspecting a lot to be processed in one or a plurality of steps, transmits to the de... | 05/22/2012 |
| 8150645 | Automatic analzyer Measurement of the uncertainty used for quality control typically involves a plurality of factors. When the uncertainty exceeds a clinical permissible value, time is required for a medical technologist to investigate and to determine the factor causing the uncertain... | 04/03/2012 |
| 8131492 | Method of evaluating a film A method of directly measuring hydrogen permeability of a film is provided. The method of evaluating a film includes acquiring, with respect to a specimen including a plurality of films stacked on each other, ion dose-dependence data of intensity of γ-beam generate... | 03/06/2012 |
| 8108168 | Managing non-destructive evaluation data A method, apparatus and program product manage non-destructive evaluation (“NDE”) data. NDE data and inspection information for at least a portion of an asset are received and at least one alignment algorithm to align the NDE data to a simulated model of the at ... | 01/31/2012 |
| 8041525 | Substrate measuring method, computer-readable recording medium recording program thereon, and substrate measuring system In the present invention, for measurement of line widths, for example, at 36 locations within a substrate processed in a coating and developing treatment system, the 36 measurement points are divided and, for example, six substrates are used to measure the line widt... | 10/18/2011 |
| 8005634 | Copper wiring module control Techniques for controlling an output property during wafer processing include forwarding feedforward and feedback information between functional units in a wafer manufacturing facility. At least some embodiments of the invention envision implementing such techniques... | 08/23/2011 |
| 7974801 | Method and system for a two-step prediction of a quality distribution of semiconductor devices By performing a two-step approach for predicting a quality distribution during the fabrication of semiconductor devices, enhanced flexibility and efficiency may be accomplished. The two-step approach first models electrical characteristics on the basis of measuremen... | 07/05/2011 |
| 7953567 | Defect inspection apparatus and defect inspection method A defect inspection apparatus includes: stages each mounting an inspecting object on which a circuit pattern having a group of parallel lines is formed, and each running perpendicular or parallel to the group of lines; an illumination optical system which illuminati... | 05/31/2011 |
| 7945409 | Method for verifying position on an angioplasty balloon A monitoring system and data archive system for a stent crimping process. The information concerning the crimped stent is used in deciding whether the stent is acceptable for insertion into the body cavity of a human or animal. ... | 05/17/2011 |
| 7945410 | Semiconductor device yield prediction system and method An average fault ratio is calculated from product characteristics of a product as a target of yield prediction, in order to predict yield accurately in the course of manufacturing the prediction target product. With respect to a reference product, whose wirin... | 05/17/2011 |
| 7937233 | Preferential defect marking on a web A system for preferentially marking defects on a web is described. The system includes a web of material to be converted into individual sheets of a plurality of different grade levels, a database storing anomaly data of anomalies on the web, wherein an anomaly is a... | 05/03/2011 |
| 7937234 | Classification of spatial patterns on wafer maps Classification of spatial patterns on wafer maps is generally described. In one example, a method includes applying K-means type clustering to wafer maps comprising one or more spatial patterns to group one or more clusters comprising wafer maps having similar spati... | 05/03/2011 |
| 7930122 | Evaluating anomaly for one-class classifiers in machine condition monitoring A method for monitoring machine conditions provides additional information using a one-class classifier in which an evaluation function is learned. In the method, a distance is determined from an anomaly measurement x to a boundary of a region R1 containi... | 04/19/2011 |
| 7925460 | System and method for improving print shop operability A computer implemented system for segmenting data collected from a document production environment is provided. The system includes determining, with a computer implemented data processing platform, that a set of document production related data should be represente... | 04/12/2011 |
| 7920980 | System and method for dynamically providing feedback A method for dynamically providing feedback is presented. The method includes monitoring one or more steps performed by one or more components in a machine, where the one or more steps are associated with a workflow. Further, the method includes analyzing the one or... | 04/05/2011 |
| 7899634 | Method and apparatus for analysis of continuous data using binary parsing A method, apparatus, and a system for generating a binary mapping of wafer regions using measured value. A first measured value relating to processing a first workpiece is acquired. A second measured value relating to a second workpiece is acquired. At least a first... | 03/01/2011 |
| 7881891 | Automated dynamic metrology sampling system and method for process control A system and method for optimizing and implementing a metrology sampling plan. A system is provided that includes a system for collecting historical metrology data from a metrology tool; and a reduction analysis system that compares an initial capability calculated ... | 02/01/2011 |
| 7853421 | Systematic surface review A method and system of comparing a part to a computer model of the part obtains coordinate data for a plurality of points on a part, compares the coordinate data to a computer model of the part to obtain comparison data, reports the comparison data corresponding to ... | 12/14/2010 |
| 7801692 | Apparatus for fastener inspection and sorting The present invention pertains to an apparatus for fastener inspection and sorting mainly including an auxiliary device disposed beside the turntable and attached to an inspecting machine. The device has a support base located adjacent to the turntable and a driving... | 09/21/2010 |
| 7797117 | Method and system for early prediction of performance of HID lamps A method and system of classifying predicted performance of HID lamps or light sources. A characteristic of each lamp or light source is measured after a relatively short time of operation of the lamp or light source. The measurement is placed into one of a pluralit... | 09/14/2010 |
| 7778786 | Method for estimating surface moisture content of wood chips A method for estimating surface moisture content of wood chips for use in a pulp and paper production process comprises measuring chip surface moisture using an infrared surface moisture sensor, and adjusting a calibration of the surface moisture measured with a mod... | 08/17/2010 |
| 7765076 | Allocating processing units to processing clusters to generate simulated diffraction signals In allocating processing units, first and second requests for jobs are obtained. First and second numbers of processing units requested are determined. First and second numbers of available processing units are determined. When the first number of available processi... | 07/27/2010 |
| 7747404 | Method for the analysis, control, automation and information management of life-cycle processes of technical products A method for the analysis, control, automation, and information management of life-cycle processes of technical products includes an engineering process, an analysis process, a test process, and accesses an information system. The engineering process, the analysis p... | 06/29/2010 |
| 7742888 | Allocating processing units to generate simulated diffraction signals used in optical metrology In allocating processing units of a computer system to generate simulated diffraction signals used in optical metrology, a request for a job to generate simulated diffraction signals using multiple processing units is obtained. A number of processing units requested... | 06/22/2010 |
| 7739064 | Inline clustered defect reduction A method of reducing an inspection time required for inspecting a wafer with an automated inspection system. A target time is determined, to which the inspection time is to be reduced. A maximum number of analyses that the automated inspection system can perform dur... | 06/15/2010 |
| 7734436 | Comparative analysis of a sample relative to a database The comparative analysis of a sample, derived from a product, with respect to a database comprises the step of determining the class membership of the different characteristics (variables) describing the samples: whether they are characteristics common to the sample... | 06/08/2010 |
| 7725278 | Method for failure analysis and system for failure analysis After completion of an arbitrary device process, an apparatus for micro-sample extraction extracts a part of a wafer as a micro-sample of a size equal to or larger than a repetition pattern with a probe and places the extracted micro-sample to a micro-sample storage... | 05/25/2010 |
| 7720624 | Information processing method, information processing apparatus and program An information processing method, an information processing apparatus and a program can prevent errors from arising when associating point group data obtained by actually measuring an item such as a metal part and design data defining the item. The characteristic va... | 05/18/2010 |
| 7715997 | Intelligent inspection based on test chip probe failure maps A method and system for semiconductor wafer inspection is disclosed. Each of a plurality of dies on a wafer may be probed with a probe tool to produce probe data. The probe data may be used to generate one or more non-repeating care areas. An inspection tool may use... | 05/11/2010 |
| 7706994 | System and method for rating the nutritional quality of food items The present application provides improved systems and methods for rating the nutritional quality of food. The method includes (a) determining the water free weight percentage of one or more macronutrients in the food item; (b) assigning a numerical influence factor ... | 04/27/2010 |
| 7689375 | Position detecting system and method for electronic device A position detecting system and method for an electronic device used an audio signal input module of the electronic device and a signal receiver to connect to the audio signal input module convert an external position signal into an audio signal. A position detectin... | 03/30/2010 |
| 7672799 | Defect inspection apparatus and defect inspection method A defect inspection apparatus includes: stages each mounting an inspecting object on which a circuit pattern having a group of parallel lines is formed, and each running perpendicular or parallel to the group of lines; an illumination optical system which illuminati... | 03/02/2010 |
| 7650250 | Methods for testing ophthalmic lenses What has been developed is a method for testing ophthalmic plastic lenses and ophthalmic plastic lens-making processes for compliance with federal safety performance requirements. The method of the invention provides an easier, less costly, and more effective means ... | 01/19/2010 |
| 7650251 | System and method for rule-based data mining and problem detection for semiconductor fabrication A fabrication history a group of wafers is provided, having a record for each wafer of the manufacturing events that did or did not occur in its fabrication, and having the measured value of a given target. A binary decision rule is formed based on the fabrication h... | 01/19/2010 |
| 7640125 | Method for controlling the quality of industrial processes and system therefrom A method for controlling the quality of industrial processes, of the type comprising the steps of: making available one or more reference signals relating to the industrial process acquiring one or more real signals, indicative of the quality of said industrial proc... | 12/29/2009 |
| 7630847 | Methods for predicting dimensional stability of a wood product based on differential characteristics Methods are provided for predicting warp of a wood product given its differential characteristics, such as, for example, curvature. The methods may involve measuring at least one original warp profile for each of one or more first wood products; measuring one or mor... | 12/08/2009 |
| 7623978 | Damage assessment of a wafer using optical metrology A method of assessing damage of a dual damascene structure includes obtaining a wafer after the wafer has been processed using a dual damascene process. A first damage-assessment procedure is performed on the wafer using an optical metrology process to gather damage... | 11/24/2009 |
| 7567878 | Evaluating anomaly for one class classifiers in machine condition monitoring A method for monitoring machine conditions provides additional information using a one-class classifier in which an evaluation function is learned. In the method, a distance is determined from an anomaly measurement x to a boundary of a region R1 containi... | 07/28/2009 |
| 7555395 | Methods and apparatus for using an optically tunable soft mask to create a profile library The present invention provides methods and system for improving the accuracy of measurements made using optical metrology. The present invention relates to methods and systems for changing the optical properties of tunable resists that can be used in the production ... | 06/30/2009 |
| 7548824 | Automated analysis system for semiconductor manufacturing fabrication A system and method for an automated analysis system for semiconductor manufacturing fabrication is disclosed. The system includes one or more site databases that each store data generated by an associated one or more semiconductor fabrication plants, a configuratio... | 06/16/2009 |
