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| Number | Title | Issue Date |
| 8155894 | X-ray inspection apparatus An X-ray inspection apparatus includes a storage device, a setting device, a determining device, a calculating device and a display control device. The setting device is configured to set a hypothetical reference value that is different from an actual reference valu... | 04/10/2012 |
| 8046178 | Defect detection system for identifying defects in weld seams A defect detection system identifies defects in weld seams. An exemplary system includes a scanner device, mounted on a displacement device of a processing unit and which can be displaced by the unit over at least one weld seam that is to be examined. The scanner un... | 10/25/2011 |
| 8024135 | Ultraviolet lidar for detection of biological warfare agents A system and method for detecting airborne agents. The system includes a semiconductor ultraviolet optical source configured to emit an ultraviolet light, a controller configured to generate a pseudo-random code for emission of the ultraviolet light modulated at the... | 09/20/2011 |
| 7983853 | EIT data processing system and method Electrical impedance tomography (EIT) data processing system, for acquiring and processing data from two-phase flows, comprising a dual-plane sensor, a plurality of digital signal processing modules configured in a data pipeline processing arrangement and a pluralit... | 07/19/2011 |
| 7949480 | Method for determining an interaction between an electromagnetic radiation and a material The exemplary embodiments of the method, system, software arrangement and computer-accessible medium according to the present invention facilitates an analysis of interactions between nonlinear absorbing materials and an incident electromagnetic wave based on materi... | 05/24/2011 |
| 7937229 | System and method for detecting damage, defect, and reinforcement in fiber reinforced polymer bonded concrete systems using far-field radar A non-contact, far-field radar nondestructive testing (NDT) method is disclosed that is capable of detecting at least one of defects, damages, and reinforcement conditions in near-surface region of multi-layer systems using monostatic inverse synthetic aperture rada... | 05/03/2011 |
| 7912657 | Method and system for providing a compensated auger spectrum A system for providing a compensated Auger spectrum, the system includes: a processor, adapted to generate a compensated Auger spectrum in response to a non-compensated Auger spectrum and in response to an electric potential related parameter, and an interface to an... | 03/22/2011 |
| 7912658 | Systems and methods for determining two or more characteristics of a wafer Systems and methods for determining two or more characteristics of a wafer are provided. The two or more characteristics include a characteristic of the wafer that is spatially localized in at least one dimension and a characteristic of the wafer that is not spatial... | 03/22/2011 |
| 7761246 | Surface inspection method and surface inspection apparatus When detecting light scattered by an object to be inspected by using a pulse laser as a light source, noise increases unless a sampling repletion period of an A/D converter is determined so as to be related to a pulse oscillation repetition period of the light sourc... | 07/20/2010 |
| 7761245 | Method for visualising the eccentricity of cables in the eccentricity measurement of the cables A method for visualizing the eccentricity of cables which is acquired in the eccentricity measurement of the cables, wherein eccentricity measurements take place at the same time on plural locations spaced apart across the perimeter of the cable during the transport... | 07/20/2010 |
| 7702471 | Determining one or more profile parameters of a photomask covered by a pellicle Provided is a method of determining one or more profile parameters of a photomask covered with a pellicle, the method comprising developing an optical metrology model of a pellicle covering a photomask, developing an optical metrology model of the photomask, the pho... | 04/20/2010 |
| 7684937 | Evaluation method of fine pattern feature, its equipment, and method of semiconductor device fabrication Equipment extracts components of spatial frequency that need to be evaluated in manufacturing a device or in analyzing a material or process out of edge roughness on fine line patterns and displays them as indexes. The equipment acquires data of edge roughness over ... | 03/23/2010 |
| 7664608 | Defect inspection method and apparatus A pattern inspection apparatus which compares images of regions, corresponding to each other, of patterns that are formed so as to be identical and judges that non-coincident portions in the images are defects. The pattern inspection apparatus is equipped with an im... | 02/16/2010 |
| 7606672 | Plant protective instrumentation equipment A plant protection instrumentation equipment, comprises, a sensor that detects a process signal indicating a quantity of a state of a plant, a plurality of A/D converters, each of the A/D converters converts the process signal into a digital signal and outputs a val... | 10/20/2009 |
| 7603241 | Light receiving apparatus, testing apparatus, light receiving method, testing method, test module and semiconductor chip An optical receiving apparatus that receives an optical signal and outputs a data value of digital data transmitted by the optical signal is provided, including a light receiving element that receives the optical signal and outputs a photocurrent according to a stre... | 10/13/2009 |
| 7571061 | Non-destructive method of measuring a moisture content profile across a hygroexpansive, composite material The teachings provided herein are generally directed to a non-destructive method of measuring a moisture content profile across a dimension of a hygroexpansive, composite material using radiation and a volumetric shrinkage correction. The measurement of a series of ... | 08/04/2009 |
| 7526388 | Method of selecting and analyzing scrap silicon Non-destructive testing is performed on individual pieces of scrap silicon using an energy dispersive x-ray fluorescent analyzer to determine from the obtained spectral data whether a prescribed impurity element is contained therein. The electrical resistivity of ea... | 04/28/2009 |
| 7487049 | Surface inspection method and surface inspection apparatus When detecting light scattered by an object to be inspected by using a pulse laser as a light source, noise increases unless a sampling repletion period of an A/D converter is determined so as to be related to a pulse oscillation repetition period of the light sourc... | 02/03/2009 |
| 7430481 | Methods for detecting and analyzing piled-up X-rays in an X-ray spectrometry system A method of processing signals relating to a plurality of X-rays received in an X-ray spectrometry system that includes a pulse processor having a main channel and zero or more fast channels includes steps of receiving a main channel dead time signal and zero or mor... | 09/30/2008 |
| 7383142 | Method and apparatus for resolving individual signals in detector output data A method and apparatus for resolving individual signals in detector output data, the method comprising determining a signal form of signals present in the data, making parameter estimates of one or more parameters of the signals, wherein the one or more parameters c... | 06/03/2008 |
| 7370532 | RF communications method and system for laser ultrasonic testing A system including a processor, a high-energy density system linked to the processor, and a communicator linked to the processor. The communicator comprehensively integrates a plurality of hardware and software functions associated with operating the high-energy den... | 05/13/2008 |
| 7373277 | Methods and systems for detection of selected defects particularly in relatively noisy inspection data Various methods and systems for detection of selected defects particularly in relatively noisy inspection data are provided. One method includes applying a spatial filter algorithm to raw inspection data acquired across an area on a substrate to determine a first po... | 05/13/2008 |
| 7366637 | Form measuring instrument A form measuring instrument comprising: a roughness sensor placed on the table, and for outputting measurement data that includes information on the cross-sectional shape; a relative movement mechanism for relatively moving the table and the roughness sensor such th... | 04/29/2008 |
| 7366620 | Evaluation method of fine pattern feature, its equipment, and method of semiconductor device fabrication Equipment extracts components of spatial frequency that need to be evaluated in manufacturing a device or in analyzing a material or process out of edge roughness on fine line patterns and displays them as indexes. The equipment acquires data of edge roughness over ... | 04/29/2008 |
| 7359815 | Method and device for correcting a spectrum A method is provided for correcting at least one portion of a spectrum, in particular a Raman spectrum, by eliminating a baseline which is due to a perturbing spectrum, in particular due to a fluorescence spectrum, superimposed on the spectrum, wherein i) a convex e... | 04/15/2008 |
| 7356115 | Radiation scanning units including a movable platform A scanning unit for inspecting objects comprises in one embodiment a radiation source to emit a beam of radiation, a rotatable platform to support an object for inspection by the beam of radiation and a detector positioned to receive radiation after interaction of t... | 04/08/2008 |
| 7312453 | Methods for determining corrosion products on substrates using infrared imaging Methods for determining corrosion products on a substrate are disclosed. In one embodiment, a non-destructive method for determining an amount of corrosion product on a metallic substrate includes non-destructively determining a value Ia of infrared energy absorbed ... | 12/25/2007 |
| 7310404 | Radiation CT radiographing device, radiation CT radiographing system, and radiation CT radiographing method using the same An object rotating type cone beam radiation CT radiographing device in which a high speed and high sensitivity are obtained with low costs is provided. Thus, a radiation CT device of high performance for vehicle-mounted use and group medical examination can be provi... | 12/18/2007 |
| 7286284 | Microscope imaging system and method for emulating a high aperture imaging system, particularly for mask inspection An optical imaging system for inspection microscopes with which lithography masks can be checked for defects particularly through emulation of high-aperture scanner systems. The microscope imaging system for emulating high-aperture imaging systems comprises imaging ... | 10/23/2007 |
| 7266234 | Method and device to control the straightness and torsions of long products Device and method to control the straightness and torsions of a long product (11), comprising at least two profile-detection devices (12a, 12b, 12c), each presenting a visual field (13) that includes a perimete... | 09/04/2007 |
| 7262865 | Method and apparatus for controlling a calibration cycle or a metrology tool A method and apparatus for controlling when a calibration cycle is started for a metrology tool. The method and apparatus exploits a correlation between a drift of a first parameter (e.g., film thickness measurement drift) and a drift of a second parameter (e.g., CD... | 08/28/2007 |
| 7242803 | System and method for significant dust detection and enhancement of dust images over land and ocean A new processing capability for desert dust enhancement using imager data from the Sea-viewing Wide Field of View Sensor (SeaWiFS) has been developed for Naval meteorology/oceanography (MetOc) operations support. The data are captured via direct broadcast high-resol... | 07/10/2007 |
| 7242789 | Moving-body detecting image sensor Two photodetectors output electric signals based on the detection of light at light receiving sections mutually spaced apart. The output signal of one of the photodetectors is delayed and a first pulse signal is generated, and second pulse signal having no delay is ... | 07/10/2007 |
| 7240306 | Integrated circuit layout critical area determination using Voronoi diagrams and shape biasing Method, system and program product for determining a critical area in a region of an integrated circuit layout using Voronoi diagrams and shape biasing. The method includes the steps of generating a biased Voronoi diagram based on a layout geometry of the region and... | 07/03/2007 |
| 7225042 | Manufacturing procedure control method and system A manufacturing procedure control method. The method executes tests during transport for object lots. The object lots are carried on a transport vehicle during transport. The object lots that pass the tests are loaded in a manufacturing tool. If a load port and a ta... | 05/29/2007 |
| 7212938 | Method of using a self-locking travel pattern to achieve calibration of remote sensors using conventionally collected data The present invention provides a method to calibrate an on-board remote sensing system using a self-locking travel pattern and target remote sensing data. The self-locking travel pattern includes a number of parallel travel lines having overlapping swath widths betw... | 05/01/2007 |
| 7209539 | Process and device for testing parts by X rays The non-destructive test of a structure (10) such as an aircraft fuselage is done by placing an X-ray source (16) on one side of the structure, and placing a digital camera (24) on the other side. The microcomputer (28) analyzes the image... | 04/24/2007 |
| 7202475 | Rapid defect composition mapping using multiple X-ray emission perspective detection scheme Disclosed are methods and apparatus for characterizing defects by using X-ray emission analysis techniques. The X-rays are emitted in response to an impinging beam, such as an electron beam, directed towards the sample surface where a defect resides. It may also be ... | 04/10/2007 |
| 7194360 | Method of determining radioactive nuclides A method of simply and quickly determining α-ray releasing nuclides having long half-life without carrying out a chemical separation is provided. By inputting a data of pulses incident to an α-ray detector in a computer, obtaining time distribution of the i... | 03/20/2007 |
| 7191091 | Advanced cable metrology system The present invention is a method for determining the center to center spacing of conductors in an insulated, multi-conductor, flat cable. The method comprising applying an X-ray field to the cable, detecting the X-ray field intensity that passes through the cable, ... | 03/13/2007 |
