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Class 702/35 - Flaw or defect detection


Subclass of Class 702 - Data processing: measuring, calibrating, or testing
Definition: Subject matter wherein the data processing system or calculating
No. of patents: 565
Last issue date: 05/29/2012


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NumberTitleIssue Date
8190378Crack growth evaluation apparatus, crack growth evaluation method, and recording medium recording crack growth evaluation program
An element damage determination unit calculates a cumulative value of a damage value using a Manson-Coffin law for a plurality of finite elements of a continuum based on a result of a stress/distortion analyzing process, and determines whether or not the cumulative ...
05/29/2012
8175819Tire inspection device
A tire inspection device generates an analyzing wavelet for wavelet transformation correlating time, corresponding to tire surface position, and frequency, based on a frequency representing a characteristic portion of a predetermined tire surface structure. After th...
05/08/2012
8135547Detection apparatus and method utilizing membranes and ratio of transmembrane pressures
The failure of an upstream filtration membrane, or the presence of a foulant in a fluid is detected using a membrane-based detector. The fluid or an effluent from the filtration membrane is directed to permeate through a first permeable membrane, and from the first ...
03/13/2012
8095324Permanent magnet rotor crack detection
A method and apparatus for permanent magnetic (PM) rotor crack detection includes a sensor which monitors magnetic flux distribution of the PM rotor and identifies the presence of a crack in the PM rotor when a magnetic flux distribution change or anomaly is detecte...
01/10/2012
8095325System and method for gemstone cut grading
A system for grading the cut of a diamond utilizes a number of appearance metrics to generate scores for a number of cut components that affect cut quality. These cut components include brightness, fire, scintillation, overweight, durability, polish, and symmetry. T...
01/10/2012
8046177Method and apparatus for detecting damage in armor structures
Detection of damage in armor structures, using networks of piezoelectric transducers. In particular, piezoelectric transducers can be placed at various points on the armor structure, effectively creating a number of paths between pairs of transducers. Each of these ...
10/25/2011
8036837Diagnostic method for detecting control valve component failure
The claimed method and system identifies faults and/or deterioration of components in a process control valve. The system may use different sensor combinations to provide the necessary data to compute irregular component integrity. Alerts may be generated to indicat...
10/11/2011
8024134Gas sensor and output processing method thereof
A gas sensor which includes: a plurality of gas detectors, each detects a target gas; an error detector which detects the occurrence of an error on each of gas sensors; an output selector which selects one output from among outputs entered from each gas sensor, the ...
09/20/2011
8019558Method for predicting failure of geotechnical structures
Provided is a method of predicting failure in geotechnical structures using an AE method instead of a conventional displacement or stress measuring method, which belongs to a field of rock mechanics and geotechnical engineering. The method is a measurement technolog...
09/13/2011
8000905Computer-implemented methods, carrier media, and systems for determining sizes of defects detected on a wafer
Computer-implemented methods, carrier media, and systems for determining sizes of defects detected on a wafer are provided. One computer-implemented method includes separating the defects into groups based on output acquired for the defects by multiple channels of a...
08/16/2011
7974791Method for the optimization of stress distribution in acoustic thermography applications
In a method for the optimization of stress distribution on an object to be tested for flaws by ultrasound excitation and evaluation based on resulting surface temperature distribution,—a simulation is performed under test conditions on a CAD model of the object pr...
07/05/2011
7953560Method for measuring doctor blade geometric deviations
A method for measuring geometric deviations of a doctor blade using an apparatus, including initializing the apparatus, mounting the doctor blade to a doctor blade holding device, illuminating the doctor blade with light, positioning a first portion of the doctor bl...
05/31/2011
7899627Automatic dynamic baseline creation and adjustment
In a plasma processing system, a method for dynamically establishing a baseline is provided. The method includes processing a first substrate. The method also includes collecting a first signal data for the first substrate. The method further includes comparing the ...
03/01/2011
7877217Electric ultimate defects analyzer detecting all defects in PCB/MCM
A method and a system of testing electronic components assemblies, each assembly comprising a multiplicity of tracks, each connecting a multiplicity of ports. The system may enable applying heat energy upon at least one part of the at least one track; measuring ener...
01/25/2011
7873484Method for reliable position monitoring
A method for reliable position monitoring includes: (a) transmitting two measured position values from a position measuring device to a first processing unit; (b) transmitting a setpoint value from a setpoint value generator to a second processing unit; (c) transmit...
01/18/2011
7869962Process and device for controlling the deformation of a metal part, in particular for redressing a metal part
The method for tracking deformation of a metal part subjected to a pressure force (F) includes the steps of measuring the displacement (d) of the metal part in the deformation zone, of measuring the intensity of the pressure force (F), of calculating, during a first...
01/11/2011
7860664System and method for self-contained structural health monitoring for composite structures
A system and method for structural health monitoring (SHM) of a physical structure, such as an aircraft component. The system may comprise a central data acquisition module and a plurality of wireless, self-contained sensor wafers bonded to a surface of the physical...
12/28/2010
7860663Abnormality diagnosing apparatus and abnormality diagnosing method
A abnormality diagnosing apparatus used in a machine equipment including a rotating or sliding part relative to a stationary member includes a detecting portion 31 fixed to the rotating or sliding part or the stationary member and including a vibration sensor...
12/28/2010
7848894Non-destructive inspection apparatus
A free-hand inspection apparatus for non-destructively inspecting a structure includes an array and an inertial sensor. The array includes a plurality of elements for transmitting and receiving inspection signals towards and from a structure being inspected. The ine...
12/07/2010
7805259Method for detecting an operation malfunction of a leakage inspector, and a leakage inspector having a function to detect an operation malfunction thereof
A method for detecting an operation malfunction of a leakage inspector causes the leakage inspector to execute a calibration process and an inspection process. The calibration process seals air inside a first device serving as a reference device and measures changes...
09/28/2010
7805258System and method for film stress and curvature gradient mapping for screening problematic wafers
A method of testing a wafer after a current top layer is formed over the wafer. Stress data is collected for the wafer after forming the current top layer. The stress data is derived from changes in wafer curvature. The stress data includes: stress-xx in an x direct...
09/28/2010
7792647Quantitatively measuring error causing parameters in fluid handling
A method for quantitatively measuring error causing physical parameters in a fluid handling system, includes: measuring the pressure of air between a piston of a pump and a liquid being handled; detecting a pressure abnormality; determining the time at which the pre...
09/07/2010
7779053Diagnosis of an automation system
The invention relates to a method, a computer program product and an engineering system for creating a diagnostic model of an automation system made up of various automation components. The diagnostic model is generated automatically during the project planning phas...
08/17/2010
7774147Systems and methods for detecting and addressing data flaws in software artifacts
Systems and methods are provided for upgrading a software artifact having accumulated data flaws. The software artifact may be accessible, for example, by a plurality of software components for backend services. Issues that cause the data flaws and corresponding fix...
08/10/2010
7734429Method and apparatus for creating at least one parameter for algorithmically evaluating damage in a structure
A method for creating at least one input parameter for an algorithmic system to evaluate damage in a structure may include: (a) Determining a plurality of damage index factors using first signal information relating to a first signal transmitted through the structur...
06/08/2010
7725269Sensor infrastructure
A device for use in detecting an event in a structure includes a sensor encapsulation, the encapsulation containing a sensor, an actuator positioned substantially in-plane to the sensor within the housing and a printed circuit board in communication with at least on...
05/25/2010
7672793Method for calculating probabilistic damage sizes in structural health monitoring systems
A method for calculating the probable damage size in a structure includes defining a configuration of an array of transducers mounted on the structure. Any pair of the transducers includes an actuator and a sensor, and each pair defines a propagation path in the str...
03/02/2010
7668667Miniature stimulating and sensing system
An electronic system for testing a material includes at least one module for mechanically mounting on the material. The module includes a signal generator for generating a signal generator signal. The module also includes a stimulus signal delivering device (SSDD) a...
02/23/2010
7650245Impulse line-clogging detecting unit and impulse line-clogging detecting method
An impulse line-clogging detecting apparatus. The apparatus is provide with: a differential pressure detecting unit that detects a differential pressure of a fluid, and outputs time-series data of the differential pressure. Fluctuations are determined by a different...
01/19/2010
7634365Inspection system and apparatus
A method and system for identifying a defect or contamination on a surface of a sample. The system operates by detecting changes in work function across a surface via both vCPD and nvCPD. It utilizes a non-vibrating contact potential difference (nvCPD) sensor for im...
12/15/2009
7627439Sensor infrastructure
A device for use in detecting an event in a structure includes a sensor encapsulation, the encapsulation containing a sensor, an actuator positioned substantially in-plane to the sensor within the housing and a printed circuit board in communication with at least on...
12/01/2009
7590496Embedded system for diagnostics and prognostics of conduits
A set of sensors to be used with an apparatus providing a means for assessment of the integrity of insulated conduits, harnesses, cables, pipelines and other interconnection systems constructed with integral sensitized media, discrete sensors, and electronics provid...
09/15/2009
7584061Device for measuring permeate flow and permeate conductivity of individual reverse osmosis membrane elements
The present disclosure relates to a system comprising an integrated sensor for measurement of permeate flow and permeate conductivity of individual membrane elements while they are in operation in an RO unit. The flow and conductivity measuring integrated sensor is ...
09/01/2009
7571060System and method for gemstone cut grading
A system for grading the cut of a diamond utilizes a number of appearance metrics to generate scores for a number of cut components that affect cut quality. These cut components include brightness, fire, scintillation, overweight, durability, polish, and symmetry. T...
08/04/2009
7567873Nondestructive inspection method and apparatus for a surface processed by shot peening
An inspection method and an inspection apparatus that can easily measure a distribution of residual stress on a surface processed by shot peening, including a state of distribution in a depth direction of a material to be treated in a relatively short time without d...
07/28/2009
7565252Method for automatic differentiation of weld signals from defect signals in long-range guided-wave inspection using phase comparison
A method and associated algorithms for identifying and distinguishing geometric feature signals from defect signals in the NDE of longitudinal structures. The method includes the steps of collecting an interrogation signal (including reflected components) from a lon...
07/21/2009
7558683Method for inspecting defect and system therefor
Based on a plurality of defects' position-coordinates and attribute detected by an inspecting apparatus, defects that are easily detectable by an observing apparatus are selected. With these selected defects employed as the indicator, the observing apparatus detects...
07/07/2009
7542856Structure monitor system
A structure monitor system comprising a measuring unit 3 for measuring distortions of the structure S at respective points on a boundary by using an optical fiber sensor 2 laid on the boundary of the structure, numerical analysis unit 5 for calc...
06/02/2009
7529631Defect detection system, defect detection method, and defect detection program
A defect detection system includes a data acquiring section that acquires time series data of device parameter of each manufacturing device including an exposure device, and information on defect distribution in an area with a size smaller than a chip area size, a p...
05/05/2009
7512501Defect inspecting apparatus for semiconductor wafer
A defect inspecting apparatus comprising: an inspection region dividing section which divides a defect inspection region of a wafer on which a circuit pattern is formed into a plurality of inspection subregions; a ...
03/31/2009
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