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Class 702/123 - Including program set up


Subclass of Class 702 - Data processing: measuring, calibrating, or testing
Definition: Subject matter including means for selecting or specifying
No. of patents: 395
Last issue date: 05/29/2012


1                    
NumberTitleIssue Date
8190392Method and apparatus for multiple trigger path triggering
A method and apparatus for determining a trigger in a test and measurement apparatus are provided. The method comprises the steps of loading a first trigger configuration to a first trigger element of the test and measurement apparatus and loading a second trigger c...
05/29/2012
8185339Test method and program product used therefor
The testing method of the present invention for testing a plurality of devices under test connected to a test module includes (a) determining combinations of devices under test that can theoretically be measured simultaneously from among the combinations of the plur...
05/22/2012
8180589System for managing recipes for operating a measurement device
A semiconductor wafer inspection device which identifies an operator when an operation is performed and checks if the requested operation is permitted is provided. In a device that has already performed an operator authentication, the operator identification is furt...
05/15/2012
8135558Automated simulation testbench generation for serializer/deserializer datapath systems
Embodiments herein present a method for automated simulation testbench generation for serializer/deserializer datapath systems. The method provides a database of transactors for generating and checking data within the datapath system, wherein the transactors are ada...
03/13/2012
8065107Combinatorial process optimization methodology and system
A method for obtaining an optimized process solution from a set of design of experiments in a cost effective manner is provided. An actual experiment is performed and data from the experiments is obtained. Through statistical analysis of the data, coefficients are o...
11/22/2011
8055467Method of generating a restricted inline resistive fault pattern and a test pattern generator
A method of generating an IRF pattern for testing an IC and a test pattern generator are disclosed. In one embodiment, the method includes: (1) identifying a path of the integrated circuit for inline resistive fault pattern generation, (2) determining if the path is...
11/08/2011
8050882Network-based system for automatically generating a graphical program based on user supplied measurement task requirements
A system and method for online configuration of a measurement system. The user may access a server over a network and specify a desired task, e.g., a measurement task, and receive programs and/or configuration information which are usable to configure the user's mea...
11/01/2011
8037109Generation of repeatable synthetic data
Systems and methods are provided for the generation of synthetic repeatable data. In an illustrative implementation, an exemplary data environment comprises at least one computing application for the management, manipulation, and generation of data. The computing ap...
10/11/2011
8019566System and method for efficiently testing cache congruence classes during processor design verification and validation
A system and method for using a single test case to test each sector within multiple congruence classes is presented. A test case generator builds a test case for accessing each sector within a congruence class. Since a congruence class spans multiple congruence pag...
09/13/2011
8005639Compact framework for automated testing
A system and method (“utility”) for automated testing using a compact framework is provided. The utility includes a plurality of functionalities that include development of a test module, development of a test flow, and execution of a test flow. Each of these fu...
08/23/2011
8000922Methods and systems for generating information to be used for selecting values for one or more parameters of a detection algorithm
Methods and systems for generating information to be used for selecting values for parameter(s) of a detection algorithm are provided. One method includes without user intervention performing a scan of an area of a wafer using an inspection system and default values...
08/16/2011
7930130Method and system for reducing device test time
A system and method for reducing device test time are disclosed herein. A method for reducing device test time includes applying a linear program solver to select a first set of tests for testing a device from a second set of tests for testing the device. The first ...
04/19/2011
7890288Timing functions to optimize code-execution time
A method and system for optimizing a test plan of an Integrated Circuit (IC). The test plan includes two or more test sequences. A test sequence includes the measurement of a parameter of the IC. The total test time of the IC is reduced by performing one or more act...
02/15/2011
7853425Parallel testing in a per-pin hardware architecture platform
Provided is a method and system for testing a DUT. The system includes a plurality of testing devices for interacting with the DUT and conducting a plurality of different tests on the DUT, and a computer-readable memory for storing computer-executable instructions d...
12/14/2010
7844413Self-generated test automation
Self-generated automated tests can use a pseudo-random number generator to select one or more arguments that are passed to programs and scripts. The random arguments are driven by a configuration file where the limits for the parameters are defined. Multidimensional...
11/30/2010
7836398Report format setting method and apparatus, and defect review system
Generated is a template edition screen on which to display components of a report as modules by OSD by use of icons. One of the icons is selected by use of a pointing device including a mouse. By a drag-and-drop operation, the icon is placed at a desired position in...
11/16/2010
7752006Device, system and method of generating a hardware-verification test case
Some demonstrative embodiments of the invention may include, for example, devices, systems and methods of performing functional verification of a hardware design. In some demonstrative embodiments, a test generator may include a transaction generator to automaticall...
07/06/2010
7739071System validation using validation programs depicted using markup language
System validation using validation programs for a plurality of root functions depicted using a markup language is disclosed. One embodiment of a method includes establishing a validation program template defining a style of input/output usable by a plurality of root...
06/15/2010
7739070Standardized interfaces for proprietary instruments
A test instrument and method for operating the same are disclosed. The data acquisition system within the instrument generates signals and couples the signals to a device and/or receives signals from the device. The data processor within the instrument includes meas...
06/15/2010
7711514Computer-implemented methods, carrier media, and systems for generating a metrology sampling plan
Various computer-implemented methods, carrier media, and systems for generating a metrology sampling plan are provided. One computer-implemented method for generating a metrology sampling plan includes identifying one or more individual defects that have one or more...
05/04/2010
7643959Methods, systems, and computer readable media that provide programming for a sensor monitoring system using a softprocessor
Methods, systems, and computer readable media provide a softprocessor that is executed by a hardware processing device of a sensor monitoring system and provide an application that is executed by the softprocessor being executed by the hardware processing device. Th...
01/05/2010
7640132Recording medium and test apparatus
A recording medium recording thereon a program for a test apparatus including test modules that test devices under test is provided. The program includes: a common function provision program which is executed on a controller for controlling the test apparatus and pr...
12/29/2009
7558694Network-based system for configuring a system using configuration information generated based on a user specification
A system and method for online configuration of a measurement system. The user may access a server over a network and specify a desired task, e.g., a measurement task, and receive programs and/or configuration information which are usable to configure the user's mea...
07/07/2009
7536269Network-based system for configuring a system using software programs generated based on a user specification
A system and method for online configuration of a measurement system. The user may access a server over a network and specify a desired task, e.g., a measurement task, and receive programs and/or configuration information which are usable to configure the user's mea...
05/19/2009
7519497Apparatus and method for state selectable trace stream generation
A trace test and debug system for a target processor generates a program counter trace stream, a timing trace stream and a data trace stream. The target processor has three states, a program code execution state, an interrupt service routine code execution state, an...
04/14/2009
7502708Test apparatus, and control method
A test apparatus that tests a device under test is provided. The test apparatus includes: a control processor that executes a test program to test the device under test; a test unit connected to the device under test that tests the device under test according to an ...
03/10/2009
7499824Graphical user interface for easily configuring measurement applications
System and method for using a graphical user interface (GUI) to generate a measurement task specification (MTS) for performing a measurement task. The measurement task includes measurement and/or signal generation. A measurement task specifier presents a GUI which g...
03/03/2009
7444259Automatic acquisition of data referenced in user equation
An apparatus includes a parser, a semantic checker, a data manager and an equation processor. The parser receives a first equation for manipulating data acquired by an instrument and detects an operand in the first equation, the instrument having a set of data acqui...
10/28/2008
7444258Automated simulation testbench generation for serializer/deserializer datapath systems
Embodiments herein present a method for automated simulation testbench generation for serializer/deserializer datapath systems. The method provides a database of transactors for generating and checking data within the datapath system, wherein the transactors are ada...
10/28/2008
7440867System and method for measuring workpieces
An exemplary method for measuring workpieces is disclosed. The method includes the steps of: measuring a workpiece; recording the measuring procedures of the workpiece; generating procedure codes according to the measuring procedures; storing the procedure codes in ...
10/21/2008
7421632Mapping logic for controlling loading of the select ram of an error data crossbar multiplexer
Methods and circuits for efficient configuration an error data crossover configuration circuit of an integrated circuit tester allows simultaneous DUT channel configuration for multiple identical DUTs for an error data control circuit. ...
09/02/2008
7404122Mapping logic for loading control of crossbar multiplexer select RAM
A circuit and method for efficiently configuring an ACAM Select RAM for an ACAM circuit of a tester that tests multiple devices under test (DUTs). ...
07/22/2008
7395170Methods and apparatus for data analysis
A method and apparatus for data analysis according to various aspects of the present invention is configured to automatically select one or more outlier identification algorithms for identifying statistical outliers in test data for components. ...
07/01/2008
7392149Automatic software testing
A computer implemented method of automatic software testing. Status information of a software test running on a test system is stored to a common information point. The common information point is typically on a computer system independent from a computer system run...
06/24/2008
7392148Heterogeneous multipath path network test system
A test system for a heterogeneous multipath network. A tester system evaluates a plurality of status indicators from a plurality of types of test components in a network. Based on the status indicators of at least one of the test components, the tester system select...
06/24/2008
7373263Analog-type measurements for a logic analyzer
A logic analyzer that performs analog-type measurements on digital data includes circuitry in its acquisition system that is programmable to search through acquired data to detect analog-type signal characteristics. In a first embodiment, the logic analyzer includes...
05/13/2008
7373360Methods and apparatus that use contextual test number factors to assign test numbers
In a method for assigning test numbers, current testflow context information is maintained during the execution of a testflow. If one or more test number factors have been specified for one or more levels of the current testflow context, the test number factors are ...
05/13/2008
7369957Method and system for generating test pulses to test electronic elements
A method and system for generating test pulses to test electronic elements are disclosed. After determining a transmission clock, which is smaller than a test clock, and a serial of predetermined pulses, the serial of data bits corresponding to the serial of predete...
05/06/2008
7366630Management of electrical cable installations in a building
The installation of an electrical cable in a building and its subsequent testing are managed by first creating a computer database indicating the type of cable, the location where the cable is to be installed, the performance standard it should meet when installed i...
04/29/2008
7363617Database breakpoint apparatus and method
An apparatus and method define the concept of a “database breakpoint.” One or more conditions in the database are specified as a database breakpoint in a debug environment for debugging a computer program that accesses the database. When the database conditions ...
04/22/2008
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