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| Number | Title | Issue Date |
| 6687649 | System, method and computer program for a synoptic interlock prompting and input override system with a maintenance log A system, method and computer program for facilitating the operation of a control system utilizing one or more input devices is disclosed. The control system provides the ability to monitor and modify operating parameters of the input devices. A function ... | 02/03/2004 |
| 6681142 | Method and system for testing a test piece A method and system for computerized testing of a test piece, wherein testing is implemented by individual test modules operating in parallel. As a result, the total testing time is shortened. A central control computer and the test modules communicate vi... | 01/20/2004 |
| 6681351 | Easy to program automatic test equipment The invention is directed to techniques for providing a test procedure for testing a device using automatic test equipment (ATE). An ATE system includes memory having a test application stored therein, a test interface to connect to the device, and a proc... | 01/20/2004 |
| 6678627 | Computer program and method for determination of electronic circuit card product life capability under exposure to vibration An application program and method for determining the fatigue life of electronic products exposed to vibration, including application program steps of (i) describing the mechanical configuration of the electronic product; (ii) describing the vibration pro... | 01/13/2004 |
| 6668237 | Run-time reconfigurable testing of programmable logic devices Method and system for testing circuitry of a programmable logic device (PLD). A host data processing arrangement is configured with a run-time reconfiguration programming interface, and a run-time reconfiguration test program that invokes methods of the i... | 12/23/2003 |
| 6662132 | Noise analyzing method and apparatus and storage medium A noise analyzing method analyzes a crosstalk noise based on circuit data in which buses having the same signal transmitting direction and buses having opposite signal transmitting directions are distinguished from each other, by analyzing the crosstalk n... | 12/09/2003 |
| 6651024 | Method for automatic testing PCMCIA cards This specification discloses a method for automatic testing PCMCIA cards. The method first loads in the main library of the control panel, then checks and displays the PCMCIA module using the application interface of the control panel library. A Setwindow... | 11/18/2003 |
| 6622107 | Edge placement and jitter measurement for electronic elements An apparatus compares propagation delay of electronic by using flip-flops or similar storage elements. The apparatus includes a strobe source having an output line coupled to a control terminal of a pattern source and an input terminal of a variable clock... | 09/16/2003 |
| 6618685 | Non-invasive testing of smart cards A system and method is provided for non-invasive testing of smart cards. In a preferred embodiment, a host computer is connected to a controller, which is then connected, through a switch, to at least one computing device and at least one testing device. ... | 09/09/2003 |
| 6609077 | ATE timing measurement unit and method Automatic test equipment is disclosed for testing a semiconductor device and including a computer workstation and pin electronics circuitry coupled between the semiconductor device and the computer. The pin electronics circuitry includes a plurality of ch... | 08/19/2003 |
| 6609084 | Data transfer performance measuring system and method A system is disclosed for benchmarking data transfers using different transport mechanisms between processes run on various nodes of a network. A central manager component interfaces with a user and reports benchmark results, and an agent component under ... | 08/19/2003 |
| 6594611 | Method in an integrated circuit (IC) manufacturing process for identifying and redirecting IC's mis-processed during their manufacture A method of manufacturing IC devices from semiconductor wafers includes providing the wafers and fabricating IC's on the wafers. At probe, a unique fuse ID is stored in each IC, and an electronic wafer map is electronically stored for each wafer indicatin... | 07/15/2003 |
| 6591214 | Communication interface unit, connection tool for test, wrap test tool, and wrap testing method A wrap test for a communication interface unit used for a computer, etc. When a wrap tool 40 is connected to a SCSI device 10, a signal (TEMPWR) is output from an output device 38 to SCSI connectors 22 and 24 through a Y-type cable 14, then wrapped in the... | 07/08/2003 |
| 6591211 | Testing unit and self-evaluating device A testing unit is provided with a test data communication port adapted to output test data to a device being tested. The testing unit also has an expected test result data communication port adapted to output expected test result data to the device. The d... | 07/08/2003 |
| 6591213 | Systems for providing zero latency, non-modulo looping and branching of test pattern data for automatic test equipment An SRAM efficient ATE system that performs high speed nested loops without constraints on loop size or modularity and that loops and/or branches from any vector in a multiple vector accessed word to any vector in another multiple vector accessed word with... | 07/08/2003 |
| 6581020 | Process-linked data management system A system for managing and reporting laboratory data wherein the data is obtained at remote data-taking stations, transferred instantaneously by wireless communication to a main data-storing/manipulating station for recording therein without being recorded... | 06/17/2003 |
| 6577981 | Test executive system and method including process models for improved configurability A test executive program which provides greatly improved configurability and modularity, thus simplifying the creation, modification and execution of test sequences. The test executive program includes process models for improved flexibility, modularity a... | 06/10/2003 |
| 6559671 | Efficient parallel testing of semiconductor devices using a known good device to generate expected responses A system for testing integrated circuit devices is disclosed in which a tester communicates with a known good device through a channel. Tester-DUT interface circuitry is provided for monitoring the channel while the tester is writing data as part of a tes... | 05/06/2003 |
| 6560554 | Automatic testing A method of automatic testing of systems, such as DWDM systems with an OSA, has manufacturer's specifications loaded into the test equipment for a plurality of systems. A user selects one of the systems from a menu, and the test equipment from the manufac... | 05/06/2003 |
| 6556962 | Method for reducing network costs and its application to domino circuits A system and method which reduce a network cost of a domino circuit. The network costs of domino circuits can be reduced by utilizing the methods and systems disclosed. The domino circuit is represented as a mixed integer linear program. The mixed integer... | 04/29/2003 |
| 6546350 | Configuration and parameterization system for diagnostic devices and associated method The invention is directed to a system and a method for the configuration and/or parameterization of diagnostic devices for test objects. The system includes a first data object having a collection of technological test object parameters of the test object... | 04/08/2003 |
| 6542844 | Method and apparatus for tracing hardware states using dynamically reconfigurable test circuits A method and apparatus for tracing hardware states using dynamically reconfigurable test circuits provides improved debug and troubleshooting capability for functional logic implemented within field programmable logic arrays (FPGAs). Special test logic co... | 04/01/2003 |
| 6526371 | Round trip response time measurement for computer programs A method, apparatus, and article of manufacture for measuring a round trip response time for a transaction performed by a computer in a network environment. The method comprises the steps of starting a software timer when a transaction is initiated at a b... | 02/25/2003 |
| 6516051 | Testing voice message applications This invention relates to bulk testing of voice messaging applications by playing back an interaction from a recorded script. During development of a voice response system and application it is necessary to simulate a plurality of calls to the system so t... | 02/04/2003 |
| 6510398 | Constrained signature-based test A test system for structurally testing an integrated circuit device includes a pattern generator for generating successive random data patterns (scan chain). The test system further includes a constraint checker and corrector module, coupled to the patter... | 01/21/2003 |
| 6505137 | Method for operating a test system A method for operating a data processing system to control a device under test and to collect data from that device. The user is provided with a first display having a list of elementary tasks having first and second tasks from which a user selects one or... | 01/07/2003 |
| 6505138 | Function-based control interface for integrated circuit tester prober and handler devices A system for testing a set of integrated circuits (ICs) that may be implemented as dies in a group of wafers or as packaged ICs mounted in a group of load boards includes a test head for testing the ICs and a prober or handler for holding each wafer or lo... | 01/07/2003 |
| 6499005 | System and method for simulating air mode and ground mode of an airplane A system for enabling an operator to select a signal indicative of an air mode and a ground mode of an airplane is provided. The air mode is a state of the airplane when the airplane is in the air, and the ground mode is a state of the airplane when the a... | 12/24/2002 |
| 6493648 | Method and apparatus for logic synthesis (inferring complex components) An embodiment of the present invention is a method for logic synthesis that reduces use of computer memory and reduces computer runtime. In particular, an embodiment of the present invention is a method for logic synthesis which includes the steps of: (a)... | 12/10/2002 |
| 6490537 | Data communication method and data communication system A data communication method comprises the steps of transmitting, in a batch, measurement data necessary for measurement of electrical characteristics of a plurality of objects to be tested from a probing apparatus to a tester, prior to conducting a test o... | 12/03/2002 |
| 6487514 | System and method for computer controlled interaction with integrated circuits A method and system for programmed interaction with integrated circuits (ICs) are disclosed in various embodiments. The system allows a hard-coded program that is suitable for a family of ICs having certain characteristics in common to be dynamically adap... | 11/26/2002 |
| 6484116 | Program executing system for semiconductor testing equipment The present invention discloses a program executing system for semiconductor testing equipment that, at the time of compiling and executing the two device test programs including a common program specification command, executes the common program based on... | 11/19/2002 |
| 6473707 | Test executive system and method including automatic result collection Abstract A test executive program which provides greatly improved configurability and modularity, thus simplifying the creation, modification and execution of test sequences. The test executive program includes process models for improved flexibility, mod... | 10/29/2002 |
| 6449578 | Method and apparatus for determining the RC delays of a network of an integrated circuit The present invention provides a method and apparatus for determining the RC delays of a network comprised in an integrated circuit. The apparatus comprises logic configured to execute a rules checker algorithm. The rules checker algorithm operates in con... | 09/10/2002 |
| 6442499 | Methods and apparatus for statistical process control of test Methods and apparatus for statistical process control of test according to various aspects of the present invention optimize the wait period between applying input signals and collecting output test signal data. In one embodiment, a tester identifies one ... | 08/27/2002 |
| 6418783 | Handheld sensing apparatus A vapor sensing device that is sufficiently small and lightweight to be handheld, and also modular so as to allow the device to be conveniently adapted for use in sensing the presence and concentration of a wide variety of specified vapors. The device pro... | 07/16/2002 |
| 6418391 | Testing system for performing an operation of an application which controls testing equipment for testing a device under test and method for controlling the same There is disclosed a testing system for performing an operation of an application which controls testing equipment for testing a device under test by displaying images such as icons or buttons on a screen, and selecting these images with use of a pointing... | 07/09/2002 |
| 6405149 | System and method for testing a telecommunication system A system and method for testing a telecommunication system, such as a voice messaging system (VMS) are provided. The system includes a processor for controlling the execution of test script commands used to direct testing of the telecommunication system, ... | 06/11/2002 |
| 6401049 | Process for inspecting the components of a system in a motor vehicle A process of testing individual components of a system in an automotive vehicle, wherein the system comprises at least one software-operated controller and the controller is adapted to be connected to an input station, with software being adapted to be up... | 06/04/2002 |
| 6385550 | Apparatus and method for providing forward and backward compatibility between a host instrument and an accessory A probe or accessory incorporating the features of the subject invention includes a communications arrangement for communicating topology-related data to a host instrument connected to the probe or accessory. The topology-related data describes the probe ... | 05/07/2002 |
