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...When G.G. Hubbard learned of his future son-in-law's invention, he called it "only a toy." His daughter was engaged to a young man named Alexander Graham Bell.
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| Number | Title | Issue Date |
| 4664870 | Testable voted logic power interface In a protection system for a complex process control system which generates three independent actuation signals, the power interface circuit includes three pairs of switches arranged in three parallel groups of switches connected in series with the load a... | 05/12/1987 |
| 4646003 | Meter testing device An apparatus and method for verifying the accuracy of watt-hour meters at their operational site includes applying a phantom load to the meter and to a watt transducer. The relative watt hour readings of the meter are compared to the watt hours computed f... | 02/24/1987 |
| 4607214 | Adaptor circuit for adapting a test facility to a unit under test having a fast signal response Test signals emitted by a test facility A may have a chronological offset relative to a defined time point which is unacceptable for certain units under test having a fast response circuitry. A system is inserted between the test facility and such a unit ... | 08/19/1986 |
| 4593820 | Robotic, in-transit, device tester/sorter A testing mechanism is disclosed for incorporation with the gripping fingers of a robot arm, to enable the real time testing of a device under test after it is picked up by the grippers. The robot arm has opposed fingers mounted thereon for transverse cla... | 06/10/1986 |
| 4588945 | High throughput circuit tester and test technique avoiding overdriving damage A method and apparatus are disclosed for reducing the likelihood of damage to digital logic devices under test or located in close electrical proximity to the device under test while attempting to locate faults in circuit assemblies using digital incircui... | 05/13/1986 |
| 4560936 | Programmable controller system with failure indicator A programmable controller system is taught which uses an oscillator to provide a relatively low frequency low duty cycle series of digital ones and zeros to the gate logic of a load control device regardless of whether the device is in the ON or OFF state... | 12/24/1985 |
| 4553090 | Method and apparatus for testing a logic circuit using parallel to serial and serial to parallel conversion A system for testing a logic circuit having a plurality of flip-flops associated with a scanning path between scanning-in and scanning-out terminals thereof and a combination circuit including logic gates is disclosed. In the system, parallel input data i... | 11/12/1985 |
| 4541066 | Method and apparatus for checking the functions of a display system A method and apparatus for checking the functions of a display system display data which is received from a processing unit, store the displayed data, and check the stored data for identity with the data which is to be received and displayed. The check de... | 09/10/1985 |
| 4525789 | Programmable network tester with data formatter A mechanized system distributing the access, test and communication functions to the point of testing, typically the centralized switching facility serving the telephone loops and equipment to be tested. Computer (200) stores information about each subscr... | 06/25/1985 |
| 4519075 | Device for checking the printing circuit of a thermal printer A device for checking the printing circuit of a thermal printer wherein pulse currents are passed through only those of the heaters which correspond to printing data stored in a shift register via a power supply resistor and driver transistors to energize... | 05/21/1985 |
| 4510572 | Signature analysis system for testing digital circuits A signature analyzer for testing digital circuits. The analyzer includes a memory which is initially programmed with a set of signatures characterizing the digital signals on the nodes of a correctly operating circuit. The nodes of a test circuit are then... | 04/09/1985 |
| 4417204 | Printed circuit board tester and adapter with memory A self-programming printed circuit board tester which receives and stores information corresponding to the conductive and insulative relationships between test points or master printed circuit boards and then compares that information to information recei... | 11/22/1983 |
| 4404635 | Programmable integrated circuit and method of testing the circuit before it is programmed This teaches a method of testing normally untestable, programmable integrated circuits before they are irreversibly programmed by providing the circuit with first and second impedances which combine to form an initial resultant impedance. The second of th... | 09/13/1983 |
| 4317177 | Power priority control system for aircraft and test apparatus therefor A control system prevents electrical overloads in an aircraft of the type in which electrical loads are automatically connected to an electrical supply bus when the wing flaps are extended. The control system determines the maximum capability of the elect... | 02/23/1982 |
| 4305097 | Automated opto-electronic test system for quality control of two-dimensional elements with high geometric figure density An automated opto-electronic test system for quality control of two-dimensional elements with high geometric figure density, such as printed circuits, intermediate printed circuit products, and printing tools has a semiconductor image sensor disposed abov... | 12/08/1981 |
| 4277831 | Computer aided wire wrap operator check system There is disclosed herein an apparatus for computerized real time verification of the correctness of pin locations for wire wrap connections made by human operators in constructing or upgrading computer backplanes. A suitably programmed microprocessor ope... | 07/07/1981 |
| 4271472 | Wire wrap operator check system There is disclosed herein an apparatus for verifying the correct placement of a wire wrap tool on a wire wrap pin in an array of pins. An outside source of pin and condition data such as a human operator operating switches or a mechanical sequential state... | 06/02/1981 |
| 4271515 | Universal analog and digital tester Method and apparatus for comparison-type testing of electronic devices which generate analog waveform output signals. A reference unit output signal and an output signal of a unit under test are paired and selectively and synchronously compared in respons... | 06/02/1981 |
| 4255792 | Automated analog circuit test system An automated sequential test system, designed to compare analog test signals, derived from plurality of test nodes, located on the circuit under test with the corresponding reference signals, derived from plurality of similar nodes, located on a pre-teste... | 03/10/1981 |
| 4243937 | Microelectronic device and method for testing same A method for testing a microelectronic circuit to detect process defects which affect first and second characteristics of the circuit elements thereof. The circuit is formed on a semiconductor chip in proximity with an independent test element. The test e... | 01/06/1981 |
| 4224690 | High speed parallel scanning means for testing or monitoring the assembly of multiwire harnesses High speed solid state apparatus is described for learning, testing and monitoring the assembly of multiconductor harnesses. Testing a harness having a very large number of end points within the matter of a few seconds is made possible through the employm... | 09/23/1980 |
| 4187540 | Control panel self-test A control panel which provides an interface to a digital computer, and which comprises at least a data input device such as a keyboard and a data output device such as an alphanumeric display or a light emitting diode display, is tested without the use of... | 02/05/1980 |
| 4161029 | Automatic transient response analyzer system An automatic transient response analyzer system takes advantage of a digital computer and circuitry controlled thereby to measure the time that a device under test takes to come within specified limits of a final output when driven by a signal which stepw... | 07/10/1979 |
| 4055801 | Automatic electronic test equipment and method A method and apparatus for the automatic testing of electronic equipment in which a general purpose digital computer is programmed for the equipment to be tested to generate appropriate stimulus waveforms for application to the equipment to be tested and ... | 10/25/1977 |
| 3976893 | Circuit for testing a logic delay timer A circuit for the in-service testing of a logic timer generating an internally-preset time-delayed output logic state in response to a timer control input logic state, including a first logic operator having an output equal to the logic product of the neg... | 08/24/1976 |
