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| Number | Title | Issue Date |
| 6931612 | Design and optimization methods for integrated circuits A method for optimizing an algorithm specified for implementation on an integrated circuit for a specified application. The algorithm is analyzed with respect to its performance, and estimates of implementation area and speed are calculated. Specifically, the degree... | 08/16/2005 |
| 6928393 | Method and system for supporting negative testing in combinatorial test case generators Provided is a system and method for black-box testing of software using positive and negative test cases with N-way combinations of parameter values. An original model comprising valid and invalid values is modified in a first phase, by generating exclusions (constr... | 08/09/2005 |
| 6928376 | Apparatus and methods for ferroelectric ram fatigue testing Apparatus are provided for fatigue testing ferroelectric material in a wafer, including an on-chip oscillator to provide a bipolar waveform to a ferroelectric capacitor formed in the wafer, as well as a switching system to selectively provide external access to the ... | 08/09/2005 |
| 6920410 | Systems and methods for testing a network service Disclosed are systems and methods for testing a network service. In one embodiment, a system and a method pertain to sending an initial request to the network service, redirecting a related request sent by the network service to an actual network service such that t... | 07/19/2005 |
| 6914944 | Method and system for testing the functioning of a testing algorithm in a data transmission apparatus The invention pertains in general to the testing of the operation of radio and other data transmission apparatus. In particular the invention pertains to the testing of the operation of a digital radio apparatus on the basis of error statistics. In order to test fun... | 07/05/2005 |
| 6909927 | Apparatus and method for monitoring manufacturing status A method of monitoring the manufacturing status of a machine comprises the steps of assigning a machine identifier to a machine comprised of one or more components, the machine to be manufactured at one or more production stations, wherein each one or more productio... | 06/21/2005 |
| 6907378 | Empirical data based test optimization method A test method for the detection of redundant tests and inefficient tests (RITs) used for testing integrated circuits (ICs) and a subsequent optimization of test complexity and test time duration. Empirical data from an execution of all tests of interest in a test pl... | 06/14/2005 |
| 6907386 | Method for computer-supported error analysis of sensors and/or actuators in a technical system Disclosed is a method wherein a state description of the technical system for an error occurrence and a state description of the technical system for error-free operation is determined in order to detect sensor and/or actor errors. The attainable states for both des... | 06/14/2005 |
| 6904380 | Simulator cart A test system (10) is coupled to a control system (20) in a manner which allows the test system to communicate with and drive the control system by sending and receiving signals via both the controller-I/O communication channel (160) and the fie... | 06/07/2005 |
| 6904381 | Testing of a frequency converter device A user interface is presented for a tester that tests a frequency converter having an input port, an output port and a local oscillator port. In a first area, a user can specify frequency for an input signal to be placed on the input port. In a second area, the user... | 06/07/2005 |
| 6898542 | On-line device testing block integrated into a process control/safety system A process control or safety system within a process plant uses one or more testing blocks to effect the timely and safe operation of on-line testing routines within field devices, such as valves, used in the process control or safety system. These testing blocks, wh... | 05/24/2005 |
| 6895563 | Universal laboratory prototyping interface system The invention includes a main circuit board which is coupled by a 68 pin SCSI-2 connector to a National Instruments DAQ (PCI-6024E or equivalent) which resides in an expansion slot of a personal computer running National Instruments LABVIEW software which has been m... | 05/17/2005 |
| 6895352 | Simultaneous rapid open and closed loop bode plot measurement using a binary pseudo-random sequence A simultaneous rapid open and closed loop bode measurement plot is described in which testing of the servo controlled instrument occurs under closed loop conditions using a binary pseudo-random sequence. The binary pseudo-random sequence is injected into the servo w... | 05/17/2005 |
| 6890773 | Dynamic maintenance of manufacturing system components A method and an apparatus for sorting between actual and perceived errors related to processing of semiconductor wafers. A plurality of semiconductor wafers are processed. Fault data relating to the processed semiconductor wafers is acquired. A trend associated with... | 05/10/2005 |
| 6892155 | Method for the rapid estimation of figures of merit for multiple devices based on nonlinear modeling A system and a general method estimate figures of merit based on nonlinear modeling and nonlinear time series analysis. Terms in a nonlinear behavioral model that depend on nonlinear combinations of a fixed input signal value are precomputed, optimizing the behavior... | 05/10/2005 |
| 6892154 | Method and apparatus for developing multiple test cases from a base test case A system and method for generating a test case for testing a device to be connected to a computer is disclosed. A base test object is provided. The base test object defines test properties for a device. The base test object includes a transaction generator that gene... | 05/10/2005 |
| 6885960 | Methods and devices for performing impedance spectroscopy A highly time resolved impedance spectroscopy that enhances the measurement of the dynamics of non-stationary systems with enhanced time resolution. The highly time resolved impedance spectroscopy includes an optimized, frequency rich a.c., or transient, voltage sig... | 04/26/2005 |
| 6868309 | Dialysis machine with symmetric multi-processing (SMP) control system and method of operation A method and control system computing platform for a dialysis machine that uses Symmetric Multi-Processing (SMP) architecture. The SMP architecture tightly couples multiple (e.g., 2) independent processors by sharing memory between the processors. A single shared me... | 03/15/2005 |
| 6868357 | Frequency domain reflectometry system for testing wires and cables utilizing in-situ connectors, passive connectivity, cable fray detection, and live wire testing A frequency domain reflectometer that is in electrical communication with a cable under test in order to determine cable characteristics including cable length and load characteristics such as capacitance, inductance, resistance, impedance (which is characterized as... | 03/15/2005 |
| 6853940 | Anti-islanding device and method for grid connected inverters using random noise injection A device and method for detecting islanding of a grid connected inverter makes use of an injected white noise as a perturbing force on the output voltage of the inverter. The white noise is injected at least once in every cycle and can be generated at different rate... | 02/08/2005 |
| 6853939 | Systems and methods for multiple winding impulse frequency response analysis test The winding testing unit provides systems and methods for determining normal and/or abnormal characteristic signatures of same-voltage windings residing in a device, such as transformer, without the need for a comparison to past historical data. A plurality of chara... | 02/08/2005 |
| 6853930 | System for aiding the preparation of operation and maintenance plans for a power generation installation In order to provide an operation and maintenance planning aiding system for a power generation installation which prepares an operation plan for a plurality of power generation units by making use of actual plant data and based on a total judgement including a varie... | 02/08/2005 |
| 6847916 | Method and system for monitoring, controlling, and locating portable devices performing remote diagnostic analysis of control network A system and method for monitoring, diagnosing and/or testing a control network using portable, wireless equipment includes computerized display device connected to a wireless intermediary device for allowing a wireless connection to be made to a control network. Th... | 01/25/2005 |
| 6847909 | System and method for generating a shmoo plot by tracking the edge of the passing region One embodiment comprises testing an electrical device using a combination of values of first and second parameters corresponding to a selected operating point comprising an origin of an R, θ polar coordinate plane; if the electrical device is determined to function... | 01/25/2005 |
| 6834259 | Guard tour system The guard tour system of the present invention is comprised of a central computer which runs a computer program that enables a variety of electronic hardware components to function as the guard tour system. As a guard progresses through a guard tour, he or she uses ... | 12/21/2004 |
| 6823280 | Control system simulation, testing, and operator training A requirements database and test generator generates tests for functional and field testing and generates requirements documentation, user manuals, operational procedures, instrument data sheets, instrument indices, instrument loop diagrams, validation reports, and ... | 11/23/2004 |
| 6810718 | Apparatus and method for fluid analysis The present invention is an apparatus and method for analyzing a fluid used in a machine or in an industrial process line. The apparatus has at least one meter placed proximate the machine or process line and in contact with the machine or process fluid for measurin... | 11/02/2004 |
| 6795788 | Method and apparatus for discovery of operational boundaries for shmoo tests Method and apparatus for discovery of operational boundaries for shmoo tests. Specifically, a method of testing operational boundaries is described in one embodiment of the present invention. The method discloses the discovery of an operational range for a hardware ... | 09/21/2004 |
| 6792373 | Methods and apparatus for semiconductor testing A method and apparatus for testing semiconductors according to various aspects of the present invention comprises a test system comprising an outlier identification element configured to identify significant data in a set of test results. The test system may be conf... | 09/14/2004 |
| 6789036 | Microelectronic transient power generator for power system validation A transient current generator for testing microelectronic power regulator systems is provided. The current generator includes a current source and one or more transistors to provide current or sink current to a microelectronic power delivery system. The generator ma... | 09/07/2004 |
| 6785629 | Accuracy determination in bit line voltage measurements A method and circuit for determining the accuracy of a measurement of a bit line voltage or a charge distribution for readout from FeRAM cells uses sense amplifiers to compare a bit line voltage to a series of reference voltages and then determines upper and lower l... | 08/31/2004 |
| 6772081 | Priority system and method for processing standardized tests Systems and methods are provided for prioritizing the processing of standardized tests. One aspect of the present subject matter relates to a method for processing completed standardized tests. In one embodiment, test-processing priority information is received, and... | 08/03/2004 |
| 6772097 | Retrieving I/O processor performance monitor data An embodiment includes retrieving performance monitor data from an I/O processor. A performance monitoring driver coupled to a performance monitoring unit may be registered as a private driver with a real time operating system of the I/O processor. Events within the... | 08/03/2004 |
| 6766265 | Processing tester information by trellising in integrated circuit technology development A method for processing tester information is provided. The number of clusters of data in the tester information is determined to determine the number of data clusters. A basis is determined from the tester information to be used for plotting the data clusters. The ... | 07/20/2004 |
| 6760684 | Method and mechanism for profiling a system Disclosed is a method and mechanism for sizing a hardware system for a software workload. An aspect is directed to modeling a workload into a set of generic system activities, in which the generic system activities are not directly tied to a specific hardware platfo... | 07/06/2004 |
| 6754602 | Wireless emergency lighting system A wireless emergency lighting system for a structural object such as a transportation vehicle. The system includes a multiplicity of discrete wireless emergency lighting assemblies installed in the transportation vehicle at spaced apart locations for assisting passe... | 06/22/2004 |
| 6748338 | Method and apparatus for testing eye diagram characteristics The present invention discloses a method and apparatus for testing eye diagram characteristics. The present invention does not utilize a RF analyst used in prior art. On the contrary, the present invention directly sends a precondition from a mainframe to a chip und... | 06/08/2004 |
| 6745144 | Circuit arrangement for a motor vehicle On a circuit arrangement for a motor vehicle that is equipped with a multitude of functional modules, which are connected with a joint gateway via at least two bus systems, the gateway is equipped with a receiving channel and a transmitting channel, respectively, fo... | 06/01/2004 |
| 6741951 | Method for performing a hazard review and safety analysis of a product or system A method for analyzing a system for safety to personnel or other systems is disclosed comprising: identifying at least one operating parameter of a first subcomponent of said product; identifying an inherent hazard of said first subcomponents based on an analysis of... | 05/25/2004 |
| 6741944 | Electron density measurement and plasma process control system using a microwave oscillator locked to an open resonator containing the plasma A system for measuring plasma electon densities (e.g., in the range of 1010 to 1012 cm−3) and for controlling a plasma generator (240). Measurement of the plasma density is essential if plasma-assisted processes, such deposi... | 05/25/2004 |
