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Class 700/51 - Statistical process control (SPC)


Subclass of Class 700 - Data processing: generic control systems or specific applications
Definition: Subject matter which monitors the performance of a process
No. of patents: 167
Last issue date: 03/13/2012


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NumberTitleIssue Date
8135481Process plant monitoring based on multivariate statistical analysis and on-line process simulation
Disclosed are systems and methods for on-line monitoring of operation of a process in connection with process measurements indicative of the operation of the process. In some cases, the operation of the process is simulated to generate model data indicative of a sim...
03/13/2012
7912562System, device and method for comprehensive input/output interface between process or machine transducers and controlling device or system
Comprehensive universal configurable interface for electrical, electronic, and electromechanical control, sensing, and actuation. Circuit, apparatus, method, and signal set for interfacing an electrical or electronic component or a mechanical component generating or...
03/22/2011
7853339Statistical signatures used with multivariate analysis for steady-state detection in a process
Methods and systems to detect steady-state operations in a process of a process plant include collecting process data. The collected process data is generated from a plurality of process variables of the process. A multivariate statistical model of the operation of ...
12/14/2010
7818074Methods to select golden devices for device model extractions
Methods for selecting one or more golden devices on a golden wafer that exhibit a smooth length and width scaling behavior. Test devices of differing geometry and carried on different chips of the golden wafer are screened with single point measurements of electrica...
10/19/2010
7720553Service metric portfolio management
A system and method is disclosed for the automated real-time collection, extraction, transformation, analysis and presentation of statistical process control (SPC) information. One or more monitored systems or processes generate operational process control informati...
05/18/2010
7689298Methods to support process quality and maintenance during control of an industrial process such as welding
A number of methods to support process quality and maintenance during control of an industrial process such as welding are provided. The methods provide, among other things: automatic process limit programming based on runtime data; user-initiated process limit prog...
03/30/2010
7660640Apparatus and method for predictive control of a power generation system
A method for controlling a power system control area according to a first and a second control performance standard, wherein operation of the control area determines area control parameter values. The method comprises (a) determining a first compliance target for th...
02/09/2010
7657333Adjustment of data collection rate based on anomaly detection
Systems and methods that vary multiple data sampling rates, to collect sets of data with different levels of granularity for an industrial system. The data for such industrial system includes sets of data from the “internal” data stream(s) (e.g., history data co...
02/02/2010
7444263Performance metric collection and automated analysis
A metric monitoring and analysis system including dynamic sampling agents located in monitored system elements and a service management platform. Each sampling agent includes a data adapter collecting metric data in a common format, a threshold generator for determi...
10/28/2008
7433758Control apparatus of robot
A robot control apparatus capable of largely reducing a calculation amount to be capable of lowering a load of a CPU is provided. A control apparatus of a robot includes: a plurality of shafts interfering with each other; each of the shafts including a motor (8
10/07/2008
7400933SISO model predictive controller
A method of predictive control for a single input, single output (SISO) system, including modeling the SISO system with model factors, detecting output from the SISO system, estimating a filtered disturbance from the output, determining a steady state target state f...
07/15/2008
7395131Method for processing data based on the data context
A method for managing collected data in a semiconductor processing environment. The collected data can include: raw data collected during a process, trace file data received during a process, and process log file data received during a process. The raw data is synch...
07/01/2008
7392165Simulation system for multi-node process control systems
A simulation system attaches to a configuration database for one or more fully configured nodes of a process control system and copies the modules within those nodes into one or more simulation computers as simulation modules. The simulation system includes an algor...
06/24/2008
7363193Safety management system and method
A safety management system includes a processor and memory in which a safety database is maintained. The safety management system receives safety data from one or more portable devices and/or computers, and the system stores this safety data in the database. When a ...
04/22/2008
7363204Process for developing an agent-based control system for an industrial flexible production system
The invention relates to a process for developing an agent-based, preferably a multi-agent-based, control system (SS) for an industrial flexible production system (PS). To simplify implementation of a control system for a flexible production system, it is provided t...
04/22/2008
7349753Adjusting manufacturing process control parameter using updated process threshold derived from uncontrollable error
A method, system and medium are provided for enabling improved feedback and feedforward control. An error, or deviation from target result, is observed during manufacture of semi conductor chips. The error within standard deviation is caused by two components: a whi...
03/25/2008
7346412Manufacturing method of semiconductor integrated circuit device
The invention intends to provide a manufacturing method of a semiconductor integrated circuit device, which can detect an off-specification faulty wafer in real time. An abnormality detection server stores apparatus log data outputted from semiconductor manufacturin...
03/18/2008
7346401Systems and methods for providing constrained optimization using adaptive regulatory control
Systems and methods are provided for optimizing the performance and/or allocation of constrained resources in a dynamic computing environment using adaptive regulatory control methods. For example, systems and methods for providing constrained optimization in a dyna...
03/18/2008
7340318Method and apparatus for assessing controller performance
A method includes providing a process controller for controlling a process tool. The process tool is controlled in accordance with a process parameter. Measurements associated with the processing parameter for a plurality of runs of the process tool are accessed. A ...
03/04/2008
7321846Two-wire process control loop diagnostics
A diagnostic device for coupling to a process control loop includes digital communication circuitry configured to receive a digital communication signal from the process control loop. The digital communication signal is a digitally modulated analog signal on the pro...
01/22/2008
7310560Numerically controlled drive device with device for detecting operating anomalies intended for detecting accidental collisions and method of detecting operating anomalies for this device
A drive device for a load (18a) comprises a device for detecting accidental collisions with a motor (14a), a first, respectively a second position sensor (15a, 16a) disposed upstream, respectively downstream of...
12/18/2007
7310566Quality control method for two-dimensional matrix codes on metallic workpieces, using an image processing device
A quality control method for two-dimensional matrix codes on metallic workpieces, the codes being in the form of stamped marking dots is disclosed. The stamping process for the marking dots is carried out by a marking tool (17) with the aid of predetermined d...
12/18/2007
7305028Methods and system for equalizing data
A method for equalizing data and systems utilizing the method. The method of this invention for equalizing (by shortening the channel response) data includes minimizing a function of the data and a number of equalizer characteristic parameters, where the function ut...
12/04/2007
7296103Method and system for dynamically selecting wafer lots for metrology processing
The present invention is generally directed to various methods and systems for dynamically controlling metrology work in progress. In one illustrative embodiment, the method comprises providing a metrology control unit that is adapted to control metrology work flow ...
11/13/2007
7290450Process diagnostics
A diagnostic device for use in a industrial process includes monitoring electronics or diagnostic circuitry configured to diagnose or identify a condition or other occurrence in the industrial process. The system can be implemented in a process device such as a flow...
11/06/2007
7272544Integrated modeling through symbolic manipulation
Integrated modeling and symbolic manipulation is leveraged for the derivation, construction, maintenance, and reuse of application-independent models. Related models created for different applications share a common ancestry and maintain model consistency while enab...
09/18/2007
7254518Pressure transmitter with diagnostics
In one embodiment, a pressure transmitter is provided which diagnoses the condition of a primary element and/or an impulse line which connects to a pressure sensor. A difference circuit coupled to the pressure sensor has a difference output which represents the sens...
08/07/2007
7250858Automated identification of anomalous conditions in supply chain processes
A product supply chain may be viewed not just as a series of discrete, unrelated shipment transactions, but as a “process” (or pipeline) that can be subject to statistical process control. The present invention is directed to novel systems and methods for collec...
07/31/2007
7243042Engine component life monitoring system and method for determining remaining useful component life
The claimed invention is a method for determining a relationship between a metal temperature of a turbine component and an operating condition of a turbine housing the component. The claimed invention is also a method for determining consumed operating life for a tu...
07/10/2007
7239399Pick and place machine with component placement inspection
Improved component placement inspection and verification is performed by a pick and place machine. Improvements include stereovision imaging of the intended placement location; enhanced illumination to facilitate the provision of relatively high-power illumination i...
07/03/2007
7239977Method and system for systematic evaluation of evaluation parameters of technical operational equipment
A method and system for the systematic evaluation and rating of technical equipment using a data processing device (20), which works together with at least one data memory (21) and has an input (22) and display device (23), in which, step...
07/03/2007
7233886Adaptive modeling of changed states in predictive condition monitoring
An improved empirical model-based surveillance or control system for monitoring or controlling a process or machine provides adaptation of the empirical model in response to new operational states that are deemed normal or non-exceptional for the process or machine....
06/19/2007
7231267Implementing production processes
In the implementation of a production process, event data corresponding to a parent event that has triggered an executable business process that has failed is logged. The event data is displayed to a user. Responsive to input from the user, a child event based on th...
06/12/2007
7225039Control system for semiconductor processing apparatus
A control system for a semiconductor processing apparatus comprises a control server connected to a semiconductor processing apparatus, a verification server connected to the control server, and a database connected to the verification server. The verification serve...
05/29/2007
7225051Closed-loop feedback for maximizing Cpk in progressive forming operations
A method and system for maximizing process capability in a progressive forming operation. The method compensates for deviations introduced by unformed components, and uses closed loop feedback to compensate for deviations introduced by forming tools. Fiducial featur...
05/29/2007
7221988Creation and display of indices within a process plant
A process control system uses an asset utilization expert to collect data or information pertaining to the assets of a process plant from various sources or functional areas of the plant including, for example, the process control functional areas, the maintenance f...
05/22/2007
7212940Transmitter and transmitter testing method
A transmitter and a method for testing the transmitter which allow easy testing for a failure in the detection processing unit thereof, thereby reducing required manpower and cost, are provided. The transmitter is provided with a detection processing unit for detect...
05/01/2007
7209793Automated closed loop step testing of process units
A multivariable process controller controls a chemical, polymer or other physical process. Slow tuning and over-conservative controlled variable values are employed during step testing. While all controlled process variables are within safe limits, only one manipula...
04/24/2007
7209859Method and apparatus for sequentially collecting and analyzing real time data with interactive monitoring
A system, comprising a plurality of slave devices collecting real time data from process stations, a master device receiving the collected data from the plurality of slave devices, wherein the master device polls the plurality of slave devices in a predetermined ord...
04/24/2007
7200457Component and material traceability control apparatus, control method, control program, and control program memory medium
The present invention is related to a component and material traceability control apparatus for controlling manufacturing lot identification information of any of a component and material constituting a product manufactured according to a process where a manufacturi...
04/03/2007
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