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Class 700/109 - Quality control


Subclass of Class 700 - Data processing: generic control systems or specific applications
Definition: Subject matter wherein the data processing system or calculating
No. of patents: 431
Last issue date: 12/13/2011


1                      
NumberTitleIssue Date
8078303Electronic supervisor
Electronic supervision may be provided. First, a stock number may be sent to a database server. The stock number may correspond to a product comprising, for example, an electrical cable. In response to sending the database server the stock number, specification info...
12/13/2011
8055372Processing system, processing method, and computer program
The present invention provides a processing system, a processing method and a program, which can readily control a gas flow rate. A vertical-type heating apparatus 1 includes a plurality of gas supply pipes 16 to 20 each adapted for supplying a ...
11/08/2011
8032244Method and system for concrete quality control based on the concrete's maturity
A method and system for controlling and monitoring the quality of concrete based on the concrete's maturity (which is a function of its time-temperature profile, or temperature history). Five different applications or embodiments of the present invention are discuss...
10/04/2011
7930053Virtual platform to facilitate automated production
A method of automating validation in a manufacturing facility is disclosed. The method comprises defining requirements, selecting and integrating automated devices for manufacturing. A hub-box with communication links is used to integrate the automated devices. The ...
04/19/2011
7917240Univariate method for monitoring and analysis of multivariate data
A method and system of monitoring multivariate process data in a process plant, where the multivariate process data comprises a plurality of process variables each having a plurality of observations, includes defining each process variable as a process variable vect...
03/29/2011
7899567Method and program for selecting product to be inspected
An inspection-required product selection method and program for minimizing the number of investigation steps at the time of a defect occurrence for a product placed on the market are disclosed. A combination of product lots to be inspected is assumed based on the in...
03/01/2011
7869894Method and system for advanced process control using a combination of weighted relative bias values
By directly using relative biases, contained in the relative bias date matrix, and by appropriately weighting the components thereof, sampling rate limitations in an APC control scheme may be efficiently compensated for. In particular embodiments, an age-based weigh...
01/11/2011
7840298Method and system for advanced process control using measurement uncertainty as control input
By taking into consideration the measurement uncertainties in the form of standard errors, the performance of APC controllers may be efficiently enhanced by using the standard errors as a control input. For example, the filter parameter of an EWMA filter may be effi...
11/23/2010
7826915System and method for providing automatic qualification intervention in a manufacturing process
A system and method is disclosed for providing automatic qualification intervention in a manufacturing process that is performed by a plurality of components. At least one qualification process is associated with each of the components. The qualification processes a...
11/02/2010
7809459Advanced-process-control system utilizing a lambda tuner
An advanced process control (APC) system. The APC system comprises a database for receiving process data from a measurement tool for a plurality of process runs and for storing the process data. A lambda tuner determines a tuned-lambda value corresponding to a proce...
10/05/2010
7805211System and method for correcting quality problems
A system for correcting quality problems includes a server (1), a database (2), and a plurality of client terminals (4) connected to the server through a network (3). The database stores data used or generated in utilizing the system. Eac...
09/28/2010
7761180Method and system for monitoring batch product manufacturing
A system and method for monitoring product through a batch manufacturing plant is provided. The system includes, a parallel flow mode when product flows concurrently from at least two units to a single unit; and a serial flow mode where product flows from one unit t...
07/20/2010
7738986Method and apparatus for compensating metrology data for site bias prior to filtering
A method includes acquiring metrology data associated with a process. Bias information associated with the process is determined. The metrology data is adjusted based on the bias information to generate bias-adjusted metrology data. The bias-adjusted metrology data ...
06/15/2010
7702412System and method for controlling product quality
A computer-based method for controlling product quality is disclosed. The method includes the steps of: detecting whether a quality of raw materials bought from at least one supplier are acceptable; detecting whether a quality of using materials used at a processing...
04/20/2010
7636609Method and apparatus for detecting abnormal characteristic values capable of suppressing detection of normal characteristic values
In a method for detecting abnormal characteristic values of a plurality of products sequentially manufactured in the same manufacturing line, it is determined whether or not a successive-decrease (or increase) tendency has occurred in a plurality of sequentially-obt...
12/22/2009
7590465Method and apparatus for detecting abnormal characteristic values capable of suppressing detection of normal characteristic values
In a method for detecting abnormal characteristic values of at least three products sequentially manufactured in the same manufacturing line, it is determined whether or not a successively-alternate increase/decrease tendency has occurred in a plurality of sequentia...
09/15/2009
7580768Method of adjusting process variables in a processing flow
A method of adjusting process variables in a processing flow is disclosed. Processed samples are tested to determine sample parameters of the tested samples. The sample parameters are analyzed analyzing in relation to the process variables applied in the processing ...
08/25/2009
7561937Automated sputtering target production
A system and method are provided for manufacturing workpieces, such as metal articles like sputtering target, the system comprising: comparing one or more physical or chemical values of a respective one of a plurality of metal target blanks to one or more comparable...
07/14/2009
7502658Methods of fabricating optimization involving process sequence analysis
An exemplary method for performing fabrication sequence analysis, the method comprising, defining a process group, wherein a process group includes fabrication processes in a fabrication sequence, determining fabrication process paths in the process group to define ...
03/10/2009
7496421Method and apparatus for order control in a production process for a fiber product
The invention relates to a method and an apparatus for order control in a production process for a fiber product. In this case, at least one primary product is provided and processed further to form the fiber product, the processing steps of the further processing b...
02/24/2009
7463941Quality control system, quality control method, and method of lot-to-lot wafer processing
A quality control system has: a QC value storage unit, a data acquisition device, a device internal information storage unit, a recipe storage unit, a QC value prediction unit, a wafer determination unit, a recipe selection unit, and a measurement device. ...
12/09/2008
7457679Solid model of statistical process control
A computer based proactive process control technique used to predict the capability of a manufacturing process. A solid model of statistical process control is created by a computer program to simulate the Bell Curve of the data or the data with in +/−3 standard d...
11/25/2008
7444196Optimized characterization of wafers structures for optical metrology
A patterned structure in a wafer is created using one or more fabrication treatment processes. The patterned structure has a treated and an untreated portion. One or more diffraction sensitivity enhancement techniques are applied to the structure, the one or more di...
10/28/2008
7444197Methods, systems, and software program for validation and monitoring of pharmaceutical manufacturing processes
Methods, systems, and software program for validation of pharmaceutical manufacturing processes and quality assurance process are described and disclosed herein. Consequently, the methods provide a means to perform validation on an integrated level whereby the quali...
10/28/2008
7433751Sorting a group of integrated circuit devices for those devices requiring special testing
A method for sorting integrated circuit (IC) devices of the type having a fuse identification (ID) into those devices requiring enhanced reliability testing and those requiring standard testing includes storing fabrication deviation data, probe data, and test data i...
10/07/2008
7424336Test data analyzing system and test data analyzing program
Disclosed is a test data analyzing method and system for use in estimation of a defect cause of a product, such as, an integrated circuit, a liquid crystal display, an optical transceiver, a thin film magnetic head, etc., which is fabricated through plural processes...
09/09/2008
7419271Manufacturing method for fine structure element, fine structure element manufactured by the method, spatial light modulator, and projector
Aspects of the invention can provide a manufacturing method for fine structure elements having a first flat portion forming step of forming an upper flat surface serving as a first flat portion on a substrate with a flat cutting tool serving as a cutting section a s...
09/02/2008
7412297Method and system for designing and manufacturing lens modules
A method for designing and manufacturing lens modules includes selecting design parameters from a design database stored with the design parameters suitable for a lens module desired to be manufactured to design the lens module according to characteristics of the le...
08/12/2008
7409306System and method for estimating reliability of components for testing and quality optimization
A system and method for determining the early life reliability of an electronic component, including classifying the electronic component based on an initial determination of a number of fatal defects, and estimating a probability of latent defects present in the el...
08/05/2008
7403834Methods of and apparatuses for controlling process profiles
Presented are methods and apparatus for controlling the processing of a substrate during a process step that is sensitive to one or more process conditions. One embodiment includes a method performed with corresponding apparatus that includes a controller. One step ...
07/22/2008
7404167Method for improving design window
A method of forming photo masks having rectangular patterns and a method for forming a semiconductor structure using the photo masks is provided. The method for forming the photo masks includes determining a minimum spacing and identifying vertical conductive featur...
07/22/2008
7403832Method and system for advanced process control including tool dependent machine constants
A controller and a method of controlling a process tool is provided, in which machine constants used for calibrating manipulated variables of the control algorithm are explicitly introduced into the process model, thereby providing an enhanced controller behavior im...
07/22/2008
7401004System for reviewing defects, a computer implemented method for reviewing defects, and a method for fabricating electronic devices
A system for reviewing defects includes an analysis module configured to analyze defect information of a plurality of intermediate products, the defect information including information of an amount of defects classified by sizes of the defects existing in each of t...
07/15/2008
7398131Method and system for concrete quality control based on the concrete's maturity
Method and system for controlling and monitoring the quality of concrete based on the concrete's maturity. Various embodiments of the present invention are discussed. First, Enhanced Maturity involves a maturity calibration method to account for the water-to-cementi...
07/08/2008
7395122Data capture for electronically delivered automation services
Content is generated on a host system based on real-time data from a controlled process collected over an internet from a customer's client machine tool control system. The real-time data is captured from the client machine tool by downloading software that manipula...
07/01/2008
7392107Methods of integrating computer products with pharmaceutical manufacturing hardware systems
Methods of integrating computer products with pharmaceutical manufacturing hardware systems are described and disclosed herein. Consequently, the methods provide a means to perform validation and quality control on an integrated level whereby a pharmaceutical manufa...
06/24/2008
7383156Apparatus for inspecting wafer surface, method for inspecting wafer surface, apparatus for judging defective wafer, method for judging defective wafer, and apparatus for processing information on wafer surface
It is possible to inspect scratches and staining on a wafer surface on the basis of an LPD map obtained from a particle counter 11, by providing a means 21 for detecting aggregation of clustered point defects (LPD) from two-dimensional distribution inf...
06/03/2008
7373216Method and apparatus for verifying a site-dependent wafer
The present invention includes a method of verifying a Site-Dependent (S-D) wafer that includes receiving a first set of S-D wafers by one or more S-D processing elements in one or more processing subsystems, creating a first set of unverified S-D wafers by performi...
05/13/2008
7369908Method for manufacturing product formed with a plurality of parts and method for combining parts
A parts-combining method having high quality or yield for a product having a large number of parts. First entering an identification number group of nondefective completed products, a table of a product identification number group and a parts identification number g...
05/06/2008
7360701Managing maintenance of serviceable items based on unique identification labeling
A system and method for tracking and managing maintenance of serviceable items based on unique identification labeling affixed to the items is disclosed. The serviceable items are described as filters within a common environment that require routine maintenance to a...
04/22/2008
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