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Class 700/108 - Performance monitoring


Subclass of Class 700 - Data processing: generic control systems or specific applications
Definition: Subject matter wherein the data processing system or calculating
No. of patents: 998
Last issue date: 05/29/2012


          9            
NumberTitleIssue Date
7181654System and method for detecting an abnormal situation associated with a reactor
A system for detecting abnormal situations associated with a reactor in a process plant receives statistical data associated with pressure within a reactor vessel. For example, a pressure sensor device disposed at least partially within the reactor vessel may genera...
02/20/2007
7177718Semiconductor production system
A semiconductor production system has storage devices for storage of all kinds of information including, but not limited to, the information concerning semiconductor design and information as to semiconductor manufacture along with information relating to semiconduc...
02/13/2007
7177007Temperature adjustment apparatus, exposure apparatus having the temperature adjustment apparatus, and semiconductor device manufacturing method
An exposure apparatus including an illumination optical unit for irradiating exposure light, a stage for mounting a substrate and moving the substrate, a driving unit for driving the stage, a heater for applying heat to the stage, and a heat generation amount contro...
02/13/2007
7177715Remote maintenance method for generating maintenance charge information, industrial device, and semiconductor device
The present invention provides a remote maintenance method, a remote maintenance system, and an industrial device for enabling control and thorough services and billing according to the contents of the remote maintenance operation and the request destination of main...
02/13/2007
7174281Method for analyzing manufacturing data
A method of manufacturing, e.g., integrated circuits, and of managing a manufacturing process. Product unit (circuit) variation data is collected from clustered product units (wafer sites). Collected data is grouped according to a selected manufacturing parameter. E...
02/06/2007
7171454Method for providing real-time production information using in-situ web services embedded in electronic production equipment
Electronics assembly equipment 12 includes a controller 13 including computer readable medium having stored thereon, executable instructions defining at least one web service 10. The web service includes information relating to the equipment. Th...
01/30/2007
7171589Method and apparatus for determining the effects of temperature variations within a computer system
One embodiment of the present invention provides a system that facilitates determining the effects of a temperature variation in a computer system. The system operates by systematically varying the flow of a coolant through the computer system to produce a temperatu...
01/30/2007
7167768Board work system having provision for establishing operating environment suitable for operator, and process of establishing the suitable operating environment
A board work system operable by a plurality of operators assigned in turn to operate. The system includes (a) at least one device changeable to each one of a plurality of different modes; (b) a control device which controls the changeable device, and receives operat...
01/23/2007
7168075Automation device and updating method
A device used for control or monitoring of a process is updated without interruption or exceeding upper response time limits for response to a change in the state of the process. If the updating task requires too much run time, the updating task is terminated. As so...
01/23/2007
7162799Method for manufacturing an item
A method for notifying installers 14–22 of the existence, type, and location of a portion 26 of an item within an assembly line 10. The notification allows the installers 14–22 to respectively ensure that the components 40 whic...
01/16/2007
7162326Mask identification database server
The physical movement of reticles and solder bump masks within a wafer processing plant are continually tracked and documented in a historical database for the useful life of the reticles or masks. In an example embodiment of the mask tracking method, the method inc...
01/09/2007
7162516Information processing apparatus, information distribution apparatus, information processing system, network monitoring apparatus and network monitoring program
An information acquiring unit checks operation command information issued to the multiple information processing apparatuses over the network in order to understand the totality of the operation command information in the network. The state of utilization of each in...
01/09/2007
7162320Assembly line quality control
Disclosed herein is a method of controlling an assembly line, comprising the steps of providing an article assembly line; designating, on the assembly line, an upstream processing station and a downstream processing station; delivering a first article to the upstrea...
01/09/2007
7158858Method to determine when a media handling system configuration is valid and a media handling system arranged in accordance with the same method
A media handling system comprises a configuration of N linked modules. Each module has an order based on the module's linkage in the configuration. Thus, a first module of order 1 links to a second module of order 2, the second module links to a third module of orde...
01/02/2007
7158919Remote monitoring system
A remote monitoring system including a sub-system, local to a nuclear power plant and a remote sub-system at an operations base. Process data is collected manually by a hand-held computer and automatically by instrumentation on the power plant. The data collected is...
01/02/2007
7158848Process monitoring device for sample processing apparatus and control method of sample processing apparatus
A plasma processing apparatus for processing a sample within a vacuum vessel, including: a plurality of sensors for detecting plural kinds of information relating to a processing state of the sample as monitor data; data selecting means for selecting a detection tim...
01/02/2007
7155450Plant information management system
In a plant information management system (PIMS, 1), data received from a process device (PCC, 10) is cached by a data logger (2) in blocks. A database controller (4) receives, for each data event, a time string, a value string, and a data...
12/26/2006
7151975System and method for monitoring wafer furnace production efficiency
A system for monitoring wafer throughput per hour in a wafer furnace includes a database, an analysis unit, a comparison unit, and an output unit. The database includes two or more operation histories of the wafer furnace. The analysis unit is coupled to the databas...
12/19/2006
7151976Multivariate control of semiconductor processes
A method for detecting a fault condition of a manufacturing process involving acquiring data and developing a model based on a plurality of manufacturing related variables for a plurality of outputs of a manufacturing process. The method also involves identifying wh...
12/19/2006
7152005System for aiding the preparation of operation and maintenance plans for a power generation installation
In order to provide an operation and maintenance planning aiding system for a power generation installation which prepares an operation plan for a plurality of power generation units by making use of actual plant data and based on a total judgment including a variet...
12/19/2006
7152170Simultaneous multi-threading processor circuits and computer program products configured to operate at different performance levels based on a number of operating threads and methods of operating
Processing circuits that are associated with the operation of threads in an SMT processor can be configured to operate at different performance levels based on a number of threads currently operated by the SMT processor. For example, in some embodiments according to...
12/19/2006
7152188Circuit arrangement for protected data transmission, particularly in ring-shaped bus systems
The present circuit arrangement allows data, which are necessary for building up fault-tolerant structures, to be transmitted on standard ring-shaped bus systems. Its implementation requires a monitoring unit and input and output units which transmit or receive data...
12/19/2006
7152212Automated methods and systems for analyzing data associated with an industrial process
Automated methods and systems for analyzing data associated with an industrial process parse data entries received from devices in an industrial process, such as a mail or paper processing system. The parsing can include applying state machines to the data to identi...
12/19/2006
7149657Method, system and computer product for estimating a remaining equipment life
A method, system and computer product for estimating a remaining equipment life is provided. Data are collected relating to the parameters. The data are stored and integrated. Then, the remaining equipment life is estimated using the integrated data. ...
12/12/2006
7149604Method and system for backing up programmable logic controllers over network
A manufacturing facility includes a plurality of programmable logic controllers that contain operating programs and process parameters. The programmable logic controllers are connected to a network such that the operating programs and process parameters from the pro...
12/12/2006
7149643Integrated process condition sensing wafer and data analysis system
A process condition measuring device and a handling system may be highly integrated with a production environment where the dimensions of the process condition measuring device are close to those of a production substrate and the handling system is similar to a subs...
12/12/2006
7148973Position detecting method and apparatus, exposure apparatus and device manufacturing method
A method of determining relative position between a reflective reticle and a substrate includes a detection step of detecting relative position between a transmissive reference mark on a reticle stage and a substrate alignment mark on a substrate stage through a ref...
12/12/2006
7149598Process-oriented modulized plant for TFT-LCD fabrication
A process-oriented modulized plant for TFT-LCD fabrication capable of preventing cross contaminations is proposed. A plant includes a plurality of independent fabs and warehouses connected between the fabs. Each independent fab can carry out at least one TFT-LCD pro...
12/12/2006
7146235Manufacturing system and controller, controlling method, controlling system, and control program for the manufacturing system
An inkjet manufacturing device 2 includes a discharger 10 for discharging a liquid material onto anything onto which the liquid material is to be discharged, a communication section 22 for transmitting and receiving data through a communication ...
12/05/2006
7146237Controller and method to mediate data collection from smart sensors for fab applications
The present invention relates to control of and data collection from sensors associated with tools. In particular, it relates to using a controller to mediate communications among a tool, sensors associated with the tool and data users, such as a host system or dist...
12/05/2006
7142940Method of processing semiconductor wafer
A method of processing a semiconductor wafer is provided. The semiconductor wafer is processed with a first process. After collecting the measured data that reflects the deviation of each part within the semiconductor wafer, the semiconductor wafer is processed with...
11/28/2006
7143316Fault diagnosis in a network
A fault manifested in a network between two network nodes is investigated by selecting highest probability failure modes of resources which form network pathways between the two nodes, and probing the network to establish whether any of the highest probability failu...
11/28/2006
7141998Method and apparatus for burn-in optimization
The present invention provides a method and apparatus for optimizing the burn-in of integrated circuits. One embodiment of the method comprises: performing a first portion of the burn-in process of the integrated circuit; monitoring a power dissipation of the integr...
11/28/2006
7142106System and method of visualizing network layout and performance characteristics in a wireless network
A system for visually detailing the layout of a wireless network and for providing performance statistics regarding the network. Graphical diagrams are generated in accordance with a request wherein the diagrams illustrate nodes and data collectors in the wireless n...
11/28/2006
7142107Wireless sensor unit
A low cost, robust, wireless sensor that provides an extended period of operability without maintenance is described. The wireless sensors are configured to communicate with a base unit or repeater. When the sensor unit detects an anomalous ambient condition (e.g., ...
11/28/2006
7139629Planning and scheduling for failure recovery system and method
A computer controlled system provides for configuration-specific recovery of operation in a reconfigurable production system having a plurality of modules with a plurality of alternative capabilities for processing work units. The system includes a system controller...
11/21/2006
7139630Allocating manufactured devices according to customer specifications
A method and system sorts manufactured integrated circuit devices by evaluating performance characteristics of the manufactured integrated circuit devices. All of the integrated circuit devices are manufactured using an identical design, and differences in the perfo...
11/21/2006
7139627Calibration of plural processing systems
Plural processing apparatuses 3 such as CVD apparatuses 31 and diffusion apparatuses 33, measuring apparatuses 5, and a control computer 7 for management are connected through a LAN 9. Each processing apparatuses 3 st...
11/21/2006
7136717Method and device for the control of a rotary tablet forming machine
A method and a device controls a rotary tablet forming machine having a rotor. The rotor is capable of being rotated by a drive unit. The rotor includes at least one matrix with allocated upper punches and lower punches and a pressing force, to act on the press mass...
11/14/2006
7133794Simulator cart
Methods and apparatus are provided which allow control systems to be tested. Specifically, a test system is coupled to a control system in a manner which allows the test system to communicate with and drive the control system by sending and receiving signals via bot...
11/07/2006
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