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| Number | Title | Issue Date |
| 7715937 | Allocating manufactured devices according to customer specifications A method and system sorts manufactured integrated circuit devices by evaluating performance characteristics of the manufactured integrated circuit devices. All of the integrated circuit devices are manufactured using an identical design, and differences in the perfo... | 05/11/2010 |
| 7698011 | Operating condition monitoring apparatus, method for monitoring operating condition and program An operating condition monitoring apparatus includes a load-time information acquisition unit 203 obtaining load-time information, of one or more production apparatuses 11, concerning load time allocated to production within a predetermined period, an ... | 04/13/2010 |
| 7680553 | Methods of interfacing nanomaterials for the monitoring and execution of pharmaceutical manufacturing processes Methods of interfacing nanomaterials used to monitor and execute the pharmaceutical manufacturing process are disclosed herein. The nanomaterials are useful to provide a plurality of analysis to the manufacturing process. Consequently, the methods provide a means to... | 03/16/2010 |
| 7676294 | Visualization of workflow in an industrial automation environment A visualization system that generates a visualization of manufacturing operations and corresponding workflow is provided. An interface component receives input concerning displayed objects and information. A context component can detect, infer or determine context i... | 03/09/2010 |
| 7650198 | Automation system unified data access for disparate data sources Historical and real-time data access is leveraged to provide unified data access for interacting with manufacturing process entities such as, for example, process overview displays, charting systems, reporting systems, logging systems, and/or recipe systems and the ... | 01/19/2010 |
| 7647131 | Dynamic determination of sampling rates A system that facilitates determination of a sampling rate to utilize in connection with sampling data in an industrial environment comprises a receiver component that receives data from an I/O port of a controller. An analysis component automatically and dynamicall... | 01/12/2010 |
| 7636608 | Method for dynamic sensor configuration and runtime execution Graphical User Interfaces (GUIs) are presented for configuring and setting-up dynamic sensors for monitoring tool and process performance in a semiconductor processing system. The semiconductor processing system includes a number of processing tools, a number of pro... | 12/22/2009 |
| 7630786 | Manufacturing process end point detection A method for identifying a predetermined state of a manufacturing process by monitoring the process which involves, monitoring a plurality of variables that vary in value during the manufacturing process. The method also involves mapping as points in a hyperspace th... | 12/08/2009 |
| 7610113 | Operational control system and a system providing for remote monitoring of a manufacturing device A system and method for providing operational control and/or remote monitoring of a manufacturing device as in a foam dispenser device such as a foam-in-bag dispensing device. In architecture, the remote monitoring system includes a server device containing a remote... | 10/27/2009 |
| 7603194 | Fabrication system and fabrication method A fabricating method for a system that includes a plurality of processing apparatuses connected to each other by an inter-apparatus transporter and a computer storing managing information of processing and transporting of semiconductor wafers. The processing apparat... | 10/13/2009 |
| 7599755 | System and method for dynamically simulating value stream and network maps A computer readable medium comprising instructions which when executed by a computer system causes the computer to implement a method for creating a dynamic value network map of a process flow is provided. For a plurality of processed objects, the method identifies ... | 10/06/2009 |
| 7580767 | Methods of and apparatuses for maintenance, diagnosis, and optimization of processes One aspect of the present invention is a method of monitoring processes, optimizing processes, and diagnosing problems in the performance of a process tool for processing a workpiece. Another aspect of the present invention is a system configured for monitoring proc... | 08/25/2009 |
| 7558642 | Method, apparatus, and product for optimizing manufacturing tests by integrating part and test objects in the same order configuration application A method, apparatus, and product are disclosed for optimizing manufacturing testing of a customized configuration of a product. A plurality of part objects are defined within an order configuration application. Each one of the part objects is associated with one of ... | 07/07/2009 |
| 7558641 | Recipe report card framework and methods thereof A computer-implemented method for performing recipe evaluation is provided. The computer-implemented method includes integrating a plurality of data sources into a single recipe report card framework. The recipe report card framework includes an editor for interacti... | 07/07/2009 |
| 7551976 | Industrial device receiving remote maintenance operation and outputting charge information The present invention provides a remote maintenance method, a remote maintenance system, and an industrial device for enabling control and thorough services and billing according to the contents of the remote maintenance operation and the request destination of main... | 06/23/2009 |
| 7548793 | On-line process specification adjusting and component disposing based on predictive model of component performance A disposition process involves a part proceeding through a sequence of fabrication steps. The process involves obtaining a specified parameter for the part at an individual fabrication step; measuring the specified parameter of the part at the individual fabrication... | 06/16/2009 |
| 7539552 | Method and apparatus for implementing a universal coordinate system for metrology data A method includes receiving a metrology report including metrology data collected by a metrology tool, position data associated with the metrology data, and context data associated with the metrology tool. A first coordinate system employed by the metrology tool is ... | 05/26/2009 |
| 7519446 | Manufacture condition setting system, manufacture condition setting method, control program, and computer-readable record medium recording control program therein A manufacture condition setting system includes a manufacture state acquisition unit to which static/dynamic conditions and a product quality in the case where the static/dynamic conditions do not change for, at least, a predetermined number of manufactured articles... | 04/14/2009 |
| 7505829 | System, method, and article of manufacture for determining a productivity rate of a manufacturing system A system, method, and article of manufacture for determining a productivity rate of a manufacturing system are provided. The manufacturing system has a first and second manufacturing cells. The first and second manufacturing cells has first and second machines, resp... | 03/17/2009 |
| 7493185 | Quality prognostics system and method for manufacturing processes A quality prognostics system and a quality prognostics method for predicting the product quality during manufacturing processes are disclosed, wherein the current production tool parameters sensed during the manufacturing process and several previous quality data co... | 02/17/2009 |
| 7483762 | Method of controlling parts processing stages, and program to control parts processing stages The present invention provides a parts processing stage control method and a parts processing stage controlling program by which the progress in parts processing can be instantly recognized. In accordance with the method and program of the present invention, a contr... | 01/27/2009 |
| 7477959 | Photoresist system A photoresist system is disclosed. A graphical user interface of the system allows an operator to initiate a bottle switching operation, among other operations. Barcode data of a photoresist bottle is obtained by an equipment server from a controller. Photoresist da... | 01/13/2009 |
| 7474933 | System and method for automating integration of semiconductor work in process updates WIP status updates, as received from semiconductor manufacturing suppliers, is converted to transactions. In one approach, supply chain events, for example lot splits, lot merges, and lot scrap, are identified based on previous lot statuses and current lot statuses ... | 01/06/2009 |
| 7451008 | Management method and system for device requiring maintenance A management method is provided for a removable device attached to an apparatus and to be removed for maintenance. Maintenance data for each removable device is stored in a data management unit. An identification code is given to each removable device. The identific... | 11/11/2008 |
| 7444196 | Optimized characterization of wafers structures for optical metrology A patterned structure in a wafer is created using one or more fabrication treatment processes. The patterned structure has a treated and an untreated portion. One or more diffraction sensitivity enhancement techniques are applied to the structure, the one or more di... | 10/28/2008 |
| 7444251 | Detecting and diagnosing faults in HVAC equipment A method and system detects and diagnoses faults in heating, ventilating and air conditioning (HVAC) equipment. Internal state variables of the HVAC equipment are measured under external driving conditions. Expected internal state variables are predicted for the HVA... | 10/28/2008 |
| 7441242 | Monitoring performance of a logically-partitioned computer A method, apparatus, system, and signal-bearing medium that in an embodiment collect a performance metric of a first partition in a logically-partitioned computer. If the difference between the performance metric and an expected performance metric exceeds a threshol... | 10/21/2008 |
| 7440812 | Component mounting apparatus, service providing device and servicing method A method for monitoring a mounting tact of a component mounting apparatus including a component supplier for supplying a component and a component holder for holding the component from the component supplying device and mounting the component onto a circuit board. T... | 10/21/2008 |
| 7440859 | Method for determining plasma characteristics Methods for determining characteristics of a plasma are provided. In one embodiment, a method for determining characteristics of a plasma includes obtaining metrics of a plasma at two different frequencies, and determining at least one characteristic of the plasma u... | 10/21/2008 |
| 7440870 | System for monitoring the quality of industrial processes and method therefrom The invention relates to a system for monitoring industrial processes, comprising sensor means for detecting one or more process quantities in at least one process station, acquisition and processing means operating on signals generated by the sensor means for obtai... | 10/21/2008 |
| 7437204 | Method and apparatus for monitoring host to tool communications An aspect of the present invention includes a method and device for listening to communications between processes and tools, recording report and report trigger definitions, matching reports from tools with the recorded definitions, and translating messages into a c... | 10/14/2008 |
| 7432115 | Test circuit, semiconductor product wafer having the test circuit, and method of monitoring manufacturing process using the test circuit A test circuit and a method of monitoring a manufacturing process of a semiconductor integrated circuit using the test circuit are provided. The test circuit comprises elements to be tested; a selection circuit for sequentially selecting at least one of the elements... | 10/07/2008 |
| 7433751 | Sorting a group of integrated circuit devices for those devices requiring special testing A method for sorting integrated circuit (IC) devices of the type having a fuse identification (ID) into those devices requiring enhanced reliability testing and those requiring standard testing includes storing fabrication deviation data, probe data, and test data i... | 10/07/2008 |
| 7433755 | Controlling the curing of a rubber compound A process for curing a natural or synthetic rubber compound under a plurality of curing conditions by: (1) obtaining time dependent data streams of dielectric or impedance values from a non-bridged impedance sensing circuit and a capacitor having the rubber compound... | 10/07/2008 |
| 7433890 | Method and apparatus for storing and retrieving data stored within an associated piece of equipment A method and apparatus that includes a storage device for securing data about an apparatus. The data is stored in a central location and can be accessed or written based upon privileges granted by a processor. ... | 10/07/2008 |
| 7428442 | Methods of performing path analysis on pharmaceutical manufacturing systems Methods of performing path analysis on pharmaceutical manufacturing systems are described and disclosed herein. Consequently, the methods provide a means to perform validation and quality control on an integrated level whereby a pharmaceutical manufacturer can ensur... | 09/23/2008 |
| 7426555 | Method, system, and storage medium for providing continuous communication between process equipment and an automated material handling system Exemplary embodiments of the invention include a method and system for providing continuous communication between passive equipment and active equipment. The method includes monitoring signals received from a passive equipment or active equipment. The signals relate... | 09/16/2008 |
| 7423288 | Technique for evaluating a fabrication of a die and wafer The fabrication of the wafer may be analyzed starting from when the wafer is in a partially fabricated state. The value of a specified performance parameter may be determined at a plurality of locations on an active area of a die of the wafer. The specified performa... | 09/09/2008 |
| 7424336 | Test data analyzing system and test data analyzing program Disclosed is a test data analyzing method and system for use in estimation of a defect cause of a product, such as, an integrated circuit, a liquid crystal display, an optical transceiver, a thin film magnetic head, etc., which is fabricated through plural processes... | 09/09/2008 |
| 7421357 | Inspection data analysis program, inspection tools, review apparatus and yield analysis apparatus An operation unit executes a process for calling to a main memory first data representative of a result of equipment QC applied to a production unit. A process for reading out to the main memory an amount of change in failure in accordance with particle numbers calc... | 09/02/2008 |
