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| Number | Title | Issue Date |
| 7098617 | Advanced programmable closed loop fan control method A fan control system and method that maintains the operating temperature of computer and electronic devices or components at about a predetermined control level to minimize power consumption and audible noise. The fan control system is a programmable closed loop sys... | 08/29/2006 |
| 7097351 | System of monitoring operating conditions of rotating equipment A monitoring system for rotating equipment includes detection of temperature conditions in various areas of the system including motor and pump bearings, mechanical seal environment including seal flush, seal cooler and seal reservoir and process fluid temperature. ... | 08/29/2006 |
| 7096468 | Programmer/feeder system task linking program A task linking program is provided for using a computer for interacting with on-line and off-line programming systems to perform tasks related to programming microdevices. The program is secure in being capable of being setup only in an administrator mode where micr... | 08/22/2006 |
| 7096294 | Method and computer program product for graphically providing interrupt request (IRQ) routing information A method and an associated computer program product are provided for obtaining interrupt requests (IRQ) routing information in a more efficient and intuitive manner. In this regard, a graphical representation of the routing of a plurality of IRQs capable of being as... | 08/22/2006 |
| 7096085 | Process control by distinguishing a white noise component of a process variance A method, system and medium is provided for enabling improved control systems. An error, or deviation from a target result, is observed for example during manufacture of semiconductor chips. The error within standard deviation is caused by two components: a white no... | 08/22/2006 |
| 7096082 | Design control document linking template A control document template streamlines the creation of control documents and facilitates consistent entry of data. A multi-page spreadsheet file incorporates the design and process failure mode effects analysis pages, the control plan, tools for forming the process... | 08/22/2006 |
| 7094292 | Mechanism for applying paint to canvas A mechanism and method for depositing oil paints, acrylics, or other textural paints provides a means for automating the process of painting a picture. The process can be programmed into a data base which is stored and used at will, or the artist can utilize control... | 08/22/2006 |
| 7096086 | Apparatus, method and program for generating a recipe for an inspection tool An apparatus for generating a recipe for an inspection tool includes an extracting module extracting recipe parameters to be set to the inspection tool from among a group of recipe, a recipe candidate generator generating recipe candidates by combining settings of r... | 08/22/2006 |
| 7092777 | Intelligent agent system and method for evaluating data integrity in process information databases A data integrity module and method for evaluating data in a process information database. A neural network generates statistical patterns for specifying patterns for the data being evaluated. A fuzzy expert rules base specifies rules for evaluating the data. A proce... | 08/15/2006 |
| 7092794 | Method and apparatus for connecting to HVAC device A system for remotely monitoring and controlling an HVAC device includes a server which receives queries from an entry device and data from the HVAC device. Databases with information regarding the location and status of the HVAC devices reside on the server, as doe... | 08/15/2006 |
| 7089077 | Monitor wafer purchase and controls database Controlling stocker capacity in an automated facility and controlling monitor budgets by capped releases, capped FOUP supplies, and wafer reuse methodology. A Database is used to order, track, and reclaim test (monitor) wafers in the FAB. The database automatically ... | 08/08/2006 |
| 7089075 | Systems and methods for metrology recipe and model generation Systems and methodologies are disclosed for generating setup information for use measuring process parameters associated with semiconductor devices. A system comprises an off-line measurement instrument to measure an unpatterned wafer and a setup information generat... | 08/08/2006 |
| 7085674 | Alarm management method and apparatus therefor An alarm management device includes: a data collection device for collecting alarm data generated by an apparatus to be managed; a database device for storing the collected alarm data; and an alarm statistic device for preparing alarm statistics using the stored ala... | 08/01/2006 |
| 7085623 | Method and system for using short ranged wireless enabled computers as a service tool A handheld device for use in a wireless environment to operate an apparatus is provided. The handheld device sends a request to an apparatus controller to initiate a maintenance sequence. The handheld device receives information from the apparatus controller to cont... | 08/01/2006 |
| 7085619 | Method for controlling an industrial process The invention relates to a method for controlling an industrial process for manufacturing or processing a product, in particular for controlling the cooling line of a hot-rolling mill, said cooling line being simulated by a physical model. To optimize the cooling pr... | 08/01/2006 |
| 7085615 | Dynamic on-line optimization of production processes A process is modeled by a dynamic model, handling time dependent relations between manipulated variables of different process sections (10A–D) and measured process output variables. Suggested input trajectories for manipulated variables for a subsequent tim... | 08/01/2006 |
| 7082441 | Method and storage and manipulation of storage system metrics A method for storage and manipulation of storage system metrics incorporates a self-describing format wherein each data file includes a header block that contains the description and order of the periodic data. The header block is followed by a data block in which t... | 07/25/2006 |
| 7082345 | Method, system and medium for process control for the matching of tools, chambers and/or other semiconductor-related entities The invention relates to a method, system and computer program useful for producing a product, such as a microelectronic device, for example in an assembly line, where the production facility includes parallel production of assembly lines of products on identically ... | 07/25/2006 |
| 7079911 | Method and system for automatically isolating suspect items in a manufacturing or assembly environment A computer-implemented method and system includes capabilities for receiving suspect item definitions (e.g. item serial numbers, lot numbers, operation identifiers, date ranges, etc.) into a computer database, detecting item identifiers in a manufacturing or assembl... | 07/18/2006 |
| 7079904 | Adaptive software management Adaptive control techniques, such as power management techniques for use in managing power consumption in an electronic device, employ optimization analysis to generate power consumption/quality of service performance plots. The optimization analysis can include exp... | 07/18/2006 |
| 7076321 | Method and system for dynamically adjusting metrology sampling based upon available metrology capacity The present invention is generally directed to various methods and systems for dynamically adjusting metrology sampling based upon available metrology capacity. In one illustrative embodiment, the method comprises providing a metrology control unit that is adapted t... | 07/11/2006 |
| 7076320 | Scatterometry monitor in cluster process tool environment for advanced process control (APC) Systems and methods that improve process control in semiconductor manufacturing are disclosed. According to an aspect of the invention, conditions in a cluster tool environment and/or a wafer therein can be monitored in-situ via, for example, a scatterometry system,... | 07/11/2006 |
| 7072798 | Semiconductor fabricating apparatus A resonant frequency sensor is disposed in a plasma-processing chamber included in a semiconductor fabricating apparatus. A change in the resonant frequency caused by etching, sputtering or deposition is sensed in order to detect the timing of performing the mainten... | 07/04/2006 |
| 7072731 | Starvation avoidance lot start agent (SALSA) A system and method are provided for monitoring work in process (“WIP”) in a manufacturing facility. The system and method utilize software objects to identify a bottleneck workstation and calculate a WIP value representing the amount of work approaching the bot... | 07/04/2006 |
| 7071705 | Apparatus and method for communications testing A communications connector tester for quickly and accurately analyzing communications connectors at production to determine whether the connectors are fit for use in certain communications applications is disclosed. Test signals at several discrete frequencies are s... | 07/04/2006 |
| 7069104 | Management system, management apparatus, management method, and device manufacturing method A management system including an acquisition device for acquiring actual processing results obtained by operating an industrial device with a set parameter value and another parameter value, and an estimated processing result, an inspection device for inspecting the... | 06/27/2006 |
| 7069103 | Controlling cumulative wafer effects A method and apparatus provided for controlling cumulative wafer effects. The method comprises processing a workpiece, determining a cumulative effect of the processing on the workpiece and comparing the determined cumulative effect to a reference target value. The ... | 06/27/2006 |
| 7069098 | Method and system for prioritizing material to clear exception conditions The present invention is generally directed to various methods and systems for prioritizing material to clear exception conditions. In one illustrative embodiment, the method includes providing a plurality of workpieces, each of the workpieces having an associated q... | 06/27/2006 |
| 7065460 | Apparatus and method for inspecting semiconductor device An image of the shape of a semiconductor wafer is displayed on a display apparatus for displaying an inspection result of a semiconductor device, and a different color or pattern is displayed for each inspection result as display information indicating the inspectio... | 06/20/2006 |
| 7065725 | Semiconductor manufacturing apparatus, management apparatus therefor, component management apparatus therefor, and semiconductor wafer storage vessel transport apparatus A semiconductor manufacturing apparatus having a plurality of portions according to this invention includes a storage device which stores, for each portion, information representing the lapsed time of use or the product processing count till occurrence of a failure ... | 06/20/2006 |
| 7065524 | Identification and correction of confounders in a statistical analysis Systems and methods are disclosed for identifying and/or compensating for relationships between influencers and outcomes. First, a metadata model of information that characterizes relationships between influencers and outcomes is built. A query is accepted from a us... | 06/20/2006 |
| 7065472 | System for aiding the preparation of operation and maintenance plans for a power generation installation In order to provide an operation and maintenance planning aiding system for a power generation installation which prepares an operation plan for a plurality of power generation units by making use of actual plant data and based on a total judgement including a varie... | 06/20/2006 |
| 7065423 | Optical metrology model optimization for process control To evaluate the adequacy of a profile model, one or more types of process control to be used in controlling a fabrication process are selected. Profile model parameters and acceptable ranges for the profile model parameters are selected. A first and second metrology... | 06/20/2006 |
| 7065422 | Method and apparatus for system state classification A method for identifying a state of a manufacturing system includes defining at least one virtual sensor having a value. At least one state descriptor including a plurality of condition terms and a trigger probability is defined. Each condition term includes a funct... | 06/20/2006 |
| 7065419 | Job flow Petri Net and controlling mechanism for parallel processing The present disclosure provides a job flow system for use in a manufacturing environment, such as a semiconductor fab. The job flow system includes a plurality of sequence-related jobs associated with the manufacturing and a computer-controlled Petri Net structure. ... | 06/20/2006 |
| 7062893 | System and method for accommodating atypical customer requirements in a mass customization A build cell is utilized to manufacture computers and load data into the computers according to customer orders. The build cell may include a build station at which components are assembled into a computer and a first network connection that links the computer with ... | 06/20/2006 |
| 7062409 | System for, method of and computer program product for detecting failure of manufacturing apparatuses A method of detecting failure of manufacturing apparatuses has: identifying a low-yield-period apparatus having a significantly lower yield period compared with other manufacturing apparatus and the significantly lower yield period by comparing yields of a plurality... | 06/13/2006 |
| 7062343 | Remote maintenance system Factories (102–104) have host computers (107) for monitoring industrial equipment (106). Each host computer (107) is connected to a management host computer (108) on a vendor (101) side through the internet (105). T... | 06/13/2006 |
| 7058470 | Method of monitoring and/or controlling a semiconductor manufacturing apparatus and a system therefor A semiconductor processing apparatus for processing a semiconductor wafer includes a sensor for monitoring a processing state of the semiconductor processing apparatus, a processing result input unit which inputs measured values for processing results of a semicondu... | 06/06/2006 |
| 7058553 | Method and system for pre-processing Effects of components in a process model on other components are determined. The effects are then used to perform preprocessing. ... | 06/06/2006 |
