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Class 451/56 - With tool treating or forming


Subclass of Class 451 - Abrading
Definition: Method wherein the abradant, either particulate material
No. of patents: 866
Last issue date: 05/08/2012


          11            
NumberTitleIssue Date
6716090Methods and apparatuses for mechanical and chemical-mechanical planarization of microelectronic-device substrate assemblies on planarizing pads
Apparatuses and methods for planarizing a microelectronic-device substrate assembly on a planarizing pad. In one aspect of the invention, material is removed from the substrate assembly by pressing the substrate assembly against a planarizing surface of a planarizin...
04/06/2004
6716089Method for controlling pH during planarization and cleaning of microelectronic substrates
A method and apparatus for processing a microelectronic substrate. In one embodiment, the method can include planarizing the microelectronic substrate with a planarizing liquid and rinsing the substrate with a rinsing liquid having a pH approximately the same as a p...
04/06/2004
6712676Methods and apparatuses for mechanical and chemical-mechanical planarization of microelectronic-device substrate assemblies on planarizing pads
Apparatuses and methods for planarizing a microelectronic-device substrate assembly on a planarizing pad. In one aspect of the invention, material is removed from the substrate assembly by pressing the substrate assembly against a planarizing surface of a planarizin...
03/30/2004
6705929Cloth cleaning device and polishing machine
Cloth cleaning device of a polishing machine which is capable of fully cleaning a polishing cloth including a part in the vicinity of a center roller. The cloth cleaning device includes an arm movable in a plane parallel to the polishing cloth between a first positi...
03/16/2004
6702654Conditioning wheel for conditioning a semiconductor wafer polishing pad and method of manufacture thereof
The present invention provides an improved conditioning wheel for conditioning polishing pads used to polish semiconductor wafers. In one embodiment, the conditioning wheel includes a planar body having a metal surface located thereon. The metal surface h...
03/09/2004
6702646Method and apparatus for monitoring polishing plate condition
An apparatus for monitoring a condition of a polishing plate, in particular for detecting the time for the polishing plate to be reconditioned or replaced, comprising a measuring unit containing at least one sensing unit and a signal-conditioning unit; an...
03/09/2004
6702651Method and apparatus for conditioning a polishing pad
A polishing material for chemical mechanical polishing has a mesh of fibers and a binder material holding the fibers in the mesh. The binder material coalesced among the fibers to leave pores in the interstices between the fibers of the mesh. The fibers a...
03/09/2004
6699107Polishing head and apparatus with an improved pad conditioner for chemical mechanical polishing
A polishing head and an apparatus for the chemical mechanical polishing (CMP) of a substrate are provided in which a conditioning surface is integrated in or directly coupled to the polishing head so that a simplified structure of the CMP apparatus can be...
03/02/2004
6699106Conditioner for polishing pad and method for manufacturing the same
A conditioner for polishing pad and a method for manufacturing the same are disclosed. The conditioner includes a substrate having formed with a plurality of geometrical protrusions of an uniformed height on at least one of its sides, and a cutting portio...
03/02/2004
6699105Method and apparatus for cutting and grinding single crystal SiC
The present invention comprises a metal bond grind stone having a flat plate portion 10a and a tapered portion 10b; an electrode 13 opposed to the metal bond grind stone with a gap therebetween; voltage applying means 12 for applying a direct-current puls...
03/02/2004
6695684Chemical mechanical polishing apparatus having a cleaner for cleaning a conditioning disc and method of conditioning a polishing pad of the apparatus
A chemical mechanical polishing apparatus includes a polishing pad on which a wafer requiring planarization is placed, a conditioning disc having an abrasive surface for conditioning the polishing pad, a tank containing de-ionized water in which the condi...
02/24/2004
6695680Polishing pad conditioner for semiconductor polishing apparatus and method of monitoring the same
The operation of a polishing pad conditioner for a CMP apparatus is monitored. The polishing pad conditioner includes a housing, a first drive pulley disposed in the housing and connected to a motor at a first side of the housing, a conditioning head havi...
02/24/2004
6688947Porous, lubricated nozzle for abrasive fluid suspension jet
A nozzle apparatus for use with an abrasive fluid jet cutting system, and its method of construction and operation, are disclosed that reduce the wear and erosion problems typically experienced in the cutting jet's nozzle. This improved nozzle apparatus c...
02/10/2004
6682404Method for controlling a temperature of a polishing pad used in planarizing substrates
A method for controlling a polishing characteristic of a polishing pad used in the planarization of a substrate is disclosed. The method includes controlling the temperature of a planarizing surface of the polishing pad so that waste matter accumulations ...
01/27/2004
6682405Polishing apparatus having a dresser and dresser adjusting method
The polishing particle surface of the dresser of a chemical mechanical polishing apparatus used for a planarization process in manufacturing semiconductor devices is inclined. Moreover, the pressure to be applied onto the polishing surface of the dresser ...
01/27/2004
6682406Abrasive cleaning tool for removing contamination
A cleaning tool for simultaneously abrading a contaminated surface and collecting contaminating particles and a method for using the same is provided the cleaning tool including an abrasive member including an abrasive surface said abrasive surface includ...
01/27/2004
6679763Apparatus and method for qualifying a chemical mechanical planarization process
A method and apparatus for qualifying a polishing pad used in chemical mechanical planarization of semiconductor wafers is described. The apparatus includes at least one qualifying member including at least one collimated hole structure, wherein the colli...
01/20/2004
6676493Integrated planarization and clean wafer processing system
A wafer processing module is provided. In one example, the wafer processing module includes a sub-aperture CMP processing system and a pad exchange system including a pad magazine for storing CMP processing pads and a pad exchange robot for transferring C...
01/13/2004
6672945Polishing apparatus and dressing method
A abstract polishing apparatus has a substrate carrier a substrate and an abrasive member having a polishing surface. The surface is slidingly engaged with the substrate in order to effect polishing. The dressing device includes a light source when genera...
01/06/2004
6672946Methods and apparatuses for mechanical and chemical-mechanical planarization of microelectronic-device substrate assemblies on planarizing pads
Apparatuses and methods for planarizing a microelectronic-device substrate assembly on a planarizing pad. In one aspect of the invention, material is removed from the substrate assembly by pressing the substrate assembly against a planarizing surface of a...
01/06/2004
6672949Polishing apparatus
A chemical-mechanical polishing apparatus is provided with a downstream device for conditioning a web-shaped polishing pad. The device may be used to condition a glazed portion of the pad, and then the conditioned pad portion may be used again for polishi...
01/06/2004
6669538Pad cleaning for a CMP system
The present invention generally provides a system and apparatus for cleaning a polishing pad, such as a fixed abrasive pad, in a substrate processing system. In one embodiment, the system includes one or more nozzles which spray a fluid at pressures of ab...
12/30/2003
6666754Method and apparatus for determining CMP pad conditioner effectiveness
A method includes supplying a signal to rotationally drive a conditioning wheel of a conditioning tool. A polishing pad of a polishing tool is conditioned using the rotationally driven conditioning wheel. Changes in the signal driving the conditioning whe...
12/23/2003
6666755Belt wiper for a chemical mechanical planarization system
A belt wiper that can be used in a linear belt-type chemical mechanical planarization (CMP) system to maintain a belt pad is provided. The belt wiper mitigates disturbances within a detection region important to a belt pad steering system. Also, the belt ...
12/23/2003
6659849Platen with debris control for chemical mechanical planarization
Generally, a method and apparatus for cleaning a backside of a web of polishing material. In one embodiment, the apparatus includes a platen having a support surface adapted to support the backside the web and a web cleaner disposed on the platen and adja...
12/09/2003
6656019Grooved polishing pads and methods of use
Grooves are formed in a CMP pad by positioning the pad on a supporting surface with a working surface of the pad in spaced relation opposite to a router bit and at least one projecting stop member adjacent to the router bit, an outer end portion of the bi...
12/02/2003
6656025Integrated pad and belt for chemical mechanical polishing
An integrated pad and belt for polishing a surface comprising a belt integrated with a polishing pad that forms a seamless polishing surface....
12/02/2003
6652364Methods and apparatuses for mechanical and chemical-mechanical planarization of microelectronic-device substrate assemblies on planarizing pads
Apparatuses and methods for planarizing a microelectronic-device substrate assembly on a planarizing pad. In one aspect of the invention, material is removed from the substrate assembly by pressing the substrate assembly against a planarizing surface of a...
11/25/2003
6652365Methods and apparatuses for mechanical and chemical-mechanical planarization of microelectronic-device substrate assemblies on planarizing pads
Apparatuses and methods for planarizing a microelectronic-device substrate assembly on a planarizing pad. In one aspect of the invention, material is removed from the substrate assembly by pressing the substrate assembly against a planarizing surface of a...
11/25/2003
6652764Methods and apparatuses for making and using planarizing pads for mechanical and chemical-mechanical planarization of microelectronic substrates
Methods and apparatuses for planarizing a microelectronic substrate. In one embodiment, a planarizing pad for mechanical or chemical-mechanical planarization includes a base section and a plurality of embedded sections. The base section has a planarizing ...
11/25/2003
6648731Polishing pad conditioning apparatus in chemical mechanical polishing apparatus
A polishing pad conditioning apparatus in a chemical mechanical polishing apparatus, wherein the conditioning apparatus includes a conditioning plate which maintains a predetermined relative velocity with respect to the polishing pad, extends from a cente...
11/18/2003
6648736Methods and apparatuses for mechanical and chemical-mechanical planarization of microelectronic-device substrate assemblies on planarizing pads
Apparatuses and methods for planarizing a microelectronic-device substrate assembly on a planarizing pad. In one aspect of the invention, material is removed from the substrate assembly by pressing the substrate assembly against a planarizing surface of a...
11/18/2003
6645052Method and apparatus for controlling CMP pad surface finish
A method and apparatus for pre-conditioning a polishing pad for use in chemical mechanical planarization of semiconductor wafers is described. The apparatus includes a pre-conditioning member having a smooth surface. The method includes providing a pre-co...
11/11/2003
6645053Polishing apparatus
A polishing apparatus has a turntable with a polishing cloth attached thereto and a top ring for holding and pressing a workpiece to be polished against the polishing cloth under a certain pressure. The polishing apparatus also has a first dressing unit h...
11/11/2003
6645056Self-forming tooling for an orbital polishing machine and method for producing the same
A method for producing, from a blank, restrictive tooling for use in an orbital polishing machine involves urging one of either the workpiece or the blank along a predetermined path against the other to physically impart a proportioned contour of the work...
11/11/2003
6645046Conditioning mechanism in a chemical mechanical polishing apparatus for semiconductor wafers
A method and apparatus for conditioning a polishing pad are described. The method includes steps of providing a chemical mechanical polishing apparatus having a polishing region and a conditioning region; cycling a polishing member through the apparatus; ...
11/11/2003
6641471Polishing pad having an advantageous micro-texture and methods relating thereto
A statistically uniform micro-texture on a polishing pad surface improves break-in preconditioning time, and is measured by: Land Surface Roughness, Ra, from about 0.01 μm to about 25 μm; Average Peak to Valley Roughness, Rtm, from about 2 μm to about 40...
11/04/2003
6638148Methods and apparatuses for mechanical and chemical-mechanical planarization of microelectronic-device substrate assemblies on planarizing pads
Apparatuses and methods for planarizing a mnicroelectronic-device substrate assembly on a planarizing pad. In one aspect of the invention, material is removed from the substrate assembly by pressing the substrate assembly against a planarizing surface of ...
10/28/2003
6634934Method for cleaning polishing tool, polishing method polishing apparatus
A method for cleaning a polishing tool capable of reliably removing deposited solidified abrasive and impurities and thereby capable of suppressing scratching of a polished object and reducing residual particles on the polished face of the polished object...
10/21/2003
6626743Method and apparatus for conditioning a polishing pad
A method and apparatus for conditioning a polishing pad is described. The method includes applying a stream of pressurized liquid to the polishing pad, and removing a significant amount of slurry and liquid from the polishing pad using a vacuum. The appar...
09/30/2003
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