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Class 451/5 - Computer controlled


Subclass of Class 451 - Abrading
Definition: Subject matter in which the operation is regulated by an
No. of patents: 2218
Last issue date: 05/08/2012


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NumberTitleIssue Date
7392580Method for manufacturing a slider using electromagnetic wave
A method for manufacturing sliders from a bar has: a radiating step which includes radiating an electromagnetic wave on at least a part of each space on a second surface of said bar, wherein said second surface is a back surface of a first surface of said bar, said ...
07/01/2008
7392579Method for protecting a slider mounted CPP GMR or TMR read head sensor from noise and ESD damage
A slider mounted CPP GMR or TMR read head sensor is protected from electrostatic discharge (ESD) damage and from noise and cross-talk from an adjacent write head by means of a balanced resistive/capacitative shunt. The shunt includes highly resistive interconnection...
07/01/2008
7393262Apparatus including pin adapter for air bearing surface (ABS) lapping
A system is provided for measuring a head during a lapping process. First provided is a wafer including at least one head each having an electrical lapping guide (ELG), a plurality of wafer contacts in electrical communication with the ELG, and a closure formed ther...
07/01/2008
7393261Cylindrical grinding method for producing hard metal tools and cylindrical grinding machine for grinding cylindrical starting bodies during the production of hard metal tools
The invention relates to a grinding method and to a cylindrical grinding machine, in which a sintered hard metal round rod is completely pushed through a chuck of a workpiece spindle head, said chuck having chuck jaws. Two backrest seats are ground on the freely pro...
07/01/2008
7392108Method of controlling an edger device, machine programmed to edge an ophthalmic lens blank, and computer program
The present invention relates to a method of controlling an ophthalmic edger device, and a machine programmed to edge and ophthalmic lens blank. A lens blank and an edger device for forming a groove in a peripheral edge of the lens blank are provided. A central proc...
06/24/2008
7389578Manufacturing method of a perpendicular recording magnetic head
Embodiments in accordance with the present invention relate to methods wherein when a main pole is processed by using an ion milling technique, a re-adhesion layer created on the side face of the resist mask is removed with certainty. In one embodiment, an inorganic...
06/24/2008
7386933Method of fabricating thin film write heads with a shortened yoke and improved dimension control
A method for fabricating a magnetic recording head writer. The writer includes a bottom magnetic pole and a write gap formed over the bottom pole and a coil trench formed in the bottom pole. A top magnetic pole is provided as two layers with the first layer includin...
06/17/2008
7386935Methods and apparatus for controlling the lapping of a slider based on an amplitude of a readback signal produced from an externally applied magnetic field
The lapping of a slider is controlled based on an amplitude of a readback signal which is produced from an externally applied magnetic field. A lapping plate is used to lap a slider which includes at least one magnetic head having a read sensor. During the lapping, ...
06/17/2008
7383626Methods for fabricating giant magnetoresistive (GMR) devices
In a method of fabricating a giant magnetoresistive (GMR) device a plurality of magnetoresistive device layers is deposited on a first silicon nitride layer formed on a silicon oxide layer. An etch stop is formed on the magnetoresistive device layers, and a second l...
06/10/2008
7384326Facetting area setting device and eyeglass lens processing apparatus
A facetting area setting device for setting a facetting area so as to perform a facetting on an edge corner of an eyeglass lens which has been finished, includes: an input unit that inputs a target lens shape; a display unit that displays a front outline graphic bas...
06/10/2008
7381114Tire uniformity machine grinding assembly
A grinder assembly (10) contacts a tire (T) supported by a frame (F) relative to the tire (T). The grinder assembly (10) includes at least one section, and a vertical repositioning system (118) supporting the at least one section. The vertical r...
06/03/2008
7377836Versatile wafer refining
Methods of refining using a plurality of refining elements are discussed. A refining apparatus having refining elements that can be smaller than the workpiece being refined are disclosed. New refining methods, refining apparatus, and refining elements disclosed. Met...
05/27/2008
7376482Grinding method and apparatus
In a grinding method and apparatus, a machining portion of a workpiece is ground with a grinding wheel on a trial, and shape errors in respective rotational phases of the machining portion are measured after the trial grinding. Based on the shape errors, control dat...
05/20/2008
7374470Knife sharpening apparatus
A sharpening apparatus having at least one guide slot, a drive pulley drivingly coupled to a frame and at least one idler pulley rotatably coupled to a support member. The support member is pivotably coupled to the frame. The apparatus includes an endless abrading b...
05/20/2008
7371152Non-uniform subaperture polishing
A method for subaperture polishing includes determining a first portion of a sample to be polished disproportionately compared to a second portion of the sample. Based on the determination of the first portion, a sweep frequency that is a first rate of lateral motio...
05/13/2008
7371153Glass etching
An apparatus for etching a workpiece in which a first abrasive particulate material, for example aluminium oxide, and a second particulate material, for example glass dust, are entrained together in a stream of gas. The apparatus recycles exhaust particulate materia...
05/13/2008
7371151Lens stocking apparatus and lens processing system having the same
A lens stocking apparatus capable of stocking a plurality of lenses, which has a first stage, on which a plurality of trays respectively accommodating lenses are mountable, for transferring a tray, a vertically movable second stage, on which a plurality of trays res...
05/13/2008
7371154Dual ophthalmic lens machining platform and simultaneous ophthalmic lens manufacturing method
A dual ophthalmic lens machining platform comprises a blocked lens mounting structure constructed to simultaneously receive a first and a second blocked lens blank, and configured to rotationally and linearly move each lens blank, wherein the first and second lens b...
05/13/2008
7371686Method and apparatus for polishing a semiconductor device
A method and an apparatus for polishing a semiconductor wafer are provided. An initial thickness of the semiconductor wafer is actually measured to obtain a measured initial thickness value. First and second inter-positions are then set or determined with reference ...
05/13/2008
7371689Backside unlayering of MOSFET devices for electrical and physical characterization
A method and system for backside unlayering a semiconductor device to expose FEOL semiconductor features of the device for subsequent electrical and/or physical probing. A window is formed within a backside substrate layer of the semiconductor. A collimated ion plas...
05/13/2008
7371149Honing feed system having full control of feed force, rate, and position and method of operation of the same
The feed system (30) for a honing machine (10) provides a capability to dynamically correct in real time errors in bore size inferred arising from variations in feed force, and a method of operation of the same. The system (10) allows a user to ...
05/13/2008
7371150Electric sander and motor control therefor
A hand held orbital sander has a housing having an electronically commutated motor disposed therein and an orbit mechanism disposed beneath the housing. A motor controller is coupled to the motor. The motor controller changes the speed of at which it runs the motor ...
05/13/2008
7370405Fabrication method of a high gradient-field recording head for perpendicular magnetic recording
A thin film magnetic head for perpendicular recording of a single-pole type has a flux enhanced part and a flux enhanced end arranged on a leading side of the main pole in parallel with the cross track direction. The side surface of the main pole intersecting the cr...
05/13/2008
7368017Method and apparatus for semiconductor wafer planarization
Broadly speaking, the present invention provides a method and an apparatus for planarizing a semiconductor wafer (“wafer”). More specifically, the present invention provides for depositing a planarizing layer over the wafer, wherein the planarizing layer serves ...
05/06/2008
7367927Methods and apparatus for supporting selectorized dumbbells
Various exercise systems include first and second selectorized dumbbell assemblies; and a frame having first and second weight supports to support respective dumbbell assemblies. Generally speaking, the systems assume multiple configurations to facilitate both use a...
05/06/2008
7367756Work phase determination method for machine tools, and device therefor
In adjusting phase for work (W), the operation of mounting/dismounting a reference tool on a spindle (6) is dispensed with and so is a storage space for the reference tool, and besides, it is arranged that the thrust on the work (W) does not directly act on t...
05/06/2008
7369255Apparatus and method for capacitive measurement of materials
Method for measuring thicknesses of a film, a foil or a material layer with a measuring head which is spaced away from the film and with which a capacitive thickness measurement is performed, in which an optical distance measurement is performed with a distance meas...
05/06/2008
7369361Magnetic head and magnetic head substructure including resistor element whose resistance corresponds to the length of the track width defining portion of the pole layer
A method of manufacturing magnetic heads comprises the step of: fabricating a magnetic head substructure by forming components of a plurality of magnetic heads on a single substrate, wherein a plurality of rows of pre-head portions that will be the respective magnet...
05/06/2008
7367866Apparatus and method for polishing semiconductor wafers using pivotable load/unload cups
An apparatus and method for polishing objects, such as semiconductor wafers, utilizes pivotable load/unload cups to transfer the objects to object carriers to polish the objects on at least one polishing surface. The pivoting axes of the pivotable load/unload cups a...
05/06/2008
7364493Lap grinding and polishing machine
An apparatus, system and method for grinding or polishing an optic is provided. The apparatus includes a shell adapted to a bending profile, torque actuators attached at an outer edge of the shell and coupled to each other, a tensioning system attached at the outer ...
04/29/2008
7364494Eyeglass lens processing apparatus and method of processing eyeglass lens
An eyeglass lens processing apparatus for processing an eyeglass lens includes: a lens chuck that holds the lens; a roughing tool; a finishing tool; a finishing data input unit that inputs finishing data; a water supply unit that supplies water to a portion being pr...
04/29/2008
7363698Process for creating a write head by forming a bump after the top pole is formed
Methods for creating a write head by forming a bump after the top pole is formed are provided. In one embodiment, a bottom pole is created out of a first layer. A non-magnetic gap material is applied to the surface of the wafer. A top pole is created out of a second...
04/29/2008
7363700Method of manufacturing a thin film magnetic head
The present invention provides a thin film magnetic head achieving improved recording performance by sharpening recording magnetic field gradient as much as possible. The thin film magnetic head has a return yoke layer disposed on a trailing side of a magnetic pole ...
04/29/2008
7366575Wafer polishing control
Methods of controlling polishing of wafers are disclosed. In one aspect, a method may include measuring one or more pre-polish thicknesses of one or more layers of a wafer. The one or more layers may then be polished. Then a post-polish thickness of a layer of the w...
04/29/2008
7366704System and method for deconvoluting the effect of topography on scanning probe microscopy measurements
A method for using a neural network to deconvolute the effects due to surface topography from the effects due to the other physical property being measured in a scanning probe microscopy (SPM) or atomic force microscopy (AFM) image. In the case of a thermal SPM, the...
04/29/2008
7364492On-line grinding method for work roll
An on-line roll grinding method for a work roll, which can decrease an overshoot, by which the pressing load of a rotating grinding wheel on a work roll exceeds a set grinding pressing load, is provided. This method is an on-line grinding method for a work roll, ada...
04/29/2008
7364497Polish pad and chemical mechanical polishing apparatus comprising the same
A polishing pad for use in chemically mechanically polishing a semiconductor substrate enhances the uniformity of the rate at which material is removed from the surface of the semiconductor substrate, thereby ensuring the reproducibility of the chemical mechanical p...
04/29/2008
7360302Manufacturing method of a magnetic sensor
A magnetic sensor comprises magnetoresistive elements and permanent magnet films, which are combined together to form GMR elements formed on a quartz substrate having a square shape, wherein the permanent magnet films are paired and connected to both ends of the mag...
04/22/2008
7360301Method of manufacturing a thin film magnetic head
The invention is directed to improvement of a write element of a thin film magnetic head. The first pole portion projects from a flat surface of a first yoke portion at a medium-facing surface side and having a reduced width at its upper end. The second pole portion...
04/22/2008
7363195Methods of configuring a sensor network
A sensor network collects time-series data from a process tool and supplies the data to an analysis system where pattern analysis techniques are used to identify structures and to monitor subsequent data based on analysis instructions or a composite model. Time-seri...
04/22/2008
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